Patents by Inventor Stuart L Friedman

Stuart L Friedman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10473694
    Abstract: A system for atomic force microscopy in which a sharp electrode tip of an flexing probe cantilever is positioned closely adjacent a sample being probed for its electrical characteristics. An optical beam irradiates a portion of the sample surrounding the probe tips and is modulated at a radio or lower modulation frequency. In one embodiment, a reference microwave signal is incident to the electrode tip. Microwave circuitry receives a microwave signal from the probe tip, which may be the reflection of the incident signal. Electronic circuitry processes the received signal with reference to the modulation frequency to produce one or more demodulated signals indicative of the electronic or atomic properties of the sample. Alternatively, the optical beam is pulsed and the demodulated signal is analyzed for its temporal characteristics. The beam may non-linearly produce the microwave signal. Two source lasers may have optical frequencies differing by the microwave frequency.
    Type: Grant
    Filed: April 12, 2019
    Date of Patent: November 12, 2019
    Assignee: Primenano, Inc.
    Inventors: Stuart L. Friedman, Michael M. Kelly
  • Publication number: 20190310180
    Abstract: In some aspects, a flow cytometer system is provided that includes beam shaping optics positioned to manipulate a light beam and produce a resulting light beam that irradiates the core stream at the interrogation zone of the flow cell. The beam shaping optics include an acylindrical lens positioned to receive and focus light in a direction of a first axis orthogonal to a direction of light travel, and a cylindrical lens positioned to receive the light output from the acylindrical lens and to focus the light output from the acylindrical lens in a direction of a second axis orthogonal to the first axis and to the direction of light travel. The resulting light beam output has a flat-top shaped intensity profile along the first axis, and a Gaussian-shaped intensity profile along the second axis. Related methods of shaping a light beam at an interrogation zone of a flow cell are also provided.
    Type: Application
    Filed: March 25, 2019
    Publication date: October 10, 2019
    Inventors: John F. Heanue, Stuart L. Friedman
  • Publication number: 20190234993
    Abstract: A system for atomic force microscopy in which a sharp electrode tip of an flexing probe cantilever is positioned closely adjacent a sample being probed for its electrical characteristics. An optical beam irradiates a portion of the sample surrounding the probe tips and is modulated at a radio or lower modulation frequency. In one embodiment, a reference microwave signal is incident to the electrode tip. Microwave circuitry receives a microwave signal from the probe tip, which may be the reflection of the incident signal. Electronic circuitry processes the received signal with reference to the modulation frequency to produce one or more demodulated signals indicative of the electronic or atomic properties of the sample. Alternatively, the optical beam is pulsed and the demodulated signal is analyzed for its temporal characteristics. The beam may non-linearly produce the microwave signal. Two source lasers may have optical frequencies differing by the microwave frequency.
    Type: Application
    Filed: April 12, 2019
    Publication date: August 1, 2019
    Applicant: Primenano, Inc.
    Inventors: Stuart L. Friedman, Michael M. Kelly
  • Patent number: 10274413
    Abstract: In some aspects, a flow cytometer system is provided that includes beam shaping optics positioned to manipulate a light beam and produce a resulting light beam that irradiates the core stream at the interrogation zone of the flow cell. The beam shaping optics include an acylindrical lens positioned to receive and focus light in a direction of a first axis orthogonal to a direction of light travel, and a cylindrical lens positioned to receive the light output from the acylindrical lens and to focus the light output from the acylindrical lens in a direction of a second axis orthogonal to the first axis and to the direction of light travel. The resulting light beam output has a flat-top shaped intensity profile along the first axis, and a Gaussian-shaped intensity profile along the second axis. Related methods of shaping a light beam at an interrogation zone of a flow cell are also provided.
    Type: Grant
    Filed: November 10, 2016
    Date of Patent: April 30, 2019
    Assignee: Abbott Laboratories
    Inventors: John F. Heanue, Stuart L. Friedman
  • Patent number: 10274513
    Abstract: A system for atomic force microscopy in which a sharp electrode tip of an flexing probe cantilever is positioned closely adjacent a sample being probed for its electrical characteristics. An optical beam irradiates a portion of the sample surrounding the probe tips and is modulated at a radio or lower modulation frequency. In one embodiment, a reference microwave signal is incident to the electrode tip. Microwave circuitry receives a microwave signal from the probe tip, which may be the reflection of the incident signal. Electronic circuitry processes the received signal with reference to the modulation frequency to produce one or more demodulated signals indicative of the electronic or atomic properties of the sample. Alternatively, the optical beam is pulsed and the demodulated signal is analyzed for its temporal characteristics. The beam may non-linearly produce the microwave signal. Two source lasers may have optical frequencies differing by the microwave frequency.
    Type: Grant
    Filed: January 31, 2017
    Date of Patent: April 30, 2019
    Assignee: Primenano, Inc.
    Inventors: Stuart L. Friedman, Michael M. Kelly
  • Publication number: 20180217181
    Abstract: A system for atomic force microscopy in which a sharp electrode tip of an flexing probe cantilever is positioned closely adjacent a sample being probed for its electrical characteristics. An optical beam irradiates a portion of the sample surrounding the probe tips and is modulated at a radio or lower modulation frequency. In one embodiment, a reference microwave signal is incident to the electrode tip. Microwave circuitry receives a microwave signal from the probe tip, which may be the reflection of the incident signal. Electronic circuitry processes the received signal with reference to the modulation frequency to produce one or more demodulated signals indicative of the electronic or atomic properties of the sample. Alternatively, the optical beam is pulsed and the demodulated signal is analyzed for its temporal characteristics. The beam may non-linearly produce the microwave signal. Two source lasers may have optical frequencies differing by the microwave frequency.
    Type: Application
    Filed: January 31, 2017
    Publication date: August 2, 2018
    Applicant: PrimeNano, Inc.
    Inventors: Stuart L. Friedman, Michael M. Kelly
  • Publication number: 20170115202
    Abstract: In some aspects, a flow cytometer system is provided that includes beam shaping optics positioned to manipulate a light beam and produce a resulting light beam that irradiates the core stream at the interrogation zone of the flow cell. The beam shaping optics include an acylindrical lens positioned to receive and focus light in a direction of a first axis orthogonal to a direction of light travel, and a cylindrical lens positioned to receive the light output from the acylindrical lens and to focus the light output from the acylindrical lens in a direction of a second axis orthogonal to the first axis and to the direction of light travel. The resulting light beam output has a flat-top shaped intensity profile along the first axis, and a Gaussian-shaped intensity profile along the second axis. Related methods of shaping a light beam at an interrogation zone of a flow cell are also provided.
    Type: Application
    Filed: November 10, 2016
    Publication date: April 27, 2017
    Inventors: John F. Heanue, Stuart L. Friedman
  • Patent number: 9523857
    Abstract: In some aspects, a flow cytometer system is provided that includes beam shaping optics positioned to manipulate a light beam and produce a resulting light beam that irradiates the core stream at the interrogation zone of the flow cell. The beam shaping optics include an acylindrical lens positioned to receive and focus light in a direction of a first axis orthogonal to a direction of light travel, and a cylindrical lens positioned to receive the light output from the acylindrical lens and to focus the light output from the acylindrical lens in a direction of a second axis orthogonal to the first axis and to the direction of light travel. The resulting light beam output has a flat-top shaped intensity profile along the first axis, and a Gaussian-shaped intensity profile along the second axis. Related methods of shaping a light beam at an interrogation zone of a flow cell are also provided.
    Type: Grant
    Filed: March 14, 2014
    Date of Patent: December 20, 2016
    Assignee: Abbott Laboratories
    Inventors: John F. Heanue, Stuart L. Friedman
  • Patent number: 9494801
    Abstract: In some aspects, a flow cytometer system is provided that includes beam shaping optics positioned to manipulate a light beam and produce a resulting light beam that irradiates the core stream at the interrogation zone of the flow cell. The beam shaping optics include an acylindrical lens positioned to receive and focus light in a direction of a first axis orthogonal to a direction of light travel, and a cylindrical lens positioned to receive the light output from the acylindrical lens and to focus the light output from the acylindrical lens in a direction of a second axis orthogonal to the first axis and to the direction of light travel. The resulting light beam output has a flat-top shaped intensity profile along the first axis, and a Gaussian-shaped intensity profile along the second axis. Related methods of shaping a light beam at an interrogation zone of a flow cell are also provided.
    Type: Grant
    Filed: March 14, 2014
    Date of Patent: November 15, 2016
    Assignee: Abbott Laboratories
    Inventors: John F. Heanue, Stuart L. Friedman
  • Publication number: 20140264097
    Abstract: In some aspects, a flow cytometer system is provided that includes beam shaping optics positioned to manipulate a light beam and produce a resulting light beam that irradiates the core stream at the interrogation zone of the flow cell. The beam shaping optics include an acylindrical lens positioned to receive and focus light in a direction of a first axis orthogonal to a direction of light travel, and a cylindrical lens positioned to receive the light output from the acylindrical lens and to focus the light output from the acylindrical lens in a direction of a second axis orthogonal to the first axis and to the direction of light travel. The resulting light beam output has a flat-top shaped intensity profile along the first axis, and a Gaussian-shaped intensity profile along the second axis. Related methods of shaping a light beam at an interrogation zone of a flow cell are also provided.
    Type: Application
    Filed: March 14, 2014
    Publication date: September 18, 2014
    Inventors: John F. Heanue, Stuart L. Friedman
  • Patent number: 8489184
    Abstract: Methods and systems for monitoring contact between a medical probe and tissue are provided. A medical probe is introduced into a patient adjacent the tissue. An electrical parameter, e.g., electrical admittance, is measured between a first electrode located on the medical probe and a second electrode remote from the first electrode. The electrical parameter is amplitude modulated in response to a physiological cycle of the patient. Contact between the medical probe and the tissue is detected based on the amplitude modulation of the measured electrical parameter.
    Type: Grant
    Filed: March 16, 2012
    Date of Patent: July 16, 2013
    Assignee: Hansen Medical, Inc.
    Inventors: Brian P. Wilfley, Joseph A. Heanue, Stuart L. Friedman
  • Publication number: 20120238897
    Abstract: Methods and systems for monitoring contact between a medical probe and tissue are provided. A medical probe is introduced into a patient adjacent the tissue. An electrical parameter, e.g., electrical admittance, is measuring between a first electrode located on the medical probe and a second electrode remote from the first electrode. The electrical parameter is amplitude modulated in response to a physiological cycle of the patient. Contact between the medical probe and the tissue is detected based on the amplitude modulation of the measured electrical parameter.
    Type: Application
    Filed: March 16, 2012
    Publication date: September 20, 2012
    Applicant: HANSEN MEDICAL, INC.
    Inventors: Brian P. Wilfley, Joseph A. Heanue, Stuart L. Friedman
  • Patent number: 8160690
    Abstract: Methods and systems for monitoring contact between a medical probe and tissue are provided. A medical probe is introduced into a patient adjacent the tissue. An electrical parameter, e.g., electrical admittance, is measured between a first electrode located on the medical probe and a second electrode remote from the first electrode. The electrical parameter is amplitude modulated in response to a physiological cycle of the patient. Contact between the medical probe and the tissue is detected based on the amplitude modulation of the measured electrical parameter.
    Type: Grant
    Filed: June 14, 2007
    Date of Patent: April 17, 2012
    Assignee: Hansen Medical, Inc.
    Inventors: Brian P. Wilfley, Joseph A. Heanue, Stuart L. Friedman
  • Patent number: 7570354
    Abstract: An optical inspection system for inspecting a substrate. A beam source produces a light beam and directs it toward a surface of the substrate, thereby producing a reflected light beam that is received by an intensifier module. A photocathode receives the reflected light beam at a first surface and producing a shower of photoelectrons at a second opposing surface. An electrical field receives the shower of photoelectrons and accelerates the photoelectrons away from the second surface of the photocathode, thereby producing an enhanced output. A sensor receives the enhanced output from the intensifier module and produces electrical signals in response to the enhanced output. A controller receives the electrical signals and produces images of the substrate, based at least in part on the electrical signals. The controller also controls and coordinates the operation of the beam source, the intensifier module, and the sensor.
    Type: Grant
    Filed: October 22, 2007
    Date of Patent: August 4, 2009
    Assignee: KLA-Tencor Corporation
    Inventors: Wei Zhao, Stuart L. Friedman
  • Publication number: 20080312713
    Abstract: Methods and systems for monitoring contact between a medical probe and tissue are provided. A medical probe is introduced into a patient adjacent the tissue. An electrical parameter, e.g., electrical admittance, is measuring between a first electrode located on the medical probe and a second electrode remote from the first electrode. The electrical parameter is amplitude modulated in response to a physiological cycle of the patient. Contact between the medical probe and the tissue is detected based on the amplitude modulation of the measured electrical parameter.
    Type: Application
    Filed: June 14, 2007
    Publication date: December 18, 2008
    Inventors: Brian P. Wilfley, Joseph A. Heanue, Stuart L. Friedman
  • Patent number: 6717146
    Abstract: A compact detector for secondary and backscattered electrons in a scanning electron beam system includes a microchannel plate detector and a solid state detector connected in a tandem manner. The detector offers large bandwidth and high dynamic range. The detector can be used for article inspection, lithography, metrology, and other related applications. The compactness of the detector makes it ideally suited for utilization in a miniature electron beam column, such as a microcolumn.
    Type: Grant
    Filed: May 24, 2001
    Date of Patent: April 6, 2004
    Assignee: Applied Materials, Inc.
    Inventors: Tai-Hon Philip Chang, Stuart L. Friedman, Ming L. Yu
  • Patent number: 6642637
    Abstract: An electron multiplier having an access for allowing a beam to pass is presented. The electron multiplier collects particles traveling back along the beam and is capable of collecting the particles arbitrarily close to the beam. The electron multiplier includes at least two plates having secondary electron emitting surfaces, the at least two plates being separated by a small distance. The electron multiplier has a beam access through the at least two plates. Particles enter the electron multiplier in a direction opposite that of propagation of the beam and impact a secondary electron emitting surface, thereby being captured between the top plate and the bottom plate. In some embodiments of the invention, the electron multiplier is segmented so that azimuthal distributions of the particles can be determined. In some embodiments, the electron multiplier includes a stack of electron emitting surfaces arranged so that an angular distribution of the particles can be determined.
    Type: Grant
    Filed: March 28, 2000
    Date of Patent: November 4, 2003
    Assignee: Applied Materials, Inc.
    Inventors: James P Spallas, Stuart L Friedman
  • Publication number: 20020175283
    Abstract: A compact detector for secondary and backscattered electrons in a scanning electron beam system includes a microchannel plate detector and a solid state detector connected in a tandem manner. The detector offers large bandwidth and high dynamic range. The detector can be used for article inspection, lithography, metrology, and other related applications. The compactness of the detector makes it ideally suited for utilization in a miniature electron beam column, such as a microcolumn.
    Type: Application
    Filed: May 24, 2001
    Publication date: November 28, 2002
    Applicant: ETEC SYSTEMS, INC.
    Inventors: Tai-Hon Philip Chang, Stuart L. Friedman, Ming L. Yu