Patents by Inventor Subra Suresh

Subra Suresh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9134294
    Abstract: The method and apparatus of the present invention detects changes in cell biomechanics caused by any of a variety of diseases and conditions. In one embodiment, the method and apparatus of the invention detect infection of red blood cells. In one embodiment, the invention is a method and apparatus comprising a microfluidic channel with a constriction, for trapping infected red blood cells while allowing healthy red blood cells to deform and pass through the channel. In another embodiment, the invention comprises a suspended microchannel resonator for detecting and counting red blood cells at the constriction of the microfluidic channel.
    Type: Grant
    Filed: November 3, 2010
    Date of Patent: September 15, 2015
    Assignee: Massachusetts Institute of Technology
    Inventors: Scott Manalis, Thomas Burg, Subra Suresh, Ken Babcock
  • Publication number: 20120064505
    Abstract: The invention in some aspects relates to methods, devices and compositions for evaluating material properties, such as mechanical and rheological properties of substances, particularly biological substances, such as cells, tissues, and biological fluids. In some aspects, the invention relates to methods, devices and compositions for evaluating material properties of deformable objects, such as cells. In further aspects, the invention relates to methods, devices and compositions for diagnosing and/or characterizing disease based on material properties of biological cells.
    Type: Application
    Filed: March 21, 2011
    Publication date: March 15, 2012
    Applicant: Massachusetts Institute of Technology
    Inventors: Subra Suresh, Jongyoon Han, Hansen Bow, Sha Huang, Monica Diez Silva, Igor V. Pivkin, Michal (Michelle) Berris, Ming Dao
  • Publication number: 20110293558
    Abstract: The invention in some aspects relates to methods, devices and compositions for evaluating material properties, such as mechanical and rheological properties of substances, particularly biological substances, such as cells, tissues, and biological fluids. In some aspects, the invention relates to methods, devices and compositions for evaluating material properties of deformable objects, such as cells. In further aspects, the invention relates to methods, devices and compositions for diagnosing and/or characterizing disease based on material properties of biological cells.
    Type: Application
    Filed: March 21, 2011
    Publication date: December 1, 2011
    Applicant: Massachusetts Institute of Technology
    Inventors: Subra Suresh, Jianzhu Chen, Irene Yin-Ting Chang
  • Publication number: 20110289043
    Abstract: The invention in some aspects relates to methods, devices and compositions for evaluating material properties, such as mechanical and rheological properties of substances, particularly biological substances, such as cells, tissues, and biological fluids. In some aspects, the invention relates to methods, devices and compositions for evaluating material properties of deformable objects, such as cells. In further aspects, the invention relates to methods, devices and compositions for diagnosing and/or characterizing disease based on material properties of biological cells.
    Type: Application
    Filed: March 21, 2011
    Publication date: November 24, 2011
    Applicants: Brown University Research Foundation, Massachusetts Institute of Technology
    Inventors: Subra Suresh, George E. Karniadakis, Bruce Caswell, Igor V. Pivkin, Dmitry Fedosov, David J. Quinn, Ming Dao
  • Publication number: 20110287948
    Abstract: The invention in some aspects relates to methods, devices and compositions for evaluating material properties, such as mechanical and rheological properties of substances, particularly biological substances, such as cells, tissues, and biological fluids. In some aspects, the invention relates to methods, devices and compositions for evaluating material properties of deformable objects, such as cells. In further aspects, the invention relates to methods, devices and compositions for diagnosing and/or characterizing disease based on material properties of biological cells.
    Type: Application
    Filed: March 21, 2011
    Publication date: November 24, 2011
    Applicant: Massachusetts Institute of Technology
    Inventors: SUBRA SURESH, Patricia Maria Almeida Carvalho, Monica Diez Silva, Ming Dao
  • Publication number: 20110124095
    Abstract: The method and apparatus of the present invention detects changes in cell biomechanics caused by any of a variety of diseases and conditions. In one embodiment, the method and apparatus of the invention detect infection of red blood cells. In one embodiment, the invention is a method and apparatus comprising a microfluidic channel with a constriction, for trapping infected red blood cells while allowing healthy red blood cells to deform and pass through the channel. In another embodiment, the invention comprises a suspended microchannel resonator for detecting and counting red blood cells at the constriction of the microfluidic channel.
    Type: Application
    Filed: November 3, 2010
    Publication date: May 26, 2011
    Inventors: Scott Manalis, Thomas Burg, Subra Suresh, Ken Babcock
  • Publication number: 20090053749
    Abstract: The method and apparatus of the present invention detects changes in cell biomechanics caused by any of a variety of diseases and conditions. In one embodiment, the method and apparatus of the invention detect infection of red blood cells. In one embodiment, the invention is a method and apparatus comprising a microfluidic channel with a constriction, for trapping infected red blood cells while allowing healthy red blood cells to deform and pass through the channel. In another embodiment, the invention comprises a suspended microchannel resonator for detecting and counting red blood cells at the constriction of the microfluidic channel.
    Type: Application
    Filed: January 5, 2007
    Publication date: February 26, 2009
    Applicant: MASSACHUSETTS INSTITUTE OF TECHNOLOGY
    Inventors: Scott Manalis, Thomas Burg, Subra Suresh, Ken Babcock
  • Patent number: 6924497
    Abstract: Methods and systems for evaluating stresses in line features formed on substrates. Stresses may be computed from measured curvature information based on simple analytical functions. The curvature information can be obtained optically by, e.g., a coherent gradient sensing method, to obtain a full-field measurement of an illuminated area.
    Type: Grant
    Filed: July 29, 2003
    Date of Patent: August 2, 2005
    Assignee: California Institute of Technology
    Inventors: Subra Suresh, Ares J. Rosakis
  • Publication number: 20050030551
    Abstract: Techniques and systems for applying analytical computations of stresses to layers with embedded line features to obtain stress information, to design microstructures, and to design and control fabrication processes.
    Type: Application
    Filed: January 27, 2004
    Publication date: February 10, 2005
    Inventors: Ares Rosakis, Tae-Soon Park, Subra Suresh
  • Patent number: 6781702
    Abstract: Techniques for determining large deformation of layered or graded structures to include effects of body forces such as gravity, electrostatic or electromagnetic forces, and other forces that uniformly distribute over the structures, support forces, and concentrated forces. A real-time stress monitoring system is also disclosed to provide in-situ monitoring of a device based on the large deformation analytical approach. A coherent gradient sensing module, for example, may be included in such a system.
    Type: Grant
    Filed: May 28, 2002
    Date of Patent: August 24, 2004
    Assignee: California Institute of Technology
    Inventors: Antonios Giannakopoulos, Subra Suresh, Ares J. Rosakis, Ilan Blech
  • Publication number: 20040075825
    Abstract: Methods and systems for evaluating stresses in line features formed on substrates. Stresses may be computed from measured curvature information based on simple analytical functions. The curvature information can be obtained optically by, e.g., a coherent gradient sensing method, to obtain a full-field measurement of an illuminated area.
    Type: Application
    Filed: July 29, 2003
    Publication date: April 22, 2004
    Inventors: Subra Suresh, Ares J. Rosakis
  • Patent number: 6641893
    Abstract: An article is provided that is highly resistant to localized normal indentation, or indentation tensile stresses, against its surface. The article is a stacked array of at least five layer units each having local anisotropy in at least one direction. Each unit has an adjacent unit that differs in a mechanical property, or offset in principle axis of anisotropy by less than 45°. The article forms part of a construction constructed and positioned to withstand indentation, or contact damage, detrimental to its use having a component normal to any tangent of the surface. The article can be a stacked array of fiber-reinforced polymeric material, i.e., prepreg, with the fiber direction offset from each layer to the next by less than 45°. Methods of making the article and methods of use of the article to resist impact are provided. Also provided are articles having surfaces, the surfaces being constructed and arranged to withstand sliding contact stress.
    Type: Grant
    Filed: April 20, 1998
    Date of Patent: November 4, 2003
    Assignees: Massachusetts Institute of Technology, University of Connecticut
    Inventors: Subra Suresh, Antonios E. Giannakopoulos, Marten Olsson, Rajendran Thampuran, Ole Jorgensen, Nitin P. Padture, Juthamas Jitcharoen
  • Patent number: 6600565
    Abstract: Methods and systems for evaluating stresses in line features formed on substrates. Stresses may be computed from measured curvature information based on simple analytical functions. The curvature information can be obtained optically by, e.g., a coherent gradient sensing method, to obtain a full-field measurement of an illuminated area.
    Type: Grant
    Filed: April 27, 2000
    Date of Patent: July 29, 2003
    Assignee: California Institute of Technology
    Inventors: Subra Suresh, Ares J. Rosakis
  • Publication number: 20030106378
    Abstract: Techniques for determining large deformation of layered or graded structures to include effects of body forces such as gravity, electrostatic or electromagnetic forces, and other forces that uniformly distribute over the structures, support forces, and concentrated forces. A real-time stress monitoring system is also disclosed to provide in-situ monitoring of a device based on the large deformation analytical approach. A coherent gradient sensing module, for example, may be included in such a system.
    Type: Application
    Filed: May 28, 2002
    Publication date: June 12, 2003
    Inventors: Antonios Giannakopoulos, Subra Suresh, Ares J. Rosakis, Ilan Blech
  • Publication number: 20030060987
    Abstract: Systems and methods are disclosed that can provide estimates of elasto-plastic properties of material samples using data from instrumented indentation tests. Alternatively, or in addition, estimated load-depth curves can be constructed by certain methods and systems provided based on known mechanical properties. Some disclosed systems and methods use large deformation theory for at least part of the analysis and/or determinations and/or may account for strains of at least 5% in the area of contact between the indenter and the material sample, which can result in more accurate estimates of mechanical properties and/or deformation behavior.
    Type: Application
    Filed: March 7, 2002
    Publication date: March 27, 2003
    Inventors: Ming Dao, Nuwong Chollacoop, Krystyn J. Van Vliet, Thandampalayam A. Venkatesh, Subra Suresh
  • Patent number: 6513389
    Abstract: Techniques for evaluating curvatures in line features embedded in a different material layer formed on a substrate. A model based a uniform layer formed over a substrate may be used to represent a structure with parallel line features embedded in a layer formed over the substrate. The curvatures of the uniform layer due to an elastic distortion along a first direction substantially parallel to the line features and along a second direction orthogonal to the first direction are determined. Next, the curvatures of the uniform layer may be used as respective curvatures of each of the line features.
    Type: Grant
    Filed: April 25, 2001
    Date of Patent: February 4, 2003
    Assignee: California Institute of Technology
    Inventors: Subra Suresh, Tae-Soon Park
  • Publication number: 20020021452
    Abstract: Methods and systems for evaluating curvatures in line features embedded in a different material layer formed on substrates.
    Type: Application
    Filed: April 25, 2001
    Publication date: February 21, 2002
    Inventors: Subra Suresh, Tae-Soon Park
  • Patent number: 6311135
    Abstract: Provided are methods and apparatus for determining from indentation testing the preexisting stress and/or effective strain in a section of a material. The invention also provides methods and apparatus for determining the variation of the stress with depth in the material (e.g. the gradient). According to the invention, first data are provided from an indentation test of the stressed (or strained) section. The stress (or effective strain) can then be determined from the first data and from second data characteristic of the material, such as a stress-strain curve. Second data can also be obtained from an additional indentation test of a section having a known stress. The methods provided herein are suitable for programming on a general purpose computer or calculator.
    Type: Grant
    Filed: July 21, 2000
    Date of Patent: October 30, 2001
    Assignee: Inventium LLC
    Inventors: Subra Suresh, Antonios Giannakopoulos
  • Patent number: 6247355
    Abstract: An indentation measurement apparatus is retrofittable onto any of a variety of load-applying frames and includes a mount for mounting an indenter of any geometry (for example blunt or sharp). The arrangement is very stiff and mechanical values including Young's modulus, strain hardening exponent, yield strength, and hardness can be obtained from a single load/unload versus displacement test. A wide variety of materials can be tested using the apparatus. An optical probe can measure displacement of the indenter head relative to a sample. A new method of calculating strain hardening directly from load/displacement measurement is presented as is a new method of calculating strain hardening exponent.
    Type: Grant
    Filed: February 19, 1998
    Date of Patent: June 19, 2001
    Assignee: Massachusetts Institute of Technology
    Inventors: Subra Suresh, Jorge Alcala, Antonios E. Giannakopoulos
  • Patent number: 6155104
    Abstract: Provided are methods and apparatus for determining from indentation testing the preexisting stress and/or effective strain in a section of a material. The invention also provides methods and apparatus for determining the variation of the stress with depth in the material (e.g. the gradient). According to the invention, first data are provided from an indentation test of the stressed (or strained) section. The stress (or effective strain) can then be determined from the first data and from second data characteristic of the material, such as a stress-strain curve. Second data can also be obtained from an additional indentation test of a section having a known stress. The methods provided herein are suitable for programming on a general purpose computer or calculator.
    Type: Grant
    Filed: May 26, 1998
    Date of Patent: December 5, 2000
    Assignee: Subra Suresh
    Inventors: Subra Suresh, Antonios Giannakopoulos