Patents by Inventor Tadayuki Yamaguchi

Tadayuki Yamaguchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8065113
    Abstract: The present invention quickly resolves troubles in an analyzer and performs effective external quality control management. An analyzer (2) and a control device (1) are connected by a network (3). Error data and sample data taken from an assay of a quality control substance are transmitted from the control device (1) to the analyzer (2). The analyzer (2) is made to be remotely operable from the control device (1) and when problems arise, repair from the control device (1) is possible. The control device (1) tallies sample data and provides the tally results to a Web page. The analyzer (2) accesses the Web page using a WWW browser, and it can perform external quality control in real time.
    Type: Grant
    Filed: September 4, 2009
    Date of Patent: November 22, 2011
    Assignee: Sysmex Corporation
    Inventors: Ken'ichi Okuno, Hiroyuki Morihara, Tadayuki Yamaguchi, Tomomi Sugiyama
  • Patent number: 8010223
    Abstract: There is provided a quality control system capable of displaying a display screen regarding quality control of an testing, including a display control part for performing a display control of the display screen regarding the quality control, wherein the display control part displays the display screen on a display in accordance with a category of a quality control sample used by a user.
    Type: Grant
    Filed: April 20, 2007
    Date of Patent: August 30, 2011
    Assignee: Sysmex Corporation
    Inventors: Tadayuki Yamaguchi, Minoru Takayanagi, Takeshi Matsumoto, Tamiko Fujita
  • Patent number: 8007968
    Abstract: In the present invention, patterning for the first time is performed on a film to be worked above the front surface of a substrate, and the actual dimension of the pattern formed by the patterning for the first time is measured. Based on the dimension measurement result of the patterning or the first time, the condition of patterning for the second time is then set. In this event, the condition of the patterning for the second time is set so that a difference between the dimension of the patterning for the first time and its target dimension is equal to a difference between the dimension of the patterning for the second time and its target dimension. Thereafter, the patterning for the second time is performed under the set patterning condition.
    Type: Grant
    Filed: July 25, 2007
    Date of Patent: August 30, 2011
    Assignee: Tokyo Electron Limited
    Inventors: Yoshiaki Yamada, Tadayuki Yamaguchi, Yuuichi Yamamoto, Yasuhito Saiga, Kazuo Sawai
  • Patent number: 7998741
    Abstract: The objective of the present invention is to provide a remote control method which allows a technician, etc. in a support center to remote-control a clinical specimen processing device, and a remote control system, a status informing device and a control apparatus used for such a method. The remote control method of the present invention, which is a remote control method for remote-controlling the clinical specimen processing device that processes a clinical specimen, is designed so that an image of the clinical specimen processing device is picked up by an image pickup device, and the image picked up by the image pickup device is supplied to a control apparatus located at a remote place from the clinical specimen processing device through a communication network so that the picked-up image is displayed on the control apparatus.
    Type: Grant
    Filed: August 31, 2005
    Date of Patent: August 16, 2011
    Assignee: Sysmex Corporation
    Inventors: Mizuho Nishikiori, Tadayuki Yamaguchi, Hiroshi Murakami
  • Publication number: 20110191409
    Abstract: The objective of the present invention is to provide a remote control method which allows a technician, etc. in a support center to remote-control a clinical specimen processing device, and a remote control system, a status informing device and a control apparatus used for such a method. The remote control method of the present invention, which is a remote control method for remote-controlling the clinical specimen processing device that processes a clinical specimen, is designed so that an image of the clinical specimen processing device is picked up by an image pickup device, and the image picked up by the image pickup device is supplied to a control apparatus located at a remote place from the clinical specimen processing device through a communication network so that the picked-up image is displayed on the control apparatus.
    Type: Application
    Filed: March 28, 2011
    Publication date: August 4, 2011
    Inventors: Mizuho Nishikiori, Tadayuki Yamaguchi, Hiroshi Murakami
  • Patent number: 7925461
    Abstract: A quality control method using a plurality of analyzers and a control device connected to the analyzers via a network, the method comprising: (a) measuring quality control samples by the analyzers; (b) collecting a plurality of quality control data obtained by measuring the quality control samples; (c) implementing a quality control by the control device based on the collected quality control data; (d) obtaining uncertainty of measurement of analyzer based on uncertainty of analyzer calibration and the quality control data; (e) outputting a result of the quality control; and (f) outputting the uncertainty of measurement is disclosed. A quality control system and an analyzer are also disclosed.
    Type: Grant
    Filed: September 21, 2007
    Date of Patent: April 12, 2011
    Assignee: Sysmex Corporation
    Inventors: Tadayuki Yamaguchi, Atsushi Shirakami, Etsuro Shinkai, Yasuhiro Ochi
  • Patent number: 7901149
    Abstract: A substrate on which a resist film has been formed is transferred to an aligner and subjected to exposure processing. The substrate is then subjected to post-exposure baking in a second processing system. The substrate is then transferred again to the aligner and subjected to exposure processing. The substrate for which exposure processing for the second time has been finished is transferred to a first processing system and again subjected to post-exposure baking. The time periods from the ends of the exposure processing to the starts of the post-exposure baking for the first time and the second time are controlled to be equal. In pattern forming processing in which exposure processing is performed a plurality of times between the resist film forming processing and the developing treatment, a pattern with a desired dimension can be finally formed.
    Type: Grant
    Filed: July 19, 2007
    Date of Patent: March 8, 2011
    Assignee: Tokyo Electron Limited
    Inventors: Yoshiaki Yamada, Tadayuki Yamaguchi, Yuuichi Yamamoto, Yasuhito Saiga
  • Publication number: 20100127885
    Abstract: The present invention quickly resolves troubles in an analyzer and performs effective external quality control management. An analyzer (2) and a control device (1) are connected by a network (3). Error data and sample data taken from an assay of a quality control substance are transmitted from the control device (1) to the analyzer (2). The analyzer (2) is made to be remotely operable from the control device (1) and when problems arise, repair from the control device (1) is possible. The control device (1) tallies sample data and provides the tally results to a Web page. The analyzer (2) accesses the Web page using a WWW browser, and it can perform external quality control in real time.
    Type: Application
    Filed: November 19, 2009
    Publication date: May 27, 2010
    Inventors: Ken'ichi Okuno, Hiroyuki Morihara, Tadayuki Yamaguchi, Tomomi Sugiyama
  • Patent number: 7725297
    Abstract: The present invention quickly resolves troubles in an analyzer and performs effective external quality control management. An analyzer (2) and a control device (1) are connected by a network (3). Error data and sample data taken from assay of a quality control substance are transmitted from the control device (1) to the analyzer (2). The analyzer (2) is made to be remotely operable from the control device (1) and when troubles arise repair from the control device (1) is possible. The control device (1) tallies sample data, and provides the tally results to a Web page. The analyzer (2) accesses the Web page using a WWW browser, and can perform external quality control in real time.
    Type: Grant
    Filed: August 15, 2007
    Date of Patent: May 25, 2010
    Assignee: Sysmex Corporation
    Inventors: Ken'ichi Okuno, Hiroyuki Morihara, Tadayuki Yamaguchi, Tomomi Sugiyama
  • Publication number: 20100057873
    Abstract: The present invention quickly resolves troubles in an analyzer and performs effective external quality control management. An analyzer (2) and a control device (1) are connected by a network (3). Error data and sample data taken from an assay of a quality control substance are transmitted from the control device (1) to the analyzer (2). The analyzer (2) is made to be remotely operable from the control device (1) and when problems arise, repair from the control device (1) is possible. The control device (1) tallies sample data and provides the tally results to a Web page. The analyzer (2) accesses the Web page using a WWW browser, and it can perform external quality control in real time.
    Type: Application
    Filed: September 4, 2009
    Publication date: March 4, 2010
    Inventors: Ken'ichi Okuno, Hiroyuki Morihara, Tadayuki Yamaguchi, Tomomi Sugiyama
  • Patent number: 7606680
    Abstract: The present invention quickly resolves troubles in an analyzer and performs effective external quality control management. An analyzer (2) and a control device (1) are connected by a network (3). Error data and sample data taken from an assay of a quality control substance are transmitted from the control device (1) to the analyzer (2). The analyzer (2) is made to be remotely operable from the control device (1) and when problems arise, repair from the control device (1) is possible. The control device (1) tallies sample data and provides the tally results to a Web page. The analyzer (2) accesses the Web page using a WWW browser, and it can perform external quality control in real time.
    Type: Grant
    Filed: August 15, 2007
    Date of Patent: October 20, 2009
    Assignee: Sysmex Corporation
    Inventors: Ken'ichi Okuno, Hiroyuki Morihara, Tadayuki Yamaguchi, Tomomi Sugiyama
  • Publication number: 20090258304
    Abstract: In the present invention, patterning for the first time is performed on a film to be worked above the front surface of a substrate, and the actual dimension of the pattern formed by the patterning for the first time is measured. Based on the dimension measurement result of the patterning or the first time, the condition of patterning for the second time is then set. In this event, the condition of the patterning for the second time is set so that a difference between the dimension of the patterning for the first time and its target dimension is equal to a difference between the dimension of the patterning for the second time and its target dimension. Thereafter, the patterning for the second time is performed under the set patterning condition.
    Type: Application
    Filed: July 25, 2007
    Publication date: October 15, 2009
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Yoshiaki Yamada, Tadayuki Yamaguchi, Yuuichi Yamamoto, Yasuhito Saiga, Kazuo Sawai
  • Publication number: 20090234905
    Abstract: A maintenance information management method comprising steps of: by a terminal processing apparatus, transmitting, to a management apparatus via a network, maintenance work information about an analyzer on which maintenance work has been performed; storing, in a maintenance work information storage section of the management apparatus, the maintenance work information transmitted via the network; and transmitting, to the terminal processing apparatus via the network, the maintenance work information of the analyzer, which is stored in the maintenance work information storage section.
    Type: Application
    Filed: March 10, 2009
    Publication date: September 17, 2009
    Applicant: SYSMEX CORPORATION
    Inventors: Tadayuki YAMAGUCHI, Takeshi Matsumoto
  • Publication number: 20090208879
    Abstract: In the present invention, a substrate on which a resist film has been formed is transferred to an aligner and subjected to exposure processing. The substrate is then subjected to post-exposure baking in a second processing system. The substrate is then transferred again to the aligner and subjected to exposure processing. The substrate for which exposure processing for the second time has been finished is transferred to a first processing system and again subjected to post-exposure baking. The time periods from the ends of the exposure processing to the starts of the post-exposure baking for the first time and the second time are controlled to be equal. According to the present invention, in pattern forming processing in which exposure processing is performed a plurality of times between the resist film forming processing and the developing treatment, a pattern with a desired dimension can be finally formed.
    Type: Application
    Filed: July 19, 2007
    Publication date: August 20, 2009
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Yoshiaki Yamada, Tadayuki Yamaguchi, Yuuichi Yamamoto, Yasuhito Saiga
  • Publication number: 20090199052
    Abstract: A management system includes a plurality of analyzers; and a computer system connected to the analyzers via a network, wherein each of the analyzers comprises: a data transmitter for transmitting data produced by the analyzer to the computer system via the network, and wherein the computer system includes a memory under control of a processor, the memory storing instructions enabling the processor to carry out operations, comprising: (a) receiving a plurality of data transmitted from the data transmitters of the plurality of analyzers; (b) generating an aggregate result used for determining a determination condition for making a determination as to whether or not a notification to a user of the analyzer is required based on the plurality of received data; and (c) outputting the aggregate result. A computer system and a method of providing information are also disclosed.
    Type: Application
    Filed: January 30, 2009
    Publication date: August 6, 2009
    Inventors: Tadayuki Yamaguchi, Atsushi Shirakami, Takeshi Matsumoto
  • Publication number: 20090185151
    Abstract: A substrate processing system (100) includes a first automated substrate transfer line or main transfer line (20) configured to transfer wafers (W) over the entire system and to transfer wafers to and from respective process sections, and a second automated substrate transfer line or auxiliary transfer line (30) configured to transfer wafers (W) inside a photolithography process section (1a). The auxiliary transfer line (30) is disposed as a transfer mechanism independent of the main transfer line (20). An OHT (31) is configured to travel around on the auxiliary transfer line (30) having a loop shape, so as to transfer wafers (W) to and from and among the respective process apparatuses in the photolithography process section (1a).
    Type: Application
    Filed: June 15, 2007
    Publication date: July 23, 2009
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Yuichi Yamamoto, Tadayuki Yamaguchi, Yasuhito Saiga, Yoshiaki Yamada
  • Patent number: 7403873
    Abstract: The present invention quickly resolves troubles in an analyzer and performs effective external quality control management. An analyzer (2) and a control device (1) are connected by a network (3). Error data and sample data taken from assay of a quality control substance are transmitted from the control device (1) to the analyzer (2). The analyzer (2) is made to be remotely operable from the control device (1) and when troubles arise repair from the control device (1) is possible. The control device (1) tallies sample data, and provides the tally results to a Web page. The analyzer (2) accesses the Web page using a WWW browser, and can perform external quality control in real time.
    Type: Grant
    Filed: April 14, 2005
    Date of Patent: July 22, 2008
    Assignee: Sysmex Corporation
    Inventors: Ken'ichi Okuno, Hiroyuki Morihara, Tadayuki Yamaguchi, Tomomi Sugiyama
  • Publication number: 20080114559
    Abstract: A quality control method using a plurality of analyzers and a control device connected to the analyzers via a network, the method comprising: (a) measuring quality control samples by the analyzers; (b) collecting a plurality of quality control data obtained by measuring the quality control samples; (c) implementing a quality control by the control device based on the collected quality control data; (d) obtaining uncertainty of measurement of analyzer based on uncertainty of analyzer calibration and the quality control data; (e) outputting a result of the quality control; and (f) outputting the uncertainty of measurement is disclosed. A quality control system and an analyzer are also disclosed.
    Type: Application
    Filed: September 21, 2007
    Publication date: May 15, 2008
    Inventors: Tadayuki Yamaguchi, Atsushi Shirakami, Etsuro Shinkai, Yasuhiro Ochi
  • Publication number: 20080046503
    Abstract: The present invention quickly resolves troubles in an analyzer and performs effective external quality control management. An analyzer (2) and a control device (1) are connected by a network (3). Error data and sample data taken from assay of a quality control substance are transmitted from the control device (1) to the analyzer (2). The analyzer (2) is made to be remotely operable from the control device (1) and when troubles arise repair from the control device (1) is possible. The control device (1) tallies sample data, and provides the tally results to a Web page. The analyzer (2) accesses the Web page using a WWW browser, and can perform external quality control in real time.
    Type: Application
    Filed: August 15, 2007
    Publication date: February 21, 2008
    Applicant: SYSMEX CORPORATION
    Inventors: Ken'ichi Okuno, Hiroyuki Morihara, Tadayuki Yamaguchi, Tomomi Sugiyama
  • Publication number: 20080046208
    Abstract: The present invention quickly resolves troubles in an analyzer and performs effective external quality control management. An analyzer (2) and a control device (1) are connected by a network (3). Error data and sample data taken from assay of a quality control substance are transmitted from the control device (1) to the analyzer (2). The analyzer (2) is made to be remotely operable from the control device (1) and when troubles arise repair from the control device (1) is possible. The control device (1) tallies sample data, and provides the tally results to a Web page. The analyzer (2) accesses the Web page using a WWW browser, and can perform external quality control in real time.
    Type: Application
    Filed: August 15, 2007
    Publication date: February 21, 2008
    Applicant: SYSMEX CORPORATION
    Inventors: Ken'ichi Okuno, Hiroyuki Morihara, Tadayuki Yamaguchi, Tomomi Sugiyama