Abstract: An electron microscope includes an irradiation optical system that irradiates a specimen with an electron beam, a specimen stage that supports the specimen, an image forming optical system that forms an image of electrons transmitted through the specimen, an imaging apparatus that captures an image formed by the image forming optical system, and a control unit that controls inclination of the specimen with respect to an incident direction of the electron beam. The irradiation optical system includes an aperture that cuts off a part of the electron beam to be irradiated to the specimen. The control unit acquires an image including Kikuchi bands that appear in a shadow region of the aperture, detects the Kikuchi bands in the shadow region of the aperture in the image, and controls inclination of the specimen with respect to the incident direction of the electron beam, based on the detected Kikuchi bands.

Abstract: An electron microscope includes: an irradiation lens system that irradiates a specimen with an electron beam; an irradiation system deflector that deflects an electron beam incident on the specimen; a specimen tilting mechanism that tilts the specimen; an imaging lens system that forms an electron diffraction pattern or an electron microscope image by using an electron having passed through the specimen; an imaging device that acquires the electron diffraction pattern or the electron microscope image formed by the imaging lens system; and a controller that controls the irradiation system deflector and the specimen tilting mechanism.

Abstract: There is provided a charged particle beam system in which a detector can be placed in an appropriate analysis position. The charged particle beam system (100) includes: a charged particle source (11) for producing charged particles; a sample holder (20) for holding a sample (S); a detector (40) for detecting, in the analysis position, a signal produced from the sample (S) by impingement of the charged particles on the sample (S); a drive mechanism (42) for moving the detector (40) into the analysis position; and a controller (52) for controlling the drive mechanism (42). The controller (52) performs the steps of: obtaining information about the type of the sample holder (20); determining the analysis position on the basis of the obtained information about the type of the sample holder (20); and controlling the drive mechanism (42) to move the detector (40) into the determined analysis position.

Abstract: Sanitary ware, including a ceramic base material, an upper glaze layer positioned on a surface of the ceramic base material, and an intermediate layer positioned between the ceramic base material and the upper glaze layer, wherein the sanitary ware satisfies at least one of the following conditions: a pore area ratio of 3% or less in terms of a ratio of an area of pores present in a cut surface obtained by cutting the upper glaze layer along the thickness direction thereof, relative to an area of the cut surface, an average pore size of 50 ?m or less as measured with respect to the cut surface obtained by cutting the upper glaze layer along the thickness direction thereof, and a difference of 50 ?m or less between the maximum and minimum values of the thickness of the upper glaze layer.

Abstract: The washbowl includes a bowl recessed downward, and comprising a ceramics base material, an intermediate layer disposed on a surface side of the ceramics base, and an upper glaze layer disposed on a surface side of the intermediate layer, the upper glaze layer being more transparent than the intermediate layer; and a drainage port. The bowl includes an inclined surface formed on a surface of the bowl and continuously recessed downward, the inclined surface formed at a position at least on a front side of the surface of the bowl when a user uses the bowl, the position being configured to be seen by the user, and the inclined surface is formed such that a tangent to the inclined surface is formed at 5 degrees to 75 degrees with respect to a horizontal plane.

Abstract: An electron microscope includes: an irradiation lens system that irradiates a specimen with an electron beam; an irradiation system deflector that deflects an electron beam incident on the specimen; a specimen tilting mechanism that tilts the specimen; an imaging lens system that forms an electron diffraction pattern or an electron microscope image by using an electron having passed through the specimen; an imaging device that acquires the electron diffraction pattern or the electron microscope image formed by the imaging lens system; and a controller that controls the irradiation system deflector and the specimen tilting mechanism.

Abstract: A charged particle beam system capable of reducing contamination has a sample chamber (15) in which the sample (S) is irradiated with a charged particle beam and a receptacle chamber (21) which is connected into the sample chamber (15) via an isolation valve (25) and is connected to the ambient via a door (26). A transport mechanism (22) conveys the sample (S) from the ambient via the door (26) into the receptacle chamber (21) and via the isolation valve (25) into the sample chamber (15). A cleaning portion supplies active oxygen into the receptacle chamber which can then be evacuated by a vacuum pump.

Abstract: There is provided a charged particle beam system in which a detector can be placed in an appropriate analysis position. The charged particle beam system (100) includes: a charged particle source (11) for producing charged particles; a sample holder (20) for holding a sample (S); a detector (40) for detecting, in the analysis position, a signal produced from the sample (S) by impingement of the charged particles on the sample (S); a drive mechanism (42) for moving the detector (40) into the analysis position; and a controller (52) for controlling the drive mechanism (42). The controller (52) performs the steps of: obtaining information about the type of the sample holder (20); determining the analysis position on the basis of the obtained information about the type of the sample holder (20); and controlling the drive mechanism (42) to move the detector (40) into the determined analysis position.

Abstract: There is provided a charged particle beam system capable of reducing contamination of at least one sample. The charged particle beam system (100) has a sample chamber (15) in which the sample (S) is irradiated with a charged particle beam. The system (100) has a receptacle chamber (21) which is connected into the sample chamber (15) via an isolation valve (25) and in which the sample (S) is accommodated. The system further includes a transport mechanism (22) for conveying the sample (S) from the receptacle chamber (21) into the sample chamber (15), an exhaust portion (24) for vacuum pumping the receptacle chamber (21), and a cleaning portion (30) for cleaning the sample (S) accommodated in the receptacle chamber (21).

Abstract: A bicycle pedal assembly includes a spindle inserted through a thin bearing-less pedal body or an axle formed integrally with a pedal body. The interior of the cage of the pedal body may include a variety of structures or no structures, such as open space. A medial portion of the spindle is inserted substantially through a hollow bolt with an internal passageway. One or more bearings are disposed outside the pedal body and in the hollow bolt to facilitate rotation of the spindle with respect to a crank arm. The bolt is screwed into a standard sized bore of the crank arm. Accordingly, the medial portion of the spindle extends transversely through the width of the crank arm.

Abstract: Provide is a moisture control constructional material which has improved moisture control performance and strength and which is easily produced, and a method for producing the same. The moisture control construction material is produced by forming a raw material that contains aluminum hydroxide and talc, and firing the formed raw material at 700° C. to 1100° C. The raw material contains 20% to 95% by weight aluminum hydroxide and 5% to 80% by weight of the talc-like material. The raw material may further contain at least one of clay and bentonite and/or montmorillonite.

Abstract: Provide is a moisture control construction material which has improved moisture control performance and strength and which is easily produced, and a method for producing the same. The moisture control construction material is produced by forming a raw material that contains aluminum hydroxide and bentonite and/or montmorillonite, and firing the formed: raw material at 700° C. to 1100° C. The raw material contains 30% to 97% by weight aluminum hydroxide and 3% to 70% by weight bentonite and/or montmorillonite, or contains 30% to 90% by weight aluminum hydroxide, 1% to 30% by weight bentonite and/or montmorillonite, and 5% to 69% by weight clay.

Abstract: A bicycle pedal assembly includes a channel-free pedal body having cross members which define holes for receiving an axle rod. The holes are axially aligned and formed with a shape which conforms to a profile of the axle rod to rotationally fix the pedal body to the rod. A first hollow bolt includes an externally threaded portion to mate with a left crank arm. A second hollow bolt includes a reversed externally threaded portion to mate with a right crank arm. Each of a pair of identical axles may be joined to either the first or second hollow bolt. Each pedal assembly in interchangeable between the left and right crank arms.

Abstract: A bicycle pedal assembly includes an axle formed integrally with a pedal body. The integral axle extends from a medial side of a pedal body through an axle connector coupled to a crank arm. The axle connector may be a separate hollow bolt screwed into a bore of the crank arm. The axle connector may house one or more bearings to facilitate rotation of the axle. The interior of the cage of the pedal body may include a variety of structures, such as bridges, or no structures, e.g., an open space, since the proximally extending integral axle need not extend across the width of the pedal body.

Abstract: A bicycle pedal assembly includes a spindle inserted through a thin bearing-less pedal body. A medial portion of the spindle is inserted substantially through a hollow bolt with an internal passageway. One or more bearings are disposed outside the pedal body and in the hollow bolt to facilitate rotation of the spindle with respect to a crank arm. The bolt is screwed into a bore of the crank arm. Accordingly, the medial portion of the spindle extends transversely through the width of the crank arm.

Abstract: A bicycle pedal assembly includes a channel-free pedal body having cross members which define holes for receiving an axle rod. The holes are axially aligned and formed with a shape which conforms to a profile of the axle rod to rotationally fix the pedal body to the rod. A first hollow bolt includes an externally threaded portion to mate with a left crank arm. A second hollow bolt includes a reversed externally threaded portion to mate with a right crank arm. Each of a pair of identical axles may be joined to either the first or second hollow bolt. Each pedal assembly in interchangeable between the left and right crank arms.

Abstract: A bicycle tire provides a first sidewall and a second sidewall each including an interior portion and an exterior portion. A rim attaching portion including a slipping reduction portion having an extended rim contact surface is connected to an inner circumference of each of the first sidewall and the second sidewall. A tire tread portion is connected to an outer circumference of the first sidewall and the second sidewall. A portion of the first sidewall and the second sidewall proximate to the inner circumference of the first sidewall and the second sidewall on the opposite side of the rim attaching portion from the slipping reduction portion has additional material providing a varying thickness.