Abstract: A semiconductor memory device that performs a flash write operation without increasing the circuit area. Column selection lines CL0-CL7 extend parallel to word lines at locations corresponding to where column gates are formed. During a flash write mode, the subcolumn decoder 14 simultaneously selects the column selection lines. This writes cell information to every memory cell connected to the selected word line.

Abstract: According to an aspect of the present invention, a memory device having a plurality of banks carries out bank interleaving by use of a plurality of common data buses, the number of which is less than the number of the banks. The present invention enables the data to be read more rapidly while suppressing the increase of the chip area.

Abstract: A semiconductor memory device outputs data in synchronization with an external clock signal. The semiconductor memory device comprises a first frequency divider dividing a frequency of the external clock signal supplied thereto so as to generate a first internal clock signal; a delay circuit delaying the external clock signal; a second frequency divider dividing a frequency of a signal supplied from the delay circuit so as to generate a second internal clock signal; and a data control unit outputting the data according to the first internal clock signal and the second internal clock signal.

Abstract: The present invention is aimed at providing a semiconductor memory device which performs a row-address pipe-line operation in accessing different row addresses so as to achieve high-speed access. The semiconductor memory device according to the present invention includes a plurality of sense-amplifiers which store data when the data is received via bit lines from memory cells corresponding to a selected word line, a column decoder which reads parallel data of a plurality of bits from selected sense amplifiers by simultaneously selecting a plurality of column gates in response to a column address, a data-conversion unit which converts the parallel data into serial data, and a precharge-signal-generation unit which generates an internal precharge signal a first delay-time period after generation of a row-access signal for selecting the selected word line so as to reset the bit lines and said plurality of sense-amplifiers.

Abstract: A semiconductor memory device that performs a flash write operation without increasing the circuit area. Column selection lines CL0-CL7 extend parallel to word lines at locations corresponding to where column gates are formed. During a flash write mode, the subcolumn decoder 14 simultaneously selects the column selection lines. This writes cell information to every memory cell connected to the selected word line.

Abstract: The present invention is aimed at providing a semiconductor memory device which performs a row-address pipe-line operation in accessing different row addresses so as to achieve high-speed access. The semiconductor memory device according to the present invention includes a plurality of sense-amplifiers which store data when the data is received via bit lines from memory cells corresponding to a selected word line, a column decoder which reads parallel data of a plurality of bits from selected sense amplifiers by simultaneously selecting a plurality of column gates in response to a column address, a data-conversion unit which converts the parallel data into serial data, and a precharge-signal-generation unit which generates an internal precharge signal a first delay-time period after generation of a row-access signal for selecting the selected word line so as to reset the bit lines and said plurality of sense-amplifiers.

Abstract: A semiconductor memory device using hierarchical word decoding for word selection includes memory-cell areas, each of which is provided for a corresponding one of column blocks. The semiconductor memory device further includes sub-word lines provided for each one of the column blocks and extending over a corresponding one of the memory-cell areas, and sub-word decoders provided on either side of a given one of the memory-cell areas to select one of the sub-word lines only with respect to the given one of the memory-cell areas.

Abstract: A clock pulse generator generates a plurality of clock pulses which has different phases during one cycle of a reference clock signal supplied from the exterior. A timing setting circuit sets a latency, which is a number of clock cycles from a start of a read operation to an output of read data, at a number which is divisible by one n-th (n=2, 3, 4 . . . ) of a cycle of the reference clock signal and outputs latency information according to the set latency. An output controlling pulse switching circuit respectively outputs each of the clock pulses as a predetermined output controlling pulse in accordance with the latency information. In other words, a plurality of the output controlling pulses are switched according to the latency information.

Abstract: A data output circuit for a semiconductor memory device, such as a synchronous DRAM (SDRAM) includes an output control circuit that acquires a command in sync with an input internal clock signal and generates an output control signal used to determine the output timing of a data signal. An output buffer receives the output control signal and then outputs the data signal in accordance with an output internal clock signal. The phase of the output internal clock signal is advanced from that of the input internal clock signal. The output control circuit also includes a latency counter that generates the output control signal by counting the cycles of a second output internal clock signal, which is delayed from the first output internal clock signal.

Abstract: A semiconductor memory includes memory cell blocks, a burst-length information generating circuit which generates burst-length information based on a burst length, and a block enable circuit which receives the burst-length information. The block enable circuit selectively enables one of the memory cell blocks when the burst length is equal to or shorter than a predetermined burst length and selectively enables a plurality of memory cell blocks based on the burst length when the burst length is longer than the predetermined burst length. Data are read from the above-mentioned one or plurality of memory cell blocks.

Abstract: A semiconductor memory, such as a multibit DRAM, has a multiple cell array banks, each having multiple cell arrays. Rows of sense amplifiers are located near each of the cell arrays and extend in a first direction. Multiple rows of transfer switches, also extending in the first direction, are located adjacent to each of the cell array banks. A first data bus, which extends in a second direction which is perpendicular to the first direction, connects the sense amplifiers with the transfer switches. Multiple data buffer rows extend in the first direction near the transfer switches. A second data bus, extending in the first direction, connects the transfer switches with the data buffers. A layout pitch is defined by a spacing between adjacent lines of the first data bus. The transfer switches are placed in accordance with the defined layout pitch and the data buffers are placed according to a layout pitch determined by multiplying the defined layout pitch by the number of cell array banks.

Abstract: A semiconductor memory device includes memory cells, word lines connected to the memory cells, bit lines connected to the memory cells, and a first circuit which resets the bit lines to a reset potential which is based on data read in a previous read cycle.

Abstract: A semiconductor memory has pairs of bit lines connected to its memory cells. Sense amps are connected across the bit line pairs. Column gate pairs are connected to the bit line pairs, and data bus pairs are connected to the bit line pairs via the column gate pairs. A column gate drive control circuit is connected to the column gate pairs and turns selected column gate pairs off during a write mask operation.

Abstract: The present invention is aimed at providing a semiconductor memory device which performs a row-address pipe-line operation in accessing different row addresses so as to achieve high-speed access. The semiconductor memory device according to the present invention includes a plurality of sense-amplifiers which store data when the data is received via bit lines from memory cells corresponding to a selected word line, a column decoder which reads parallel data of a plurality of bits from selected sense amplifiers by simultaneously selecting a plurality of column gates in response to a column address, a data-conversion unit which converts the parallel data into serial data, and a precharge-signal-generation unit which generates an internal precharge signal a first delay-time period after generation of a row-access signal for selecting the selected word line so as to reset the bit lines and said plurality of sense-amplifiers.

Abstract: A semiconductor memory device uses a wave pipeline system which can reduce a power consumption by reducing a current for charging a data bus between a memory core part and an output circuit. A single line data bus transmits read data output from the memory core part. A data bus drive circuit outputs the read read data to send to the single data bus. Each of a plurality of data latch circuits has a data input terminal connected to the data bus. A data input control circuit inputs the read data which is serially transmitted on the data bus to the data latch circuits in parallel in response to an operation of the data bus drive circuit. A data output control circuit outputs the latched read data in an order of latching by sequentially selecting outputs of the data latch circuits.

Abstract: A semiconductor or memory device has a decoder circuit for decoding a plurality of external address signals. The external address signals include first and second external address signals. A first address buffer receives the first external address signals and outputs first internal address signals to first address lines. A second address buffer receives the second external address signals and outputs second internal address signals to second address lines. First predecoders have input terminals connected to the first address lines, and output first predecode signals to first predecode lines. Second predecoders have input terminals connected to the second address lines and output second predecode signals to second predecode lines. Main decoders have input terminals connected to the first predecode lines and the second predecode lines and output decode signals. The number of the first external address signals are greater than the number of the second external address signals.

Abstract: A semiconductor integrated circuit system includes a first power line which supplies a first source power voltage, and a second power line which supplies a second source power voltage. A first edge detecting unit outputs a first edge detection signal when a rising edge of the first source power voltage is detected. A second edge detecting unit outputs a second edge detection signal when a rising edge of the second source power voltage is detected. An output unit is connected to the first power line, and outputs data to a data terminal in a data output cycle and sets the data terminal in a high-impedance state in response to the first edge detection signal. An output control unit is connected to the second power line, and controls the output unit in accordance with a read-data signal in the data output cycle, and controls the output unit in response to the second edge detection signal, so that the data terminal is set in the high-impedance state by the output unit.