Abstract: A content-addressable memory (CAM) storage element includes bit storage cell bit comparison cells. The bit storage cell is arranged on a first die tier and includes at least one transistor, one or two bit lines, and a storage node. The bit comparison cell is arranged on a second die tier and has a match line, complementary search lines, and at least three transistors. The complementary search lines are decoupled from the bit line(s). A 3D connection couples the storage node to one of the transistors of the second die tier. The CAM cell performs at least one CAM search per clock cycle using at least four transistors per search, including the at least one transistor of the bit storage cell and the at least three transistors of the bit comparison cell, and to output results of the at least one CAM search on the match line.

Abstract: Various implementations described herein are related to a device having energy harvesting circuitry that experiences power failures. The device may include computing circuitry having a processor coupled to the energy harvesting circuitry. The processor may be configured to reduce a number of write operations to a log structure having a hardware bit-vector used by the computing circuitry to boost computational progress even with the power failures.

Abstract: A three-dimensional (3D) integrated circuit (IC) can include a bottom tier with first circuitry and first backside TSVs coupled to a substrate; a top tier coupled to the first tier at a front side and having second circuitry and second backside TSVs; and a heat conductor on the second backside TSVs of the top tier. The heat conductor is coupled to the second backside TSVs to provide improved heat dissipation through the top tier. During pre-bond testing, the top tier can be tested at speed using the second backside TSVs.

Abstract: Methods, systems and devices for operation of non-volatile memory device are described herein. In one aspect, a signal may have an amplitude within a continuous amplitude range, and a non-volatile memory element may be placed in an impedance state representing the amplitude. The amplitude of the signal may be recovered based, at least in part, on the impedance state of the non-volatile memory element.

Abstract: A three-dimensional (3D) integrated circuit (IC) can include a bottom tier with first circuitry and first backside TSVs coupled to a substrate; a top tier coupled to the first tier at a front side and having second circuitry and second backside TSVs; and a heat conductor on the second backside TSVs of the top tier. The heat conductor is coupled to the second backside TSVs to provide improved heat dissipation through the top tier. During pre-bond testing, the top tier can be tested at speed using the second backside TSVs.

Abstract: Various implementations described herein refer to an integrated circuit having a memory structure with an array of bitcells accessible via wordlines arranged in rows and bitlines arranged in columns. The integrated circuit may include source lines coupled to the bitcells. The integrated circuit may include source line drivers coupled between the wordlines and the source lines, and the source line drivers may allow the source lines to be used as switched source lines.

Abstract: Various implementations described herein refer to an integrated circuit having a memory structure with an array of bitcells accessible via wordlines arranged in rows and bitlines arranged in columns. The integrated circuit may include source lines coupled to the bitcells. The integrated circuit may include source line drivers coupled between the wordlines and the source lines, and the source line drivers may allow the source lines to be used as switched source lines.

Abstract: Disclosed are methods, systems and devices for operation of memory device. In one aspect, a signal may have an amplitude within a continuous amplitude range, and a non-volatile memory element may be placed in an impedance state representing the amplitude. The amplitude of the signal may be recovered based, at least in part, on the impedance state of the correlated electron element.

Abstract: An interconnect within an integrated circuit provides arbitration to select one of a plurality of signal inputs for connection to a signal output. The arbitration applied uses a first arbitration parameter value, in the form of a time stamp value, and, if two or more signal inputs share such a time stamp value, then uses a second arbitration parameter, in the form of a least recently granted value. The time increment applied to the time stamp value associated with each signal input when it is granted access to the signal output is selected to reflect the quality of service to be associated with that signal input. When a comparison is made between time stamp values, the lowest time stamp value is given priority. A large time increment value corresponds to a low priority (quality of service).

Abstract: An interconnect within an integrated circuit provides arbitration to select one of a plurality of signal inputs for connection to a signal output. The arbitration applied uses a first arbitration parameter value, in the form of a time stamp value, and, if two or more signal inputs share such a time stamp value, then uses a second arbitration parameter, in the form of a least recently granted value. The time increment applied to the time stamp value associated with each signal input when it is granted access to the signal output is selected to reflect the quality of service to be associated with that signal input. When a comparison is made between time stamp values, the lowest time stamp value is given priority. A large time increment value corresponds to a low priority (quality of service).

Abstract: An interconnect within an integrated circuit provides arbitration to select one of a plurality of signal inputs for connection to a signal output. The arbitration applied uses a first arbitration parameter value, in the form of a time stamp value, and, if two or more signal inputs share such a time stamp value, then uses a second arbitration parameter, in the form of a least recently granted value. The time increment applied to the time stamp value associated with each signal input when it is granted access to the signal output is selected to reflect the quality of service to be associated with that signal input. When a comparison is made between time stamp values, the lowest time stamp value is given priority. A large time increment value corresponds to a low priority (quality of service).

Abstract: A storage device has a plurality of storage cells for storing data values. Control circuitry is provided to simultaneously couple at least two cells to at least one common signal line. Sensing circuitry is provided to sense a signal on the at least one common signal line, which indicates a result of a logical operation applied to the data values stored in each of the at least two storage cells. This allows logic operations such as AND, OR, XOR, etc. to be performed within a storage device so that it is not necessary to read out each data value independently and transfer each data value to a separate processing circuit in order to find the result of the logical operation. This helps to improve performance within a data processing apparatus having the storage device.

Abstract: A storage device has a plurality of storage cells for storing data values. Control circuitry is provided to simultaneously couple at least two cells to at least one common signal line. Sensing circuitry is provided to sense a signal on the at least one common signal line, which indicates a result of a logical operation applied to the data values stored in each of the at least two storage cells. This allows logic operations such as AND, OR, XOR, etc. to be performed within a storage device so that it is not necessary to read out each data value independently and transfer each data value to a separate processing circuit in order to find the result of the logical operation. This helps to improve performance within a data processing apparatus having the storage device.

Abstract: An interconnect 6 within an integrated circuit 2 provides arbitration to select one of a plurality of signal inputs for connection to a signal output. The arbitration applied uses a first arbitration parameter value, in the form of a time stamp value, and, if two or more signal inputs share such a time stamp value, then uses a second arbitration parameter, in the form of a least recently granted value. The time increment applied to the time stamp value associated with each signal input when it is granted access to the signal output is selected to reflect the quality of service to be associated with that signal input. When a comparison is made between time stamp values, the lowest time stamp value is given priority. A large time increment value corresponds to a low priority (quality of service).

Abstract: A system for scan testing an IC includes one or more scan registers, one or more scan-in pads, one or more scan-out pads, and one or more comparators. Scan test data is transmitted from the scan-in pads to the scan registers. The functional response obtained from the scan test is transmitted to the comparator. The scan-out pad transmits the expected data to the comparator. The comparator compares the expected data and the functional response data and the comparison result is stored. The test result data is transmitted at positive and negative edges of the test clock signal.