Patents by Inventor Shu-Jen Chen

Shu-Jen Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20040047124
    Abstract: A heat sink attached externally on a bottom portion of a portable computer has the heat sink placed at a rear lower aspect of the portable computer; the present invention is characterized that the heat sink is a flat casing; at least one fan is installed inside the heat sink; an air inlet is disposed at the upper aspect of the fan; an air outlet is disposed at the front aspect of a bearing plate on the front aspect of the fan; a current guide board is disposed at the lower aspect of the fan; according to the abovementioned structure, when being used, the air current enters from the air inlet and discharges outwardly from the air outlet thereby allowing the cooling air current to enter from the bottom portion of the portable computer for heat dissipation.
    Type: Application
    Filed: September 10, 2002
    Publication date: March 11, 2004
    Inventors: Chen-Huang Hsieh, Shu-Jen Chen
  • Publication number: 20030181482
    Abstract: This invention relates to novel heteroatom containing compounds and compositions thereof, and their use for the prevention and treatment of disease. The invention also provides for methods of making the compounds. The invention is based on the discovery that certain heteroatom containing compounds, 3-oxoacetamideindolyl compounds, have potent anticancer, cytotoxic, and anti-angiogenic activity.
    Type: Application
    Filed: December 5, 2002
    Publication date: September 25, 2003
    Inventors: Chiung-Tong Chen, Shu-Jen Chen, Ming-Chu Hsu, Der-Ren Hwang, Wen-Tai Li, Chu-Chung Lin
  • Publication number: 20030087936
    Abstract: A compound having the formula: 1
    Type: Application
    Filed: July 9, 2002
    Publication date: May 8, 2003
    Inventors: Kak-Shan Shia, Shin-Ru Shih, Chung-Ming Chang, Jyh-Haur Chern, Wen-Tai Li, Shu-Jen Chen, Ming-Chu Hsu
  • Patent number: 6462390
    Abstract: A multi-film capping layer having a cobalt layer, a barrier layer, and a stuffing layer is disclosed, wherein the barrier layer isolates the cobalt layer from the stuffing layer. The multi-film capping layer is formed on a gate transistor and applicable to a self-aligned silicide (salicide) process, so that a sheet resistance of the salicide layer on conductive regions of the gate transistor is significantly reduced. The stuffing layer further prevents entry of oxygen or moisture to the salicide layer, thus no cobalt oxide is formed when RTP is performed. Without formation of the cobalt oxide, the salicide process is free from the bridging issue and the filament issue.
    Type: Grant
    Filed: September 27, 2000
    Date of Patent: October 8, 2002
    Assignee: United Microelectronics Corp.
    Inventors: Ming-Shing Chen, Shu-Jen Chen, Jy-Hwang Lin, Kuen-Syh Tseng
  • Publication number: 20020131961
    Abstract: A method for liver-directed gene therapy is described. The method involves transfer of Bcl2 and a selected transgene to hepatocytes. Bcl2 protects those hepatocytes which express it from apoptosis and permits proliferation of hepatocytes containing the transgene.
    Type: Application
    Filed: January 30, 2002
    Publication date: September 19, 2002
    Applicant: The Trustees of the University of Pennsylvania
    Inventors: James M. Wilson, Shu-Jen Chen
  • Patent number: 6333262
    Abstract: A method for forming silicide on a semiconductor wafer. The semiconductor wafer includes a doped silicon layer on a predetermined area of the semiconductor wafer, a metal layer positioned on the doped silicon layer, and a barrier layer covering the metal layer. A first rapid thermal processing (RTP) step is performed to make portions of the metal layer react with silicon inside the doped silicon layer so as to form a transitional silicide. The barrier layer and the portions of the metal layer that have not reacted with silicon are then removed. A dielectric layer is formed on the transitional silicide. Finally, a second rapid thermal processing (RTP) step is performed to make the transitional silicide react with portions of the doped silicon layer so as to form the silicide.
    Type: Grant
    Filed: August 11, 2000
    Date of Patent: December 25, 2001
    Assignee: United Microelectronics Corp.
    Inventors: Kuen-Syh Tseng, Ruoh-Haw Chang, Shu-Jen Chen
  • Patent number: 6303043
    Abstract: A method of fabricating a preserve layer. A top metallic layer is formed over the substrate. Portions of the metallic layer and the substrate are removed to form a trench. A conformal pad oxide layer is formed over the substrate. A conformal first nitride layer is formed on the pad oxide layer. A spin-on glass layer is formed on the first nitride layer to fill the trench. An etching back step is performed to remove a portion of the spin-on glass layer. The remaining spin-on glass layer fills the trench to the surface of the first nitride layer above the top metallic layer. An oxide layer is formed over the substrate. A second nitride layer is formed on the oxide layer. A preserve layer comprising the pad oxide layer, the first nitride layer, the oxide layer, and the second nitride layer is formed.
    Type: Grant
    Filed: July 7, 1999
    Date of Patent: October 16, 2001
    Assignee: United Microelectronics Corp.
    Inventors: Wei-Shiau Chen, Ruoh-Haw Chang, Shu-Jen Chen
  • Patent number: 6218294
    Abstract: A method of manufacturing an interconnect. A first conductive layer is formed on the wafer. Portions of the first conductive layer are removed to form a wire in the interior region and to expose the surface of the wafer in the edge region, simultaneously. An insulating layer is formed on the wire and the wafer. An opening is formed to penetrate through the insulating layer and exposes the wire. A second conductive layer is formed on the insulating layer and fills the opening.
    Type: Grant
    Filed: April 16, 1999
    Date of Patent: April 17, 2001
    Assignee: United Microelectronics Corp.
    Inventors: Chien-Chih Lin, Shu-Jen Chen, William Lu
  • Patent number: 6203975
    Abstract: A recombinant adenovirus and a method for producing the virus are provided which utilize a recombinant shuttle vector comprising adenovirus DNA sequence for the 5′ and 3′ cis-elements necessary for replication and virion encapsidation in the absence of sequence encoding viral genes and a selected minigene linked thereto, and a helper adenovirus comprising sufficient adenovirus gene sequences necessary for a productive viral infection. Desirably the helper gene is crippled by modifications to its 5′ packaging sequences, which facilitates purification of the viral particle from the helper virus.
    Type: Grant
    Filed: October 21, 1999
    Date of Patent: March 20, 2001
    Assignee: The Trustees of the University of Pennsylvania
    Inventors: James M. Wilson, Krishna J. Fisher, Shu-Jen Chen, Matthew Weitzman
  • Patent number: 6177319
    Abstract: A method of manufacturing a salicide layer is described. A substrate having a memory region and a logic circuit region is provided, wherein the memory region comprises a first gate structure and a first source/drain region and the logic circuit region comprises a second gate structure and a second source/drain region. A first salicide layer is formed on the second gate structure and the second source/drain region in the logic circuit region. A dielectric layer is formed over the substrate. A portion of the dielectric layer is removed to expose the first gate structure and the first salicide layer above the second gate structure. A second salicide layer is formed on the first and the second gate structure.
    Type: Grant
    Filed: July 1, 1999
    Date of Patent: January 23, 2001
    Assignee: United Microelectronics Corp.
    Inventor: Shu-Jen Chen
  • Patent number: 6150264
    Abstract: The invention relates to a method for manufacturing of a titanium self-aligned silicide (Salicide). This process includes of forming a metal layer over the surfaces of the semiconductor substrate and the gate electrode. Then, a rapid thermal process is performed with three stages to form the salicide, for example, titanium silicide, at the interface between the titanium and silicon, namely on the surfaces of the gate electrode and source/drain region. The rapid thermal process with three stages includes using the first stage with the first temperature to form the early titanium silicide having the C49 phase. The temperature is raised to a second temperature and the RTA process is performed with nitrogen gases to transform the high resistance phase C49 of the titanium nitride into a low resistance phase C54 in the second stage. Then, the temperature is rapidly raised to a third temperature to transform the C49 phase into the C54 phase completely and to prevent the agglomeration phenomenon.
    Type: Grant
    Filed: May 8, 1998
    Date of Patent: November 21, 2000
    Assignee: United Semiconductor Corp.
    Inventors: Shu-Jen Chen, Ruoh-Haw Chang, Chih-Ching Hsu
  • Patent number: 6001557
    Abstract: A recombinant adenovirus and a method for producing the virus are provided which utilize a recombinant shuttle vector comprising adenovirus DNA sequence for the 5' and 3' cis-elements necessary for replication and virion encapsidation in the absence of sequence encoding viral genes and a selected minigene linked thereto, and a helper adenovirus comprising sufficient adenovirus gene sequences necessary for a productive viral infection. Desirably, the helper gene is crippled by modifications to its 5' packaging sequences, which facilitates purification of the viral particle from the helper virus.
    Type: Grant
    Filed: August 25, 1997
    Date of Patent: December 14, 1999
    Assignee: The Trustees of the University of Pennsylvania
    Inventors: James M. Wilson, Krishna J. Fisher, Shu-Jen Chen, Matthew Weitzman
  • Patent number: 5998286
    Abstract: The method of the present invention includes forming a MOS on a semiconductor substrate. Subsequently, a silicon-rich metal silicide layer is deposited on the MOS and substrate by using chemical vapor deposition to act as a silicon material source. Then, a thermal process is carried out to separate a portion of the silicon out of the metal silicide layer, thereby forming a silicon layer on top of the gate of the MOS, source/drain. The nest step is to remove the metal suicide layer. A self-aligned metal silicide layer is formed on the silicon layer.
    Type: Grant
    Filed: March 26, 1998
    Date of Patent: December 7, 1999
    Assignee: United Semiconductor Circuit Corp.
    Inventors: Shu-Jen Chen, Jacky Kuo, Jiunn-Hsien Lin, Chih-Ching Hsu
  • Patent number: 5956590
    Abstract: A field effect transistor which is not susceptible to mask edge detects at its gate spacer oxides. The transistor is formed upon a semiconductor substrate through successive layering of a gate oxide, a gate electrode and a gate cap oxide. A pair of curved gate spacer oxides are then formed covering opposite edges of the stack of the gate oxide, the gate electrode and the gate cap oxide. The semiconductor substrate is then etched to provide a smooth topographic transition from the gate spacer oxides to the etched semiconductor surface. Source/drain electrodes are then implanted into the etched semiconductor substrate and annealed to yield the finished transistor. A second embodiment of the field effect transistor possesses a polysilicon gate. Alter removal of the gate cap oxide, a metal layer may be deposited and sintered upon the polysilicon gate and the source/drain electrodes. The metal salicide layers formed upon the electrodes of the transistor have limited susceptibility to parasitic current leakage.
    Type: Grant
    Filed: August 6, 1997
    Date of Patent: September 21, 1999
    Assignee: United Microelectronics Corp.
    Inventors: Yong-Fen Hsieh, Shu-Jen Chen, Joe Ko
  • Patent number: 5924010
    Abstract: A method of fabricating salicide and self-aligned barrier simultaneously is disclosed. The initial steps include sputtering a metal stack (Ti--TiN--Ti) and forming a salicide layer by thermally reacting the metal stack and the wafer followed by a chemical etching which removes the unreacted portions of the metal stack. The portions of the metal stack on Si can react with Si to form a TiSi.sub.2 layer, thus forming TiSi.sub.2 --TiN--TiSi.sub.2. The TiSi.sub.2 layer over the TiN layer acts as a mask in the chemical etching and protects the TiN layer from been etched. The diffusion barrier layer is thus formed simultaneously within the fabricating of salicide.
    Type: Grant
    Filed: October 30, 1996
    Date of Patent: July 13, 1999
    Assignee: United Microelectronics Corp.
    Inventors: Shu-Jen Chen, Jiunn-Hsien Lin, Chih-Ching Hsu