Patents by Inventor Stephan W. Wegerich

Stephan W. Wegerich has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20020133320
    Abstract: An improved empirical model-based surveillance or control system for monitoring or controlling a process or machine provides adaptation of the empirical model in response to new operational states that are deemed normal or non-exceptional for the process or machine. An adaptation decision module differentiates process or sensor upset requiring alerts from new operational states not yet modeled. A retraining module updates the empirical model to incorporate the new states, and a pruning technique optionally maintains the empirical model by removing older states in favor of the added new states recognized by the model.
    Type: Application
    Filed: February 27, 2001
    Publication date: September 19, 2002
    Inventors: Stephan W. Wegerich, David R. Bell, Xiao Xu
  • Publication number: 20020128731
    Abstract: An improved empirical model-based surveillance or control system for monitoring or controlling a process or machine provides identification of transitions between operational states. Empirical model-based estimates generated in response to receiving actual operational parameters are compared using a global similarity operator to the actual parameters to indicate whether the process or machine is operating in a stable state, or is in transition from one state to another.
    Type: Application
    Filed: February 27, 2001
    Publication date: September 12, 2002
    Inventors: Stephan W. Wegerich, Dave R. Bell, Xiao Xu
  • Publication number: 20020091499
    Abstract: In a machine for monitoring an instrumented process or for analyzing one or more signals, an empirical modeling module for modeling non-linearly and linearly correlated signal inputs using a non-linear angular similarity function with variable sensitivity across the range of a signal input. A different angle-based similarity function can be chosen for different inputs for improved sensitivity particular to the behavior of that input. Sections of interest within a range of a signal input can be lensed for particular sensitivity.
    Type: Application
    Filed: March 9, 2001
    Publication date: July 11, 2002
    Inventors: Stephan W. Wegerich, R. Matthew Pipke, Andre Wolosewicz
  • Publication number: 20020087290
    Abstract: System and method for selection of appropriate modeling data from a general data set to characterize a modeled process. The data is typically correlated sensor data, representing a multitude of snapshots of a sensed machine or process. The invention accommodates selection of greater amounts of general data for inclusion in the modeling data where that data exhibits greater dynamics, and selects less data from regions of little change. The system can comprise a computer running a software program, or a microprocessor.
    Type: Application
    Filed: February 16, 2001
    Publication date: July 4, 2002
    Inventors: Stephan W. Wegerich, Alan D. Wilks, Andre Wolosewicz
  • Publication number: 20020055826
    Abstract: A system for detecting subtle differences in a signal in a set of linearly and/or non-linearly related signals that characterize a sensor-instrumented machine, process or living system. The system employs an improved similarity operator for signal differentiation. Signals or data representative of several linearly and/or non-linearly related parameters that describe a machine, process or living system are input to the inventive system, which compares the input to acceptable modeled states. If one or more of the input signals or data are different than expected, given the relationships between the parameters, the inventive system will indicate that difference. The system can provide expected parameter values, as well as the differences between expected and input signals; or the system can provide raw measures of similarity between the collection of input signals and the collection of acceptable modeled states. The system can be embodied in software or in a micro-controller.
    Type: Application
    Filed: February 12, 2001
    Publication date: May 9, 2002
    Inventors: Stephan W. Wegerich, Alan D. Wilks, John D. Nelligan
  • Publication number: 20010049590
    Abstract: A system, method and program product for monitoring a complex signal for ultrasensitive detection of state changes, or for signature recognition and classification is provided. A complex signal is decomposed periodically for empirical modeling. Wavelet analysis, frequency band filtering or other methods may be used to decompose the complex signal into components. A library of signature data may be referenced for selection of a recognized signature in the decomposed complex signal. The recognized signature may indicate data being carried in the complex signal. Estimated signal data may be generated for determination of an operational state of a monitored process or machine using a statistical hypothesis test with reference to the decomposed input signal.
    Type: Application
    Filed: March 8, 2001
    Publication date: December 6, 2001
    Inventor: Stephan W. Wegerich
  • Patent number: 6240372
    Abstract: A method and system for monitoring at least one of a system, a process and a data source. A method and system have been developed for carrying out surveillance, testing and modification of an ongoing process or other source of data, such as a spectroscopic examination. A signal from the system under surveillance is collected and compared with a reference signal, a frequency domain transformation carried out for the system signal and reference signal, a frequency domain difference function established. The process is then repeated until a full range of data is accumulated over the time domain and a SPRT sequential probability ratio test methodology applied to determine a three-dimensional surface plot characteristic of the operating state of the system under surveillance.
    Type: Grant
    Filed: November 14, 1997
    Date of Patent: May 29, 2001
    Assignee: Arch Development Corporation
    Inventors: Kenneth C. Gross, Stephan W. Wegerich, Cynthia Criss-Puszkiewicz, Alan D. Wilks
  • Patent number: 6202038
    Abstract: A method and apparatus for monitoring a source of data for determining an operating state of a working system. The method includes determining a sensor (or source of data) arrangement associated with monitoring the source of data for a system, activating a method for performing a sequential probability ratio test if the data source includes a single data (sensor) source, activating a second method for performing a regression sequential possibility ratio testing procedure if the arrangement includes a pair of sensors (data sources) with signals which are linearly or non-linearly related; activating a third method for performing a bounded angle ratio test procedure if the sensor arrangement includes multiple sensors and utilizing at least one of the first, second and third methods to accumulate sensor signals and determining the operating state of the system.
    Type: Grant
    Filed: August 12, 1999
    Date of Patent: March 13, 2001
    Assignee: ARCH Development Corporation
    Inventors: Stephan W. Wegerich, Kristin K. Jarman, Kenneth C. Gross
  • Patent number: 6181975
    Abstract: A system and method for monitoring an industrial process and/or industrial data source. The system includes generating time varying data from industrial data sources, processing the data to obtain time correlation of the data, determining the range of data, determining learned states of normal operation and using these states to generate expected values, comparing the expected values to current actual values to identify a current state of the process closest to a learned, normal state; generating a set of modeled data, and processing the modeled data to identify a data pattern and generating an alarm upon detecting a deviation from normalcy.
    Type: Grant
    Filed: February 24, 1998
    Date of Patent: January 30, 2001
    Assignee: ARCH Development Corporation
    Inventors: Kenneth C. Gross, Stephan W Wegerich, Ralph M. Singer, Jack E. Mott
  • Patent number: 6119111
    Abstract: A method and system for monitoring a process and determining its condition. Initial data is sensed, a first set of virtual data is produced by applying a system state analyzation to the initial data, a second set of virtual data is produced by applying a neural network analyzation to the initial data and a parity space analyzation is applied to the first and second set of virtual data and also to the initial data to provide a parity space decision about the condition of the process. A logic test can further be applied to produce a further system decision about the state of the process.
    Type: Grant
    Filed: June 9, 1998
    Date of Patent: September 12, 2000
    Assignee: ARCH Development Corporation
    Inventors: Kenneth C. Gross, Ralph M. Singer, Rollin G. Van Alstine, Stephan W. Wegerich, Yong Yue
  • Patent number: 6107919
    Abstract: A method and system for analyzing a source of data. The system and method involves initially training a system using a selected data signal, calculating at least two levels of sensitivity using a pattern recognition methodology, activating a first mode of alarm sensitivity to monitor the data source, activating a second mode of alarm sensitivity to monitor the data source and generating a first alarm signal upon the first mode of sensitivity detecting an alarm condition and a second alarm signal upon the second mode of sensitivity detecting an associated alarm condition. The first alarm condition and second alarm condition can be acted upon by an operator and/or analyzed by a specialist or computer program.
    Type: Grant
    Filed: February 24, 1999
    Date of Patent: August 22, 2000
    Assignee: ARCH Development Corporation
    Inventors: Alan D. Wilks, Stephan W. Wegerich, Kenneth C. Gross
  • Patent number: 5987399
    Abstract: A method and apparatus for monitoring a source of data for determining an operating state of a working system. The method includes determining a sensor (or source of data) arrangement associated with monitoring the source of data for a system, activating a method for performing a sequential probability ratio test if the data source includes a single data (sensor) source, activating a second method for performing a regression sequential possibility ratio testing procedure if the arrangement includes a pair of sensors (data sources) with signals which are linearly or non-linearly related; activating a third method for performing a bounded angle ratio test procedure if the sensor arrangement includes multiple sensors and utilizing at least one of the first, second and third methods to accumulate sensor signals and determining the operating state of the system.
    Type: Grant
    Filed: January 14, 1998
    Date of Patent: November 16, 1999
    Assignee: ARCH Development Corporation
    Inventors: Stephan W. Wegerich, Kristin K. Jarman, Kenneth C. Gross
  • Patent number: 5774379
    Abstract: A method and apparatus for monitoring and responding to conditions of an industrial process. Industrial process signals, such as repetitive manufacturing, testing and operational machine signals, are generated by a system. Sensor signals characteristic of the process are generated over a time length and compared to reference signals over the time length. The industrial signals are adjusted over the time length relative to the reference signals, the phase shift of the industrial signals is optimized to the reference signals and the resulting signals output for analysis by systems such as SPRT.
    Type: Grant
    Filed: July 21, 1995
    Date of Patent: June 30, 1998
    Assignee: The University of Chicago
    Inventors: Kenneth C. Gross, Stephan W. Wegerich, Rick B. Vilim, Andrew M. White
  • Patent number: 5764509
    Abstract: A system and method for monitoring an industrial process and/or industrial data source. The system includes generating time varying data from industrial data sources, processing the data to obtain time correlation of the data, determining the range of data, determining learned states of normal operation and using these states to generate expected values, comparing the expected values to current actual values to identify a current state of the process closest to a learned, normal state; generating a set of modeled data, and processing the modeled data to identify a data pattern and generating an alarm upon detecting a deviation from normalcy.
    Type: Grant
    Filed: June 19, 1996
    Date of Patent: June 9, 1998
    Assignee: The University of Chicago
    Inventors: Kenneth C. Gross, Stephan W. Wegerich, Ralph M. Singer, Jack E. Mott
  • Patent number: 5745382
    Abstract: A method and system for performing surveillance of transient signals of an industrial device to ascertain the operating state. The method and system involves the steps of reading into a memory training data, determining neural network weighting values until achieving target outputs close to the neural network output. If the target outputs are inadequate, wavelet parameters are determined to yield neural network outputs close to the desired set of target outputs and then providing signals characteristic of an industrial process and comparing the neural network output to the industrial process signals to evaluate the operating state of the industrial process.
    Type: Grant
    Filed: August 31, 1995
    Date of Patent: April 28, 1998
    Assignee: ARCH Development Corporation
    Inventors: Richard B. Vilim, Kenneth C. Gross, Stephan W. Wegerich