Patents by Inventor Tadashi Matsushita

Tadashi Matsushita has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110163272
    Abstract: Disclosed is a method for producing an electrode material which has high discharge capacity at high charge/discharge rate and enables to realize sufficient charge/discharge rate performance. Also disclosed are an electrode material, an electrode and a lithium ion battery. Specifically disclosed is a method for producing an electrode material, which is characterized in that a slurry containing an electrode active material or a precursor of the electrode active material, and organic compounds each selected from at least two groups among the group A, group B and group C is sprayed and dried for forming a granule, and the thus-formed granule is fired at a temperature not less than 500° C. but not more than 1000° C. in a non-oxidizing atmosphere.
    Type: Application
    Filed: September 3, 2008
    Publication date: July 7, 2011
    Inventors: Koji Ono, Atsushi Honda, Tadashi Matsushita, Mitsumasa Saito
  • Publication number: 20110089027
    Abstract: The present invention provides an excellent durable cathode for hydrogen generation, which has a low hydrogen overvoltage and reduced dropping-off of a catalyst layer against the reverse current generated when an electrolyzer is stopped, and a method for producing the same. The present invention provides a cathode for hydrogen generation having a conductive base material and a catalyst layer formed on the conductive base material, wherein the catalyst layer includes crystalline iridium oxide, platinum and iridium-platinum alloy.
    Type: Application
    Filed: July 2, 2009
    Publication date: April 21, 2011
    Applicant: ASAHI KASEI CHEMICALS CORPORATION
    Inventors: Takeaki Sasaki, Akiyasu Funakawa, Tadashi Matsushita, Toshinori Hachiya
  • Patent number: 7819989
    Abstract: A composition for surface treatment of aluminium, aluminum alloys, magnesium or magnesium alloys and the treating solutions being diluted to the desired concentration are defined. The composition contains (1) compound A containing at least one metal element selected from the group consisting of Hf(IV), Ti(IV) and Zr(IV), (2) a fluorine-containing compound of sufficient amount to make fluorine exist in the composition in an amount of at least 5 times the molarity of the total molarity of the metal contained in the above-mentioned compound A, (3) at least one metal ion B selected from the group of alkaline earth metals, (4) at least one metal ion C selected from the group consisting of Al, Zn, Mg, Mn and Cu, and (5) nitric ion and the mol concentration of compound A is 0.1-50 mmol/L as the metal element of Hf(IV), Ti(IV) and Zr(IV). A metal treated with the treating method of the present invention solution has an excellent resistance to various corrosive environments.
    Type: Grant
    Filed: June 12, 2002
    Date of Patent: October 26, 2010
    Assignees: Nihon Parkerizing Co., Ltd., Toyota Jidosha Kabushiki Kaisha
    Inventors: Kazuhiro Ishikura, Michiro Kurosawa, Takaomi Nakayama, Hiroyuki Sato, Tadashi Matsushita, Eisaku Okada, Fumiya Yoshida, Katsuhiro Shiota
  • Patent number: 7531051
    Abstract: The present invention is the method for surface treatment of a metal material containing iron and/or zinc, containing component (A) and component (B); where (A) is a compound containing at least one metal element selected from the group consisting of Ti, Zr, Hf and Si, (B) is a compound containing fluorine as a supplying source of HF, wherein the ratio K=A/B between the total mole weight A of metal elements of Ti, Zr, Hf and Si in the compound of component (A) and the mole weight B which when the total fluorine atoms in the fluorine-containing compound of component (B) is converted to HF is within the range of 0.06?K?0.18, and the concentration of component (A) indicated by the total mole concentration of metal elements of Ti, Zr, Hf and Si is within the region of 0.05 to 100 m mol/L. To the treating solution for surface treatment, at least one compound containing at least one metal element selected from the group consisting of Ag, Al, Cu, Fe, Mn, Mg, Ni, Co and Zn can be blended.
    Type: Grant
    Filed: June 12, 2002
    Date of Patent: May 12, 2009
    Assignees: Nihon Parkerizing Co., Ltd., Toyota Jidosha Kabushiki Kaisha, Daihatsu Motor Co., Ltd.
    Inventors: Takaomi Nakayama, Hiroyuki Sato, Tetsuo Ootsuki, Tadashi Matsushita, Eisaku Okada, Fumiya Yoshida, Katsuhiro Shiota
  • Patent number: 7098433
    Abstract: An optical system deviation estimating apparatus includes an erected/inverted attitude setting means 9 for changing dispositional attitude of an optical system under test, a non-interferometric type wavefront measuring means 10 for measuring wavefronts at the attitudes as set up without resorting to interference phenomenon of light, a polynomial approximation means 15 for expanding measured wavefront values determined by the non-interferometric type wavefront measuring means 10 to a polynomial, an averaging arithmetic means 11 for averaging the measured values derived from output of the non-interferometric type wavefront measuring means 10 or alternatively arithmetic values derived from output of the polynomial approximation means 15, and a polynomial specific coefficient extraction arithmetic means 16 for extracting specific coefficient values of the polynomial.
    Type: Grant
    Filed: January 17, 2002
    Date of Patent: August 29, 2006
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Jiro Suzuki, Toshiyuki Ando, Hiroshi Suzuki, Shusou Wadaka, Yoshihito Hirano, Izumi Mikami, Tadashi Matsushita
  • Publication number: 20050067057
    Abstract: A composition for surface treatment of aluminium, aluminum alloy, magnesium or magnesium alloy and the treating solutions being diluted to the desired concentration are defined. A said composition of this invention containing (1) compound A containing at least one metal element selected from the group consisting of Hf(IV), Ti(IV) and Zr(IV), (2) fluorine containing compound of sufficient amount to make fluorine existed in the composition at least by 5 times of molarity to the total molarity of metal contained in above mentioned compound A, (3) at least one metal ion B selected from the group of alkaline earth metals, (4) at least one metal ion C selected from the group consisting of Al, Zn, Mg, Mn and Cu, and (5) nitric ion and the mol concentration of compound A is 0.1-50 mmol/L as metal element of Hf(IV), Ti(IV) and Zr(IV). The metal treated with the treating method applying the present invention solution has excellent resistance to various corrosive environments.
    Type: Application
    Filed: June 12, 2002
    Publication date: March 31, 2005
    Inventors: Kazuhiro Ishikura, Michiro Kurosawa, Takaomi Nakayama, Hiroyuki Sato, Tadashi Matsushita, Eisaku Okada, Fumiya Yoshida, Katsuhiro Shiota
  • Publication number: 20040244874
    Abstract: The present invention is the method for surface treatment of a metal material containing iron and/or zinc, comprising component (A) and component (B);
    Type: Application
    Filed: July 19, 2004
    Publication date: December 9, 2004
    Inventors: Takaomi Nakayama, Hiroyuki Sato, Tetsuo Ootsuki, Tadashi Matsushita, Eisaku Okada, Fumiya Yoshida, Katsuhiro Shiota
  • Publication number: 20040027566
    Abstract: An optical system deviation estimating apparatus includes an erected/inverted attitude setting means 9 for changing dispositional attitude of an optical system under test, a non-interferometric type wavefront measuring means 10 for measuring wavefronts at the attitudes as set up without resorting to interference phenomenon of light, a polynomial approximation means 15 for expanding measured wavefront values determined by the non-interferometric type wavefront measuring means 10 to a polynomial, an averaging arithmetic means 11 for averaging the measured values derived from output of the non-interferometric type wavefront measuring means 10 or alternatively arithmetic values derived from output of the polynomial approximation means 15, and a polynomial specific coefficient extraction arithmetic means 16 for extracting specific coefficient values of the polynomial.
    Type: Application
    Filed: May 5, 2003
    Publication date: February 12, 2004
    Inventors: Jiro Suzuki, Toshiyuki Ando, Hiroshi Suzuki, Shusou Wadaka, Yoshihito Hirano, Izumi Mikami, Tadashi Matsushita
  • Patent number: 5591652
    Abstract: A electrically erasable and programmable memory comprising: a semiconductor substrate; a source region and a drain region formed spaced apart from each other by a definite distance on a main surface of said semiconductor substrate; a channel region provided between the source region and the drain region; a gate insulating film provided on the channel region; a floating gate electrode provided on the gate insulating film; and a control gate electrode provided with an interlayer insulating film sandwiched therebetween so that the control gate electrode at least partially laminates the floating gate electrode; the channel region and the main surface having an inclined portion and the source region being provided relatively above or below the drain region.
    Type: Grant
    Filed: May 30, 1995
    Date of Patent: January 7, 1997
    Assignee: Sharp Kabushiki Kaisha
    Inventor: Tadashi Matsushita
  • Patent number: 5502321
    Abstract: A electrically erasable and programmable memory comprising: a semiconductor substrate; a source region and a drain region formed spaced apart from each other by a definite distance on a main surface of said semiconductor substrate; a channel region provided between the source region and the drain region; a gate insulating film provided on the channel region; a floating gate electrode provided on the gate insulating film; and a control gate electrode provided with an interlayer insulating film sandwiched therebetween so that the control gate electrode at least partially laminates the floating gate electrode; the channel region and the main surface having an inclined portion and the source region being provided relatively above or below the drain region.
    Type: Grant
    Filed: October 24, 1994
    Date of Patent: March 26, 1996
    Assignee: Sharp Kabushiki Kaisha
    Inventor: Tadashi Matsushita
  • Patent number: 5238858
    Abstract: An ion implantation method for forming a high concentration dopant implanted layer in a semiconductor substrate comprising irradiating an ion beam of a desired dopant in the semiconductor substrate and annealing the resultant, in which the irradiation of the ion beam is conducted with stepwise reduction of an acceleration energy for the ion beam, intercepting at least for a period during its reduction being proceeded, whereby affording the high concentration dopant implanted layer distributed as a substantially contiguous amorphous layer, and an ion implantation apparatus comprising an ion source, ion attracting means for attracting ions from the ion source, ion selecting means for selecting specified ions among the ions attracted by the ion attracting means, accelerating means for accelerating a beam of the specified ions selected by the ion selecting means with an acceleration energy stepwise reduced, beam scanning means for scanning a direction of the ion beam accelerated by the accelerating means, a sampl
    Type: Grant
    Filed: January 17, 1992
    Date of Patent: August 24, 1993
    Assignee: Sharp Kabushiki Kaisha
    Inventor: Tadashi Matsushita