Patents by Inventor Stephen R. Porter

Stephen R. Porter has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11714191
    Abstract: Embodiments for a terrain following (TF) radar configured for use in an airborne system are generally described herein. In some embodiments, a radar return comprising dual polarimetry radar data is processed to determine a Correlation Coefficient (CC), a Differential Reflectivity (ZDR), and a Specific Differential Phase (KDP). Discriminator logic is applied to the CC, the ZDR and the KDP to determine whether the radar return comprises solely rain. Further signal processing may be performed on the radar return when the radar return does not comprise solely rain. When the radar signal comprises solely rain, the radar return is tagged as a rain return. Applying the discriminator logic may include applying linear and/or quadratic functions to the CC, the ZDR and the KDP to determine whether the radar return comprises solely rain.
    Type: Grant
    Filed: August 4, 2020
    Date of Patent: August 1, 2023
    Assignee: Raytheon Company
    Inventor: Stephen R. Porter
  • Publication number: 20220043141
    Abstract: Embodiments for a terrain following (TF) radar configured for use in an airborne system are generally described herein. In some embodiments, a radar return comprising dual polarimetry radar data is processed to determine a Correlation Coefficient (CC), a Differential Reflectivity (ZDR), and a Specific Differential Phase (KDP). Discriminator logic is applied to the CC, the ZDR and the KDP to determine whether the radar return comprises solely rain. Further signal processing may be performed on the radar return when the radar return does not comprise solely rain. When the radar signal comprises solely rain, the radar return is tagged as a rain return. Applying the discriminator logic may include applying linear and/or quadratic functions to the CC, the ZDR and the KDP to determine whether the radar return comprises solely rain.
    Type: Application
    Filed: August 4, 2020
    Publication date: February 10, 2022
    Inventor: Stephen R. Porter
  • Publication number: 20220035956
    Abstract: A technique includes an access controller of a programmable logic device providing password protection-based access to a memory of the programmable logic device. The programmable logic device initiates programming of the access controller with a password; and in response to the programmable logic device detecting a predetermined stimulus, the programmable logic device initiates communication of the password to the access controller to unlock access to the memory.
    Type: Application
    Filed: July 30, 2020
    Publication date: February 3, 2022
    Inventors: Stephen R. Porter, Gennadiy Rozenberg, Yendri Karina Gonzalez Rodriguez, Luis Federico Li Chang, Jhovel Louie L. Lopez
  • Patent number: 7746720
    Abstract: Techniques for reducing gate induced drain leakage (GIDL) in memory devices utilizing negative wordline architectures. More specifically, a method and apparatus are provided to determine whether any of the word lines in a section of a memory array are active. If any one of the plurality of word lines is active, each of the inactive word lines in the section are coupled to a negative voltage level. If none of the plurality of word lines is active, each of the plurality of word lines is coupled to ground to reduce GIDL.
    Type: Grant
    Filed: July 17, 2007
    Date of Patent: June 29, 2010
    Assignee: Micron Technology, Inc.
    Inventors: Scott J. Derner, Venkatraghavan Bringivijayaraghavan, Abhay S. Dixit, Scot M. Graham, Stephen R. Porter, Ethan A. Williford
  • Patent number: 7466618
    Abstract: Method and apparatus are provided for regulating an antifuse programming current by lightly doping an electrically connected region so that the resistance of the region responds in a non-linear manner to changes in voltage. In this way a variable resistor or a variably resistive transistor may be created which vary their resistance in response to an applied voltage and which may thereby limit a programming current while not limiting a lesser, reading current to a serially connected antifuse.
    Type: Grant
    Filed: August 31, 2004
    Date of Patent: December 16, 2008
    Assignee: Micron Technology, Inc.
    Inventors: Stephen R. Porter, Scott J. Derner
  • Patent number: 7426148
    Abstract: The disclosed embodiments relate to a method and apparatus for identifying short circuits in an integrated circuit device. The method may comprise the acts of programming a first memory cell associated with a first digit line to a first data value, programming a second memory cell associated with a second digit line to a second data value, the second data value being complementary with respect to the first data value, firing a first sense amplifier associated with the first digit line, firing a second sense amplifier associated with the second digit line after a time delay with respect to the act of firing the first sense amplifier associated with the first digit line, detecting a measured data value associated with the second digit line, and comparing the measured data value to the second data value to determine whether the first digit line is short circuited to the second digit line.
    Type: Grant
    Filed: December 5, 2005
    Date of Patent: September 16, 2008
    Assignee: Micron Technology, Inc.
    Inventor: Stephen R. Porter
  • Patent number: 7336522
    Abstract: A method and apparatus is provided for reducing the current in a memory device. Peripheral device control signals are translated to the wordline off voltage level, such as a negative wordline voltage. The translated signals prevent the peripheral devices from conducting current in the wordline off mode, even if a wordline-to-digitline short should occur. The control signals may include a column select signal for a column select device and an active pull-up signal for a sense amplifier, among others. Additionally, an equalization circuit having high and low resistance components is provided for the memory device. The equalization circuit limits current, even if a wordline-to-digitline short occurs.
    Type: Grant
    Filed: July 19, 2006
    Date of Patent: February 26, 2008
    Assignee: Micron Technology, Inc.
    Inventors: Scott J. Derner, Stephen R. Porter, Scot M. Graham, Ethan A. Williford, Kevin G. Duesman
  • Patent number: 7257043
    Abstract: A memory device includes isolation devices located between-memory cells. A plurality of isolation lines connects the isolation devices to a positive voltage during normal operations but still keeps the isolation devices in the off state to provide isolation between the memory cells. A current control circuit is placed between the isolation lines and a power node for reducing a current flowing between the isolation lines and the power node in case a deflect occurs at any one of isolation devices.
    Type: Grant
    Filed: February 21, 2006
    Date of Patent: August 14, 2007
    Assignee: Micron Technology, Inc.
    Inventors: Luan C. Tran, Stephen R. Porter, Scot M. Graham, Steven E. Howell
  • Patent number: 7245548
    Abstract: Techniques for reducing gate induced drain leakage (GIDL) in memory devices utilizing negative wordline architectures. More specifically, a method and apparatus are provided to determine whether any of the word lines in a section of a memory array are active. If any one of the plurality of word lines is active, each of the inactive word lines in the section are coupled to a negative voltage level. If none of the plurality of word lines is active, each of the plurality of word lines is coupled to ground to reduce GIDL.
    Type: Grant
    Filed: July 27, 2004
    Date of Patent: July 17, 2007
    Assignee: Micron Technology, Inc.
    Inventors: Scott J. Derner, Venkatraghavan Bringivijayaraghavan, Abhay S. Dixit, Scot M. Graham, Stephen R. Porter, Ethan A. Williford
  • Patent number: 7173855
    Abstract: Method and apparatus are disclosed for regulating an antifuse programming current by lightly doping an electrically connected region so that the resistance of the region responds in a non-linear manner to changes in voltage. In this way a variable resistor or a variably resistive transistor may be created which vary their resistance in response to an applied voltage and which may thereby limit a programming current while not limiting a lesser, reading current to a serially connected antifuse.
    Type: Grant
    Filed: August 31, 2004
    Date of Patent: February 6, 2007
    Assignee: Micron Technology, Inc.
    Inventors: Stephen R. Porter, Scott J. Derner
  • Patent number: 7142446
    Abstract: A method and apparatus is provided for reducing the current in a memory device. Peripheral device control signals are translated to the wordline off voltage level, such as a negative wordline voltage. The translated signals prevent the peripheral devices from conducting current in the wordline off mode, even if a wordline-to-digitline short should occur. The control signals may include a column select signal for a column select device and an active pull-up signal for a sense amplifier, among others. Additionally, an equalization circuit having high and low resistance components is provided for the memory device. The equalization circuit limits current, even if a wordline-to-digitline short occurs.
    Type: Grant
    Filed: July 29, 2004
    Date of Patent: November 28, 2006
    Assignee: Micron Technology, Inc.
    Inventors: Scott J. Derner, Stephen R. Porter, Scot M. Graham, Ethan A. Williford, Kevin G. Duesman
  • Patent number: 7091067
    Abstract: Method and apparatus are disclosed for regulating an antifuse programming current by lightly doping an electrically connected region so that the resistance of the region responds in a non-linear manner to changes in voltage. In this way a variable resistor or a variably resistive transistor may be created which vary their resistance in response to an applied voltage and which may thereby limit a programming current while not limiting a lesser, reading current to a serially connected antifuse.
    Type: Grant
    Filed: August 31, 2004
    Date of Patent: August 15, 2006
    Assignee: Micron Technology, Inc.
    Inventors: Stephen R. Porter, Scott J. Derner
  • Patent number: 7033867
    Abstract: The antifuse device comprises an insulating layer positioned in the trench, a conductive member positioned above the insulating layer, at least a portion of the conductive member being positioned within the trench, the conductive member adapted to have at least one programming voltage applied thereto, and at least one doped active region formed in the substrate adjacent the trench. The antifuse further comprises at least one conductive contact coupled to the conductive member, and at least one conductive contact coupled to the doped active region.
    Type: Grant
    Filed: March 4, 2004
    Date of Patent: April 25, 2006
    Assignee: Micron Technology, Inc.
    Inventor: Stephen R. Porter
  • Patent number: 7020039
    Abstract: A memory device includes isolation devices located between memory cells. A plurality of isolation lines connects the isolation devices to a positive voltage during normal operations but still keeps the isolation devices in the off state to provide isolation between the memory cells. A current control circuit is placed between the isolation lines and a power node for reducing a current flowing between the isolation lines and the power node in case a deflect occurs at any one of isolation devices.
    Type: Grant
    Filed: November 29, 2004
    Date of Patent: March 28, 2006
    Assignee: Micron Technology, Inc.
    Inventors: Luan C. Tran, Stephen R. Porter, Scot M. Graham, Steven E. Howell
  • Patent number: 6992939
    Abstract: The disclosed embodiments relate to a method and apparatus for identifying short circuits in an integrated circuit device. The method may comprise the acts of programming a first memory cell associated with a first digit line to a first data value, programming a second memory cell associated with a second digit line to a second data value, the second data value being complementary with respect to the first data value, firing a first sense amplifier associated with the first digit line, firing a second sense amplifier associated with the second digit line after a time delay with respect to the act of firing the first sense amplifier associated with the first digit line, detecting a measured data value associated with the second digit line, and comparing the measured data value to the second data value to determine whether the first digit line is short circuited to the second digit line.
    Type: Grant
    Filed: January 26, 2004
    Date of Patent: January 31, 2006
    Assignee: Micron Technology, Inc.
    Inventor: Stephen R. Porter
  • Patent number: 6859408
    Abstract: Method and apparatus for regulating an antifuse programming current by lightly doping an electrically connected region so that the resistance of the region responds in a non-linear manner to changes in voltage. In this way a variable resistor or a variably resistive transistor may be created which vary their resistance in response to an applied voltage and which may thereby limit a programming current while not limiting a lesser, reading current to a serially connected antifuse.
    Type: Grant
    Filed: August 29, 2002
    Date of Patent: February 22, 2005
    Assignee: Micron Technology, Inc.
    Inventors: Stephen R. Porter, Scott J. Derner
  • Patent number: 6834019
    Abstract: A memory device includes isolation devices located between memory cells. A plurality of isolation lines connects the isolation devices to a positive voltage during normal operations but still keeps the isolation devices in the off state to provide isolation between the memory cells. A current control circuit is placed between the isolation lines and a power node for reducing a current flowing between the isolation lines and the power node in case a deflect occurs at any one of isolation devices.
    Type: Grant
    Filed: August 29, 2002
    Date of Patent: December 21, 2004
    Assignee: Micron Technology, Inc.
    Inventors: Luan C. Tran, Stephen R. Porter, Scot M. Graham, Steven E. Howell
  • Patent number: 6816425
    Abstract: A balanced sense amplifier control for open digit line architecture memory devices. Firing of the sense amplifiers on each side of a section of a memory device is controlled by a two stage NAND gate logic circuit that utilizes a tree routing scheme. By gating the global signal with a section signal through the two stage NAND gate logic circuit, the sense amplifiers on each side of a section can be fired simultaneously.
    Type: Grant
    Filed: February 11, 2004
    Date of Patent: November 9, 2004
    Assignee: Micron Technology, Inc.
    Inventors: Scot M. Graham, Scott J. Derner, Stephen R. Porter
  • Patent number: 6787400
    Abstract: An electrostatic discharge protection device is formed in a substrate and contains a drain area of a first dopant concentration abutting an extended drain area having a dopant concentration lower than the first dopant concentration. Similarly, a highly doped source area abuts a lower doped source extension area. The source and drain are laterally bounded by oxide regions and covered by an insulation layer. The areas of lower doping prevent charge crowding during an electrostatic discharge event by resistively forcing current though the nearly planer bottom surface of the drain, rather than the curved drain extension. In addition, a highly doped buried layer can abut an area of a graded doping level. By adjusting the doping levels of the graded areas and the buried layers, the substrate breakdown voltage is pre-selected.
    Type: Grant
    Filed: January 16, 2003
    Date of Patent: September 7, 2004
    Assignee: Micron Technology, Inc.
    Inventors: Stephen R. Porter, Manny K. Ma, Stephen Casper, Kevin Duesman
  • Publication number: 20040169254
    Abstract: The antifuse device comprises an insulating layer positioned in the trench, a conductive member positioned above the insulating layer, at least a portion of the conductive member being positioned within the trench, the conductive member adapted to have at least one programming voltage applied thereto, and at least one doped active region formed in the substrate adjacent the trench. The antifuse further comprises at least one conductive contact coupled to the conductive member, and at least one conductive contact coupled to the doped active region.
    Type: Application
    Filed: March 4, 2004
    Publication date: September 2, 2004
    Applicant: Micron Technology, Inc.
    Inventor: Stephen R. Porter