Patents by Inventor Tadayuki Yamaguchi

Tadayuki Yamaguchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20080021572
    Abstract: There is provided a quality control system capable of displaying a display screen regarding quality control of an testing, including a display control part for performing a display control of the display screen regarding the quality control, wherein the display control part displays the display screen on a display in accordance with a category of a quality control sample used by a user.
    Type: Application
    Filed: April 20, 2007
    Publication date: January 24, 2008
    Inventors: Tadayuki Yamaguchi, Minoru Takayanagi, Takeshi Matsumoto, Tamiko Fujita
  • Publication number: 20060046299
    Abstract: The objective of the present invention is to provide a remote control method which allows a technician, etc. in a support center to remote-control a clinical specimen processing device, and a remote control system, a status informing device and a control apparatus used for such a method. The remote control method of the present invention, which is a remote control method for remote-controlling the clinical specimen processing device that processes a clinical specimen, is designed so that an image of the clinical specimen processing device is picked up by an image pickup device, and the image picked up by the image pickup device is supplied to a control apparatus located at a remote place from the clinical specimen processing device through a communication network so that the picked-up image is displayed on the control apparatus.
    Type: Application
    Filed: August 31, 2005
    Publication date: March 2, 2006
    Inventors: Mizuho Nishikiori, Tadayuki Yamaguchi, Hiroshi Murakami
  • Patent number: 6937964
    Abstract: The present invention quickly resolves troubles in an analyzer and performs effective external quality control management. An analyzer (2) and a control device (1) are connected by a network (3). Error data and sample data taken from assay of a quality control substance are transmitted from the control device (1) to the analyzer (2). The analyzer (2) is made to be remotely operable from the control device (1) and when troubles arise repair from the control device (1) is possible. The control device (1) tallies sample data, and provides the tally results to a Web page. The analyzer (2) accesses the Web page using a WWW browser, and can perform external quality control in real time.
    Type: Grant
    Filed: July 17, 2003
    Date of Patent: August 30, 2005
    Assignee: Sysmex Corporation
    Inventors: Ken'ichi Okuno, Hiroyuki Morihara, Tadayuki Yamaguchi, Tomomi Sugiyama
  • Publication number: 20050177345
    Abstract: The present invention quickly resolves troubles in an analyzer and performs effective external quality control management. An analyzer (2) and a control device (1) are connected by a network (3). Error data and sample data taken from assay of a quality control substance are transmitted from the control device (1) to the analyzer (2). The analyzer (2) is made to be remotely operable from the control device (1) and when troubles arise repair from the control device (1) is possible. The control device (1) tallies sample data, and provides the tally results to a Web page. The analyzer (2) accesses the Web page using a WWW browser, and can perform external quality control in real time.
    Type: Application
    Filed: April 14, 2005
    Publication date: August 11, 2005
    Applicant: SYSMEX CORPORATION
    Inventors: Ken'ichi Okuno, Hiroyuki Morihara, Tadayuki Yamaguchi, Tomomi Sugiyama
  • Publication number: 20040019460
    Abstract: The present invention quickly resolves troubles in an analyzer and performs effective external quality control management. An analyzer (2) and a control device (1) are connected by a network (3). Error data and sample data taken from assay of a quality control substance are transmitted from the control device (1) to the analyzer (2). The analyzer (2) is made to be remotely operable from the control device (1) and when troubles arise repair from the control device (1) is possible. The control device (1) tallies sample data, and provides the tally results to a Web page. The analyzer (2) accesses the Web page using a WWW browser, and can perform external quality control in real time.
    Type: Application
    Filed: July 17, 2003
    Publication date: January 29, 2004
    Inventors: Ken?apos;ichi Okuno, Hiroyuki Morihara, Tadayuki Yamaguchi, Tomomi Sugiyama
  • Patent number: 6629060
    Abstract: The present invention quickly resolves troubles in an analyzer and performs effective external quality control management. An analyzer (2) and a control device (1) are connected by a network (3). Error data and sample data taken from assay of a quality control substance are transmitted from the control device (1) to the analyzer (2). The analyzer (2) is made to be remotely operable from the control device (1) and when troubles arise repair from the control device (1) is possible. The control device (1) tallies sample data, and provides the tally results to a Web page. The analyzer (2) accesses the Web page using a WWW browser, and can perform external quality control in real time.
    Type: Grant
    Filed: November 30, 2000
    Date of Patent: September 30, 2003
    Assignee: Sysmex Corporation
    Inventors: Ken′ichi Okuno, Hiroyuki Morihara, Tadayuki Yamaguchi, Tomomi Sugiyama
  • Publication number: 20020128801
    Abstract: The present invention quickly resolves troubles in an analyzer and performs effective external quality control management. An analyzer (2) and a control device (1) are connected by a network (3). Error data and sample data taken from assay of a quality control substance are transmitted from the control device (1) to the analyzer (2). The analyzer (2) is made to be remotely operable from the control device (1) and when troubles arise repair from the control device (1) is possible. The control device (1) tallies sample data, and provides the tally results to a Web page. The analyzer (2) accesses the Web page using a WWW browser, and can perform external quality control in real time.
    Type: Application
    Filed: November 30, 2000
    Publication date: September 12, 2002
    Inventors: Ken?apos;ichi Okuno, Hiroyuki Morihara, Tadayuki Yamaguchi, Tomomi Sugiyama
  • Patent number: 6405094
    Abstract: A second mounting section housing a plurality of substrates abnormally processed in a process section and a plurality of substrates processed previous to ordinary processing therein is provided in addition to a first mounting section housing a plurality of substrates before and after processing. Abnormally processed substrates or previously processed substrates are collected in the second mounting section. Thus, the abnormally processed substrates can be exactly taken out and subjected to inspection and the like, and the substrates processed previous to ordinary processing can be exactly taken out and subjected to inspection and the like.
    Type: Grant
    Filed: July 8, 1999
    Date of Patent: June 11, 2002
    Assignee: Tokyo Electron Limited
    Inventors: Issei Ueda, Tadayuki Yamaguchi, Yoshitaka Hara
  • Patent number: 6319322
    Abstract: Temperature regulation is performed at a buffer cassette in which a wafer is temporarily housed before and after being delivered to/from an aligner, or at an inlet-side delivery stage of a portion for delivering a wafer to the aligner, in reference with a state of temperature regulation of the wafer in the aligner, so that the temperature of the wafer can be more accurately regulated on a temperature regulating plate in the aligner in a shorter time. Therefore, circuit patterns can be accurately transferred, and throughput can be improved by speeding up the processing.
    Type: Grant
    Filed: July 13, 1999
    Date of Patent: November 20, 2001
    Assignee: Tokyo Electron Limited
    Inventors: Issei Ueda, Michiaki Matsushita, Kazuhiko Ito, Tadayuki Yamaguchi
  • Patent number: 6318948
    Abstract: This invention related to a substrate transfer apparatus having an arm holder moving into and out of a cassette while a substrate is mounted thereon, a forward and backward driving mechanism for moving the arm holder forward and backward, and a contact support member for supporting the substrate in contact with a lower surface peripheral portion of the substrate placed on the arm holder, said contact support member comprising a first defining portion for defining a front end of the substrate placed on the arm holder, and a second defining portion facing the first defining portion, for defining a rear end of the substrate placed on the arm holder.
    Type: Grant
    Filed: May 14, 1999
    Date of Patent: November 20, 2001
    Assignee: Tokyo Electron Limited
    Inventors: Issei Ueda, Tadayuki Yamaguchi