Patents by Inventor Sukeshwar Kannan

Sukeshwar Kannan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for testing an electric circuit
    Patent number: 8742777
    Abstract: Embodiments include a method and system for testing an electric circuit. A carrier signal of a first frequency is modulated with a multi-tone signal to generate a test signal. The test signal is applied to an input of a circuit under test (CUT). A crest factor of an output signal that corresponds to the test signal received at an output of the CUT is measured. A crest factor differential between the measured crest factor and a reference crest factor is determined. If the crest factor differential exceeds a threshold value, the CUT is determined to be defective.
    Type: Grant
    Filed: December 29, 2010
    Date of Patent: June 3, 2014
    Assignee: The Board of Trustees of the University of Alabama for and on behalf of the University of Alabama
    Inventors: Bruce C. Kim, Sukeshwar Kannan, Ganesh Srinivasan, Friedrich Taenzler
  • METHOD AND MODEL OF CARBON NANOTUBE BASED THROUGH SILICON VIAS (TSV) FOR RF APPLICATIONS
    Publication number: 20120306096
    Abstract: A carbon nanotube (CNT) through silicon via (TSV) for three-dimensional (3D) substrate interconnects is described. TSV technologies provide for high performance and high density 3D packages. The CNT-based TSVs provide for integration of analog, RF and mixed-signal integrated circuits. CNT-based TSV provides superior electrical characteristics as compared to conventional TVs filled with conductive metals.
    Type: Application
    Filed: May 30, 2012
    Publication date: December 6, 2012
    Applicant: THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ALABAMA
    Inventors: Bruce Kim, Anurag Gupta, Sukeshwar Kannan, Falah Mohammed, Byoungchul Ahn
  • METHOD AND SYSTEM FOR TESTING AN ELECTRIC CIRCUIT
    Publication number: 20120169359
    Abstract: Embodiments include a method and system for testing an electric circuit. A carrier signal of a first frequency is modulated with a multi-tone signal to generate a test signal. The test signal is applied to an input of a circuit under test (CUT). A crest factor of an output signal that corresponds to the test signal received at an output of the CUT is measured. A crest factor differential between the measured crest factor and a reference crest factor is determined. If the crest factor differential exceeds a threshold value, the CUT is determined to be defective.
    Type: Application
    Filed: December 29, 2010
    Publication date: July 5, 2012
    Applicant: The Board of Trustees of the University of Alabama for and on behalf of the University of Alabama
    Inventors: Bruce C. Kim, Sukeshwar Kannan, Ganesh Srinivasan, Friedrich Taenzler