Patents by Inventor Shou Tai

Shou Tai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10218145
    Abstract: A vortex laser generation device in a degenerate cavity with a spiral phase element and a vortex laser generation method are provided. The vortex laser generation device has a degenerate cavity, and the degenerate cavity has a resonator mirror, a gain medium, an optical element, and an output coupler. The off-axis beams are formed in multiple pass transverse modes to resonate by disposing an optical element in the degenerate cavity, so that a vortex laser with orbital angular momentum can be generated.
    Type: Grant
    Filed: July 2, 2018
    Date of Patent: February 26, 2019
    Assignee: NATIONAL SUN YAT-SEN UNIVERSITY
    Inventors: Yuan-Yao Lin, Yen-Yin Lin, Shou-Tai Lin, An-Chung Chiang
  • Patent number: 9922245
    Abstract: A method, a system, and a non-transitory computer readable medium for recognizing an object. The method includes emitting an array of infrared rays from an infrared emitter towards a projection region, the projection region including a first object; generating a reference infrared image by recording an intensity of ray reflection from the projection region without the first object; generating a target infrared image by recording the intensity of ray reflection from the projection region with the first object; comparing the target infrared image to the reference infrared image to generate a predetermined intensity threshold; and extracting the first object from the target infrared image, if the intensity of ray reflection of the target infrared image of the first object exceeds the predetermined intensity threshold.
    Type: Grant
    Filed: August 15, 2014
    Date of Patent: March 20, 2018
    Assignee: KONICA MINOLTA LABORATORY U.S.A., INC.
    Inventors: Yongmian Zhang, Hung-Shou Tai, Haisong Gu
  • Publication number: 20160048727
    Abstract: A method, a system, and a non-transitory computer readable medium for recognizing an object are disclosed, the method including: emitting an array of infrared rays from an infrared emitter towards a projection region, the projection region including a first object; generating a reference infrared image by recording an intensity of ray reflection from the projection region without the first object; generating a target infrared image by recording the intensity of ray reflection from the projection region with the first object; comparing the target infrared image to the reference infrared image to generate a predetermined intensity threshold; and extracting the first object from the target infrared image, if the intensity of ray reflection of the target infrared image of the first object exceeds the predetermined intensity threshold.
    Type: Application
    Filed: August 15, 2014
    Publication date: February 18, 2016
    Applicant: Konica Minolta Laboratory U.S.A., Inc.
    Inventors: Yongmian ZHANG, Hung-Shou Tai, Haisong Gu
  • Publication number: 20120195333
    Abstract: A laser-wavelength conversion system with a broad temperature acceptance bandwidth is provided. The laser system includes a broad-band pump laser driving one or several cascaded laser wavelength converters, wherein the pump laser spectrum is broader than the spectral acceptance bandwidth of at least one of the laser wavelength converters. The broad pump laser spectrum allows some temperature variation in the laser wavelength converters, resulting in a broad temperature acceptance for the whole laser system. The laser system provides stable multi-color laser radiation for applications such as the red-green-blue laser projection TV.
    Type: Application
    Filed: February 1, 2011
    Publication date: August 2, 2012
    Applicant: NATIONAL TSING HUA UNIVERSITY
    Inventors: Yen-Chieh Huang, Yen-Yin Lin, Shou-Tai Lin
  • Patent number: 8184667
    Abstract: The configurations of an electro-optic Bragg deflector and the methods of using it as a laser Q-switch in a Q-switched laser and in a Q-switched wavelength-conversion laser are provided. As a first embodiment, the electro-optic Bragg deflector comprises an electrode-coated electro-optic material with one of a 1D and a 2D spatially modulated electro-optic coefficient. When a voltage is supplied to the electrodes, the electro-optic material behaves like a Bragg grating due to the electro-optically induced spatial modulation of the refractive index. The second embodiment relates to an actively Q-switched laser, wherein the electro-optic Bragg deflector functions as a laser Q-switch. The third embodiment of the present invention combines the Q-switched laser and a laser-wavelength converter to form a Q-switched wavelength-conversion laser, wherein the EO Bragg deflector can be monolithically integrated with a quasi-phase-matching wavelength converter in a fabrication process.
    Type: Grant
    Filed: December 9, 2010
    Date of Patent: May 22, 2012
    Assignee: National Tsing Hua University
    Inventors: An-Chung Chiang, Shou-Tai Lin, Yen-Chieh Huang, Yen-Yin Lin, Guey-Wu Chang
  • Publication number: 20110075688
    Abstract: The configurations of an electro-optic Bragg deflector and the methods of using it as a laser Q-switch in a Q-switched laser and in a Q-switched wavelength-conversion laser are provided. As a first embodiment, the electro-optic Bragg deflector comprises an electrode-coated electro-optic material with one of a 1D and a 2D spatially modulated electro-optic coefficient. When a voltage is supplied to the electrodes, the electro-optic material behaves like a Bragg grating due to the electro-optically induced spatial modulation of the refractive index. The second embodiment relates to an actively Q-switched laser, wherein the electro-optic Bragg deflector functions as a laser Q-switch. The third embodiment of the present invention combines the Q-switched laser and a laser-wavelength converter to form a Q-switched wavelength-conversion laser, wherein the EO Bragg deflector can be monolithically integrated with a quasi-phase-matching wavelength converter in a fabrication process.
    Type: Application
    Filed: December 9, 2010
    Publication date: March 31, 2011
    Applicant: NATIONAL TSING HUA UNIVERSITY
    Inventors: An-Chung Chiang, Shou-Tai Lin, Yen-Chieh Huang, Yen-Yin Lin, Guey-Wu Chang
  • Publication number: 20090059967
    Abstract: The configurations of an electro-optic Bragg deflector and the methods of using it as a laser Q-switch in a Q-switched laser and in a Q-switched wavelength-conversion laser are provided. As a first embodiment of the present invention, the electro-optic Bragg deflector comprises an electrode-coated electro-optic material with a spatially modulated electro-optic coefficient. When a voltage is supplied to the electrodes, the electro-optic material behaves like a Bragg grating due to the electro-optically induced spatial modulation of the refractive index. The second embodiment of the present invention relates to an actively Q-switched laser, wherein the electro-optic Bragg deflector functions as a laser Q-switch. The third embodiment of the present invention combines the Q-switched laser and a laser-wavelength converter to form a Q-switched wavelength-conversion laser, wherein the EO Bragg deflector can be monolithically integrated with a quasi-phase-matching wavelength converter in a fabrication process.
    Type: Application
    Filed: February 28, 2008
    Publication date: March 5, 2009
    Applicant: NATIONAL TSING HUA UNIVERSITY
    Inventors: An-Chung Chiang, Shou-Tai Lin, Yen-Chieh Huang, Yen-Yin Lin, Guey-Wu Chang
  • Patent number: 7015710
    Abstract: A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.
    Type: Grant
    Filed: August 2, 2004
    Date of Patent: March 21, 2006
    Assignee: Genesis Technology Incorporated
    Inventors: Hideaki Yoshida, Toshinori Ishii, Atushi Matsuda, Mituyoshi Ueki, Noriyoshi Tachikawa, Tadashi Nakamura, Naoki Katou, Shou Tai, Hayato Sasaki, Naohumi Iwamoto, Akihumi Mishima, Toshiharu Hiji, Akihiro Masuda
  • Patent number: 6937042
    Abstract: A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.
    Type: Grant
    Filed: August 2, 2004
    Date of Patent: August 30, 2005
    Assignee: Genesis Technology Incorporated
    Inventors: Hideaki Yoshida, Toshinori Ishii, Atushi Matsuda, Mituyoshi Ueki, Noriyoshi Tachikawa, Tadashi Nakamura, Naoki Katou, Shou Tai, Hayato Sasaki, Naohumi Iwamoto, Akihumi Mishima, Toshiharu Hiji, Akihiro Masuda
  • Patent number: 6919732
    Abstract: A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.
    Type: Grant
    Filed: August 2, 2004
    Date of Patent: July 19, 2005
    Assignee: Genesis Technology Incorporation
    Inventors: Hideaki Yoshida, Toshinori Ishii, Atushi Matsuda, Mituyoshi Ueki, Noriyoshi Tachikawa, Tadashi Nakamura, Naoki Katou, Shou Tai, Hayato Sasaki, Naohumi Iwamoto, Akihumi Mishima, Toshiharu Hiji, Akihiro Masuda
  • Patent number: 6917211
    Abstract: A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.
    Type: Grant
    Filed: August 2, 2004
    Date of Patent: July 12, 2005
    Assignee: Genesis Technology Incorporated
    Inventors: Hideaki Yoshida, Toshinori Ishii, Atushi Matsuda, Mituyoshi Ueki, Noriyoshi Tachikawa, Tadashi Nakamura, Naoki Katou, Shou Tai, Hayato Sasaki, Naohumi Iwamoto, Akihumi Mishima, Toshiharu Hiji, Akihiro Masuda
  • Patent number: 6903563
    Abstract: A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.
    Type: Grant
    Filed: August 2, 2004
    Date of Patent: June 7, 2005
    Assignee: Genesis Technology Incorporated
    Inventors: Hideaki Yoshida, Toshinori Ishii, Atushi Matsuda, Mituyoshi Ueki, Noriyoshi Tachikawa, Tadashi Nakamura, Naoki Katou, Shou Tai, Hayato Sasaki, Naohumi Iwamoto, Akihumi Mishima, Toshiharu Hiji, Akihiro Masuda
  • Patent number: 6900647
    Abstract: A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.
    Type: Grant
    Filed: February 12, 2004
    Date of Patent: May 31, 2005
    Assignee: Genesis Technology Incorporated
    Inventors: Hideaki Yoshida, Toshinori Ishii, Atushi Matsuda, Mituyoshi Ueki, Noriyoshi Tachikawa, Tadashi Nakamura, Naoki Katou, Shou Tai, Hayato Sasaki, Naohumi Iwamoto, Akihumi Mishima, Toshiharu Hiji, Akihiro Masuda
  • Publication number: 20050007130
    Abstract: A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.
    Type: Application
    Filed: August 2, 2004
    Publication date: January 13, 2005
    Applicant: Genesis Technology Incorporated
    Inventors: Hideaki Yoshida, Toshinori Ishii, Atushi Matsuda, Mituyoshi Ueki, Noriyoshi Tachikawa, Tadashi Nakamura, Naoki Katou, Shou Tai, Hayato Sasaki, Naohumi Iwamoto, Akihumi Mishima, Toshiharu Hiji, Akihiro Masuda
  • Publication number: 20050001643
    Abstract: A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.
    Type: Application
    Filed: August 2, 2004
    Publication date: January 6, 2005
    Applicant: Genesis Technology Incorporated
    Inventors: Hideaki Yoshida, Toshinori Ishii, Atushi Matsuda, Mituyoshi Ueki, Noriyoshi Tachikawa, Tadashi Nakamura, Naoki Katou, Shou Tai, Hayato Sasaki, Naohumi Iwamoto, Akihumi Mishima, Toshiharu Hiji, Akihiro Masuda
  • Publication number: 20050001644
    Abstract: A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.
    Type: Application
    Filed: August 2, 2004
    Publication date: January 6, 2005
    Applicant: Genesis Technology Incorporated
    Inventors: Hideaki Yoshida, Toshinori Ishii, Atushi Matsuda, Mituyoshi Ueki, Noriyoshi Tachikawa, Tadashi Nakamura, Naoki Katou, Shou Tai, Hayato Sasaki, Naohumi Iwamoto, Akihumi Mishima, Toshiharu Hiji, Akihiro Masuda
  • Publication number: 20050001642
    Abstract: A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.
    Type: Application
    Filed: August 2, 2004
    Publication date: January 6, 2005
    Applicant: Genesis Technology Incorporated
    Inventors: Hideaki Yoshida, Toshinori Ishii, Atushi Matsuda, Mituyoshi Ueki, Noriyoshi Tachikawa, Tadashi Nakamura, Naoki Kato, Shou Tai, Hayato Sasaki, Naohumi Iwamoto, Akihumi Mishima, Toshiharu Hiji, Akihiro Masuda
  • Publication number: 20050001641
    Abstract: A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.
    Type: Application
    Filed: August 2, 2004
    Publication date: January 6, 2005
    Applicant: Genesis Technology Incorporated
    Inventors: Hideaki Yoshida, Toshinori Ishii, Atushi Matsuda, Mituyoshi Ueki, Noriyoshi Tachikawa, Tadashi Nakamura, Naoki Kato, Shou Tai, Hayato Sasaki, Naohumi Iwamoto, Akihumi Mishima, Toshiharu Hiji, Akihiro Masuda
  • Publication number: 20040160236
    Abstract: A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.
    Type: Application
    Filed: February 12, 2004
    Publication date: August 19, 2004
    Applicant: Genesis Technology Incorporated
    Inventors: Hideaki Yoshida, Toshinori Ishii, Atushi Matsuda, Mituyoshi Ueki, Noriyoshi Tachikawa, Tadashi Nakamura, Naoki Katou, Shou Tai, Hayato Sasaki, Naohumi Iwamoto, Akihumi Mishima, Toshiharu Hiji, Akihiro Masuda
  • Patent number: 6710608
    Abstract: A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.
    Type: Grant
    Filed: February 19, 2002
    Date of Patent: March 23, 2004
    Assignee: Mitsubishi Materials Corporation
    Inventors: Hideaki Yoshida, Toshinori Ishii, Atushi Matsuda, Mituyoshi Ueki, Noriyoshi Tachikawa, Tadashi Nakamura, Naoki Katou, Shou Tai, Hayato Sasaki, Naohumi Iwamoto, Akihumi Mishima, Toshiharu Hiji, Akihiro Masuda