Patents by Inventor Sriram Krishnaswami

Sriram Krishnaswami has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220190245
    Abstract: Systems and methods for depositing materials on a substrate via OVJP are provided. A float table and grippers are used to move and position the substrate relative to one or more OVJP print bars to reduce the chance of damaging or compromising the substrate or prior depositions.
    Type: Application
    Filed: December 13, 2021
    Publication date: June 16, 2022
    Inventors: Kent Khuong NGUYEN, Sriram KRISHNASWAMI, Daniel TOET, Jeff HAWTHORNE, William E. QUINN
  • Publication number: 20220142927
    Abstract: The present invention relates to oral sustained release formulations of tofacitinib and pharmaceutical acceptable salts thereof. The formulations described herein have desirable pharmacokinetic characteristics.
    Type: Application
    Filed: January 21, 2022
    Publication date: May 12, 2022
    Applicant: PFIZER INC.
    Inventors: Scott Max Herbig, Sriram Krishnaswami, Joseph Kushner, IV, Manisha Lamba, Thomas C. Stock
  • Patent number: 11253523
    Abstract: The present invention relates to oral sustained release formulations of tofacitinib and pharmaceutical acceptable salts thereof. The formulations described herein have desirable pharmacokinetic characteristics.
    Type: Grant
    Filed: March 13, 2020
    Date of Patent: February 22, 2022
    Assignee: Pfizer Inc.
    Inventors: Scott Max Herbig, Sriram Krishnaswami, Joseph Kushner, IV, Manisha Lamba, Thomas C. Stock
  • Publication number: 20200206232
    Abstract: The present invention relates to oral sustained release formulations of tofacitinib and pharmaceutical acceptable salts thereof. The formulations described herein have desirable pharmacokinetic characteristics.
    Type: Application
    Filed: March 13, 2020
    Publication date: July 2, 2020
    Applicant: PFIZER INC.
    Inventors: Scott Max Herbig, Sriram Krishnaswami, Joseph Kushner, IV, Manisha Lamba, Thomas C. Stock
  • Patent number: 10639309
    Abstract: The present invention relates to oral sustained release formulations of tofacitinib and pharmaceutical acceptable salts thereof. The formulations described herein have desirable pharmacokinetic characteristics.
    Type: Grant
    Filed: March 8, 2018
    Date of Patent: May 5, 2020
    Assignee: Pfizer Inc.
    Inventors: Scott Max Herbig, Sriram Krishnaswami, Joseph Kushner, IV, Manisha Lamba, Thomas C. Stock
  • Publication number: 20180193347
    Abstract: The present invention relates to oral sustained release formulations of tofacitinib and pharmaceutical acceptable salts thereof. The formulations described herein have desirable pharmacokinetic characteristics.
    Type: Application
    Filed: March 8, 2018
    Publication date: July 12, 2018
    Applicant: PFIZER INC.
    Inventors: Scott Max Herbig, Sriram Krishnaswami, Joseph Kushner, Manisha Lamba, Thomas C. Stock
  • Patent number: 9937181
    Abstract: The present invention relates to oral sustained release formulations of tofacitinib and pharmaceutical acceptable salts thereof. The formulations described herein have desirable pharmacokinetic characteristics.
    Type: Grant
    Filed: March 14, 2014
    Date of Patent: April 10, 2018
    Assignee: Pfizer Inc.
    Inventors: Scott Max Herbig, Sriram Krishnaswami, Joseph Kushner, IV, Manisha Lamba, Thomas C Stock
  • Publication number: 20170294291
    Abstract: An electron-beam induced plasma is utilized to establish a non-mechanical, electrical contact to a device of interest. This plasma source may be referred to as atmospheric plasma source and may be configured to provide a plasma column of very fine diameter and controllable characteristics. The plasma column traverses the atmospheric space between the plasma source into the atmosphere and the device of interest and acts as an electrical path to the device of interest in such a way that a characteristic electrical signal can be collected from the device. Additionally, by controlling the gases flowing into the plasma column the probe may be used for surface modification, etching and deposition.
    Type: Application
    Filed: September 17, 2015
    Publication date: October 12, 2017
    Inventors: Nedal SALEH, Unit B STERLING, Daniel TOET, Arie GLAZER, Ronen LOEWINGER, Sriram KRISHNASWAMI
  • Publication number: 20160299103
    Abstract: An electron-beam induced plasmas is utilized to establish a non-mechanical, electrical contact to a device of interest. This plasma source may be referred to as atmospheric plasma source and may be configured to provide a plasma column of very fine diameter and controllable characteristics. The plasma column traverses the atmospheric space between the plasma source into the atmosphere and the device of interest and acts as an electrical path to the device of interest in such a way that a characteristic electrical signal can be collected from the device. Additionally, by controlling the gases flowing into the plasma column the probe may be used for surface modification, etching and deposition.
    Type: Application
    Filed: October 2, 2014
    Publication date: October 13, 2016
    Inventors: Nedal Saleh, Daniel Toet, Enrique Sterling, Ronen Loewinger, Sriram Krishnaswami, Arie Glazer
  • Publication number: 20140266244
    Abstract: Described are techniques for maintaining reliable and reproducible conditions for panel inspection, i.e. pixel and line defect detection, while at the same time preventing large-scale panel damage. One implementation involves an apparatus for identifying a defect in an electronic circuit incorporating a circuit driving module configured to apply an electrical test signal to the electronic circuit; a defect detection module configured to identify the defect in the electronic circuit based at least on the applied electrical test signal; a signal monitoring module configured to measure the electrical test signal at the electronic circuit; and a control module operatively coupled to the signal monitoring module and the circuit driving module and configured to control at least the circuit driving module based on the electrical test signal measured at the electronic circuit.
    Type: Application
    Filed: March 16, 2014
    Publication date: September 18, 2014
    Applicant: Photon Dynamics Inc.
    Inventors: Viacheslav MINAEV, Raul Albert MARTIN, Thomas E. WISHARD, Michael Sean CASSADY, Jongho LEE, Thomas H. BAILEY, Sriram KRISHNASWAMI
  • Publication number: 20140271842
    Abstract: The present invention relates to oral sustained release formulations of tofacitinib and pharmaceutical acceptable salts thereof. The formulations described herein have desirable pharmacokinetic characteristics.
    Type: Application
    Filed: March 14, 2014
    Publication date: September 18, 2014
    Applicant: Pfizer Inc.
    Inventors: Scott Max Herbig, Sriram Krishnaswami, Joseph Kushner, IV, Manisha Lamba, Thomas C Stock
  • Patent number: 7973546
    Abstract: A method for testing a plurality of electronic devices formed on a large area substrate is described. In one embodiment, the method includes transferring a substrate on an end effector relative to a testing platform having a plurality of testing columns coupled thereto, the substrate having a plurality of electronic devices located thereon, and moving the substrate in a single directional axis relative to an optical axis of each of the plurality of testing columns, the single directional axis being substantially orthogonal to the optical axis to define a test area on the substrate, wherein the test area is configured to cover an entire length or an entire width of the substrate such that the testing columns are capable of testing the entire substrate as the substrate is moved through the test area.
    Type: Grant
    Filed: June 29, 2010
    Date of Patent: July 5, 2011
    Assignee: Applied Materials, Inc.
    Inventors: Fayez E. Abboud, Sriram Krishnaswami, Benjamin M. Johnston, Hung T. Nguyen, Matthias Brunner, Ralf Schmid, John M. White, Shinichi Kurita, James C. Hunter
  • Publication number: 20100327162
    Abstract: A method and apparatus for testing a plurality of electronic devices formed on a large area substrate is described. In one embodiment, the apparatus performs a test on the substrate in one linear axis in at least one chamber that is slightly wider than a dimension of the substrate to be tested. Clean room space and process time is minimized due to the smaller dimensions and volume of the system.
    Type: Application
    Filed: June 29, 2010
    Publication date: December 30, 2010
    Inventors: FAYEZ E. ABBOUD, Sriram Krishnaswami, Benjamin M. Johnston, Hung T. Nguyen, Matthias Brunner, Ralf Schmid, John M. White, Shinichi Kurita, James C. Hunter
  • Patent number: 7786742
    Abstract: An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays on the large area substrate. The apparatus includes a prober assembly that is movable relative to the large area substrate and/or the contact points, and may be configured to test various patterns of displays and contact points on various large area substrates. The prober assembly is also configured to test fractional sections of the large area substrate positioned on a testing table, and the prober assembly may be configured for different display and contact point patterns without removing the prober assembly from the testing table.
    Type: Grant
    Filed: May 9, 2007
    Date of Patent: August 31, 2010
    Assignee: Applied Materials, Inc.
    Inventors: Sriram Krishnaswami, Matthias Brunner, William Beaton, Yong Liu, Benjamin M. Johnston, Hung T. Nguyen, Ludwig Ledl, Ralf Schmid
  • Patent number: 7746088
    Abstract: A method and apparatus for testing a plurality of electronic devices formed on a large area substrate is described. In one embodiment, the apparatus performs a test on the substrate in one linear axis in at least one chamber that is slightly wider than a dimension of the substrate to be tested. Clean room space and process time is minimized due to the smaller dimensions and volume of the system.
    Type: Grant
    Filed: April 10, 2009
    Date of Patent: June 29, 2010
    Assignee: Applied Materials, Inc.
    Inventors: Fayez E. Abboud, Sriram Krishnaswami, Benjamin M. Johnston, Hung T. Nguyen, Matthias Brunner, Ralf Schmid, John M. White, Shinichi Kurita, James C. Hunter
  • Publication number: 20090321399
    Abstract: Methods and systems for improving the alignment between a previously formed feature and a subsequently formed feature are provided. An exemplary method can include laser scribing a workpiece (104, 550) having a previously formed first feature. The exemplary method includes imaging the workpiece (104, 550) with an imaging device (320, 420, 554, 640) so as to capture a plurality of positions of the first feature on the workpiece (104, 550) relative to the laser-scribing device (100). The exemplary method further includes using the captured positions to align output from the laser-scribing device (100) in order to form a second feature on the workpiece (104, 550) at a controlled distance from the first feature.
    Type: Application
    Filed: April 10, 2009
    Publication date: December 31, 2009
    Applicant: Applied Materials, Inc.
    Inventors: Makoto Inagawa, Shinichi Kurita, Bassam Shamoun, Sriram Krishnaswami, Michael D. Shirk, Kevin L. Cunningham
  • Publication number: 20090321397
    Abstract: Laser-scribing systems and translation stages operable to support a workpiece during laser scribing are provided. A laser-scribing system includes a base section, a bed supported by the base section, a laser, a first driving mechanism operable to move a workpiece longitudinally along the bed, and a second driving mechanism. The bed comprises a movable section configured to translate with respect to the base section. The movable section comprises a gap to allow a laser beam to pass through. The laser is positioned to direct the laser beam through the gap. The second driving mechanism is operable to laterally translate the laser and the movable section in order to scribe a pattern on the workpiece.
    Type: Application
    Filed: April 10, 2009
    Publication date: December 31, 2009
    Applicant: Applied Materials, Inc.
    Inventors: Sriram Krishnaswami, Shinichi Kurita, Bassam Shamoun, Bejamin M. Johnston, John M. White, Jiafa Fan, Inchen Huang
  • Publication number: 20090255911
    Abstract: Laser scribing can be performed on a workpiece (104) such as substrates with layers formed thereon for use in a solar panel without need to rotate the workpiece (104) during the scribing process. A series of lasers (602, 622) can be used to concurrently remove material from multiple positions on the workpiece (104). Each laser (602, 622) can have at least one scanning device (614, 630, 632) positioned along a beam path thereof in order to adjust a position of the laser output relative to the workpiece (104). By adjusting the beam or pulse positions using the scanning devices (614, 630, 632) while translating the workpiece (104), substantially any pattern can be scribed into at least one layer of the workpiece (104) without the need for any rotation of the workpiece (104).
    Type: Application
    Filed: April 10, 2009
    Publication date: October 15, 2009
    Applicant: Applied Materials, Inc.
    Inventors: Sriram Krishnaswami, Shinichi Kurita, Bassam Shamoun, Benjamin M. Johnston, John M. White, Jiafa Fan, Inchen Huang, Antoine P. Manens, Wei-Sheng Lei, Wei-Yung Hsu
  • Patent number: 7602199
    Abstract: An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays. The apparatus includes a prober assembly that is movable relative to the large area substrate and may be configured to test various patterns of displays and contact points. The prober assembly is also configured to test fractional sections of the large area substrate. The apparatus also includes a test chamber configured to store at least two prober assemblies within an interior volume.
    Type: Grant
    Filed: May 9, 2007
    Date of Patent: October 13, 2009
    Assignee: Applied Materials, Inc.
    Inventors: Benjamin M. Johnston, Sriram Krishnaswami, Hung T. Nguyen, Matthias Brunner, Yong Liu
  • Publication number: 20090195262
    Abstract: A method and apparatus for testing a plurality of electronic devices formed on a large area substrate is described. In one embodiment, the apparatus performs a test on the substrate in one linear axis in at least one chamber that is slightly wider than a dimension of the substrate to be tested. Clean room space and process time is minimized due to the smaller dimensions and volume of the system.
    Type: Application
    Filed: April 10, 2009
    Publication date: August 6, 2009
    Inventors: Fayez E. Abboud, Sriram Krishnaswami, Benjamin M. Johnston, Hung T. Nguyen, Matthias Brunner, Ralf Schmid, John M. White, Shinichi Kurita, James C. Hunter