Abstract: An exemplary system, method, and computer-accessible medium may be provided, which may include, for example, receiving a design a memory including a plurality MBIST logic paths and a plurality of non-MBIST logic paths, determining particular non-MBIST logic path(s) of the non-MBIST logic paths to deactivate, and deactivating only the particular non-MBIST logic path(s). The particular non-MBIST logic path(s) may be deactivated using a clock signal. A simulation on the memory may be performed while the particular non-MBIST logic path(s) may be deactivated. The particular non-MBIST logic path(s) may be reactivated after the simulation has been performed. The deactivating the particular non-MBIST logic path(s) may include forcing all flip flops in the particular non-MBIST logic path(s) to a known state.

Abstract: Systems and methods disclosed herein provide for efficiently testing memories during mission mode self-test (“MMST”) without destroying any original functional data. Embodiments provide for a converter to feed a manipulated version of the original functional data back into the tested memories. Embodiments further provide an accumulator to count the occurrences of correctable and uncorrectable errors associated with the tested memories.

Abstract: Systems and methods disclosed herein provide for improved testing of memory error correction code (“ECC”) logic with memory built-in self-test (“MBIST”). Embodiments provide for a masking element to inject one or more faults into the ECC logic during at least one of a manufacturing test (“MFGT”) and a power-on-self-test (“POST”), wherein, based on the injected faults, it can be determined if the ECC logic contains any errors.

Abstract: A method for identifying a physical memory(ies) associated with a logical memory(ies) in a memory design can include (a) receiving a generic netlist for the memory design, (b) generating a test mode for the memory using the generic netlist, (c) determining the logical memory(ies); (d) performing a simulation on the test mode for the logical memory(ies); and (e) identifying the physical memory(ies) by tracing chip selects for the physical memory(ies) to the logical memory(ies). The identifying the physical memory(ies) may further include identifying which chip selects are active. The identifying the physical memory(ies) can further include tracing an address and a data pin(s) for the logical memory(ies) in the simulation. The identifying the physical memory(ies) can further include determining an address and a data pin(s) for the logical memory(ies) in the simulation.

Abstract: Systems and methods disclosed herein provide for improved diagnostics for memory built-in self-test (“MBIST”). Embodiments provide for a sequence iterator unit including a diagnostics analysis unit that monitors and reports on the failing read count associated with the tested memory. Embodiments further provide for a bit fail map report that is generated based on the failing read count.

Abstract: Embodiments relate generally to a scalable, modularized mechanism which allows for storing programmable data streams on chip and provides repeatable on-demand issuances of data streams to one or more targeted instruments. In some embodiments, multiple data streams are grouped into data stream schedules to perform a series of programmable operations on demand. In these and other embodiments, data stream schedules can be reused and further grouped into data stream plans that can be executed in any order upon request or are hard-coded in a specific order.

Abstract: An exemplary fuse control arrangement can be provided, which can include, for example, a fuse control unit(s), which includes a test access method interface(s) and a programmable memory(ies), wherein the fuse control unit(s) is configured to provide fuse information to repair a memory(ies). The fuse control unit(s) can be coupled to the memory(ies) and the memory(ies) can be coupled to a register repair unit(s). The fuse control unit(s) can provide the register repair unit(s) with the fuse information to repair the memory(ies).

Abstract: Systems and methods disclosed herein provide for improved diagnostics for memory built-in self-test (“MBIST”). Embodiments provide for a two-pass diagnostic test of the target memory, wherein, in the first pass, a data compare unit provides clock cycle values associated with detected mis-compares to a tester, and, in the second pass, the data compare unit extracts data vectors associated with the clock cycle values. Embodiments further provide for a bit fail map report that is generated based on the extracted data vectors.

Abstract: An exemplary system, method, and computer-accessible medium for modifying a memory unit(s) may be provided, which may include, for example, determining a location of a first memory built-in self-test (MBIST) logic(s) in the memory unit(s), removing the first MBIST logic(s) from the memory unit(s), and inserting a second MBIST logic(s) into the memory unit(s) at the location. The second MBIST logic(s) may be based on the first MBIST logic(s). The second MBIST logic(s) may be generated, which may be performed by modifying the first MBIST logic(s). The first MBIST logic(s) may be modified based on a modification(s) to a register transfer level (RTL) list associated with the memory unit(s). A pattern control file or a Test Data Register mapping file may be modified based on the modification to the first MBIST logic(s).

Abstract: Computer system for programmable built-in self-test (PMBIST) insertion into system-on-chip designs comprising one or more memories, including at least one processor and computer-executable instructions that cause the system to determine a PMBIST configuration based on one or more test configuration files; generate one or more package files based on the PMBIST configuration; insert PMBIST hardware into the SoC design based on the package files and characteristics of the memories; suspend PMBIST hardware insertion after an event related to the package files; and resume PMBIST hardware insertion after receiving one or more updated package files. In some embodiments, the package files are independent of vendor-specific memory models. In some embodiments, the package files comprise a plurality of data structures. Exemplary methods and computer-readable media can also be provided embodying one or more procedures the system is configured to perform.

Abstract: An exemplary bitmap file can be provided, which can include, for example, a map of a cell array structure of a memory(ies), a plurality of memory values superimposed on the cell array structure based on a simulated testing of the memory(ies). The memory values may be values being written to the memory(ies) while the memory(ies) is being tested. The memory values may be values in a test pattern(s) being used to test the memory(ies). Each cell in the cell array structure can have a particular memory value superimposed thereon. A cell(s) in the cell array structure may be highlighted, which may correspond to an incorrect memory value.

Abstract: An exemplary memory arrangement can be provided, which can include, for example, a memory(ies), and an algorithmic memory unit(s) (AMU) coupled to the memory(ies), wherein the AMU includes a programmed testplan algorithm(s) configured to test the memory(ies). The AMU(s) can further include a hardwired testplan(s) configured to test the memory(ies). A Joint Test Action Group (“JTAG”) controller may be coupled to the AMU(s), which can be configured to access logic of the programmed testplan algorithm(s). A direct access controller (DAC) can be coupled to the AMU(s), which can be configured to access internal nodes in the AMU(s). The DAC can be configured to activate the programmed testplan algorithm(s) using a minimally direct access pin interface in the AMU(s).

Abstract: Electronic design automation (EDA) systems, methods, and computer readable media are presented for adding design for test (DFT) logic at register transfer level (RTL) into an integrated circuit (IC) design at RTL. In some embodiments, the DFT logic at RTL includes a port that connects to a hierarchical reference with a hierarchical path in the tree structure hierarchy to a part of the IC design at RTL. Such DFT modification helps to decrease the number of new ports added at this stage, and as a result assists subsequent debugging and back-annotation of RTL.

Abstract: In one aspect, electronic design automation systems, methods, and non-transitory computer readable media are presented for adding a memory built-in self-test (MBIST) logic at register transfer level (RTL) or at netlist level into an integrated circuit (IC) design. In some embodiments, the MBIST logic is coupled to a physical memory module via a logical boundary of an intermediate level module that contains the physical memory module. The MBIST logic helps to keep intact integrity of the intermediate level module, making it more likely to meet any specified performance of the intermediate level module and reduce area overhead.

Abstract: A system and method automatically determines the physical memories inside a core or macro and their association with logical memories and their enabling signals. An integrated circuit (IC) source file that describes an integrated circuit in a hardware description language is received. The IC source file includes macros corresponding to memory. For each macro, a physical description file corresponding to the macro is generated. The description includes how the macro corresponds to the physical memory, associations of physical memories with the logical memory, enabling conditions, and data needed to test the memory.

Abstract: Method and apparatus for testing the memory components of an integrated Circuit (IC) using a routing logic and a built-in design for test (DFT) hardware processing device. Based on input provided from an interface controller to the IC, the IC is tested according to one of at least two modes. In a first mode, the built-in DFT hardware processing device executes a test that checks for faults in the physical memory of the IC. In a second mode, the built-in DFT hardware processing device executes a test that checks for faults in the error correction logic of the IC. By using the same routing logic and built-in DFT hardware processing device, tests of the memory components according to the first and second mode can be executed on an automatic and serial basis, even after the manufacture of the IC.

Abstract: Aspects of the present disclosure involve insertion of power domain aware memory testing logic into integrated circuit designs to enable efficient testing of the memories embedded therein. In example embodiments, each power domain of the integrated circuit, and the memories included therein, are associated with dedicated test data register (TDR) set and instruction set. Each instruction set causes memory test logic circuitry in the integrated circuit to test the memories included in the corresponding power domain in parallel. Once testing of memories within a particular power domain is over, the test circuitry tests memories belonging to another power domain in parallel, and so on.

Abstract: Embodiments provide methods, systems, devices, and/or machine readable storage medium for memory built-in self testing (memory BIST) that may not require JTAG. Embodiments may provide less chip overhead through the use of one or more direct access pins. Embodiments may provide simple checks to determine if the memories on a chip are good or bad with minimal cost, for example. In some cases, the memory BIST may determine whether or not memories are good when the chip powers on. Some embodiments may also perform stress testing on the memories to force early life failures of the memories. Embodiments do not necessarily have to diagnose failures.

Abstract: A coherency controller for configurable caches. A base microprocessor design accommodates system configurations both with and without L2 cache tag and data arrays installed. Second level cache control logic exists within the microprocessor chip, and when the external second level cache tag and data arrays are removed their inputs to the microprocessor are tied to an inactive state. A configuration switch is set in the second level cache controller that causes snoop requests from a system bus to get reflected onto a first level cache snooping path. The first level cache status is then fed back to the second level cache controller, in a manner consistent with the timing required for support of a second level cache search, and fed into the second level cache status signal generation logic, effectively making the second level cache controller believe that the second level cache still exists for snooping.

Abstract: A storage subsystem for use in a data processing system having real and extended storage, a vector processor and a store-in cache buffer. Transfers between real and extended storage are performed with a store buffer external to the cache, but comparable in size to the line size of the cache directly associated with the real storage. Hard data errors in the cache are corrected with hardware invert-retry mechanism which operates in response to a machine check and does the correction as a part of the instruction retry. Vector processor storage operations bypass the cache and transfer data directly from storage to the vector processor.