Patents by Inventor Stuart L Friedman
Stuart L Friedman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11262288Abstract: In some aspects, a flow cytometer system is provided that includes beam shaping optics positioned to manipulate a light beam and produce a resulting light beam that irradiates the core stream at the interrogation zone of the flow cell. The beam shaping optics include an acylindrical lens positioned to receive and focus light in a direction of a first axis orthogonal to a direction of light travel, and a cylindrical lens positioned to receive the light output from the acylindrical lens and to focus the light output from the acylindrical lens in a direction of a second axis orthogonal to the first axis and to the direction of light travel. The resulting light beam output has a flat-top shaped intensity profile along the first axis, and a Gaussian-shaped intensity profile along the second axis. Related methods of shaping a light beam at an interrogation zone of a flow cell are also provided.Type: GrantFiled: August 14, 2020Date of Patent: March 1, 2022Inventors: John F. Heanue, Stuart L. Friedman
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Publication number: 20210131943Abstract: In some aspects, a flow cytometer system is provided that includes beam shaping optics positioned to manipulate a light beam and produce a resulting light beam that irradiates the core stream at the interrogation zone of the flow cell. The beam shaping optics include an acylindrical lens positioned to receive and focus light in a direction of a first axis orthogonal to a direction of light travel, and a cylindrical lens positioned to receive the light output from the acylindrical lens and to focus the light output from the acylindrical lens in a direction of a second axis orthogonal to the first axis and to the direction of light travel. The resulting light beam output has a flat-top shaped intensity profile along the first axis, and a Gaussian-shaped intensity profile along the second axis. Related methods of shaping a light beam at an interrogation zone of a flow cell are also provided.Type: ApplicationFiled: August 14, 2020Publication date: May 6, 2021Inventors: John F. Heanue, Stuart L. Friedman
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Patent number: 10830686Abstract: In some aspects, a flow cytometer system is provided that includes beam shaping optics positioned to manipulate a light beam and produce a resulting light beam that irradiates the core stream at the interrogation zone of the flow cell. The beam shaping optics include an acylindrical lens positioned to receive and focus light in a direction of a first axis orthogonal to a direction of light travel, and a cylindrical lens positioned to receive the light output from the acylindrical lens and to focus the light output from the acylindrical lens in a direction of a second axis orthogonal to the first axis and to the direction of light travel. The resulting light beam output has a flat-top shaped intensity profile along the first axis, and a Gaussian-shaped intensity profile along the second axis. Related methods of shaping a light beam at an interrogation zone of a flow cell are also provided.Type: GrantFiled: March 25, 2019Date of Patent: November 10, 2020Assignee: Abbott LaboratoriesInventors: John F. Heanue, Stuart L. Friedman
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Patent number: 10473694Abstract: A system for atomic force microscopy in which a sharp electrode tip of an flexing probe cantilever is positioned closely adjacent a sample being probed for its electrical characteristics. An optical beam irradiates a portion of the sample surrounding the probe tips and is modulated at a radio or lower modulation frequency. In one embodiment, a reference microwave signal is incident to the electrode tip. Microwave circuitry receives a microwave signal from the probe tip, which may be the reflection of the incident signal. Electronic circuitry processes the received signal with reference to the modulation frequency to produce one or more demodulated signals indicative of the electronic or atomic properties of the sample. Alternatively, the optical beam is pulsed and the demodulated signal is analyzed for its temporal characteristics. The beam may non-linearly produce the microwave signal. Two source lasers may have optical frequencies differing by the microwave frequency.Type: GrantFiled: April 12, 2019Date of Patent: November 12, 2019Assignee: Primenano, Inc.Inventors: Stuart L. Friedman, Michael M. Kelly
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Publication number: 20190310180Abstract: In some aspects, a flow cytometer system is provided that includes beam shaping optics positioned to manipulate a light beam and produce a resulting light beam that irradiates the core stream at the interrogation zone of the flow cell. The beam shaping optics include an acylindrical lens positioned to receive and focus light in a direction of a first axis orthogonal to a direction of light travel, and a cylindrical lens positioned to receive the light output from the acylindrical lens and to focus the light output from the acylindrical lens in a direction of a second axis orthogonal to the first axis and to the direction of light travel. The resulting light beam output has a flat-top shaped intensity profile along the first axis, and a Gaussian-shaped intensity profile along the second axis. Related methods of shaping a light beam at an interrogation zone of a flow cell are also provided.Type: ApplicationFiled: March 25, 2019Publication date: October 10, 2019Inventors: John F. Heanue, Stuart L. Friedman
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Publication number: 20190234993Abstract: A system for atomic force microscopy in which a sharp electrode tip of an flexing probe cantilever is positioned closely adjacent a sample being probed for its electrical characteristics. An optical beam irradiates a portion of the sample surrounding the probe tips and is modulated at a radio or lower modulation frequency. In one embodiment, a reference microwave signal is incident to the electrode tip. Microwave circuitry receives a microwave signal from the probe tip, which may be the reflection of the incident signal. Electronic circuitry processes the received signal with reference to the modulation frequency to produce one or more demodulated signals indicative of the electronic or atomic properties of the sample. Alternatively, the optical beam is pulsed and the demodulated signal is analyzed for its temporal characteristics. The beam may non-linearly produce the microwave signal. Two source lasers may have optical frequencies differing by the microwave frequency.Type: ApplicationFiled: April 12, 2019Publication date: August 1, 2019Applicant: Primenano, Inc.Inventors: Stuart L. Friedman, Michael M. Kelly
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Patent number: 10274413Abstract: In some aspects, a flow cytometer system is provided that includes beam shaping optics positioned to manipulate a light beam and produce a resulting light beam that irradiates the core stream at the interrogation zone of the flow cell. The beam shaping optics include an acylindrical lens positioned to receive and focus light in a direction of a first axis orthogonal to a direction of light travel, and a cylindrical lens positioned to receive the light output from the acylindrical lens and to focus the light output from the acylindrical lens in a direction of a second axis orthogonal to the first axis and to the direction of light travel. The resulting light beam output has a flat-top shaped intensity profile along the first axis, and a Gaussian-shaped intensity profile along the second axis. Related methods of shaping a light beam at an interrogation zone of a flow cell are also provided.Type: GrantFiled: November 10, 2016Date of Patent: April 30, 2019Assignee: Abbott LaboratoriesInventors: John F. Heanue, Stuart L. Friedman
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Patent number: 10274513Abstract: A system for atomic force microscopy in which a sharp electrode tip of an flexing probe cantilever is positioned closely adjacent a sample being probed for its electrical characteristics. An optical beam irradiates a portion of the sample surrounding the probe tips and is modulated at a radio or lower modulation frequency. In one embodiment, a reference microwave signal is incident to the electrode tip. Microwave circuitry receives a microwave signal from the probe tip, which may be the reflection of the incident signal. Electronic circuitry processes the received signal with reference to the modulation frequency to produce one or more demodulated signals indicative of the electronic or atomic properties of the sample. Alternatively, the optical beam is pulsed and the demodulated signal is analyzed for its temporal characteristics. The beam may non-linearly produce the microwave signal. Two source lasers may have optical frequencies differing by the microwave frequency.Type: GrantFiled: January 31, 2017Date of Patent: April 30, 2019Assignee: Primenano, Inc.Inventors: Stuart L. Friedman, Michael M. Kelly
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Publication number: 20180217181Abstract: A system for atomic force microscopy in which a sharp electrode tip of an flexing probe cantilever is positioned closely adjacent a sample being probed for its electrical characteristics. An optical beam irradiates a portion of the sample surrounding the probe tips and is modulated at a radio or lower modulation frequency. In one embodiment, a reference microwave signal is incident to the electrode tip. Microwave circuitry receives a microwave signal from the probe tip, which may be the reflection of the incident signal. Electronic circuitry processes the received signal with reference to the modulation frequency to produce one or more demodulated signals indicative of the electronic or atomic properties of the sample. Alternatively, the optical beam is pulsed and the demodulated signal is analyzed for its temporal characteristics. The beam may non-linearly produce the microwave signal. Two source lasers may have optical frequencies differing by the microwave frequency.Type: ApplicationFiled: January 31, 2017Publication date: August 2, 2018Applicant: PrimeNano, Inc.Inventors: Stuart L. Friedman, Michael M. Kelly
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Publication number: 20170115202Abstract: In some aspects, a flow cytometer system is provided that includes beam shaping optics positioned to manipulate a light beam and produce a resulting light beam that irradiates the core stream at the interrogation zone of the flow cell. The beam shaping optics include an acylindrical lens positioned to receive and focus light in a direction of a first axis orthogonal to a direction of light travel, and a cylindrical lens positioned to receive the light output from the acylindrical lens and to focus the light output from the acylindrical lens in a direction of a second axis orthogonal to the first axis and to the direction of light travel. The resulting light beam output has a flat-top shaped intensity profile along the first axis, and a Gaussian-shaped intensity profile along the second axis. Related methods of shaping a light beam at an interrogation zone of a flow cell are also provided.Type: ApplicationFiled: November 10, 2016Publication date: April 27, 2017Inventors: John F. Heanue, Stuart L. Friedman
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Patent number: 9523857Abstract: In some aspects, a flow cytometer system is provided that includes beam shaping optics positioned to manipulate a light beam and produce a resulting light beam that irradiates the core stream at the interrogation zone of the flow cell. The beam shaping optics include an acylindrical lens positioned to receive and focus light in a direction of a first axis orthogonal to a direction of light travel, and a cylindrical lens positioned to receive the light output from the acylindrical lens and to focus the light output from the acylindrical lens in a direction of a second axis orthogonal to the first axis and to the direction of light travel. The resulting light beam output has a flat-top shaped intensity profile along the first axis, and a Gaussian-shaped intensity profile along the second axis. Related methods of shaping a light beam at an interrogation zone of a flow cell are also provided.Type: GrantFiled: March 14, 2014Date of Patent: December 20, 2016Assignee: Abbott LaboratoriesInventors: John F. Heanue, Stuart L. Friedman
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Patent number: 9494801Abstract: In some aspects, a flow cytometer system is provided that includes beam shaping optics positioned to manipulate a light beam and produce a resulting light beam that irradiates the core stream at the interrogation zone of the flow cell. The beam shaping optics include an acylindrical lens positioned to receive and focus light in a direction of a first axis orthogonal to a direction of light travel, and a cylindrical lens positioned to receive the light output from the acylindrical lens and to focus the light output from the acylindrical lens in a direction of a second axis orthogonal to the first axis and to the direction of light travel. The resulting light beam output has a flat-top shaped intensity profile along the first axis, and a Gaussian-shaped intensity profile along the second axis. Related methods of shaping a light beam at an interrogation zone of a flow cell are also provided.Type: GrantFiled: March 14, 2014Date of Patent: November 15, 2016Assignee: Abbott LaboratoriesInventors: John F. Heanue, Stuart L. Friedman
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Publication number: 20140264097Abstract: In some aspects, a flow cytometer system is provided that includes beam shaping optics positioned to manipulate a light beam and produce a resulting light beam that irradiates the core stream at the interrogation zone of the flow cell. The beam shaping optics include an acylindrical lens positioned to receive and focus light in a direction of a first axis orthogonal to a direction of light travel, and a cylindrical lens positioned to receive the light output from the acylindrical lens and to focus the light output from the acylindrical lens in a direction of a second axis orthogonal to the first axis and to the direction of light travel. The resulting light beam output has a flat-top shaped intensity profile along the first axis, and a Gaussian-shaped intensity profile along the second axis. Related methods of shaping a light beam at an interrogation zone of a flow cell are also provided.Type: ApplicationFiled: March 14, 2014Publication date: September 18, 2014Inventors: John F. Heanue, Stuart L. Friedman
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Patent number: 8489184Abstract: Methods and systems for monitoring contact between a medical probe and tissue are provided. A medical probe is introduced into a patient adjacent the tissue. An electrical parameter, e.g., electrical admittance, is measured between a first electrode located on the medical probe and a second electrode remote from the first electrode. The electrical parameter is amplitude modulated in response to a physiological cycle of the patient. Contact between the medical probe and the tissue is detected based on the amplitude modulation of the measured electrical parameter.Type: GrantFiled: March 16, 2012Date of Patent: July 16, 2013Assignee: Hansen Medical, Inc.Inventors: Brian P. Wilfley, Joseph A. Heanue, Stuart L. Friedman
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Publication number: 20120238897Abstract: Methods and systems for monitoring contact between a medical probe and tissue are provided. A medical probe is introduced into a patient adjacent the tissue. An electrical parameter, e.g., electrical admittance, is measuring between a first electrode located on the medical probe and a second electrode remote from the first electrode. The electrical parameter is amplitude modulated in response to a physiological cycle of the patient. Contact between the medical probe and the tissue is detected based on the amplitude modulation of the measured electrical parameter.Type: ApplicationFiled: March 16, 2012Publication date: September 20, 2012Applicant: HANSEN MEDICAL, INC.Inventors: Brian P. Wilfley, Joseph A. Heanue, Stuart L. Friedman
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Patent number: 8160690Abstract: Methods and systems for monitoring contact between a medical probe and tissue are provided. A medical probe is introduced into a patient adjacent the tissue. An electrical parameter, e.g., electrical admittance, is measured between a first electrode located on the medical probe and a second electrode remote from the first electrode. The electrical parameter is amplitude modulated in response to a physiological cycle of the patient. Contact between the medical probe and the tissue is detected based on the amplitude modulation of the measured electrical parameter.Type: GrantFiled: June 14, 2007Date of Patent: April 17, 2012Assignee: Hansen Medical, Inc.Inventors: Brian P. Wilfley, Joseph A. Heanue, Stuart L. Friedman
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Patent number: 7570354Abstract: An optical inspection system for inspecting a substrate. A beam source produces a light beam and directs it toward a surface of the substrate, thereby producing a reflected light beam that is received by an intensifier module. A photocathode receives the reflected light beam at a first surface and producing a shower of photoelectrons at a second opposing surface. An electrical field receives the shower of photoelectrons and accelerates the photoelectrons away from the second surface of the photocathode, thereby producing an enhanced output. A sensor receives the enhanced output from the intensifier module and produces electrical signals in response to the enhanced output. A controller receives the electrical signals and produces images of the substrate, based at least in part on the electrical signals. The controller also controls and coordinates the operation of the beam source, the intensifier module, and the sensor.Type: GrantFiled: October 22, 2007Date of Patent: August 4, 2009Assignee: KLA-Tencor CorporationInventors: Wei Zhao, Stuart L. Friedman
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Publication number: 20080312713Abstract: Methods and systems for monitoring contact between a medical probe and tissue are provided. A medical probe is introduced into a patient adjacent the tissue. An electrical parameter, e.g., electrical admittance, is measuring between a first electrode located on the medical probe and a second electrode remote from the first electrode. The electrical parameter is amplitude modulated in response to a physiological cycle of the patient. Contact between the medical probe and the tissue is detected based on the amplitude modulation of the measured electrical parameter.Type: ApplicationFiled: June 14, 2007Publication date: December 18, 2008Inventors: Brian P. Wilfley, Joseph A. Heanue, Stuart L. Friedman
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Patent number: 6717146Abstract: A compact detector for secondary and backscattered electrons in a scanning electron beam system includes a microchannel plate detector and a solid state detector connected in a tandem manner. The detector offers large bandwidth and high dynamic range. The detector can be used for article inspection, lithography, metrology, and other related applications. The compactness of the detector makes it ideally suited for utilization in a miniature electron beam column, such as a microcolumn.Type: GrantFiled: May 24, 2001Date of Patent: April 6, 2004Assignee: Applied Materials, Inc.Inventors: Tai-Hon Philip Chang, Stuart L. Friedman, Ming L. Yu
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Patent number: 6642637Abstract: An electron multiplier having an access for allowing a beam to pass is presented. The electron multiplier collects particles traveling back along the beam and is capable of collecting the particles arbitrarily close to the beam. The electron multiplier includes at least two plates having secondary electron emitting surfaces, the at least two plates being separated by a small distance. The electron multiplier has a beam access through the at least two plates. Particles enter the electron multiplier in a direction opposite that of propagation of the beam and impact a secondary electron emitting surface, thereby being captured between the top plate and the bottom plate. In some embodiments of the invention, the electron multiplier is segmented so that azimuthal distributions of the particles can be determined. In some embodiments, the electron multiplier includes a stack of electron emitting surfaces arranged so that an angular distribution of the particles can be determined.Type: GrantFiled: March 28, 2000Date of Patent: November 4, 2003Assignee: Applied Materials, Inc.Inventors: James P Spallas, Stuart L Friedman