Patents by Inventor Srinivasan Parthasarathy

Srinivasan Parthasarathy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20170228650
    Abstract: A computer program product is provided for estimating algorithm run times given parameters of the algorithm, specifications of an architecture on which the algorithm will execute and dimensions of a data set which will be input into the algorithm. The computer program product includes instructions to cause a processing circuit to create training data sets, generate run time data of executions of instances of the algorithm on the architecture for each training data set, identify model-usable features, generate a map of the model-usable features to an expression of the run time data and iteratively tuning the model-usable features toward improving map accuracy until a target map accuracy is achieved, develop a predictive model based on iteratively tuned versions of the model-usable features and estimate a run time of an execution of the algorithm on a new data set and on a new architecture using the predictive model.
    Type: Application
    Filed: February 8, 2016
    Publication date: August 10, 2017
    Inventors: Yanjie Fu, Srinivasan Parthasarathy, Deepak Turaga
  • Publication number: 20170228432
    Abstract: An automated outlier detection system implements an unsupervised set of processes to determine feature subspaces from a dataset; determine candidate exploratory actions, where each candidate exploratory action is a specific combination of a feature subspace and a parameterized instance of an outlier detection algorithm; and identify a set of optimal exploratory actions to recommend for execution on the dataset from among the candidate exploratory actions. Outlier scores obtained as a result of execution of the set of optimal exploratory actions are processed to obtain one or more outlier views such that each outlier view represents a consistent characterization of outliers by each optimal exploratory action corresponding to that outlier view.
    Type: Application
    Filed: December 20, 2016
    Publication date: August 10, 2017
    Inventors: Charu Aggarwal, Yanjie Fu, Srinivasan Parthasarathy, Deepak Turaga
  • Patent number: 9720671
    Abstract: The described implementations relate to installation of customized applications. One technique obtains a software application generated by a producer. The technique identifies customizations made by a customizer to the software application that are desired by a customer. The technique further installs the software application and the customizations on the customer's computer in a single operation.
    Type: Grant
    Filed: June 17, 2008
    Date of Patent: August 1, 2017
    Assignee: Microsoft Technology Licensing, LLC
    Inventors: Srinivasan Parthasarathy, Chandrudu Pokala, Soren Francker, Heriberto Coll, Christopher P. Stine
  • Patent number: 9576031
    Abstract: An automated outlier detection system implements an unsupervised set of processes to determine feature subspaces from a dataset; determine candidate exploratory actions, where each candidate exploratory action is a specific combination of a feature subspace and a parameterized instance of an outlier detection algorithm; and identify a set of optimal exploratory actions to recommend for execution on the dataset from among the candidate exploratory actions. Outlier scores obtained as a result of execution of the set of optimal exploratory actions are processed to obtain one or more outlier views such that each outlier view represents a consistent characterization of outliers by each optimal exploratory action corresponding to that outlier view.
    Type: Grant
    Filed: February 8, 2016
    Date of Patent: February 21, 2017
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Charu Aggarwal, Yanjie Fu, Srinivasan Parthasarathy, Deepak Turaga
  • Patent number: 9517521
    Abstract: A method for repairing a component is provided. The method comprises: tracing an electrode across a defect/damage on the component at a preselected distance from the component; feeding a first metal powder and a second metal powder into a discharging gap between the electrode and the component; controlling feed rates of the first and second metal powders separately; and electro-spark depositing the first and second metal powders to the component to form a hybrid metal coating. The first metal powder comprises a first metal or alloy with a Vickers hardness rating of about 70-200% of the Vickers hardness rating of the component. The second metal powder comprises a second metal or alloy having lubricating/anti-corrosion properties.
    Type: Grant
    Filed: July 3, 2013
    Date of Patent: December 13, 2016
    Assignee: GENERAL ELECTRIC COMPANY
    Inventors: Mayank Tiwari, Laurent Cretegny, Yong Liu, Bala Srinivasan Parthasarathy, Ravi Agrawal, Yong Wu
  • Publication number: 20160357747
    Abstract: A method, system, and computer program product derive data schema for application to a data set. One or more processors generate a directed acyclic weighted graph that encodes data types and semantic types used by a data set. One or more processors assign estimated frequencies for each component of the directed acyclic weighted graph, where the estimated frequencies predict a likelihood of a particular data schema element being used by any data set. One or more processors traverse through paths in the directed acyclic weighted graph with a predetermined portion of the data set to determine a data schema that correctly defines data from the data set and identifies any errors in the data set, and then apply the data schema to the data set to generate clean data that is properly formatted.
    Type: Application
    Filed: June 4, 2015
    Publication date: December 8, 2016
    Inventors: Srinivasan Parthasarathy, Venkata N. Pavuluri, Deepak S. Turaga
  • Publication number: 20160154719
    Abstract: The present invention describes a method and system for optimizing a test flow within each ATE (Automated Test Equipment) station. The test flow includes a plurality of test blocks. A test block includes a plurality of individual tests. A computing system schedule the test flow based one or more of: a test failure model, test block duration and a yield model. The failure model determines an order or sequence of the test blocks. There are at least two failure models: independent failure model and dependant failure model. The yield model describes whether a semiconductor chip is defective or not. Upon completing the scheduling, the ATE station conducts tests according to the scheduled test flow. The present invention can also be applied to software testing.
    Type: Application
    Filed: August 21, 2013
    Publication date: June 2, 2016
    Applicant: International Business Machines Corporation
    Inventors: Wei Fan, Nagui Halim, Mark C. Johnson, Srinivasan Parthasarathy, Deepak S. Turaga, Olivier Verscheure
  • Patent number: 9342424
    Abstract: The present invention describes a method and system for optimizing a test flow within each ATE (Automated Test Equipment) station. The test flow includes a plurality of test blocks. A test block includes a plurality of individual tests. A computing system schedule the test flow based one or more of: a test failure model, test block duration and a yield model. The failure model determines an order or sequence of the test blocks. There are at least two failure models: independent failure model and dependant failure model. The yield model describes whether a semiconductor chip is defective or not. Upon completing the scheduling, the ATE station conducts tests according to the scheduled test flow. The present invention can also be applied to software testing.
    Type: Grant
    Filed: August 21, 2013
    Date of Patent: May 17, 2016
    Assignee: International Business Machines Corporation
    Inventors: Wei Fan, Nagui Halim, Mark C. Johnson, Srinivasan Parthasarathy, Deepak S. Turaga, Olivier Verscheure
  • Patent number: 9330163
    Abstract: A horizontal anomaly detection method includes receiving at plurality of objects described in a plurality of information sources, wherein each individual information source captures a plurality of similarity relationships between the objects, combining the information sources to determine a similarity matrix whose entries represent quantitative scores of similarity between pairs of the objects, and identifying at least one horizontal anomaly of the objects within the similarity matrix, wherein the horizontal anomalies are anomalous relationships across the plurality of information sources.
    Type: Grant
    Filed: August 27, 2013
    Date of Patent: May 3, 2016
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Wei Fan, Jing Gao, Srinivasan Parthasarathy, Deepak Turaga
  • Publication number: 20160110362
    Abstract: Embodiments relate to analyzing dataset. A method of analyzing data is provided. The method obtains a description of a dataset. The method automatically generates a plurality of analysis options from the description of the dataset. The method generates a plurality of queries based on the analysis options. The method deploys the queries on the dataset to build a plurality of statistical models from the dataset.
    Type: Application
    Filed: October 20, 2014
    Publication date: April 21, 2016
    Inventors: Udayan Khurana, Srinivasan Parthasarathy, Venkata N. Pavuluri, Deepak S. Turaga, Long H. Vu
  • Publication number: 20160110410
    Abstract: Embodiments relate to analyzing dataset. A method of analyzing data is provided. The method obtains a description of a dataset. The method automatically generates a plurality of analysis options from the description of the dataset. The method generates a plurality of queries based on the analysis options. The method deploys the queries on the dataset to build a plurality of statistical models from the dataset.
    Type: Application
    Filed: June 19, 2015
    Publication date: April 21, 2016
    Inventors: Udayan Khurana, Srinivasan Parthasarathy, Venkata N. Pavuluri, Deepak S. Turaga, Long H. Vu
  • Patent number: 9032521
    Abstract: Performing adaptive cyber-security analytics including a computer implemented method that includes receiving a report on a network activity. A score responsive to the network activity and to a scoring model is computed at a computer. The score indicates a likelihood of a security violation. The score is validated and the scoring model is automatically updated responsive to results of the validating. The network activity is reported as suspicious in response to the score being within a threshold of a security violation value.
    Type: Grant
    Filed: October 13, 2010
    Date of Patent: May 12, 2015
    Assignee: International Business Machines Corporation
    Inventors: Lisa Amini, Mihai Christodorescu, Mitchell A. Cohen, Srinivasan Parthasarathy, Josyula Rao, Reiner Sailer, Douglas L. Schales, Wietse Z. Venema, Oliver Verscheure
  • Publication number: 20150125279
    Abstract: A submersible pump component is provided. The component includes a substrate including an outer surface in a plurality of orientations, wherein a first portion of the outer surface is configured to be worn by a first wear mechanism, and a second portion of said outer surface is configured to be worn by a second wear mechanism. The component also includes at least one layer of a first coating applied to the outer surface, and at least one layer of a second coating applied over said first coating at said second portion of said outer surface. The first coating is configured to inhibit the first wear mechanism at the first portion of the outer surface, and the second coating is configured to inhibit the second wear mechanism at the second portion of the outer surface.
    Type: Application
    Filed: November 4, 2013
    Publication date: May 7, 2015
    Applicant: General Electric Company
    Inventors: Patrick James McCluskey, Dennis Michael Gray, Scott Andrew Weaver, Bala Srinivasan Parthasarathy, Richard Arthur Nardi, JR., Charles Joseph Underwood
  • Publication number: 20150058668
    Abstract: The present invention describes a method and system for optimizing a test flow within each ATE (Automated Test Equipment) station. The test flow includes a plurality of test blocks. A test block includes a plurality of individual tests. A computing system schedule the test flow based one or more of: a test failure model, test block duration and a yield model. The failure model determines an order or sequence of the test blocks. There are at least two failure models: independent failure model and dependant failure model. The yield model describes whether a semiconductor chip is defective or not. Upon completing the scheduling, the ATE station conducts tests according to the scheduled test flow. The present invention can also be applied to software testing.
    Type: Application
    Filed: August 21, 2013
    Publication date: February 26, 2015
    Applicant: International Business Machines Corporation
    Inventors: Wei Fan, Nagui Halim, Mark C. Johnson, Srinivasan Parthasarathy, Deepak S. Turaga, Olivier Verscheure
  • Patent number: 8903824
    Abstract: A method, an apparatus and an article of manufacture for processing a random-walk based vertex-proximity query on a graph. The method includes computing at least one vertex cluster and corresponding meta-information from a graph, dynamically updating the clustering and corresponding meta-information upon modification of the graph, and identifying a vertex cluster relevant to at least one query vertex and aggregating corresponding meta-information of the cluster to process the query.
    Type: Grant
    Filed: December 9, 2011
    Date of Patent: December 2, 2014
    Assignee: International Business Machines Corporation
    Inventors: Leman Akoglu, Rohit M. Khandekar, Vibhore Kumar, Srinivasan Parthasarathy, Deepak Rajan, Kun-Lung Wu
  • Patent number: 8666988
    Abstract: According to an exemplary embodiment of the present invention, a method to configure a network of classifiers includes configuring a plurality of classifiers in a network of classifiers, such that the configuring associates a plurality of operating points with each output branch, associating a different quality profile with each output point for each output branch in the plurality of classifiers, and storing the configured network of classifiers and quality profile associations in the computer system to be used for classifying future input data according to the network configuration and quality profile association. Each classifier comprises executable code that classifies the data. Each of said classifiers has a plurality of the output branches that each output the data to another classifier. Each operating point comprises a probability of determining that a data item input to the classifier has a particular characteristic and a probability that said determination falsely detected the characteristic.
    Type: Grant
    Filed: May 14, 2009
    Date of Patent: March 4, 2014
    Assignee: International Business Machines Corporation
    Inventors: Srinivasan Parthasarathy, Deepak S. Turaga, Olivier Verscheure
  • Publication number: 20140040279
    Abstract: A method for automated data exploration including selecting a plurality of analytic flows from an analytic flow pattern, executing a task, wherein the task is tracked by the plurality of analytic flows, receiving feedback for each of the plurality of analytic flows, determining a performance score for each of the plurality of analytic flows, and adjusting the flow according to the performance score.
    Type: Application
    Filed: August 2, 2012
    Publication date: February 6, 2014
    Applicant: International Business Machines Corporation
    Inventors: Alina Beygelzimer, Nicholas Mastronarde, Srinivasan Parthasarathy, Anton V. Riabov, Deepak Turaga, Octavian Udrea
  • Publication number: 20140008330
    Abstract: A method for repairing a component is provided. The method comprises: tracing an electrode across a defect/damage on the component at a preselected distance from the component; feeding a first metal powder and a second metal powder into a discharging gap between the electrode and the component; controlling feed rates of the first and second metal powders separately; and electro-spark depositing the first and second metal powders to the component to form a hybrid metal coating. The first metal powder comprises a first metal or alloy with a Vickers hardness rating of about 70-200% of the Vickers hardness rating of the component. The second metal powder comprises a second metal or alloy having lubricating/anti-corrosion properties.
    Type: Application
    Filed: July 3, 2013
    Publication date: January 9, 2014
    Inventors: Mayank Tiwari, Laurent Cretegny, Yong Liu, Bala Srinivasan Parthasarathy, Ravi Agrawal, Yong Wu
  • Patent number: 8625538
    Abstract: A method for association of a mobile terminal with an access point (AP) includes determining a set of available APs. The AP from among the available APs that has the coverage area that is likely to encompass the mobile terminal for the greatest period of time or distance is selected. The selected AP is associated with the mobile terminal.
    Type: Grant
    Filed: November 13, 2007
    Date of Patent: January 7, 2014
    Assignee: International Business Machines Corporation
    Inventors: Minkyong Kim, Zhen Liu, Srinivasan Parthasarathy, Dimitrios Pendarakis, Hao Yang
  • Publication number: 20130346411
    Abstract: A horizontal anomaly detection method includes receiving at plurality of objects described in a plurality of information sources, wherein each individual information source captures a plurality of similarity relationships between the objects, combining the information sources to determine a similarity matrix whose entries represent quantitative scores of similarity between pairs of the objects, and identifying at least one horizontal anomaly of the objects within the similarity matrix, wherein the horizontal anomalies are anomalous relationships across the plurality of information sources.
    Type: Application
    Filed: August 27, 2013
    Publication date: December 26, 2013
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: WEI FAN, Jing Gao, Srinivasan Parthasarathy, Deepak Turaga