Abstract: A circuit arrangement for supplying configuration data in an FPGA device includes a plurality of output flip flops allocated to respective configurable logic cells of the FGPGA device. Each output flip flop comprises at least one data input and one data output and a data input of a first output flip flop of the plurality of output flip flops is switchably connected to a data output of a second output flip flop of the plurality of output flip flops for forming a shift register by means of a switching device integrated in the FPGA device.

Abstract: A mask-programmable logic macro includes at least three input terminals an output terminal and a first set of transistors comprised of at least three transistors formed on a semiconductor substrate, each of the transistors comprising a controllable path and a control terminal. The controllable paths can be connected in series with one another between a first supply terminal and the output terminal by metallizing first metallization regions. The the transistors of the first set of transistors are arranged on the semiconductor substrate in such a way that at least one controllable path of the transistors can be bridged by metallizing one of the first metallization regions. A respective of the input terminals can be connected to a respective of the control terminals by metallizing a second metallization region.

Abstract: In order to test digital modules with functional elements, these are divided into test units (3) which respectively have inputs and outputs. Alternating test patterns are applied to the inputs of the test unit (3), and the test responses resulting from this are evaluated at the outputs of the test unit (3). The effect is then encountered that changes at each of the inputs of a test unit (3) do not all affect a particular output of this test unit (3). For every output of the test unit (3), it is possible to define a cone (5) whose apex is formed by the particular output of the test unit (3) and whose base comprises the inputs of the test unit (3) where, and only where, changes affect the particular output. According to the invention, the test pattern to be applied to the inputs of the test unit (3) is constructed of sub-patterns, whose length is in particular ? the number of inputs of the test unit (3) that are contained in the base of a cone (5).

Abstract: A mask programmable logic cell for configuration of at least one either LUT-based and MUX-based configurable cell comprises a first set of 2:1 multiplexers each having two input terminals and one select terminal and a second set of 4:1 multiplexers each having four input terminals and comprising three hierarchal arranged 2:1 multiplexers. A LUT-based configurable cell, a MUX-based configurable cell arrangement and a configurable logic array is provided. Furthermore, a mask programmable basic cell and a mask programmable gate array is provided.

Abstract: A divider circuit comprises at least two clock edge controlled differential buffer store elements, each being clocked by complementary input clock signals, each comprising internal storage nodes which are pre-chargeable to a pre-charge potential, and each comprising a differential data input. The internal storage nodes of the buffer store elements are either pre-charged at the pre-charge potential or store a logic level, depending on the relevant input clock signals. The differential data inputs of one of the buffer store elements is connected to the internal storage nodes of the other buffer store element and pulsed signals can be tapped off at the internal differential storage node.

Abstract: The invention relates to a shift register cell for safely providing a configuration bit having a master latch which can be connected to a serial data input on the shift register cell for the purpose of buffer storing a data bit; a first slave latch which can be connected to the master latch for the purpose of buffer storing the data bit; at least one second slave latch which can be connected to the master latch for the purpose of buffer storing the data bit, and having an evaluation logic unit which outputs the configuration bit on the basis of the data bits which are buffer stored in the master latch and in the slave latches. In addition, the invention provides a shift register for safely providing configuration bits which has a plurality of inventive shift register cells which are connected in series to form a shift register chain.

Abstract: The present invention provides a CAM (content addressable memory) apparatus having: a first memory device (10) with a word line input (WL) and at least one storage node (12; 13) for storing a first bit of a data word; a second memory device (11) with a word line input (WL) and at least one storage node (14; 15) for storing a second bit of a data word; and a comparator device (16) for comparing the first and second stored bits with two precoded comparison bits fed via four inputs (20; 21; 22; 23) and for driving a hit node (17) in the event of the first stored bit corresponding to the first comparison bit and the second stored bit corresponding to the second comparison bit.

Abstract: A carry-ripple adder having inputs for supplying three input bits of equal significance 2n that are to be summed and two carry bits of equal significance 2n+1 that are also to be summed. A calculated sum bit of significance 2n and two calculated carry bits of equal significance 2n+1 which are higher than the significance 2n of the sum bit are provided at outputs. A final carry-ripple stage VMA may be used even after a reduction to three bits.

Abstract: A mask-programmable logic macro includes at least three input terminals an output terminal and a first set of transistors comprised of at least three transistors formed on a semiconductor substrate, each of the transistors comprising a controllable path and a control terminal. The controllable paths can be connected in series with one another between a first supply terminal and the output terminal by metallizing first metallization regions. The the transistors of the first set of transistors are arranged on the semiconductor substrate in such a way that at least one controllable path of the transistors can be bridged by metallizing one of the first metallization regions. A respective of the input terminals can be connected to a respective of the control terminals by metallizing a second metallization region.

Abstract: A circuit arrangement for supplying configuration data in an FPGA device includes a plurality of output flip flops allocated to respective configurable logic cells of the FGPGA device. Each output flip flop comprises at least one data input and one data output and a data input of a first output flip flop of the plurality of output flip flops is switchably connected to a data output of a second output flip flop of the plurality of output flip flops for forming a shift register by means of a switching device integrated in the FPGA device.

Abstract: A carry ripple adder contains five first inputs for accepting five input bits having equal significance w that are to be summed and two second inputs for accepting two carry bits having the significance w. It also contains an output for a sum bit having the significance w and two outputs for two carry bits having the significances 2w and 4w.

Abstract: Shift register for safely providing a configuration bit The invention relates to a shift register cell (1-i, 100-i) for safely providing a configuration bit (6-i) having a master latch (8-i) which can be connected to a serial data input (2-i) on the shift register cell (1-i, 100-i) for the purpose of buffer-storing a data bit (3-i); a first slave latch (10-i) which can be connected to the master latch (8-i) for the purpose of buffer-storing the data bit; at least one second slave latch (12-i) which can be connected to the master latch (8-i) for the purpose of buffer-storing the data bit, and having an evaluation logic unit (13-i) which outputs the configuration bit (6-i) on the basis of the data bits which are buffer-stored in the master latch (8-i) and in the slave latches (10-i, 12-i). In addition, the invention provides a shift register (17) for safely providing configuration bits (6-1, . . . 6-N) which has a plurality of inventive shift register cells (1-1, . . . 1-N, 100-1, . . .

Abstract: The three-transistor DRAM cell has a memory transistor formed as a field-effect transistor with a short-channel section and a long-channel section. A second insulating layer and a conductive layer are additionally formed on a gate layer of the memory transistor. A substantially constant voltage value is present between a potential of the conductive layer and a potential of the substrate area.

Abstract: A function test is implemented for an individual circuit level (1) that is provided for vertical integration in a semiconductor component. Stacks of circuit levels respectively provided over or under this circuit level in the finished component are simulated as test heads (2, 3). These test heads are provided with terminal contacts for reversible contacting. The circuit level (1) under test is connected to these test heads (2, 3) during the function test, and the test heads are removed after the test.

Abstract: A method for simulating an open fault in a logic circuit comprising field effect transistors utilizes a simulation model which is employed and which takes the fault condition signal storage into consideration by way of an output stage. Given the appearance of a fault-influence signal at the output of a simulation stage, this maintains the through-connection of the signal which appeared immediately before the influenced signal to the simulation model output. In order to take reloading events in the real logic circuit into consideration, this through-connection is canceled after a prescribable time interval.

Abstract: A method for simulating an erroneously-delayed signal switching at the output of the logic circuit utilizing a modified simulation model which is inherently suited for the simulation of a stuck-open fault and which, in particular, comprises an output stage which takes the signal storage appearing given this fault into consideration is disclosed. The modification is comprised in that the storage behavior of the output stage is suppressed after one clock period.

Abstract: Monolithically-integrated circuits comprise at least two circuit branches parallel to one another which respectively contain one or more field effect transistors. In order to reduce open errors in the transistor leads, the connecting regions of the field effect transistors are constructed such that they form strip-shaped connecting zones which are interrupted only by the channel regions of the field effect transistors and which are otherwise self-contained.