Patents by Inventor Stephan W. Wegerich

Stephan W. Wegerich has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7085675
    Abstract: A system, method and program product for predictive condition monitoring of a monitored system by means of sub-band decomposition of a complex monitored signal. Features of the decomposed signal are extracted for modeling estimation and detection of deviations in the features. Deviations are indicative of impending monitored system fault.
    Type: Grant
    Filed: February 6, 2003
    Date of Patent: August 1, 2006
    Assignee: The University of Chicago
    Inventor: Stephan W. Wegerich
  • Patent number: 6999899
    Abstract: A method and system for monitoring at least one of a system, a process and a data source. A method and system have been developed for carrying out surveillance, testing and modification of an ongoing process or other source of data, such as a spectroscopic examination. A signal from the system under surveillance is collected and compared with a reference signal, a frequency domain transformation carried out for the system signal and reference signal, a frequency domain difference function established. The process is then repeated until a full range of data is accumulated over the time domain and a Sequential Probability Ratio Test (“SPRT”) methodology applied to determine a three-dimensional surface plot characteristic of the operating state of the system under surveillance.
    Type: Grant
    Filed: February 2, 2004
    Date of Patent: February 14, 2006
    Assignee: ARCH Development Corporation
    Inventors: Kenneth C. Gross, Stephan W. Wegerich, Cynthia Criss-Puszkiewicz, Alan D. Wilks
  • Patent number: 6975962
    Abstract: A system and method for monitoring a condition of a monitored system. Estimates of monitored parameters from a model of the system provide residual values that can be analyzed using a sequential probability ratio test (“SPRT”). The invention employs empirically derived distributions in the SPRT to provide more accurate and sensitive alerts of impending faults, breakdowns and process deviations. The distributions can be generated from piecewise continuous approximation or spline functions based on the actual distribution of residual data to provide improved computational performance. The distributions can be provided before monitoring, or can be updated and determined during monitoring in an adaptive fashion.
    Type: Grant
    Filed: June 7, 2002
    Date of Patent: December 13, 2005
    Assignee: SmartSignal Corporation
    Inventors: Stephan W. Wegerich, Robert Matthew Pipke
  • Patent number: 6957172
    Abstract: A system, method and program product for monitoring a complex signal for ultrasensitive detection of state changes, or for signature recognition and classification is provided. A complex signal is decomposed periodically for empirical modeling. Wavelet analysis, frequency band filtering or other methods may be used to decompose the complex signal into components. A library of signature data may be referenced for selection of a recognized signature in the decomposed complex signal. The recognized signature may indicate data being carried in the complex signal. Estimated signal data may be generated for determination of an operational state of a monitored process or machine using a statistical hypothesis test with reference to the decomposed input signal.
    Type: Grant
    Filed: March 8, 2001
    Date of Patent: October 18, 2005
    Assignee: Smartsignal Corporation
    Inventor: Stephan W. Wegerich
  • Patent number: 6952662
    Abstract: A system for detecting subtle differences in a signal in a set of linearly and/or non-linearly related signals that characterize a sensor-instrumented machine, process or living system. The system employs an improved similarity operator for signal differentiation. Signals or data representative of several linearly and/or non-linearly related parameters that describe a machine, process or living system are input to the inventive system, which compares the input to acceptable modeled states. If one or more of the input signals or data are different than expected, given the relationships between the parameters, the inventive system will indicate that difference. The system can provide expected parameter values, as well as the differences between expected and input signals; or the system can provide raw measures of similarity between the collection of input signals and the collection of acceptable modeled states. The system can be embodied in software or in a micro-controller.
    Type: Grant
    Filed: February 12, 2001
    Date of Patent: October 4, 2005
    Assignee: SmartSignal Corporation
    Inventors: Stephan W. Wegerich, Alan D. Wilks, John D. Nelligan
  • Patent number: 6876943
    Abstract: An improved system and method for producing replacement sensor signals for failed sensors, and inferred sensor signals for non-instrumented physical parameters, in processes and equipment having one or more sensors in place for monitoring physical parameters. A data history from a fully-instrumented prototype provides a representative data set of anticipated operating parameters for forming an empirical model in a computer module for generating “virtual” signals for a process or machine in real-time. Replacement or inferential sensor signals can be advantageously used in downstream control processing or analysis. A memory for storing the representative training set, or a transformation thereof, is coupled to a processor. The processor receives from an input data signals embodying real values from sensors actually on the process or machine, and may receive these in real-time.
    Type: Grant
    Filed: March 20, 2003
    Date of Patent: April 5, 2005
    Assignee: SmartSignal Corporation
    Inventor: Stephan W. Wegerich
  • Patent number: 6859739
    Abstract: An improved empirical model-based surveillance or control system for monitoring or controlling a process or machine provides identification of transitions between operational states. Empirical model-based estimates generated in response to receiving actual operational parameters are compared using a global similarity operator to the actual parameters to indicate whether the process or machine is operating in a stable state, or is in transition from one state to another.
    Type: Grant
    Filed: February 27, 2001
    Date of Patent: February 22, 2005
    Assignee: Smartsignal Corporation
    Inventors: Stephan W. Wegerich, David R. Bell, Xiao Xu
  • Patent number: 6839655
    Abstract: An improved system for monitoring non-coincident, non-stationary, process signals. The mean, variance, and length of a reference signal is defined by an automated system, followed by the identification of the leading and falling edges of a monitored signal and the length of the monitored signal. The monitored signal is compared to the reference signal, and the monitored signal is resampled in accordance with the reference signal. The reference signal is then correlated with the resampled monitored signal such that the reference signal and the resampled monitored signal are coincident in time with each other. The resampled monitored signal is then compared to the reference signal to determine whether the resampled monitored signal is within a set of predesignated operating conditions.
    Type: Grant
    Filed: May 25, 2001
    Date of Patent: January 4, 2005
    Assignee: University of Chicago
    Inventors: Kenneth C. Gross, Stephan W. Wegerich
  • Publication number: 20040260515
    Abstract: In a machine for monitoring an instrumented process or for analyzing one or more signals, an empirical modeling module for modeling non-linearly and linearly correlated signal inputs using a non-linear angular similarity function with variable sensitivity across the range of a signal input. A different angle-based similarity function can be chosen for different inputs for improved sensitivity particular to the behavior of that input. Sections of interest within a range of a signal input can be lensed for particular sensitivity.
    Type: Application
    Filed: July 16, 2004
    Publication date: December 23, 2004
    Applicant: SMARTSIGNAL CORPORATION
    Inventors: Stephan W. Wegerich, R. Matthew Pipke, Andre Wolosewicz
  • Patent number: 6804628
    Abstract: A method and system for monitoring at least one of a system, a process and a data source. A method and system have been developed for carrying out surveillance, testing and modification of an ongoing process or other source of data, such as a spectroscopic examination. A signal from the system under surveillance is collected and compared with a reference signal, a frequency domain transformation carried out for the system signal and reference signal, a frequency domain difference function established. The process is then repeated until a full range of data is accumulated over the time domain and a Sequential Probability Ratio Test (“SPRT”) methodology applied to determine a three-dimensional surface plot characteristic of the operating state of the system under surveillance.
    Type: Grant
    Filed: May 28, 2002
    Date of Patent: October 12, 2004
    Assignee: ARCH Development Corporation
    Inventors: Kenneth C. Gross, Stephan W. Wegerich, Cynthia Criss-Puszkiewicz, Alan D. Wilks
  • Publication number: 20040162685
    Abstract: A method and system for monitoring at least one of a system, a process and a data source. A method and system have been developed for carrying out surveillance, testing and modification of an ongoing process or other source of data, such as a spectroscopic examination. A signal from the system under surveillance is collected and compared with a reference signal, a frequency domain transformation carried out for the system signal and reference signal, a frequency domain difference function established. The process is then repeated until a full range of data is accumulated over the time domain and a Sequential Probability Ratio Test (“SPRT”) methodology applied to determine a three-dimensional surface plot characteristic of the operating state of the system under surveillance.
    Type: Application
    Filed: February 2, 2004
    Publication date: August 19, 2004
    Applicant: ARCH Development Corporation
    Inventors: Kenneth C. Gross, Stephan W. Wegerich, Cynthia Criss-Puszkiewicz, Alan D. Wilks
  • Patent number: 6775641
    Abstract: In a machine for monitoring an instrumented process or for analyzing one or more signals, an empirical modeling module for modeling non-linearly and linearly correlated signal inputs using a non-linear angular similarity function with variable sensitivity across the range of a signal input. A different angle-based similarity function can be chosen for different inputs for improved sensitivity particular to the behavior of that input. Sections of interest within a range of a signal input can be lensed for particular sensitivity.
    Type: Grant
    Filed: March 9, 2001
    Date of Patent: August 10, 2004
    Assignee: SmartSignal Corporation
    Inventors: Stephan W. Wegerich, R. Matthew Pipke, Andre Wolosewicz
  • Publication number: 20040078171
    Abstract: A system for empirically diagnosing a condition of a monitored system. Estimates of monitored parameters from a model of the system provide residual values that can be analyzed for failure mode signature recognition. Residual values can also be tested for alert (non-zero) conditions, and patterns of alerts thus generated are analyzed for failure mode signature patterns. The system employs a similarity operator for signature recognition and also for parameter estimation. Failure modes are empirically determined, and precursor data is automatically analyzed to determine differentiable signatures for failure modes.
    Type: Application
    Filed: October 9, 2003
    Publication date: April 22, 2004
    Applicant: SMARTSIGNAL CORPORATION
    Inventors: Stephan W. Wegerich, Andre Wolosewicz, R. Matthew Pipke
  • Publication number: 20030220767
    Abstract: A system, method and program product for predictive condition monitoring of a monitored system by means of sub-band decomposition of a complex monitored signal. Features of the decomposed signal are extracted for modeling estimation and detection of deviations in the features. Deviations are indicative of impending monitored system fault.
    Type: Application
    Filed: February 6, 2003
    Publication date: November 27, 2003
    Applicant: The University of Chicago
    Inventor: Stephan W. Wegerich
  • Publication number: 20030139908
    Abstract: A system for empirically diagnosing a condition of a monitored system. Estimates of monitored parameters from a model of the system provide residual values that can be analyzed for failure mode signature recognition. Residual values can also be tested for alert (non-zero) conditions, and patterns of alerts thus generated are analyzed for failure mode signature patterns. The system employs a similarity operator for signature recognition and also for parameter estimation. Failure modes are empirically determined, and precursor data is automatically analyzed to determine differentiable signatures for failure modes.
    Type: Application
    Filed: October 22, 2002
    Publication date: July 24, 2003
    Inventors: Stephan W. Wegerich, Andre Wolosewicz, R. Matthew Pipke
  • Patent number: 6556939
    Abstract: Inferred sensor signals are generated for uninstrumented physical parameters not among parameters measured in processes and equipment having one or more sensors in place for monitoring physical parameters. Inferential sensor signals can be advantageously used in downstream control processing or analysis. The inferred sensor signals generated accordingly may be returned to a control system or display system local to the process or machine, or located at the remote location or yet a different remote location. The system can provide expected parameter values, as well as the differences between expected and input signals; or the system can provide raw measures of similarity between the collection of input signals and the collection of acceptable modeled states. A memory for storing the representative training set, or a transformation thereof, is coupled to a processor.
    Type: Grant
    Filed: November 22, 2000
    Date of Patent: April 29, 2003
    Assignee: SmartSignal Corporation
    Inventor: Stephan W. Wegerich
  • Publication number: 20030055607
    Abstract: A system and method for monitoring a condition of a monitored system. Estimates of monitored parameters from a model of the system provide residual values that can be analyzed using a sequential probability ratio test (“SPRT”). The invention employs empirically derived distributions in the SPRT to provide more accurate and sensitive alerts of impending faults, breakdowns and process deviations. The distributions can be generated from piecewise continuous approximation or spline functions based on the actual distribution of residual data to provide improved computational performance. The distributions can be provided before monitoring, or can be updated and determined during monitoring in an adaptive fashion.
    Type: Application
    Filed: June 7, 2002
    Publication date: March 20, 2003
    Inventors: Stephan W. Wegerich, Robert Matthew Pipke
  • Publication number: 20030028349
    Abstract: An improved system for monitoring non-coincident, non-stationary, process signals. The mean, variance, and length of a reference signal is defined by an automated system, followed by the identification of the leading and falling edges of a monitored signal and the length of the monitored signal. The monitored signal is compared to the reference signal, and the monitored signal is resampled in accordance with the reference signal. The reference signal is then correlated with the resampled monitored signal such that the reference signal and the resampled monitored signal are coincident in time with each other. The resampled monitored signal is then compared to the reference signal to determine whether the resampled monitored signal is within a set of predesignated operating conditions.
    Type: Application
    Filed: May 25, 2001
    Publication date: February 6, 2003
    Inventors: Kenneth C. Gross, Stephan W. Wegerich
  • Publication number: 20020183971
    Abstract: A system for empirically diagnosing a condition of a monitored system. Estimates of monitored parameters from a model of the system provide residual values that can be analyzed for failure mode signature recognition. Residual values can also be tested for alert (non-zero) conditions, and patterns of alerts thus generated are analyzed for failure mode signature patterns. The system employs a similarity operator for signature recognition and also for parameter estimation. Failure modes are empirically determined, and precursor data is automatically analyzed to determine differentiable signatures for failure modes.
    Type: Application
    Filed: April 10, 2001
    Publication date: December 5, 2002
    Inventors: Stephan W. Wegerich, Andre Wolosewicz, Robert Matthew Pipke
  • Publication number: 20020152056
    Abstract: A method and apparatus for improved monitoring the operational state of instrumented systems is provided. An empirical model characterizes normal or desirable operation of the system, and real-time observations are provided to the model to generate estimates of expected sensor values. Comparison of the estimates with the real-time observations provides advanced warning of discrepancies in the operational state of the instrumented system. The invention provides for incipient failure detection, sensor failure detection and incipient process upset. An improved similarity operator provides for estimates that are not impaired by real-time observations at or beyond the limits of modeled data. The similarity operator comprises a difference function added to a constant, and the result is inverted.
    Type: Application
    Filed: February 22, 2001
    Publication date: October 17, 2002
    Inventors: James P. Herzog, Stephan W. Wegerich