Patents by Inventor Steven J. Kommrusch
Steven J. Kommrusch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11936382Abstract: An output clock frequency of an adaptive oscillator circuit changes in response to noise on an integrated circuit power supply line. The circuit features two identical delay lines which are separately connected to a regulated supply and a droopy supply. In response to noise on the droopy supply, the delay lines cause a change in the output clock frequency. The adaptive oscillator circuit slows down the output clock frequency when the droopy supply droops or falls below the regulated supply. The adaptive oscillator circuit clamps the output clock frequency at a level determined by the regulated supply when the droopy supply overshoots or swings above the regulated supply.Type: GrantFiled: June 27, 2019Date of Patent: March 19, 2024Assignees: Advanced Micro Devices, Inc., ATI TECHNOLOGIES ULCInventors: Joyce Cheuk Wai Wong, Dragoljub Ignjatovic, Mikhail Rodionov, Ljubisa Bajic, Stephen V. Kosonocky, Steven J. Kommrusch
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Publication number: 20190319609Abstract: An output clock frequency of an adaptive oscillator circuit changes in response to noise on an integrated circuit power supply line. The circuit features two identical delay lines which are separately connected to a regulated supply and a droopy supply. In response to noise on the droopy supply, the delay lines cause a change in the output clock frequency. The adaptive oscillator circuit slows down the output clock frequency when the droopy supply droops or falls below the regulated supply. The adaptive oscillator circuit clamps the output clock frequency at a level determined by the regulated supply when the droopy supply overshoots or swings above the regulated supply.Type: ApplicationFiled: June 27, 2019Publication date: October 17, 2019Inventors: Joyce Cheuk Wai WONG, Dragoljub IGNJATOVIC, Mikhail RODIONOV, Ljubisa BAJIC, Stephen V. KOSONOCKY, Steven J. KOMMRUSCH
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Patent number: 10382014Abstract: An output clock frequency of an adaptive oscillator circuit changes in response to noise on an integrated circuit power supply line. The circuit features two identical delay lines which are separately connected to a regulated supply and a droopy supply. In response to noise on the droopy supply, the delay lines cause a change in the output clock frequency. The adaptive oscillator circuit slows down the output clock frequency when the droopy supply droops or falls below the regulated supply. The adaptive oscillator circuit clamps the output clock frequency at a level determined by the regulated supply when the droopy supply overshoots or swings above the regulated supply.Type: GrantFiled: December 23, 2016Date of Patent: August 13, 2019Assignees: ATI Technologies ULC, Advanced Micro Devices, Inc.Inventors: Joyce Cheuk Wai Wong, Dragoljub Ignjatovic, Mikhail Rodionov, Ljubisa Bajic, Stephen V. Kosonocky, Steven J. Kommrusch
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Publication number: 20180183413Abstract: An output clock frequency of an adaptive oscillator circuit changes in response to noise on an integrated circuit power supply line. The circuit features two identical delay lines which are separately connected to a regulated supply and a droopy supply. In response to noise on the droopy supply, the delay lines cause a change in the output clock frequency. The adaptive oscillator circuit slows down the output clock frequency when the droopy supply droops or falls below the regulated supply. The adaptive oscillator circuit clamps the output clock frequency at a level determined by the regulated supply when the droopy supply overshoots or swings above the regulated supply.Type: ApplicationFiled: December 23, 2016Publication date: June 28, 2018Inventors: Joyce Cheuk Wai Wong, Dragoljub Ignjatovic, Mikhail Rodionov, Ljubisa Bajic, Stephen V. Kosonocky, Steven J. Kommrusch
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Patent number: 9621143Abstract: Techniques are disclosed relating to detecting and minimizing timing problems created by clock domain crossing (CDC) in integrated circuits. In various embodiments, one or more timing parameters are associated with a path that crosses between clock domains in an integrated circuit, where the one or more timing parameters specify a propagation delay for the path. In one embodiment, the timing parameters may be distributed to different design stages using a configuration file. In some embodiments, the one or more parameters may be used in conjunction with an RTL model to simulate propagation of a data signal along the path. In some embodiments, the one or more parameters may be used in conjunction with a netlist to create a physical design for the integrated circuit, where the physical design includes a representation of the path that has the specified propagation delay.Type: GrantFiled: November 8, 2013Date of Patent: April 11, 2017Assignee: Advanced Micro Devices, Inc.Inventors: Michael J. Osborn, Michael J. Tresidder, Aaron J. Grenat, Joseph Kidd, Priyank Parakh, Steven J. Kommrusch
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Patent number: 9043628Abstract: We report methods, integrated circuit devices, and fabrication processes relating to power management transitions of multiple compute units sharing a cache. One method includes indicating that a first compute unit of a plurality of compute units of an integrated circuit device is attempting to enter a low power state, determining if the first compute unit is the only compute unit of the plurality in a normal power state, and in response to determining the first compute unit is the only compute unit in the normal power state: saving a state of a shared cache unit of the integrated circuit device, flushing at least a portion of a cache of the shared cache unit, repeating the flushing until either a second compute unit exits the low power state or the cache is completely flushed, and permitting the first compute unit to enter the low power state.Type: GrantFiled: August 24, 2012Date of Patent: May 26, 2015Assignee: Advanced Micro Devices, Inc.Inventors: Paul Kitchin, William L. Walker, Steven J. Kommrusch
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Patent number: 9037911Abstract: Embodiments include methods for performing various operations in a computing system that includes an electronic module and a debug circuit. The method includes programming the debug circuit to monitor for pre-selected triggers produced by the computing system, and to perform actions in response to detecting the pre-select triggers. For example, in response to various pre-selected triggers, the debug circuit may, among other things: perform state transitions and log information indicating whether or not the state transitions were performed; monitor various signals when the debug circuit has determined that a test escape has occurred; and/or perform one or more actions that initiate stopping one or more clocks in response to certain pre-selected triggers.Type: GrantFiled: April 27, 2011Date of Patent: May 19, 2015Assignee: ADVANCED MICRO DEVICES, INC.Inventors: Eric M. Rentschler, Steven J. Kommrusch, Scott Nixon
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Patent number: 8884663Abstract: Methods, apparatus, and fabrication techniques relating to management of noise arising from capacitance in a clock tree of an integrated circuit. In some embodiments, the methods comprise receiving a signal to adjust a clock having a first rate to a second rate; and ramping, in response to receiving the signal, the clock from the first rate to the second rate, wherein the ramping comprises changing the frequency of the clock to at least one third rate between the first and second rates.Type: GrantFiled: February 25, 2013Date of Patent: November 11, 2014Assignee: Advanced Micro Devices, Inc.Inventors: Steven J. Kommrusch, Zihno Jusufovic
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Patent number: 8884668Abstract: Methods, apparatus, and fabrication techniques relating to improved propagation of fuse data through an integrated circuit device during scan shift reset. In some embodiments, the methods comprise loading a first value of at least one fuse bit to an integrated circuit device, during a time period when a clock signal having a first frequency is provided to at least one component of the integrated circuit device; disabling a scan shift after the loading of the first value; inactivating the clock signal after the loading of the first value; propagating the first value of the at least one fuse bit to the at least one component of the integrated circuit device; and reactivating the clock signal after the propagation of the first value.Type: GrantFiled: April 4, 2013Date of Patent: November 11, 2014Assignee: Advanced Micro Devices, Inc.Inventors: Steven J. Kommrusch, Bill K. C. Kwan
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Publication number: 20140310541Abstract: We report methods, integrated circuit devices, and fabrication processes relating to power management transitions of multiple compute units sharing a resource. One method include, in response to an indication that a first compute unit of a plurality of compute units is attempting to enter a normal power state and in response to no other compute units being in a low power state, causing a resource to enter the normal power state, wherein the plurality of compute units share the resource; and causing the first compute unit to enter the normal power state.Type: ApplicationFiled: April 15, 2013Publication date: October 16, 2014Applicant: Advanced Micro Devices, Inc.Inventor: Steven J. Kommrusch
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Publication number: 20140300395Abstract: Methods, apparatus, and fabrication techniques relating to improved propagation of fuse data through an integrated circuit device during scan shift reset. In some embodiments, the methods comprise loading a first value of at least one fuse bit to an integrated circuit device, during a time period when a clock signal having a first frequency is provided to at least one component of the integrated circuit device; disabling a scan shift after the loading of the first value; inactivating the clock signal after the loading of the first value; propagating the first value of the at least one fuse bit to the at least one component of the integrated circuit device; and reactivating the clock signal after the propagation of the first value.Type: ApplicationFiled: April 4, 2013Publication date: October 9, 2014Applicant: ADVANCED MICRO DEVICES, INC.Inventors: Steven J. Kommrusch, Bill K.C. Kwan
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Publication number: 20140240009Abstract: Methods, apparatus, and fabrication techniques relating to management of noise arising from capacitance in a clock tree of an integrated circuit. In some embodiments, the methods comprise receiving a signal to adjust a clock having a first rate to a second rate; and ramping, in response to receiving the signal, the clock from the first rate to the second rate, wherein the ramping comprises changing the frequency of the clock to at least one third rate between the first and second rates.Type: ApplicationFiled: February 25, 2013Publication date: August 28, 2014Applicant: ADVANCED MICRO DEVICES, INC.Inventors: Steven J. Kommrusch, Zihno Jusufovic
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Publication number: 20140201542Abstract: Methods, apparatus, and fabrication relating to adaptive performance optimization of a plurality of components in view of power consumption and demand, component activity, and thermal events. A method may comprise allocating a first power budget to a first component of an apparatus, wherein the first power budget is less than a maximum power required by the first component; applying at least a portion of a borrowable power budget, wherein the borrowable power budget equals the maximum power required by the first component minus the first power budget, to a second component of the apparatus; and increasing the first power budget of the first component, in response to a first number or more of thermal events occurring in a first time period.Type: ApplicationFiled: January 17, 2013Publication date: July 17, 2014Applicant: ADVANCED MICRO DEVICES, INC.Inventors: Steven J. Kommrusch, Alexander J. Branover, Marvin A. Denman
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Patent number: 8683265Abstract: An embodiment of an electronic system includes a first electronic module, a second electronic module, a first debug circuit integrated with the first electronic module, a second debug circuit integrated with the second electronic module, and a communications interface between the first debug circuit and the second debug circuit. The first debug circuit is configured to determine that a triggering event has occurred, and to produce a first cross trigger signal on the communications interface in response to determining that the triggering event has occurred. The second debug circuit is configured to detect the first cross trigger signal on the communications interface, and to perform an action in response to detecting the first cross trigger signal.Type: GrantFiled: December 29, 2010Date of Patent: March 25, 2014Assignee: Advanced Micro Devices, Inc.Inventors: Eric M. Rentschler, Steven J. Kommrusch, Elizabeth M. Cooper, Stephen Ennis
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Publication number: 20140062555Abstract: Techniques are disclosed relating to detecting and minimizing timing problems created by clock domain crossing (CDC) in integrated circuits. In various embodiments, one or more timing parameters are associated with a path that crosses between clock domains in an integrated circuit, where the one or more timing parameters specify a propagation delay for the path. In one embodiment, the timing parameters may be distributed to different design stages using a configuration file. In some embodiments, the one or more parameters may be used in conjunction with an RTL model to simulate propagation of a data signal along the path. In some embodiments, the one or more parameters may be used in conjunction with a netlist to create a physical design for the integrated circuit, where the physical design includes a representation of the path that has the specified propagation delay.Type: ApplicationFiled: November 8, 2013Publication date: March 6, 2014Applicant: Advanced Micro Devices, Inc.Inventors: Michael J. Osborn, Michael J. Tresidder, Aaron J. Grenat, Joseph Kidd, Priyank Parakh, Steven J. Kommrusch
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Publication number: 20140059371Abstract: We report methods, integrated circuit devices, and fabrication processes relating to power management transitions of multiple compute units sharing a cache. One method includes indicating that a first compute unit of a plurality of compute units of an integrated circuit device is attempting to enter a low power state, determining if the first compute unit is the only compute unit of the plurality in a normal power state, and in response to determining the first compute unit is the only compute unit in the normal power state: saving a state of a shared cache unit of the integrated circuit device, flushing at least a portion of a cache of the shared cache unit, repeating the flushing until either a second compute unit exits the low power state or the cache is completely flushed, and permitting the first compute unit to enter the low power state.Type: ApplicationFiled: August 24, 2012Publication date: February 27, 2014Inventors: Paul Kitchin, William L. Walker, Steven J. Kommrusch
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Patent number: 8584067Abstract: Techniques are disclosed relating to detecting and minimizing timing problems created by clock domain crossing (CDC) in integrated circuits. In various embodiments, one or more timing parameters are associated with a path that crosses between clock domains in an integrated circuit, where the one or more timing parameters specify a propagation delay for the path. In one embodiment, the timing parameters may be distributed to different design stages using a configuration file. In some embodiments, the one or more parameters may be used in conjunction with an RTL model to simulate propagation of a data signal along the path. In some embodiments, the one or more parameters may be used in conjunction with a netlist to create a physical design for the integrated circuit, where the physical design includes a representation of the path that has the specified propagation delay.Type: GrantFiled: November 2, 2010Date of Patent: November 12, 2013Assignee: Advanced Micro Devices, Inc.Inventors: Michael J. Osborn, Michael J. Tresidder, Aaron J. Grenat, Joseph Kidd, Priyank Parakh, Steven J. Kommrusch
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Patent number: 8575972Abstract: A first plurality of clock signals including a first clock signal and a second clock signal is received, the first and second clock signal out of phase with each other. A second plurality of clock signals comprising a third clock signal and a fourth clock signal is received, the third and fourth clock signals out of phase with each other. A plurality of enable signals are received. A fifth clock signal is determined based on the first plurality of clock signals and the plurality of enable signals. A sixth clock signal is determined based on the second plurality of clock signals and the plurality of enable signals. A seventh clock signal is determined based on the fifth clock signal and the sixth clock signal.Type: GrantFiled: March 23, 2009Date of Patent: November 5, 2013Assignee: Advanced Micro Devices, Inc.Inventors: Richard W. Reeves, Spencer M. Gold, Steven J. Kommrusch, Anwar P. Kashem
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Patent number: 8566645Abstract: A processor or an integrated circuit chip including a debug state machine (DSM) that allows for programming complex triggering sequences for flexible and efficient debug visibility is disclosed. The DSM centralizes control of local debug functions such as trace start and stop, trace filtering, cross triggering between DSMs, clock stopping, triggering a system debug mode interrupt, flexible microcode interface, and the like. The DSM is configured to receive triggers from a processor core, other DSMs, a northbridge, other sockets, and the like and initiate a programmed action on a condition that a corresponding trigger or a sequence of triggers occurs.Type: GrantFiled: December 2, 2010Date of Patent: October 22, 2013Assignee: Advanced Micro Devices, Inc.Inventors: Eric Rentschler, Steven J. Kommrusch, Scott P. Nixon
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Publication number: 20120146658Abstract: An embodiment of an electronic system includes a first electronic module, a second electronic module, a first debug circuit integrated with the first electronic module, a second debug circuit integrated with the second electronic module, and a communications interface between the first debug circuit and the second debug circuit. The first debug circuit is configured to determine that a triggering event has occurred, and to produce a first cross trigger signal on the communications interface in response to determining that the triggering event has occurred. The second debug circuit is configured to detect the first cross trigger signal on the communications interface, and to perform an action in response to detecting the first cross trigger signal.Type: ApplicationFiled: December 29, 2010Publication date: June 14, 2012Applicant: ADVANCED MICRO DEVICES, INC.Inventors: Eric M. Rentschler, Steven J. Kommrusch, Elizabeth M. Cooper, Stephen Ennis