Abstract: Systems and methods for registration degradation correction for surgical procedures are disclosed. An example system includes a processor and a surgical camera configured to record images of a patient. The processor is configured to perform an initial patient registration that registers a patient volume space of virtual positional data points to physical positional points of at least a portion of the patient. The processor also identifies or receives an indication of an identification of a natural patient mark using recorded images of the patient and records a virtual mark in the patient volume space in response to a received activation action based on the identification of the natural patient mark. The processor then causes the patient volume space of virtual positional data points and the recorded virtual mark to be displayed in an overlaid manner over the recorded images on a single display.

Abstract: New and innovative systems and methods for registration degradation correction for surgical procedures are disclosed. An example system includes a surgical marking pen including a first trackable target and a registration plate including a second trackable target. The system also includes a navigation camera and a processor configured to perform a pen registration that determines a transformation between a tip of the surgical marking pen and the first trackable target when the tip of the surgical marking pen is placed on the registration plate. The pen registration enables the processor to record virtual marks at locations of the pen tip that correspond to physical marks drawn by the pen. Locations of the virtual marks are later compared to images of the physical marks to correct any registration degradation by moving a surgical camera or robotic arm connected to the surgical camera.

Abstract: Systems and methods are disclosed for an automated touchless registration of patient anatomy for surgical navigation systems. An example method includes: acquiring a plurality of images of the patient; determining relevant objects from a plurality of poses; and processing the received images through a photogrammetry module. The photogrammetry module may provide camera calibration and facilitate camera registration. As such, manual movement or robotic movement capabilities of the camera head, and digital visualization capabilities of a digital surgical microscope disclosed herein can be extended to allow near-automated or fully automated touchless registration for traditional surgical navigation.

Abstract: The present disclosure provides new and innovative systems and apparatuses for a surgical registration probe that provides improved detection by a surgical navigation system (e.g., localizer). An example apparatus includes a surgical registration probe; a localizer configured to track the surgical registration probe; and a surgical visualization system (e.g., localizer) configured to display a surgical site responsive to the tracking. The surgical registration probe may include: a marker shaft with at least one marker or fiducial; wherein the marker or fiducial causes the localizer to detect the surgical registration probe; and a probe shaft having at least three sections that are bent at a defined angle with respect to each other. In some embodiments, the apparatus may further comprise a calibration plate for securing the surgical registration probe.

Abstract: The present disclosure relates generally to a system, method, and apparatus for tracking a tool via a digital surgical microscope. Cameras on the digital surgical microscope may capture a scene view of a medical procedure in real time, and present the scene view to the surgeon in a digitized video stream with minimal interference from the surgeon. The digital surgical microscope may process image data from each scene view in real time and use computer vision and machine learning models (e.g., neural networks) to detect and track one or more tools used over the course of the medical procedure in real-time. As the digital surgical microscope detects and tracks the tools, and responds accordingly, the surgeon can thus indirectly control, using the tools already in the surgeon's hands, various parameters of the digital surgical microscope, including the position and orientation of the robotic-arm-mounted digital surgical microscope.

Abstract: The present disclosure describes a method, a system, and a computer program product of indicating a status of an analytical instrument on a screen of the analytical instrument. In an embodiment, the method, the system, and the computer program product include receiving data from an analytical instrument monitoring a liquid sample, segmenting the received data into data segments for at least two characteristics of at least one of the instrument, the sample, and an operating environment of the instrument, analyzing each of the data segments for the at least two characteristics, retrieving threshold values for the at least two characteristics from a computer data source, calculating at least one status of at least one of the instrument, the sample, and the operating environment, with respect to the analyzed data segments and the threshold values, and displaying the at least one status on a display of the instrument.

Abstract: New and innovative systems and methods for registration degradation correction for surgical procedures are disclosed. An example system includes a surgical marking pen including a first trackable target and a registration plate including a second trackable target. The system also includes a navigation camera and a processor configured to perform a pen registration that determines a transformation between a tip of the surgical marking pen and the first trackable target when the tip of the surgical marking pen is placed on the registration plate. The pen registration enables the processor to record virtual marks at locations of the pen tip that correspond to physical marks drawn by the pen. Locations of the virtual marks are later compared to images of the physical marks to correct any registration degradation by moving a surgical camera or robotic arm connected to the surgical camera.

Abstract: The present disclosure describes a method, a system, and a computer program product of indicating a status of an analytical instrument on a screen of the analytical instrument. In an embodiment, the method, the system, and the computer program product include receiving data from an analytical instrument monitoring a liquid sample, segmenting the received data into data segments for at least two characteristics of at least one of the instrument, the sample, and an operating environment of the instrument, analyzing each of the data segments for the at least two characteristics, retrieving threshold values for the at least two characteristics from a computer data source, calculating at least one status of at least one of the instrument, the sample, and the operating environment, with respect to the analyzed data segments and the threshold values, and displaying the at least one status on a display of the instrument.

Abstract: An apparatus and method of collecting topography, mechanical property data and electrical property data with an atomic force microscope (AFM) in either a single pass or a dual pass operation. PFT mode is preferably employed thus allowing the use of a wide range of probes, one benefit of which is to enhance the sensitivity of electrical property measurement.

Abstract: An apparatus and method of collecting topography, mechanical property data and electrical property data with an atomic force microscope (AFM) in either a single pass or a dual pass operation. PFT mode is preferably employed thus allowing the use of a wide range of probes, one benefit of which is to enhance the sensitivity of electrical property measurement.

Abstract: An apparatus and method of performing physical property measurements on a sample with a probe-based metrology instrument employing a nano-confined light source is provided. In one embodiment, an SPM probe tip is configured to support an appropriate receiving element so as to provide a nano-localized light source that is able to efficiently and locally excite the sample on the nanoscale. Preferably, the separation between the tip apex and the sample during spectroscopic measurements is maintained at less than 10 nm, for example, using an AFM TR Mode control scheme.

Abstract: An apparatus and method of collecting topography, mechanical property data and electrical property data with an atomic force microscope (AFM) in either a single pass or a dual pass operation. PFT mode is preferably employed thus allowing the use of a wide range of probes, one benefit of which is to enhance the sensitivity of electrical property measurement.

Abstract: An apparatus and method of performing physical property measurements on a sample with a probe-based metrology instrument employing a nano-confined light source is provided. In one embodiment, an SPM probe tip is configured to support an appropriate receiving element so as to provide a nano-localized light source that is able to efficiently and locally excite the sample on the nanoscale. Preferably, the separation between the tip apex and the sample during spectroscopic measurements is maintained at less than 10 nm, for example, using an AFM TR Mode control scheme.

Abstract: An apparatus and method of performing physical property measurements on a sample with a probe-based metrology instrument employing a nano-confined light source is provided. In one embodiment, an SPM probe tip is configured to support an appropriate receiving element so as to provide a nano-localized light source that is able to efficiently and locally excite the sample on the nanoscale. Preferably, the separation between the tip apex and the sample during spectroscopic measurements is maintained at less than 10 nm, for example, using an AFM TR Mode control scheme.

Abstract: An apparatus and method of performing physical property measurements on a sample with a probe-based metrology instrument employing a nano-confined light source is provided. In one embodiment, an SPM probe tip is configured to support an appropriate receiving element so as to provide a nano-localized light source that is able to efficiently and locally excite the sample on the nanoscale. Preferably, the separation between the tip apex and the sample during spectroscopic measurements is maintained at less than 10 nm, for example, using an AFM TR Mode control scheme.

Abstract: An apparatus and method of performing physical property measurements on a sample with a probe-based metrology instrument employing a nano-confined light source is provided. In one embodiment, an SPM probe tip is configured to support an appropriate receiving element so as to provide a nano-localized light source that is able to efficiently and locally excite the sample on the nanoscale. Preferably, the separation between the tip apex and the sample during spectroscopic measurements is maintained at less than 10 nm, for example, using an AFM TR Mode control scheme.

Abstract: An apparatus and method of collecting topography, mechanical property data and electrical property data with an atomic force microscope (AFM) in either a single pass or a dual pass operation. PFT mode is preferably employed thus allowing the use of a wide range of probes, one benefit of which is to enhance the sensitivity of electrical property measurement.

Abstract: A method of making a probe having a cantilever and a tip include providing a substrate having a surface and forming a tip extending substantially orthogonally from the surface. The method includes depositing an etch stop layer on the substrate, whereby the etch stop layer protects the tip during process. A silicon nitride layer is then deposited on the etch stop layer. An etch operation is used to release the cantilever and expose the etch stop layer protecting the tip. Preferably, the tip is silicon and the cantilever supporting the tip, preferably via the etch stop layer, is silicon nitride. A probe for a surface analysis instrument made according to the method includes a tip and a silicon nitride cantilever having a thickness defined during the deposition process.

Abstract: A scanning probe microscope method and apparatus that modifies imaging dynamics using an active drive technique to optimize the bandwidth of amplitude detection. The deflection is preferably measured by an optical detection system including a laser and a photodetector, which measures cantilever deflection by an optical beam bounce technique or another conventional technique. The detected deflection of the cantilever is subsequently demodulated to give a signal proportional to the amplitude of oscillation of the cantilever, which is thereafter used to drive the cantilever.

Abstract: A scanning probe microscope method and apparatus that modifies imaging dynamics using an active drive technique to optimize the bandwidth of amplitude detection. The deflection is preferably measured by an optical detection system including a laser and a photodetector, which measures cantilever deflection by an optical beam bounce technique or another conventional technique. The detected deflection of the cantilever is subsequently demodulated to give a signal proportional to the amplitude of oscillation of the cantilever, which is thereafter used to drive the cantilever.