Patents by Inventor Stephen E. Mick

Stephen E. Mick has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices
    Patent number: 10192714
    Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
    Type: Grant
    Filed: May 30, 2017
    Date of Patent: January 29, 2019
    Assignee: Protochips, Inc.
    Inventors: John Damiano, Jr., David P. Nackashi, Stephen E. Mick
  • Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices
    Patent number: 10043633
    Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
    Type: Grant
    Filed: January 13, 2016
    Date of Patent: August 7, 2018
    Assignee: Protochips, Inc.
    Inventors: John Damiano, Jr., David P. Nackashi, Stephen E. Mick
  • Microscopy support structures
    Patent number: 9984850
    Abstract: Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.
    Type: Grant
    Filed: February 23, 2016
    Date of Patent: May 29, 2018
    Assignee: Protochips, Inc.
    Inventors: John Damiano, Jr., Stephen E. Mick, David P. Nackashi
  • Method for forming an electrical connection to a sample support in an electron microscope holder
    Patent number: 9837746
    Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
    Type: Grant
    Filed: September 1, 2016
    Date of Patent: December 5, 2017
    Assignee: Protochips, Inc.
    Inventors: John Damiano, Jr., David P. Nackashi, Stephen E. Mick
  • ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL WITH TWO SEMICONDUCTOR DEVICES
    Publication number: 20170278670
    Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
    Type: Application
    Filed: May 30, 2017
    Publication date: September 28, 2017
    Inventors: John Damiano, JR., David P. Nackashi, Stephen E. Mick
  • Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices
    Patent number: 9666409
    Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
    Type: Grant
    Filed: October 7, 2016
    Date of Patent: May 30, 2017
    Assignee: Protochips, Inc.
    Inventors: John Damiano, Jr., David P. Nackashi, Stephen E. Mick
  • ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL WITH TWO SEMICONDUCTOR DEVICES
    Publication number: 20170025245
    Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
    Type: Application
    Filed: October 7, 2016
    Publication date: January 26, 2017
    Inventors: John Damiano, JR., David P. Nackashi, Stephen E. Mick
  • MICROSCOPY SUPPORT STRUCTURES
    Publication number: 20160172153
    Abstract: Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.
    Type: Application
    Filed: February 23, 2016
    Publication date: June 16, 2016
    Inventors: John DAMIANO, Jr., Stephen E. MICK, David P. NACKASHI
  • ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL WITH TWO SEMICONDUCTOR DEVICES
    Publication number: 20160126056
    Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
    Type: Application
    Filed: January 13, 2016
    Publication date: May 5, 2016
    Inventors: John DAMIANO, JR., David P. NACKASHI, Stephen E. MICK
  • Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices
    Patent number: 9324539
    Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
    Type: Grant
    Filed: September 9, 2014
    Date of Patent: April 26, 2016
    Assignee: PROTOCHIPS, INC.
    Inventors: John Damiano, Jr., David P. Nackashi, Stephen E. Mick
  • Specimen holder used for mounting samples in electron microscopes
    Patent number: 9312097
    Abstract: A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
    Type: Grant
    Filed: October 14, 2014
    Date of Patent: April 12, 2016
    Assignee: PROTOCHIPS, INC.
    Inventors: David P. Nackashi, John Damiano, Jr., Stephen E. Mick, Thomas G. Schmelzer, Michael Zapata, III
  • Microscopy support structures
    Patent number: 9275826
    Abstract: Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.
    Type: Grant
    Filed: October 28, 2014
    Date of Patent: March 1, 2016
    Assignee: PROTOCHIPS, INC.
    Inventors: John Damiano, Jr., Stephen E. Mick, David P. Nackashi
  • MEMBRANE SUPPORTS WITH REINFORCEMENT FEATURES
    Publication number: 20150338322
    Abstract: A sample support structure with integrated support features and methods of making and using the reinforced membrane. The sample support structures are useful for supporting samples for analysis using microscopic techniques, such as electron microscopy, optical microscopy, x-ray microscopy, UV-VIS spectroscopy and nuclear magnetic resonance (NMR) techniques.
    Type: Application
    Filed: May 22, 2015
    Publication date: November 26, 2015
    Inventors: John DAMIANO, JR., Stephen E. MICK, David P. NACKASHI, Madeline DUKES
  • MICROSCOPY SUPPORT STRUCTURES
    Publication number: 20150179397
    Abstract: Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.
    Type: Application
    Filed: October 28, 2014
    Publication date: June 25, 2015
    Inventors: John DAMIANO, JR., Stephen E. MICK, David P. NACKASHI
  • Specimen mount for microscopy
    Patent number: 9064672
    Abstract: Mounts, stages, and systems that allow for in situ manipulation, experimentation and analysis of specimens directly within an electron microscope. The mounts fixture and interface with a device, wherein the device corresponds to a structure that holds a specimen for microscopic imaging. The mounts are mateably and/or electrically compatible with a stage. Systems using the devices, mounts, and stages that can be used directly within the electron microscope are disclosed.
    Type: Grant
    Filed: December 22, 2008
    Date of Patent: June 23, 2015
    Assignee: PROTOCHIPS, INC.
    Inventors: Stephen E. Mick, John Damiano, David P. Nackashi
  • ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL WITH TWO SEMICONDUCTOR DEVICES
    Publication number: 20150162164
    Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
    Type: Application
    Filed: September 9, 2014
    Publication date: June 11, 2015
    Inventors: John DAMIANO, JR., David P. NACKASHI, Stephen E. MICK
  • Membrane supports with reinforcement features
    Patent number: 9040939
    Abstract: A sample support structure with integrated support features and methods of making and using the reinforced membrane. The sample support structures are useful for supporting samples for analysis using microscopic techniques, such as electron microscopy, optical microscopy, x-ray microscopy, UV-VIS spectroscopy and nuclear magnetic resonance (NMR) techniques.
    Type: Grant
    Filed: February 29, 2008
    Date of Patent: May 26, 2015
    Assignee: PROTOCHIPS, INC.
    Inventors: John Damiano, Jr., Stephen E. Mick, David P. Nackashi
  • SPECIMEN HOLDER USED FOR MOUNTING SAMPLES IN ELECTRON MICROSCOPES
    Publication number: 20150129778
    Abstract: A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
    Type: Application
    Filed: October 14, 2014
    Publication date: May 14, 2015
    Inventors: David P. Nackashi, John Damiano, Jr., Stephen E. Mick, Thomas G. Schmelzer, Michael Zapata, III
  • Sample support structure and methods
    Patent number: 8920723
    Abstract: A sample support structure comprising a sample support manufactured from a semiconductor material and having one or more openings therein. Methods of making and using the sample support structure.
    Type: Grant
    Filed: November 16, 2007
    Date of Patent: December 30, 2014
    Assignee: Protochips, Inc.
    Inventors: John Damiano, Jr., Stephen E. Mick, David P. Nackashi
  • Specimen holder used for mounting samples in electron microscopes
    Patent number: RE48201
    Abstract: A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
    Type: Grant
    Filed: October 12, 2016
    Date of Patent: September 8, 2020
    Assignee: Protochips, Inc.
    Inventors: David P. Nackashi, John Damiano, Stephen E. Mick, Thomas G. Schmelzer, Michael Zapata