Patents by Inventor Stephen C. Minne

Stephen C. Minne has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7036357
    Abstract: A scanning probe microscope method and apparatus that modifies imaging dynamics using an active drive technique to optimize the bandwidth of amplitude detection. The deflection is preferably measured by an optical detection system including a laser and a photodetector, which measures cantilever deflection by an optical beam bounce technique or another conventional technique. The detected deflection of the cantilever is subsequently demodulated to give a signal proportional to the amplitude of oscillation of the cantilever, which is thereafter used to drive the cantilever.
    Type: Grant
    Filed: January 6, 2004
    Date of Patent: May 2, 2006
    Assignee: Veeco Instruments Inc.
    Inventors: Dennis M. Adderton, Stephen C. Minne
  • Patent number: 7017398
    Abstract: An AFM that combines an AFM Z position actuator and a self-actuated Z position cantilever (both operable in cyclical mode and contact mode), with appropriate nested feedback control circuitry to achieve high-speed imaging and accurate Z position measurements. A preferred embodiment of an AFM for analyzing a surface of a sample in either ambient air or fluid includes a self-actuated cantilever having a Z-positioning element integrated therewith and an oscillator that oscillates the self-actuated cantilever at a frequency generally equal to a resonant frequency of the self-actuated cantilever and at an oscillation amplitude generally equal to a setpoint value.
    Type: Grant
    Filed: October 15, 2004
    Date of Patent: March 28, 2006
    Assignee: Veeco Instruments Inc.
    Inventors: Dennis M. Adderton, Stephen C. Minne
  • Patent number: 6951143
    Abstract: According to a first aspect of the preferred embodiment, a three-axis sensor assembly for use in an elastomeric material includes a first pair of sensors disposed along a first pair of respective axes that intersect, the first sensors being adapted to detect a force in a first direction. In addition, the sensor assembly includes a second pair of sensors disposed along a second pair of respective axes that intersect, the second sensors detecting a force in a second direction generally orthogonal to the first direction. Furthermore, in the assembly, the force measured in the first direction is equal to the difference between the outputs of the first sensors, and the force measured in the second direction is equal to the difference between the outputs of said second sensors. According to another aspect of the preferred embodiment, the sum of the outputs of the first sensors and the second sensors equals a force in a third direction orthogonal to the first and second directions.
    Type: Grant
    Filed: November 28, 2000
    Date of Patent: October 4, 2005
    Assignee: Michelin Recherche et Technique S.A.
    Inventors: Dennis M. Adderton, Stephen C. Minne
  • Patent number: 6941823
    Abstract: A method to compensate for stress deflection in a compound microprobe that includes a substrate, a microcantilever extending outwardly from the substrate, and a film formed on the microcantilever. The method preferably comprises the steps of determining an amount of stress-induced deflection of the microcantilever, and then mounting the microprobe so as to compensate for the stress-induced deflection. The mounting step preferably includes selecting a compensation piece based upon the amount of stress-induced deflection, where the compensation piece is a wedge generally aligning the microcantilever with a deflection detection apparatus. In general, the step of selecting the compensation piece includes correcting an angle between a longitudinal axis of the microcantilever and the substrate so as to insure that light reflected from the microcantilever during operation contacts a detector of a deflection detection apparatus.
    Type: Grant
    Filed: November 7, 2001
    Date of Patent: September 13, 2005
    Assignee: Veeco Instruments Inc.
    Inventors: Jonathan W. Lai, Hector B. Cavazos, Stephen C. Minne, Dennis M. Adderton
  • Patent number: 6912893
    Abstract: A method of operating a probe-based instrument includes providing a probe assembly and a probe holder and oscillating a probe of the probe assembly with an actuator that generates oscillation energy. The method also includes mounting the probe assembly on the probe holder so as to lessen interference with the oscillation energy coupled to the tip of the probe. A corresponding probe assembly includes a base having two substantially opposed surfaces and a cantilever extending from the base and supporting a tip. The probe assembly is mounted in a probe holder such that a probe holder surface contacts one of the opposed surfaces. The one opposed surface preferably includes at least one opening such that the surface area of the one opposed surface is substantially less than the surface area of the probe holder surface.
    Type: Grant
    Filed: April 17, 2003
    Date of Patent: July 5, 2005
    Assignee: Veeco Instruments Inc.
    Inventors: Stephen C. Minne, Hector B. Cavazos
  • Patent number: 6886395
    Abstract: A method of making a probe having a cantilever and a tip include providing a substrate having a surface and forming a tip extending substantially orthogonally from the surface. The method includes depositing an etch stop layer on the substrate, whereby the etch stop layer protects the tip during process. A silicon nitride layer is then deposited on the etch stop layer. An etch operation is used to release the cantilever and expose the etch stop layer protecting the tip. Preferably, the tip is silicon and the cantilever supporting the tip, preferably via the etch stop layer, is silicon nitride. A probe for a surface analysis instrument made according to the method includes a tip and a silicon nitride cantilever having a thickness defined during the deposition process.
    Type: Grant
    Filed: January 16, 2003
    Date of Patent: May 3, 2005
    Assignee: Veeco Instruments Inc.
    Inventor: Stephen C. Minne
  • Publication number: 20040255651
    Abstract: A scanning probe microscope method and apparatus that modifies imaging dynamics using an active drive technique to optimize the bandwidth of amplitude detection. The deflection is preferably measured by an optical detection system including a laser and a photodetector, which measures cantilever deflection by an optical beam bounce technique or another conventional technique. The detected deflection of the cantilever is subsequently demodulated to give a signal proportional to the amplitude of oscillation of the cantilever, which is thereafter used to drive the cantilever.
    Type: Application
    Filed: January 6, 2004
    Publication date: December 23, 2004
    Inventors: Dennis M. Adderton, Stephen C. Minne
  • Patent number: 6810720
    Abstract: An AFM that combines an AFM Z position actuator and a self-actuated Z position cantilever (both operable in cyclical mode and contact mode), with appropriate nested feedback control circuitry to achieve high-speed imaging and accurate Z position measurements. A preferred embodiment of an AFM for analyzing a surface of a sample in either ambient air or fluid includes a self-actuated cantilever having a Z-positioning element integrated therewith and an oscillator that oscillates the self-actuated cantilever at a frequency generally equal to a resonant frequency of the self-actuated cantilever and at an oscillation amplitude generally equal to a setpoint value.
    Type: Grant
    Filed: December 5, 2002
    Date of Patent: November 2, 2004
    Assignee: Veeco Instruments Inc.
    Inventors: Dennis M. Adderton, Stephen C. Minne
  • Publication number: 20040206165
    Abstract: A method of operating a probe-based instrument includes providing a probe assembly and a probe holder and oscillating a probe of the probe assembly with an actuator that generates oscillation energy. The method also includes mounting the probe assembly on the probe holder so as to lessen interference with the oscillation energy coupled to the tip of the probe. A corresponding probe assembly includes a base having two substantially opposed surfaces and a cantilever extending from the base and supporting a tip. The probe assembly is mounted in a probe holder such that a probe holder surface contacts one of the opposed surfaces. The one opposed surface preferably includes at least one opening such that the surface area of the one opposed surface is substantially less than the surface area of the probe holder surface.
    Type: Application
    Filed: April 17, 2003
    Publication date: October 21, 2004
    Applicant: NonoDevices, Inc.
    Inventors: Stephen C. Minne, Hector B. Cavazos
  • Patent number: 6770472
    Abstract: The present invention provides an apparatus and method for nucleotide or DNA sequencing by monitoring the molecular charge configuration as the DNA moves through a protein that is capable of transcribing the DNA. The apparatus and method provides a nanoscale electrometer that immobilizes the protein. The protein receives the DNA and transcribes the DNA. The nanoscale electrometer is a sensitive device that is capable of sensing and measuring the electronic charge that is released during the transcription process. The apparatus and method of the present invention further provides monitoring means that are attached to the nanoscale electrometer to monitor the electronic charge configuration as the DNA moves through the protein. Once the electronic charge configuration is established, a correlation is computed, using computing means, between the electronic charge configuration and a nucleotide signature of the DNA.
    Type: Grant
    Filed: November 13, 2001
    Date of Patent: August 3, 2004
    Assignee: The Board of Trustees of the Leland Stanford Junior University
    Inventors: Scott R. Manalis, Stephen C. Minne, Calvin F. Quate
  • Publication number: 20040139794
    Abstract: A method of making a probe having a cantilever and a tip include providing a substrate having a surface and forming a tip extending substantially orthogonally from the surface. The method includes depositing an etch stop layer on the substrate, whereby the etch stop layer protects the tip during process. A silicon nitride layer is then deposited on the etch stop layer. An etch operation is used to release the cantilever and expose the etch stop layer protecting the tip. Preferably, the tip is silicon and the cantilever supporting the tip, preferably via the etch stop layer, is silicon nitride. A probe for a surface analysis instrument made according to the method includes a tip and a silicon nitride cantilever having a thickness defined during the deposition process.
    Type: Application
    Filed: January 16, 2003
    Publication date: July 22, 2004
    Applicant: NANODEVICES, INC.
    Inventor: Stephen C. Minne
  • Publication number: 20040053440
    Abstract: A method of fabricating carbon nanotubes in a nanotube growth apparatus including executing a nanotube growth process recipe and monitoring a safety condition during the executing step. The executing step is interlocked to the monitoring step such that the executing step can be aborted based on the output of the monitoring step.
    Type: Application
    Filed: March 28, 2003
    Publication date: March 18, 2004
    Applicant: First Nano, Inc.
    Inventors: Jonathan W. Lai, Dennis M. Adderton, Stephen C. Minne
  • Publication number: 20040037767
    Abstract: A carbon nanotube fabricating system and method that employs control automation to ensure safety during the fabrication of nanotubes in a variety of applications. A method of producing carbon nanotubes in a process chamber includes executing a nanotube growth recipe and purging oxygen from the process chamber in response to the executing step. The purge step is performed by flowing an inert gas through the process chamber at appropriate times and for predetermined durations during the fabrication process.
    Type: Application
    Filed: March 28, 2003
    Publication date: February 26, 2004
    Applicant: First Nano, Inc.
    Inventors: Dennis M. Adderton, Jonathan W. Lai, Stephen C. Minne
  • Patent number: 6672144
    Abstract: A scanning probe microscope method and apparatus that modifies imaging dynamics using an active drive technique to optimize the bandwidth of amplitude detection. The deflection is preferably measured by an optical detection system including a laser and a photodetector, which measures cantilever deflection by an optical beam bounce technique or another conventional technique. The detected deflection of the cantilever is subsequently demodulated to give a signal proportional to the amplitude of oscillation of the cantilever, which is thereafter used to drive the cantilever.
    Type: Grant
    Filed: July 13, 2001
    Date of Patent: January 6, 2004
    Assignee: Veeco Instruments Inc.
    Inventors: Dennis M. Adderton, Stephen C. Minne
  • Patent number: 6637276
    Abstract: A tire sensor assembly that is embedded in an elastomeric tire at a particular radial depth inwardly from a contact patch of the tire includes a flexible generally pyramid-shaped body and a pair of first strain sensors disposed on first opposed faces of the pyramid-shaped body, the first strain sensors detecting a force in a first direction. In addition, the assembly includes a pair of second strain sensors disposed on second opposed faces of the pyramid-shaped body, the second strain sensors detecting a force in a second direction. Moreover, each face of the first and second opposed faces is non-planar. Preferably, the first and second opposed faces of the pyramid-shaped body are curved and generally symmetrical about an axis extending longitudinally through the apex of the body so as to allow adjustment of the sensitivity of the sensor assembly generally independent of the radial depth.
    Type: Grant
    Filed: April 27, 2001
    Date of Patent: October 28, 2003
    Assignee: Michelin Recherche et Technique S.A.
    Inventors: Dennis M. Adderton, Stephen C. Minne
  • Publication number: 20030094036
    Abstract: An AFM that combines an AFM Z position actuator and a self-actuated Z position cantilever (both operable in cyclical mode and contact mode), with appropriate nested feedback control circuitry to achieve high-speed imaging and accurate Z position measurements. A preferred embodiment of an AFM for analyzing a surface of a sample in either ambient air or fluid includes a self-actuated cantilever having a Z-positioning element integrated therewith and an oscillator that oscillates the self-actuated cantilever at a frequency generally equal to a resonant frequency of the self-actuated cantilever and at an oscillation amplitude generally equal to a setpoint value.
    Type: Application
    Filed: December 5, 2002
    Publication date: May 22, 2003
    Inventors: Dennis M. Adderton, Stephen C. Minne
  • Patent number: 6530266
    Abstract: An AFM that combines an AFM Z position actuator and a self-actuated Z position cantilever (both operable in cyclical mode and contact mode), with appropriate nested feedback control circuitry to achieve high-speed imaging and accurate Z position measurements. A preferred embodiment of an AFM for analyzing a surface of a sample in either ambient air or fluid includes a self-actuated cantilever having a Z-positioning element integrated therewith and an oscillator that oscillates the self-actuated cantilever at a frequency generally equal to a resonant frequency of the self-actuated cantilever and at an oscillation amplitude generally equal to a setpoint value.
    Type: Grant
    Filed: December 30, 1999
    Date of Patent: March 11, 2003
    Assignee: NanoDevices, Inc.
    Inventors: Dennis M. Adderton, Stephen C. Minne
  • Publication number: 20020092364
    Abstract: A tire sensor assembly that is embedded in an elastomeric tire at a particular radial depth inwardly from a contact patch of the tire includes a flexible generally pyramid-shaped body and a pair of first strain sensors disposed on first opposed faces of the pyramid-shaped body, the first strain sensors detecting a force in a first direction. In addition, the assembly includes a pair of second strain sensors disposed on second opposed faces of the pyramid-shaped body, the second strain sensors detecting a force in a second direction. Moreover, each face of the first and second opposed faces is non-planar. Preferably, the first and second opposed faces of the pyramid-shaped body are curved and generally symmetrical about an axis extending longitudinally through the apex of the body so as to allow adjustment of the sensitivity of the sensor assembly generally independent of the radial depth.
    Type: Application
    Filed: April 27, 2001
    Publication date: July 18, 2002
    Inventors: Dennis M. Adderton, Stephen C. Minne
  • Publication number: 20020086318
    Abstract: The present invention provides an apparatus and method for nucleotide or DNA sequencing by monitoring the molecular charge configuration as the DNA moves through a protein that is capable of transcribing the DNA. The apparatus and method provides a nanoscale electrometer that immobilizes the protein. The protein receives the DNA and transcribes the DNA. The nanoscale electrometer is a sensitive device that is capable of sensing and measuring the electronic charge that is released during the transcription process. The apparatus and method of the present invention further provides monitoring means that are attached to the nanoscale electrometer to monitor the electronic charge configuration as the DNA moves through the protein. Once the electronic charge configuration is established, a correlation is computed, using computing means, between the electronic charge configuration and a nucleotide signature of the DNA.
    Type: Application
    Filed: November 13, 2001
    Publication date: July 4, 2002
    Inventors: Scott R. Manalis, Stephen C. Minne, Calvin F. Quate
  • Publication number: 20020062684
    Abstract: A scanning probe microscope method and apparatus that modifies imaging dynamics using an active drive technique to optimize the bandwidth of amplitude detection. The deflection is preferably measured by an optical detection system including a laser and a photodetector, which measures cantilever deflection by an optical beam bounce technique or another conventional technique. The detected deflection of the cantilever is subsequently demodulated to give a signal proportional to the amplitude of oscillation of the cantilever, which is thereafter used to drive the cantilever.
    Type: Application
    Filed: July 13, 2001
    Publication date: May 30, 2002
    Applicant: Nanodevices, Inc.
    Inventors: Dennis M. Adderton, Stephen C. Minne