Abstract: A graphene light-emitting device and a method of manufacturing the same are provided. The graphene light-emitting device includes a p-type graphene doped with a p-type dopant; an n-type graphene doped with an n-type dopant; and an active graphene that is disposed between the type graphene and the n-type graphene and emits light, wherein the p-type graphene, the n-type graphene, and the active graphene are horizontally disposed.

Abstract: A memory device includes a gate stack on a substrate. The gate stack is disposed between a source and a drain. The gate stack includes a tunneling film, storage node, and control oxide film. A thickness of the control oxide film is greater than or equal to about 5 nm and less than or equal to about 30 nm. A method of manufacturing a memory device, including a gate stack on a substrate, wherein the gate stack is disposed between a source and a drain, includes: sequentially forming a tunneling film, a first silicon-rich oxide film, and a control oxide film on the substrate, wherein the first silicon-rich oxide film comprises a SiOx film (1.5<x<1.7); converting the first silicon-rich oxide film into a silicon oxide (SiO2) film comprising silicon nano-crystals; and patterning the control oxide film, the silicon oxide film, and the tunneling film to form the gate stack.

Abstract: Example embodiments may provide memory devices having a charge trap layer which includes a hole trap and an electron trap. The memory device may generate a relatively large flat band voltage gap according to an applied bias voltage. Accordingly, a stable multilevel cell may be realized.