Patents by Inventor Shuichi Nakagawa

Shuichi Nakagawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9502208
    Abstract: A stage system includes a stage that holds an object, a linear motor mechanism that moves the stage by a thrust force generated by a current flowing through the coil, and a control section that controls the current flowing through the coil. The current flowing through the coil in a state where the stage is maintained in the static state be greater than a minimum current amount required for generating the thrust force greater than a maximum static friction force of the stage with respect to the guide rails.
    Type: Grant
    Filed: June 23, 2015
    Date of Patent: November 22, 2016
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Masaki Mizuochi, Akira Nishioka, Shuichi Nakagawa, Hironori Ogawa
  • Publication number: 20160284506
    Abstract: A stage apparatus includes a base. A table is movable relative to the base in a predetermined moving direction. A drive mechanism moves the table in the moving direction. A pressing mechanism presses the table in a direction different from the moving direction of the table. A position detection device detects a location of the table. A control device controls the pressing mechanism in accordance with table position information. The control device pinpoints a first location of the table before the table is pressed by the pressing mechanism and a second location of the table after the table is pressed by the pressing mechanism, and controls one or both of the drive mechanism and the pressing mechanism in accordance with a difference between the first and second locations of the table.
    Type: Application
    Filed: March 21, 2016
    Publication date: September 29, 2016
    Inventors: Hironori OGAWA, Masaki MIZUOCHI, Shuichi NAKAGAWA, Motohiro TAKAHASHI, Takanori KATO
  • Patent number: 9368320
    Abstract: The purpose of the present invention is to provide a stage apparatus that effectively suppresses the transmission of heat generated by a drive mechanism to a sample, and a charged particle beam apparatus using the same. In order to achieve the purpose, there are proposed a stage apparatus and a charged particle beam apparatus. The stage apparatus comprises a table; a drive source that drives the table in a predetermined direction; a first connection member provided between the table and the drive source; a second connection member provided between the table and the drive source and closer to the drive source than the first member; a slide unit supported by the second connection member; and a rail guiding the slide unit in a predetermined direction, the first connection member comprising a member having a relatively low heat conductivity with respect to the second connection member.
    Type: Grant
    Filed: August 19, 2014
    Date of Patent: June 14, 2016
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Akira Nishioka, Masaki Mizuochi, Shuichi Nakagawa, Hiroshi Tsuji
  • Publication number: 20160005568
    Abstract: A stage system includes a stage that holds an object, a linear motor mechanism that moves the stage by a thrust force generated by a current flowing through the coil, and a control section that controls the current flowing through the coil. The current flowing through the coil in a state where the stage is maintained in the static state be greater than a minimum current amount required for generating the thrust force greater than a maximum static friction force of the stage with respect to the guide rails.
    Type: Application
    Filed: June 23, 2015
    Publication date: January 7, 2016
    Inventors: Masaki MIZUOCHI, Akira NISHIOKA, Shuichi NAKAGAWA, Hironori OGAWA
  • Publication number: 20150340198
    Abstract: In order to prevent a sample from thermally expanding and contracting when the sample is placed on a sample stage inside a vacuum chamber, the related art has proposed a coping method of awaiting observation by setting a standby time from when the wafer is conveyed into the vacuum chamber until the wafer and the sample table are brought into thermal equilibrium. In addition, the coping method is configured so as to await the observation until the wafer is cooled down to room temperature when the wafer is heated in the previous step. Consequently, throughput of an apparatus decreases. A temperature control mechanism which can control temperature of the sample is installed inside a mini-environment device. The sample temperature control mechanism controls the temperature of the sample inside the mini-environment device so as to become a setting temperature which is set in view of a lowered temperature of the sample inside a load lock chamber.
    Type: Application
    Filed: January 20, 2014
    Publication date: November 26, 2015
    Inventors: Shuichi NAKAGAWA, Masaru MATSUSHIMA, Masakazu TAKAHASHI, Seiichiro KANNO
  • Publication number: 20150259299
    Abstract: Provided are a method for producing a sulfonyl amidine compound, which has an excellent gonadotropin releasing hormone receptor antagonism and is useful as a therapeutic agent for gonadotropin-dependent diseases (for example, prostate cancer, breast cancer, endometriosis, uterine fibroid, prostatic hyperplasia, or the like) or a salt thereof, and a synthesis intermediate useful in the production method. The production method of the present invention controls formation of a by-product which is hardly removed unless column purification is conducted and racemization of a target compound, thereby obtaining the target compound with a high purity, and therefore, the production method is suitable for industrial production.
    Type: Application
    Filed: September 6, 2013
    Publication date: September 17, 2015
    Applicant: Astellas Pharma Inc.
    Inventors: Takashi Kikuchi, Shinya Yoshida, Atsushi Nakamura, Takahiro Akiba, Toshitaka Yoshino, Shuichi Nakagawa, Kiichi Sato
  • Publication number: 20150248991
    Abstract: To attain the above object, in the present invention, proposed are a stage apparatus including a sample stage that mounts a sample, a first position detection device that detects a position of the sample stage, a second position detection device that detects a position of the sample stage when the sample stage is positioned in a part of a stage movement range that the first position detection device is capable of detecting, and a control device that adjusts an offset amount of the first position detection device on the basis of a position detection result obtained by the second position detection device, and a charged particle beam apparatus using the stage apparatus.
    Type: Application
    Filed: February 19, 2015
    Publication date: September 3, 2015
    Inventors: Hironori OGAWA, Masaki MIZUOCHI, Shuichi NAKAGAWA, Tsukasa SUGAWARA
  • Publication number: 20150053857
    Abstract: The purpose of the present invention is to provide a stage apparatus that effectively suppresses the transmission of heat generated by a drive mechanism to a sample, and a charged particle beam apparatus using the same. In order to achieve the purpose, there are proposed a stage apparatus and a charged particle beam apparatus. The stage apparatus comprises a table; a drive source that drives the table in a predetermined direction; a first connection member provided between the table and the drive source; a second connection member provided between the table and the drive source and closer to the drive source than the first member; a slide unit supported by the second connection member; and a rail guiding the slide unit in a predetermined direction, the first connection member comprising a member having a relatively low heat conductivity with respect to the second connection member.
    Type: Application
    Filed: August 19, 2014
    Publication date: February 26, 2015
    Inventors: Akira NISHIOKA, Masaki MIZUOCHI, Shuichi NAKAGAWA, Hiroshi TSUJI
  • Patent number: 8946652
    Abstract: Provided is a sample positioning technology wherein micro-vibrations of a top table on which a sample is placed are suppressed such that the quality of an image to be observed or the precision of a measured dimension value can be improved. A sample positioning apparatus according to the present invention is provided with an active brake for stopping the top table, an inner frame which surrounds the active brake, an outer frame which surrounds the inner frame, and actuators for driving the active brake. The actuators, after driving the active brake to stop the top table with respect to a stage, press the outer frame to adjust the position of the top table.
    Type: Grant
    Filed: November 8, 2012
    Date of Patent: February 3, 2015
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Motohiro Takahashi, Hironori Ogawa, Nobuo Shibata, Masaki Mizuochi, Shuichi Nakagawa, Hiroshi Tsuji
  • Publication number: 20150032388
    Abstract: A method of controlling a transmission apparatus, executed by a processor, the transmission apparatus including a plurality of ports capable of connection to an optical module, the method includes receiving operating time information of the optical module, and monitor information including at least one of information on temperature of the optical module, optical output power, and a bias current value of a semiconductor laser at predetermined time intervals, when the optical module is coupled to a first port; calculating a deterioration point based on the operating time information and the monitor information at the predetermined time intervals; calculating an accumulated deterioration point by adding the deterioration point at the predetermined time intervals; and determining a deterioration degree of the optical module based on the accumulated deterioration point, when the optical module is recoupled to the first port, or when the optical module is coupled to a second port.
    Type: Application
    Filed: June 17, 2014
    Publication date: January 29, 2015
    Inventor: Shuichi Nakagawa
  • Publication number: 20140312246
    Abstract: Provided is a sample positioning technology wherein micro-vibrations of a top table on which a sample is placed are suppressed such that the quality of an image to be observed or the precision of a measured dimension value can be improved. A sample positioning apparatus according to the present invention is provided with an active brake for stopping the top table, an inner frame which surrounds the active brake, an outer frame which surrounds the inner frame, and actuators for driving the active brake. The actuators, after driving the active brake to stop the top table with respect to a stage, press the outer frame to adjust the position of the top table.
    Type: Application
    Filed: November 8, 2012
    Publication date: October 23, 2014
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Motohiro Takahashi, Hironori Ogawa, Nobuo Shibata, Masaki Mizuochi, Shuichi Nakagawa, Hiroshi Tsuji
  • Patent number: 8822952
    Abstract: Charged particle beam apparatus arrangements in which either a first noise absorber which provides noise absorbing performance specialized for a first frequency range including the natural frequency of the charged particle beam apparatus as reference, or a second noise absorber which provides noise absorbing performance specialized for a second frequency range including the frequency of acoustic standing waves generated within the cover as reference, or both of the first and second noise absorbers is/are disposed within a cover of the charged particle beam apparatus.
    Type: Grant
    Filed: October 14, 2011
    Date of Patent: September 2, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Daisuke Muto, Masanori Watanabe, Masaru Matsushima, Shuichi Nakagawa, Masahiro Akatsu, Yusuke Tanba, Satoshi Okada
  • Patent number: 8823309
    Abstract: Disclosed is a smaller and lighter stage device which can be applied to a device such as a length measurement SEM for inspecting and/or evaluating a semiconductor, and in which the effect of a magnetic field on an electron beam can be reduced. Linear motors 110, 111, 112, 113 are disposed on four sides of a base 104 to be distanced from an electron beam projection position (the center of the stage device), respectively. The base 104 has dimensions substantially equivalent to minimum dimensions determined by the size of a top table 101 and a movable stroke. Linear motor stators 110, 112 are configured to have a “C-shaped” structure whose opening faces outside of the stage device, respectively. Further, a movable table is coupled to the top table via linear guides 107, 109 composed of a nonmagnetic material or roller mechanisms composed of a nonmagnetic material.
    Type: Grant
    Filed: September 17, 2010
    Date of Patent: September 2, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hironori Ogawa, Masahiro Koyama, Nobuo Shibata, Masaru Matsushima, Shuichi Nakagawa, Katsunori Onuki, Yoshimasa Fukushima
  • Patent number: 8653455
    Abstract: The charged particle beam device has a problem that a symmetry of equipotential distribution is disturbed near the outer edge of a specimen, an object being evaluated, causing a charged particle beam to deflect there. An electrode plate installed inside the specimen holding mechanism of electrostatic attraction type is formed of an inner and outer electrode plates arranged concentrically. The outer electrode plate is formed to have an outer diameter larger than that of the specimen. The dimensions of the electrode plates are determined so that an overlapping area of the outer electrode plate and the specimen is substantially equal to an area of the inner electrode plate. The inner electrode plate is impressed with a voltage of a positive polarity with respect to a reference voltage and of an arbitrary magnitude, and the outer electrode is impressed with a voltage of a negative polarity and of an arbitrary magnitude.
    Type: Grant
    Filed: June 3, 2010
    Date of Patent: February 18, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hiroyuki Kitsunai, Seiichiro Kanno, Masaru Matsushima, Shuichi Nakagawa, Go Miya
  • Publication number: 20140042338
    Abstract: A stage apparatus includes a column for irradiating a sample with a charged particle beam, a vacuum sample chamber to which the column is attached, moving tables disposed in the vacuum sample chamber to move the sample relatively to the column, and position detectors for detecting positions of the moving tables. The stage apparatus includes an attachment member disposed between the column and the vacuum sample chamber. The attachment member has an opening which restricts movement of the column in a same direction as directions of the moving tables. Reference mirrors in the position detectors for detecting the positions of the tables are attached to the attachment member. Each of the reference mirrors has an adjustment apparatus to adjust a relative angle between the reference mirror and the laser beam.
    Type: Application
    Filed: March 7, 2013
    Publication date: February 13, 2014
    Applicant: Hitachi High-Technologies Corporation
    Inventors: Nobuo Shibata, Masahiro Koyama, Hironori Ogawa, Katsunori Onuki, Hiroyuki Kitsunai, Shuichi Nakagawa, Masaki Mizuochi, Satoru Okabe
  • Publication number: 20130228686
    Abstract: Currently, there is no noise-proof cover, particularly noise-proof cover used in a clean room, which absorbs noise by a structure specialized for an estimated frequency of noise produced by environmental noise. Therefore, efficient noise absorption is still difficult. Accordingly, the invention provides a charged particle beam apparatus in which either a first noise absorber which provides noise absorbing performance specialized for a first frequency range including the natural frequency of the charged particle beam apparatus as reference, or a second noise absorber which provides noise absorbing performance specialized for a second frequency range including the frequency of acoustic standing waves generated within the cover as reference, or both of the first and second noise absorbers is/are disposed within a cover of the charged particle beam apparatus.
    Type: Application
    Filed: October 14, 2011
    Publication date: September 5, 2013
    Inventors: Daisuke Muto, Masanori Watanabe, Masaru Matsushima, Shuichi Nakagawa, Masahiro Akatsu, Yusuke Tanba, Satoshi Okada
  • Publication number: 20120145920
    Abstract: Disclosed is a smaller and lighter stage device which can be applied to a device such as a length measurement SEM for inspecting and/or evaluating a semiconductor, and in which the effect of a magnetic field on an electron beam can be reduced. Linear motors 110, 111, 112, 113 are disposed on four sides of a base 104 to be distanced from an electron beam projection position (the center of the stage device), respectively. The base 104 has dimensions substantially equivalent to minimum dimensions determined by the size of a top table 101 and a movable stroke. Linear motor stators 110, 112 are configured to have a “C-shaped” structure whose opening faces outside of the stage device, respectively. Further, a movable table is coupled to the top table via linear guides 107, 109 composed of a nonmagnetic material or roller mechanisms composed of a nonmagnetic material.
    Type: Application
    Filed: September 17, 2010
    Publication date: June 14, 2012
    Applicant: Hitachi High-Technologies Corporation
    Inventors: Hironori Ogawa, Masahiro Koyama, Nobuo Shibata, Masaru Matsushima, Shuichi Nakagawa, Katsunori Onuki, Yoshimasa Fukushima
  • Patent number: 8174229
    Abstract: The present invention provides a stage apparatus capable of reducing a positioning time without increasing a positional deviation. A positioning control method of a sample stage apparatus includes: a high-speed movement step of moving a table to a high-speed movement target position at a first movement speed; a positional deviation correcting step of moving the table to a low-speed positioning step start position at a second movement speed that is lower than the first movement speed; a low-speed positioning step of moving the table to a target position at a third movement speed that is lower than the second movement speed. After the low-speed positioning step is completed, a rod connected to a motor returns to its original position to separate a pin of the rod side from a concave portion of the table side.
    Type: Grant
    Filed: April 8, 2009
    Date of Patent: May 8, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Masashi Fujita, Shuichi Nakagawa, Takashi Kobayashi
  • Publication number: 20120070066
    Abstract: The charged particle beam device has a problem that a symmetry of equipotential distribution is disturbed near the outer edge of a specimen, an object being evaluated, causing a charged particle beam to deflect there. An electrode plate installed inside the specimen holding mechanism of electrostatic attraction type is formed of an inner and outer electrode plates arranged concentrically. The outer electrode plate is formed to have an outer diameter larger than that of the specimen. The dimensions of the electrode plates are determined so that an overlapping area of the outer electrode plate and the specimen is substantially equal to an area of the inner electrode plate. The inner electrode plate is impressed with a voltage of a positive polarity with respect to a reference voltage and of an arbitrary magnitude, and the outer electrode is impressed with a voltage of a negative polarity and of an arbitrary magnitude.
    Type: Application
    Filed: June 3, 2010
    Publication date: March 22, 2012
    Applicant: Hitachi High-Technologies Corporation
    Inventors: Hiroyuki Kitsunai, Seiichiro Kanno, Masaru Matsushima, Shuichi Nakagawa, Go Miya
  • Patent number: 8076651
    Abstract: A specimen stage apparatus has a braking structure which can generate a braking force enough to stop a specimen stage while keeping a movable table from increasing in its weight. The specimen stage apparatus has an X guide fixed on an X base and representing a guide structure in X direction, an X table constrained by the X guide to be movable in X direction, an X actuator having its movable part fixed to the X table and an X brake fixed to the X base and representing a braking structure for the X table. A controller carries out positioning control in which it generates a braking force by pushing the X brake against the bottom surface of the X table to stop a specimen stage and turning off the servo-control of the X actuator after stoppage of the specimen stage.
    Type: Grant
    Filed: March 31, 2009
    Date of Patent: December 13, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Masahiro Koyama, Hironori Ogawa, Nobuo Shibata, Masaru Matsushima, Toshinori Kobayashi, Shuichi Nakagawa