Abstract: A disclosed printer includes a frame; a thermal head attached to the frame; a platen roller drive motor attached to the frame; a reduction gear train attached to the frame and configured to reduce the speed of rotation generated by the platen roller drive motor; and a platen roller detachably attached to the frame and configured to be driven by the platen roller drive motor via the reduction gear train and to feed paper while pressing the paper against the thermal head. The frame is produced by press-forming sheet metal and includes a horizontal plate part, a backboard part rising vertically from a back edge of the horizontal plate part, sideboard parts rising vertically from corresponding side edges of the horizontal plate part, and a projecting part protruding outward from an edge of one of the sideboard parts and forming a surrounding part of a gearbox.

Abstract: A disclosed printer includes a frame; a thermal head attached to the frame; a platen roller drive motor attached to the frame; a reduction gear train attached to the frame and configured to reduce the speed of rotation generated by the platen roller drive motor; and a platen roller detachably attached to the frame and configured to be driven by the platen roller drive motor via the reduction gear train and to feed paper while pressing the paper against the thermal head. The frame is produced by press-forming sheet metal and includes a horizontal plate part, a backboard part rising vertically from a back edge of the horizontal plate part, sideboard parts rising vertically from corresponding side edges of the horizontal plate part, and a projecting part protruding outward from an edge of one of the sideboard parts and forming a surrounding part of a gearbox.

Abstract: A scanning electron microscope is provided with a channel cylinder between a sample and an electron source. The channel cylinder generates a deceleration electrical field to decelerate an electron beam emitted from the electron source. The channel cylinder has a portion having an electron source side and sample side. A detector is provided on the electron source side and sample channel cylinder portion. The detector detects the secondary signal emitted from the sample, so that a scan image is obtained with a high spatial resolution.

Abstract: An electron microscope eliminates external ducting for evacuation by interlinking the interiors of a sample chamber for a sample, a casing for electron lenses and a chamber for an electron gun. Those interiors form a closed space with an evacuation path extending therethrough and are evacuated by evacuation means a vacuum pump connected to the sample chamber. The electron lenses are contained within sealed modules and the evacuation path passes between the sides of those modules and the internal walls of the casing. The resulting structure may be enclosed in substantially unbroken magnetic shielding.

Abstract: An objective lens of an electron beam apparatus in which an electron beam emitted from an electron gun is converged onto a specimen, the reflected electron from the specimen or the secondary electron emitted therefrom is detected, and a fine pattern on the specimen is measured, comprises: a magnetic circuit consisting of an upper magnetic pole member having an opening adapted to transmit the electron beam to be converted which was emitted from the electron gun, a lower magnetic pole member provided so as to face the upper magnetic pole member, and a magnetic path member to connect the outer peripheral edges of the upper and lower magnetic pole members; a coil, provided for a part of the magnetic circuit, for generating the magnetic fluxes passing through the upper and lower magnetic pole members, the magnetic path member, and the space between the opening edge and the lower magnetic pole member when this coil is excited; and a moving apparatus which is disposed on the surface of the lower magnetic pole member

Abstract: A feed screw is provided in a specimen-exchanging chamber connecting with a specimen chamber valve and a removable element is removed in the axial direction of the feed screw by rotation of the feed screw. The removal of the removable element makes it possible to remove a specimen holder between the specimen chamber and the specimen-exchanging chamber. It is possible to load and unload the specimen holder with the removable element. Thus, while leaving the specimen holder in the specimen chamber, only the removable element can be removed to the specimen-exchanging chamber.

Abstract: The present invention relates to an apparatus for detecting the secondary electrons which are obtained from a sample (4) when the sample is irradiated with an electron beam (2). When this electron beam (2) is subjected to a low acceleration voltage, it is desirable to detect the secondary electrons efficiently without interfering with the deflection of the electron beam (2). In order to solve this subject matter, there is used a means (7) for generating an electric field and a magnetic field which are so perpendicular to each other that they apply deflecting forces in the direction common to the secondary electrons while applying no deflecting force to the electron beam as a whole.

Abstract: An apparatus is disclosed for facilitating adjustments of an image of a specimen obtained from an electron microscope and displayed on a cathode ray tube by displaying additionally and concurrently a wave form indicating information representative of contrast, focus, brightness or the like parameters of said image of the specimen. To this end, an electric specimen information signal is derived and applied alternatively to the Y-axis deflection coil and grid electrode of the display cathode ray tube (CRT) in response to a scanning line of the CRT in the direction of the X-axis thereof.