Patents by Inventor Sidney I. Soclof
Sidney I. Soclof has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 5097316Abstract: The invention is a pair of complementary transistors or arrays thereof and method for producing same in sub-micron dimensions on a silicon substrate selectively doped P and N type by forming intersecting slots in spaced apart relation across the P substrate regions to define semi-arrays of V shaped intermediate regions which will become transistors. Silicon oxide fills these slots and separates the NPN transistor regions from the substrate. Orthogonal slots devide the semi-arrays into individual transistor active regions which are doped N and introduced into each active regions via the orthogonal slots and driven in to comprise the emitter and collector regions on respective sides of original substrate comprising the base regions. The same construction obtains in the N substrate regions to form the arrays of PNP transistors.Type: GrantFiled: June 11, 1987Date of Patent: March 17, 1992Assignee: Rockwell International CorporationInventor: Sidney I. Soclof
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Patent number: 5047828Abstract: The invention provides a unique sub-micron dimensioned PNP-type transistor wherein hundreds of such transistors may be fabricated on a single chip with each transistor comprising an active region surrounded by field oxide completely isolating it from the substrate and its effects on operation. Slots made in the substrate permit angle evaporation of etch-resist to protect the active region while it is disconnected form the substrate by etching therebeneath via the slots.Type: GrantFiled: June 24, 1987Date of Patent: September 10, 1991Assignee: Rockwell International CorporationInventor: Sidney I. Soclof
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Patent number: 5043787Abstract: An array of hundreds of devices may be simultaneously processed on a chip to sub-micron dimensions by establishing tiny active regions for each transistor surrounded by field oxide filled moats or slotted regions, wherein the slots are utilized to dope the substrate within the active region. The N type substrate is double energy boron planted through one surface to establish a P region to a given depth. This surface is oxidized and photoresist mask conventionally to open regions for the slots which are ion milled or ODE etched to a given depth. N+ regions are established by the slots by ion implanting at an angle such that the entire depth of the slot is not doped but rather the doping is confined to a region within the double energy P implanted depth. Drive-in diffusion enlarges the N+ areas for the emitter and collector and oxidation fills the moat insulating regions around the active area.Type: GrantFiled: June 24, 1987Date of Patent: August 27, 1991Assignee: Rockwell International CorporationInventor: Sidney I. Soclof
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Patent number: 5031014Abstract: The invention is a transistor or array thereof and method for producing same in VLSI dimensions on a silicon substrate doped P or N type by forming intersecting slots in spaced apart relation across the substrate to define semi-arrays of V shaped intermediate regions which will become transistors. Silicon oxide fills these slots and separates the transistor regions from the substrate. Orthogonal slots divided the semi-arrays into individual transistor active regions which are doped by one of N or P doping introduced into each active regions via the orthogonal slots and driven in to comprise the emitter and collector regions on respective sides of original substrate comprising the base regions. Metallization patterns complete electrical connections to the emitter base and collector regions and silicon oxide substantially covers the periphery of each active region for total isolation.Type: GrantFiled: June 12, 1987Date of Patent: July 9, 1991Assignee: Rockwell International CorporationInventor: Sidney I. Soclof
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Patent number: 5027184Abstract: The invention provides a unique sub-micron dimensioned NPN type transistor, wherein hundreds of such transistors may be fabricated on a single chip with each transistor comprising an active region surrounded by field oxide completely isolating it from the substrate and its effects on operation. Slots made in the substrate permit angle evaporation of etch-resist to protect the active region while it is disconnected from the substrate by etching therebeneath via the slots.Type: GrantFiled: June 17, 1987Date of Patent: June 25, 1991Assignee: Rockwell International CorporationInventor: Sidney I. Soclof
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Patent number: 5025302Abstract: The invention provides a unique sub-micron dimensioned PNP-type transistor wherein hundreds of such transistors may be fabricated on a single chip with each transistor comprising an active region surrounded by field oxide completely isolating it from the substrate and its effects on operation. Slots made in the substrate permit angle evaporation of etch-resist to protect the active region while it is disconnected from the substrate by etching therebeneath via the slots.Type: GrantFiled: June 16, 1987Date of Patent: June 18, 1991Assignee: Rockwell International CorporationInventor: Sidney I. Soclof
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Patent number: 4683399Abstract: A vacuum electron device including a semiconductor device in a hermetically sealed container enclosing a vacuum. The device includes an electron emissive source for emitting electrons into the vacuum, and a collector for collecting electrons emitted from the electron emissive source and tranported through the vacuum. The device is subjected to a high internal electric field such that electrons in the emissive source are excited to energies greater than the electron affinity of the semiconductor body.Type: GrantFiled: June 29, 1981Date of Patent: July 28, 1987Assignee: Rockwell International CorporationInventor: Sidney I. Soclof
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Patent number: 4611387Abstract: The invention provides a unique VLSI dimensioned NPN type transistor and method of making the same, wherein hundreds of such transistors may be fabricated on a single chip with each transistor comprising an active region surrounded by field oxide completely isolating it from the substrate and its effects on operation. Spaced apart slots made in the substrate permit the introduction of orientation dependent etching fluid therein to at least substantially etch semi-arrays of active regions of the substrate away from the substrate except for spaced apart supports therealong. Oxidation serves to support the semi-arrays directly from the substrate or by webs of oxidation along the tops of the semi-arrays connected to the substrate.Type: GrantFiled: April 8, 1985Date of Patent: September 16, 1986Assignee: Rockwell International CorporationInventor: Sidney I. Soclof
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Patent number: 4584762Abstract: The invention is a transistor or array thereof and method for producing same in VLSI dimensions on a silicon substrate doped P or N type by forming intersecting slots in spaced apart relation across the substrate to define semiarrays of V shaped intermediate regions which will become transistors. Silicon oxide fills these slots and separates the transistor regions from the substrate. Orthogonal slots divided the semiarrays into individual transistor active regions which are doped by one of N or P doping introduced into each active regions via the orthogonal slots and driven in to comprise the emitter and collector regions on respective sides of original substrate comprising the base regions. Metallization patterns complete electrical connections to the emitter base and collector regions and silicon oxide substantially covers the periphery of each active region for total isolation.Type: GrantFiled: December 5, 1983Date of Patent: April 29, 1986Assignee: Rockwell International CorporationInventor: Sidney I. Soclof
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Patent number: 4580331Abstract: The invention provides a unique VLSI dimensioned PNP-type transistor and method of making the same wherein hundreds of such transistors may be fabricated on a single chip with each transistor comprising an active region surrounded by field oxide completely isolating it from the substrate and its effects on operation. Slots made in the substrate permit angle evaporation of etch-resist to protect the active region while it is disconnected from the substrate by etching therebeneath via the slots.Type: GrantFiled: December 5, 1983Date of Patent: April 8, 1986Assignee: Rockwell International CorporationInventor: Sidney I. Soclof
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Patent number: 4522682Abstract: The invention provides a unique sub-micron dimensioned PNP type transistor and method of making the same, wherein hundreds of such transistors may be fabricated on a single chip with each transistor comprising an active region surrounded by field oxide completely isolating it from the substrate and its effects on operation. Spaced apart slots made in the substrate permit the introduction of orientation dependent etching fluid therein to at least substantially etch semi-arrays of active regions of the substrate away from the substrate except for spaced apart supports therealong. Oxidation serves to support the semi-arrays and subsequent steps directly from the substrate or by webs of oxidation along the tops of the semi-arrays connected to the substrate.Type: GrantFiled: June 21, 1982Date of Patent: June 11, 1985Assignee: Rockwell International CorporationInventor: Sidney I. Soclof
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Patent number: 4506283Abstract: The invention provides a unique sub-micron dimensioned resistor and methods of making the same, wherein hundreds of such resistors may be fabricated on a single chip with each comprising an active region surrounded by field oxide completely isolating it from the substrate and its effects on operation. Spaced apart slots made in the substrate permit the introduction of orientation dependent etching fluid therein to at least substantially etch semi-arrays of active regions of the substrate away from the substrate except for spaced apart supports therealong. Oxidation serves to support the semi-arrays and subsequent steps directly from the substrate or by webs of oxidation along the tops of the semi-arrays connected to the substrate.Type: GrantFiled: May 8, 1981Date of Patent: March 19, 1985Assignee: Rockwell International CorporationInventor: Sidney I. Soclof
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Patent number: 4497685Abstract: The invention provides a unique sub-micron dimensioned resistor and methods of making the same, wherein hundreds of such resistors may be fabricated on a single chip with each comprising an active region surrounded by field oxide completely isolating it from the substrate and its effects on operation. Spaced apart slots made in the substrate permit the introduction of orientation dependent etching fluid therein to at least substantially etch semi-arrays of active regions of the substrate away from the substrate except for spaced apart supports therealong. Oxidation serves to support the semi-arrays and subsequent steps directly from the substrate or by webs of oxidation along the tops of the semi-arrays connected to the substrate.Type: GrantFiled: October 24, 1983Date of Patent: February 5, 1985Assignee: Rockwell International CorporationInventor: Sidney I. Soclof
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Patent number: 4485551Abstract: The invention provides a unique sub-micron dimensioned NPN type transistor and method of making the same, wherein hundreds of such transistors may be fabricated on a single chip with each transistor comprising an active region surrounded by field oxide completely isolating it from the substrate and its effects on operation. Spaced apart slots made in the substrate permit the introduction of orientation dependent etching fluid therein to at least substantially etch semi-arrays of active regions of the substrate away from the substrate except for spaced apart supports therealong. Oxidation serves to support the semi-arrays and subsequent steps directly from the substrate or by webs of oxidation along the tops of the semi-arrays connected to the substrate.Type: GrantFiled: December 16, 1982Date of Patent: December 4, 1984Assignee: Rockwell International CorporationInventor: Sidney I. Soclof
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Patent number: 4473834Abstract: A light emitting bipolar transistor, adapted to produce light from cathodoluminescence, upon being biased into conduction, the light emitting bipolar transistor being formed on the top surface of a relatively flat semiconductor substrate and having active regions comprising: a collector region, and an emitter region, the collector and emitter regions being of a first conductivity type, and an extended base region of a second conductivity type, the extended base region being interposed between the collector and the emitter regions, and the base region having a coatable surface, a phosphor coating, the phosphor coating covering the base region coatable surface, and respective connections to the collector emitter and base regions; whereby, biasing the transistor into conduction produces an electric field in the base region, the electric field in the base field inducing electrons in the base region to increase energy to a high energy level and to drift, some drifting high energy electrons being scattered into theType: GrantFiled: April 19, 1982Date of Patent: September 25, 1984Assignee: Rockwell International CorporationInventor: Sidney I. Soclof
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Patent number: 4466180Abstract: The invention is a punch through voltage regulator having an active region formed on a substrate by any one of four different methods. Each method includes recessing the substrate substantially along the periphery of the regulator active region, selectively doping the regulator active region through portions of the recess, filling the recesses with substrate oxide to isolate the active region from the substrate and forming conductors to selectively doped portions of the active region to serve as electrode connections. For P doped substrates N type doping is introduced via the recesses and in a second method the recesses are deepened and P type doping is introduced into the substrate to change the doping in the active region. For N doped substrates P type doping is introduced via the recesses and when the recesses are deepened in the fourth method, N type doping is introduced into the substrate to change the doping of the active portion.Type: GrantFiled: June 25, 1981Date of Patent: August 21, 1984Assignee: Rockwell International CorporationInventor: Sidney I. Soclof
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Patent number: 4466178Abstract: An array of hundreds of devices may be simultaneously processed on a chip to sub-micron dimensions by establishing tiny active regions for each transistor surrounded by field oxide filled moats or slotted regions, wherein the slots are utilized to dope the substrate within the active region. The P type substrate is double energy arsenic planted through one surface to establish a N region to a given depth. This surface is oxidized and photoresist masked conventionally to open regions for the slots which are ion milled or ODE etched to a given depth. P+ regions are established by the slots by ion implanting at an angle such that the entire depth of the slot is not doped but rather the doping is confined to a region within the double energy N implanted depth. Drive-in diffusion enlarges the P+ areas for the emitter and collector and oxidation fills the moat insulating regions around the active area.Type: GrantFiled: June 25, 1981Date of Patent: August 21, 1984Assignee: Rockwell International CorporationInventor: Sidney I. Soclof
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Patent number: 4437226Abstract: The invention provides a unique sub-micron dimensioned NPN type transistor and method of making the same wherein hundreds of such transistors may be fabricated on a single chip with each transistor comprising an active region surrounded by field oxide completely isolating it from the substrate and its effects on operation. Slots made in the substrate permit angle evaporation of etch-resist to protect the active region while it is disconnected from the substrate by etching therebeneath via the slots.Type: GrantFiled: December 16, 1982Date of Patent: March 20, 1984Assignee: Rockwell International CorporationInventor: Sidney I. Soclof
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Patent number: 4435899Abstract: The invention is a transistor or array thereof and method for producing same in sub-micron dimensions on a silicon substrate doped P or N type by forming slots in spaced apart relation across the substrate to define semi-arrays of V shaped intermediate regions which will become a plurality of transistors. Silicon oxide fills these slots and separates the transistor regions from the substrate. Orthogonal slots divide the semi-arrays into individual transistor active regions which are doped by one of N or P doping introduced into each active regions via the orthogonal slots and driven in to comprise the emitter and collector regions on respective sides of original substrate comprising the base regions. Metallization patterns complete electrical connections to the emitter base and collector regions and silicon oxide substantially covers the periphery of each active region for total isolation.Type: GrantFiled: December 16, 1982Date of Patent: March 13, 1984Assignee: Rockwell International CorporationInventor: Sidney I. Soclof
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Patent number: 4419150Abstract: The invention is a sub-micron dielectrically isolated transistor and method of making the same wherein hundreds of such transistors may be fabricated on a single chip with each transistor comprising an active region surrounded by a field oxide region, N+ spaced-apart doped portions within said regions and a P+ doped portion of said region spaced from each N+ doped portions, and electrical connections to the base P+ portion and the collector and emitter N+ portions. These regions are established by first forming boundary recesses about each active portion where a transistor will be formed, depositing arsenic in the recesses to form N+ regions in the transistor-active region adjacent the recesses, deepening the recesses, diffusing boron into the deepened recesses to dope the substrate P-type beneath the N+ regions and also between the N+ regions, and patterning and metallizing the substrate to develop the electrical connections of the base, emitter and collector electrodes.Type: GrantFiled: September 16, 1982Date of Patent: December 6, 1983Assignee: Rockwell International CorporationInventor: Sidney I. Soclof