Abstract: A socket detection apparatus for supporting anomaly detection of an earth wire and a neutral wire includes: a micro-control unit, provided with a test plug of a fire wire connection end, a neutral wire connection end and an earth wire connection end, and a detection circuit connected with the test plug; and an induction antenna arranged corresponding to a fire wire end of a detected power socket, the induction antenna being connected with a first signal input end of the micro-control unit.

Abstract: A socket detection apparatus for supporting anomaly detection of an earth wire and a neutral wire includes: a micro-control unit, provided with a test plug of a fire wire connection end, a neutral wire connection end and an earth wire connection end, and a detection circuit connected with the test plug; and an induction antenna arranged corresponding to a fire wire end of a detected power socket, the induction antenna being connected with a first signal input end of the micro-control unit.

Abstract: Electronic components are transferred from a source surface for supplying electronic components to a destination surface for receiving electronic components by an ejector device that is locatable at an ejection position for pushing an electronic component mounted on the source surface towards the destination surface. A support device that is locatable at a receiving position supports the electronic component that is pushed onto the destination surface. Further, a pre-transfer imaging device inspects the electronic component before it is transferred from the source surface and a post-transfer imaging device inspects the electronic component after it has been transferred onto the destination surface, wherein the pre-transfer and post-transfer imaging devices are located on opposite sides of the source and destination surfaces.

Abstract: Electronic components are transferred from a source surface for supplying electronic components to a destination surface for receiving electronic components by an ejector device that is locatable at an ejection position for pushing an electronic component mounted on the source surface towards the destination surface. A support device that is locatable at a receiving position supports the electronic component that is pushed onto the destination surface. Further, a pre-transfer imaging device inspects the electronic component before it is transferred from the source surface and a post-transfer imaging device inspects the electronic component after it has been transferred onto the destination surface, wherein the pre-transfer and post-transfer imaging devices are located on opposite sides of the source and destination surfaces.

Abstract: A semiconductor pick and place apparatus comprises: a pick arm having a main body, and a conduit incorporated in the main body for permitting fluid flow through the main body via the conduit, the conduit further defining a holding orifice which is operative in use to secure a semiconductor die, the conduit being configured to convey light received from one side of the pick arm through the holding orifice and an alignment window located on the main body to an opposite side of the pick arm.

Abstract: A semiconductor pick and place apparatus comprises: a pick arm having a main body, and a conduit incorporated in the main body for permitting fluid flow through the main body via the conduit, the conduit further defining a holding orifice which is operative in use to secure a semiconductor die, the conduit being configured to convey light received from one side of the pick arm through the holding orifice and an alignment window located on the main body to an opposite side of the pick arm.

Abstract: An apparatus for determining an orientation of a die mounted on a tape includes an imaging device, a light source and a conveying mechanism. The die is at least partially translucent and includes at least one orientation feature indicative of the orientation of the die. In use, the conveying mechanism conveys the tape to position the die at an inspection position between the imaging device and the light source. The light source projects light to the imaging device and the imaging device captures an image. The projected light from the light source passing through the die is obstructed by the at least one orientation feature of the die to cause the captured image to include an image of the at least one orientation feature, whereby the orientation of the die may be determined.

Abstract: A pick arm for a pick and place apparatus for semiconductor devices, the pick arm comprising first and second ends along a longitudinal axis of the pick arm, and a pick tool located at the first end of the pick arm for picking up semiconductor devices. The pick arm further comprises a winged part extending in a direction transverse to the longitudinal axis between the first and second ends of the pick arm, wherein the winged part comprising a sloping surface. The sloping surface is inclined between a top portion and a bottom portion of the winged part such that the sloping surface is nearer to the longitudinal axis at the top portion than at the bottom portion of the winged part.

Abstract: A semiconductor die pick and place device comprising a handing mechanism comprising a pick arm movable between a placement location and a pick-up location. A reference feature is located on the pick arm, and a light reflecting module is carried by the pick arm. The light reflecting module is operable to reflect an image of the reference feature to an image capturing module such that the reference feature appears to the light reflecting module to be in focus at a virtual position that is equivalent to a position at the pick-up location and/or the placement location.

Abstract: A die tester comprising a testing table on which a plurality of dice arranged in an array are mountable, and a first probe and a second probe that are adjustable to a fixed position with a fixed separation distance between the first probe and the second probe. The fixed position corresponds to predetermined test points on the plurality of dice, and the testing table and the first and second probes are movable relative to each other so as to position test points of a first die of the plurality of dice to the first probe and the second probe for testing the first die. The die tester further comprises movable third and fourth probes that are movable relative to each other and positionable to test points on a second die of the plurality of dice for testing the second die.

Abstract: A pick arm for a pick and place apparatus for semiconductor devices, the pick arm comprising first and second ends along a longitudinal axis of the pick arm, and a pick tool located at the first end of the pick arm for picking up semiconductor devices. The pick arm further comprises a winged part extending in a direction transverse to the longitudinal axis between the first and second ends of the pick arm, wherein the winged part comprising a sloping surface. The sloping surface is inclined between a top portion and a bottom portion of the winged part such that the sloping surface is nearer to the longitudinal axis at the top portion than at the bottom portion of the winged part.

Abstract: A semiconductor die pick and place device comprising a handing mechanism comprising a pick arm movable between a placement location and a pick-up location. A reference feature is located on the pick arm, and a light reflecting module is carried by the pick arm. The light reflecting module is operable to reflect an image of the reference feature to an image capturing module such that the reference feature appears to the light reflecting module to be in focus at a virtual position that is equivalent to a position at the pick-up location and/or the placement location.

Abstract: A die tester comprising a testing table on which a plurality of dice arranged in an array are mountable, and a first probe and a second probe that are adjustable to a fixed position with a fixed separation distance between the first probe and the second probe. The fixed position corresponds to predetermined test points on the plurality of dice, and the testing table and the first and second probes are movable relative to each other so as to position test points of a first die of the plurality of dice to the first probe and the second probe for testing the first die. The die tester further comprises movable third and fourth probes that are movable relative to each other and positionable to test points on a second die of the plurality of dice for testing the second die.

Abstract: Embodiments of the invention provide a method and apparatus for adjusting the gain of conference users including a separate input gain for each user and an output gain for each user. The input gain may be determined in response to whether active audio is detected. Users may be classified as dominant speakers or passive participants. A separate class of input gain levels may be provided for dominant speakers (higher) and passive participants (lower). The input gain may be inversely proportional to user input energy level for dominant speakers. The output gain may be inversely proportional to user input energy level.

Abstract: Systems and methods of controlling a display provide for determining an operating mode of a mobile device, where the mobile device includes the display. An active region of the display and an inactive region of the display can be defined based on the operating mode. The active region enables user access to the device and the inactive region enables greater power savings.

Abstract: A method for treating progression of a refractive disorder in a human eye. The method includes the steps of producing a first image on a retina of the human eye and producing a second image to generate a defocus.

Abstract: A method includes receiving a voice signal in the form of a sequence of data packets, detecting a marker bit in a header of one of the received packets, selecting at least one received packet in response to the detected marker bit, and dropping the selected at least one packet. Other embodiments are described and claimed.

Abstract: Apparatus and systems, as well as methods and articles, may operate to generate a system coverage map from a plurality of geosystemic data points, as well as to change wireless system operational parameters responsive to various parameters associated with the plurality of geosystemic data points.

Abstract: Method and apparatus to synchronize packet rate for audio information are described.

Abstract: Conference calls are handled using distributed processing. In one embodiment, the invention includes receiving sets of telephone audio signals from conference subnodes, the telephone audio signals corresponding to subscribers of the conference call, selecting an output set of telephone audio signals from all of the received telephone audio signals, and transmitting the output set to the conference subnodes. In another embodiment, the invention includes receiving a set of telephone audio signals, each signal being received from a subscriber node of a single conference call, selecting a subset of the set of signals, transmitting the selected subset of signals to a conference node, receiving a second set of telephone audio signals from the conference node, and transmitting the second set to the subscriber nodes.