Patents by Inventor Steven C. Steps
Steven C. Steps has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Publication number: 20180080981Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: ApplicationFiled: November 27, 2017Publication date: March 22, 2018Applicant: AEHR TEST SYSTEMSInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
-
Patent number: 9857418Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: GrantFiled: October 13, 2016Date of Patent: January 2, 2018Assignee: Aehr Test SystemsInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
-
Publication number: 20170200660Abstract: A tester apparatus is provided. Slot assemblies are removably mounted to a frame. Each slot assembly allows for individual heating and temperature control of a respective cartridge that is inserted into the slot assembly. A closed loop air path is defined by the frame and a heater and cooler are located in the closed loop air path to cool or heat the cartridge with air. Individual cartridges can be inserted or be removed while other cartridges are in various stages of being tested or in various stages of temperature ramps.Type: ApplicationFiled: January 6, 2017Publication date: July 13, 2017Applicant: Aehr Test SystemsInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps
-
Publication number: 20170030965Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: ApplicationFiled: October 13, 2016Publication date: February 2, 2017Applicant: Aehr Test SystemsInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
-
Patent number: 9500702Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: GrantFiled: February 3, 2016Date of Patent: November 22, 2016Assignee: Aehr Test SystemsInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
-
Publication number: 20160154053Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: ApplicationFiled: February 3, 2016Publication date: June 2, 2016Applicant: Aehr Test SystemsInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
-
Patent number: 9291668Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: GrantFiled: June 16, 2015Date of Patent: March 22, 2016Assignee: Aehr Test SystemsInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, Alberto Calderon
-
Publication number: 20150285856Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: ApplicationFiled: June 16, 2015Publication date: October 8, 2015Applicant: Aehr Test SystemsInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, Alberto Calderon
-
Patent number: 9086449Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: GrantFiled: May 17, 2012Date of Patent: July 21, 2015Assignee: Aehr Test SystemsInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
-
Publication number: 20120223729Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: ApplicationFiled: May 17, 2012Publication date: September 6, 2012Applicant: Aehr Test SystemsInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
-
Patent number: 8198909Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: GrantFiled: February 8, 2011Date of Patent: June 12, 2012Assignee: AEHR Test SystemsInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
-
Publication number: 20110156745Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: ApplicationFiled: February 8, 2011Publication date: June 30, 2011Applicant: Aehr Test SystemsInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
-
Patent number: 7902846Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: GrantFiled: January 7, 2010Date of Patent: March 8, 2011Assignee: Aehr Test SystemsInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
-
Publication number: 20100109696Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: ApplicationFiled: January 7, 2010Publication date: May 6, 2010Applicant: Aehr Test SystemsInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
-
Patent number: 7667475Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: GrantFiled: April 4, 2008Date of Patent: February 23, 2010Assignee: AEHR Test SystemsInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
-
Publication number: 20090015282Abstract: The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.Type: ApplicationFiled: April 4, 2008Publication date: January 15, 2009Applicant: Aehr Test SystemsInventors: Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon
-
Patent number: 4858111Abstract: A computer system in which only the cache memory is permitted to communicate with main memory and the same address being used in the cache is also sent at the same time to the main memory. Thus, as soon as it is discovered that the desired main memory address is not presently in the cache, the main memory RAMs can be read to the cache without being delayed by the main memory address set up time. In addition, since the main memory is not accessable other than from the cache memory, there is also no main memory access delay caused by requests from other system modules such as the I/O controller. Likewise, since the contents of the cache memory is written into a temporary register before being sent to the main memory, a main memory read can be performed before doing a writeback of the cache to the main memory, so that data can be back to the cache in approximately the same amount of time required for a normal main memory access.Type: GrantFiled: October 20, 1986Date of Patent: August 15, 1989Assignee: Hewlett-Packard CompanyInventor: Steven C. Steps
-
Patent number: 4724518Abstract: Provided is a cache memory architecture which is two blocks wide and is made up of a map RAM, two cache data RAMs (each one word wide), and a selection system for selecting data from either one or both cache data RAMs, depending on whether the access is between cache and CPU, or between cache and main memory. The data stored in the two cache data RAMs has a particular address configuration. It consists of having data with even addresses of even pages and odd addresses of odd pages stored in one cache data RAM, with odd addresses and even addresses interleaved therein; and odd addresses of even pages and even addresses of odd pages stored in the other cache data RAM, with the odd addresses and even addresses interleaved but inverted relative to the other cache data RAM.Type: GrantFiled: June 16, 1987Date of Patent: February 9, 1988Assignee: Hewlett-Packard CompanyInventor: Steven C. Steps
-
Patent number: 4654787Abstract: The individual RAMs comprising the memory space of a computer may be of various sizes and are automatically located within a memory space during initialization and address enable information is stored in ID-RAMs on each RAM card. Shift registers on the RAM cards are connected in series and an ID bit is serially clocked through the shift registers during initialization. At each clock pulse the contents of the shift registers are written to the ID-RAMs of each RAM card. The presence of an ID bit at a specific memory location in an ID-RAM on a RAM card indicates that card is to be enabled when the memory location address is accessed; the location of the ID bit within the memory location indicates the particular RAM on the RAM card to be accessed. A detector monitors a transfer of the ID bit between adjacent shift registers so that card memory boundaries, and RAM size, may be known.Type: GrantFiled: July 29, 1983Date of Patent: March 31, 1987Assignee: Hewlett-Packard CompanyInventors: James S. Finnell, Steven C. Steps