Patents by Inventor Stephan W. Wegerich
Stephan W. Wegerich has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7085675Abstract: A system, method and program product for predictive condition monitoring of a monitored system by means of sub-band decomposition of a complex monitored signal. Features of the decomposed signal are extracted for modeling estimation and detection of deviations in the features. Deviations are indicative of impending monitored system fault.Type: GrantFiled: February 6, 2003Date of Patent: August 1, 2006Assignee: The University of ChicagoInventor: Stephan W. Wegerich
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Patent number: 6999899Abstract: A method and system for monitoring at least one of a system, a process and a data source. A method and system have been developed for carrying out surveillance, testing and modification of an ongoing process or other source of data, such as a spectroscopic examination. A signal from the system under surveillance is collected and compared with a reference signal, a frequency domain transformation carried out for the system signal and reference signal, a frequency domain difference function established. The process is then repeated until a full range of data is accumulated over the time domain and a Sequential Probability Ratio Test (“SPRT”) methodology applied to determine a three-dimensional surface plot characteristic of the operating state of the system under surveillance.Type: GrantFiled: February 2, 2004Date of Patent: February 14, 2006Assignee: ARCH Development CorporationInventors: Kenneth C. Gross, Stephan W. Wegerich, Cynthia Criss-Puszkiewicz, Alan D. Wilks
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Patent number: 6975962Abstract: A system and method for monitoring a condition of a monitored system. Estimates of monitored parameters from a model of the system provide residual values that can be analyzed using a sequential probability ratio test (“SPRT”). The invention employs empirically derived distributions in the SPRT to provide more accurate and sensitive alerts of impending faults, breakdowns and process deviations. The distributions can be generated from piecewise continuous approximation or spline functions based on the actual distribution of residual data to provide improved computational performance. The distributions can be provided before monitoring, or can be updated and determined during monitoring in an adaptive fashion.Type: GrantFiled: June 7, 2002Date of Patent: December 13, 2005Assignee: SmartSignal CorporationInventors: Stephan W. Wegerich, Robert Matthew Pipke
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Patent number: 6957172Abstract: A system, method and program product for monitoring a complex signal for ultrasensitive detection of state changes, or for signature recognition and classification is provided. A complex signal is decomposed periodically for empirical modeling. Wavelet analysis, frequency band filtering or other methods may be used to decompose the complex signal into components. A library of signature data may be referenced for selection of a recognized signature in the decomposed complex signal. The recognized signature may indicate data being carried in the complex signal. Estimated signal data may be generated for determination of an operational state of a monitored process or machine using a statistical hypothesis test with reference to the decomposed input signal.Type: GrantFiled: March 8, 2001Date of Patent: October 18, 2005Assignee: Smartsignal CorporationInventor: Stephan W. Wegerich
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Patent number: 6952662Abstract: A system for detecting subtle differences in a signal in a set of linearly and/or non-linearly related signals that characterize a sensor-instrumented machine, process or living system. The system employs an improved similarity operator for signal differentiation. Signals or data representative of several linearly and/or non-linearly related parameters that describe a machine, process or living system are input to the inventive system, which compares the input to acceptable modeled states. If one or more of the input signals or data are different than expected, given the relationships between the parameters, the inventive system will indicate that difference. The system can provide expected parameter values, as well as the differences between expected and input signals; or the system can provide raw measures of similarity between the collection of input signals and the collection of acceptable modeled states. The system can be embodied in software or in a micro-controller.Type: GrantFiled: February 12, 2001Date of Patent: October 4, 2005Assignee: SmartSignal CorporationInventors: Stephan W. Wegerich, Alan D. Wilks, John D. Nelligan
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Patent number: 6876943Abstract: An improved system and method for producing replacement sensor signals for failed sensors, and inferred sensor signals for non-instrumented physical parameters, in processes and equipment having one or more sensors in place for monitoring physical parameters. A data history from a fully-instrumented prototype provides a representative data set of anticipated operating parameters for forming an empirical model in a computer module for generating “virtual” signals for a process or machine in real-time. Replacement or inferential sensor signals can be advantageously used in downstream control processing or analysis. A memory for storing the representative training set, or a transformation thereof, is coupled to a processor. The processor receives from an input data signals embodying real values from sensors actually on the process or machine, and may receive these in real-time.Type: GrantFiled: March 20, 2003Date of Patent: April 5, 2005Assignee: SmartSignal CorporationInventor: Stephan W. Wegerich
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Patent number: 6859739Abstract: An improved empirical model-based surveillance or control system for monitoring or controlling a process or machine provides identification of transitions between operational states. Empirical model-based estimates generated in response to receiving actual operational parameters are compared using a global similarity operator to the actual parameters to indicate whether the process or machine is operating in a stable state, or is in transition from one state to another.Type: GrantFiled: February 27, 2001Date of Patent: February 22, 2005Assignee: Smartsignal CorporationInventors: Stephan W. Wegerich, David R. Bell, Xiao Xu
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Patent number: 6839655Abstract: An improved system for monitoring non-coincident, non-stationary, process signals. The mean, variance, and length of a reference signal is defined by an automated system, followed by the identification of the leading and falling edges of a monitored signal and the length of the monitored signal. The monitored signal is compared to the reference signal, and the monitored signal is resampled in accordance with the reference signal. The reference signal is then correlated with the resampled monitored signal such that the reference signal and the resampled monitored signal are coincident in time with each other. The resampled monitored signal is then compared to the reference signal to determine whether the resampled monitored signal is within a set of predesignated operating conditions.Type: GrantFiled: May 25, 2001Date of Patent: January 4, 2005Assignee: University of ChicagoInventors: Kenneth C. Gross, Stephan W. Wegerich
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Publication number: 20040260515Abstract: In a machine for monitoring an instrumented process or for analyzing one or more signals, an empirical modeling module for modeling non-linearly and linearly correlated signal inputs using a non-linear angular similarity function with variable sensitivity across the range of a signal input. A different angle-based similarity function can be chosen for different inputs for improved sensitivity particular to the behavior of that input. Sections of interest within a range of a signal input can be lensed for particular sensitivity.Type: ApplicationFiled: July 16, 2004Publication date: December 23, 2004Applicant: SMARTSIGNAL CORPORATIONInventors: Stephan W. Wegerich, R. Matthew Pipke, Andre Wolosewicz
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Patent number: 6804628Abstract: A method and system for monitoring at least one of a system, a process and a data source. A method and system have been developed for carrying out surveillance, testing and modification of an ongoing process or other source of data, such as a spectroscopic examination. A signal from the system under surveillance is collected and compared with a reference signal, a frequency domain transformation carried out for the system signal and reference signal, a frequency domain difference function established. The process is then repeated until a full range of data is accumulated over the time domain and a Sequential Probability Ratio Test (“SPRT”) methodology applied to determine a three-dimensional surface plot characteristic of the operating state of the system under surveillance.Type: GrantFiled: May 28, 2002Date of Patent: October 12, 2004Assignee: ARCH Development CorporationInventors: Kenneth C. Gross, Stephan W. Wegerich, Cynthia Criss-Puszkiewicz, Alan D. Wilks
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Publication number: 20040162685Abstract: A method and system for monitoring at least one of a system, a process and a data source. A method and system have been developed for carrying out surveillance, testing and modification of an ongoing process or other source of data, such as a spectroscopic examination. A signal from the system under surveillance is collected and compared with a reference signal, a frequency domain transformation carried out for the system signal and reference signal, a frequency domain difference function established. The process is then repeated until a full range of data is accumulated over the time domain and a Sequential Probability Ratio Test (“SPRT”) methodology applied to determine a three-dimensional surface plot characteristic of the operating state of the system under surveillance.Type: ApplicationFiled: February 2, 2004Publication date: August 19, 2004Applicant: ARCH Development CorporationInventors: Kenneth C. Gross, Stephan W. Wegerich, Cynthia Criss-Puszkiewicz, Alan D. Wilks
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Patent number: 6775641Abstract: In a machine for monitoring an instrumented process or for analyzing one or more signals, an empirical modeling module for modeling non-linearly and linearly correlated signal inputs using a non-linear angular similarity function with variable sensitivity across the range of a signal input. A different angle-based similarity function can be chosen for different inputs for improved sensitivity particular to the behavior of that input. Sections of interest within a range of a signal input can be lensed for particular sensitivity.Type: GrantFiled: March 9, 2001Date of Patent: August 10, 2004Assignee: SmartSignal CorporationInventors: Stephan W. Wegerich, R. Matthew Pipke, Andre Wolosewicz
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Publication number: 20040078171Abstract: A system for empirically diagnosing a condition of a monitored system. Estimates of monitored parameters from a model of the system provide residual values that can be analyzed for failure mode signature recognition. Residual values can also be tested for alert (non-zero) conditions, and patterns of alerts thus generated are analyzed for failure mode signature patterns. The system employs a similarity operator for signature recognition and also for parameter estimation. Failure modes are empirically determined, and precursor data is automatically analyzed to determine differentiable signatures for failure modes.Type: ApplicationFiled: October 9, 2003Publication date: April 22, 2004Applicant: SMARTSIGNAL CORPORATIONInventors: Stephan W. Wegerich, Andre Wolosewicz, R. Matthew Pipke
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Publication number: 20030220767Abstract: A system, method and program product for predictive condition monitoring of a monitored system by means of sub-band decomposition of a complex monitored signal. Features of the decomposed signal are extracted for modeling estimation and detection of deviations in the features. Deviations are indicative of impending monitored system fault.Type: ApplicationFiled: February 6, 2003Publication date: November 27, 2003Applicant: The University of ChicagoInventor: Stephan W. Wegerich
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Publication number: 20030139908Abstract: A system for empirically diagnosing a condition of a monitored system. Estimates of monitored parameters from a model of the system provide residual values that can be analyzed for failure mode signature recognition. Residual values can also be tested for alert (non-zero) conditions, and patterns of alerts thus generated are analyzed for failure mode signature patterns. The system employs a similarity operator for signature recognition and also for parameter estimation. Failure modes are empirically determined, and precursor data is automatically analyzed to determine differentiable signatures for failure modes.Type: ApplicationFiled: October 22, 2002Publication date: July 24, 2003Inventors: Stephan W. Wegerich, Andre Wolosewicz, R. Matthew Pipke
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Patent number: 6556939Abstract: Inferred sensor signals are generated for uninstrumented physical parameters not among parameters measured in processes and equipment having one or more sensors in place for monitoring physical parameters. Inferential sensor signals can be advantageously used in downstream control processing or analysis. The inferred sensor signals generated accordingly may be returned to a control system or display system local to the process or machine, or located at the remote location or yet a different remote location. The system can provide expected parameter values, as well as the differences between expected and input signals; or the system can provide raw measures of similarity between the collection of input signals and the collection of acceptable modeled states. A memory for storing the representative training set, or a transformation thereof, is coupled to a processor.Type: GrantFiled: November 22, 2000Date of Patent: April 29, 2003Assignee: SmartSignal CorporationInventor: Stephan W. Wegerich
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Publication number: 20030055607Abstract: A system and method for monitoring a condition of a monitored system. Estimates of monitored parameters from a model of the system provide residual values that can be analyzed using a sequential probability ratio test (“SPRT”). The invention employs empirically derived distributions in the SPRT to provide more accurate and sensitive alerts of impending faults, breakdowns and process deviations. The distributions can be generated from piecewise continuous approximation or spline functions based on the actual distribution of residual data to provide improved computational performance. The distributions can be provided before monitoring, or can be updated and determined during monitoring in an adaptive fashion.Type: ApplicationFiled: June 7, 2002Publication date: March 20, 2003Inventors: Stephan W. Wegerich, Robert Matthew Pipke
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Publication number: 20030028349Abstract: An improved system for monitoring non-coincident, non-stationary, process signals. The mean, variance, and length of a reference signal is defined by an automated system, followed by the identification of the leading and falling edges of a monitored signal and the length of the monitored signal. The monitored signal is compared to the reference signal, and the monitored signal is resampled in accordance with the reference signal. The reference signal is then correlated with the resampled monitored signal such that the reference signal and the resampled monitored signal are coincident in time with each other. The resampled monitored signal is then compared to the reference signal to determine whether the resampled monitored signal is within a set of predesignated operating conditions.Type: ApplicationFiled: May 25, 2001Publication date: February 6, 2003Inventors: Kenneth C. Gross, Stephan W. Wegerich
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Publication number: 20020183971Abstract: A system for empirically diagnosing a condition of a monitored system. Estimates of monitored parameters from a model of the system provide residual values that can be analyzed for failure mode signature recognition. Residual values can also be tested for alert (non-zero) conditions, and patterns of alerts thus generated are analyzed for failure mode signature patterns. The system employs a similarity operator for signature recognition and also for parameter estimation. Failure modes are empirically determined, and precursor data is automatically analyzed to determine differentiable signatures for failure modes.Type: ApplicationFiled: April 10, 2001Publication date: December 5, 2002Inventors: Stephan W. Wegerich, Andre Wolosewicz, Robert Matthew Pipke
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Publication number: 20020152056Abstract: A method and apparatus for improved monitoring the operational state of instrumented systems is provided. An empirical model characterizes normal or desirable operation of the system, and real-time observations are provided to the model to generate estimates of expected sensor values. Comparison of the estimates with the real-time observations provides advanced warning of discrepancies in the operational state of the instrumented system. The invention provides for incipient failure detection, sensor failure detection and incipient process upset. An improved similarity operator provides for estimates that are not impaired by real-time observations at or beyond the limits of modeled data. The similarity operator comprises a difference function added to a constant, and the result is inverted.Type: ApplicationFiled: February 22, 2001Publication date: October 17, 2002Inventors: James P. Herzog, Stephan W. Wegerich