Abstract: There is disclosed a method of improving an electrostatic discharge (“ESD”) characteristic in a flash memory device. In order to prevent generation of leak current caused when charges generated upon a testing of the ESD are introduced into an internal circuit, the prevent can prevent a current fail in the internal circuit, by connecting a drain junction power supply terminal and a ground terminal line, in the connection of an internal circuit and a SDA input buffer in a flash memory device, to connection terminals spaced apart to each other.

Abstract: There is disclosed a method of programming a flash memory cell, which is performed applying a given voltage a gate and a drain and maintaining a source and a substrate at a ground potential. The method variably applies a given voltage, with two or more steps, to one of the gate and drain terminals while applying a given voltage to the other of the gate and drain terminals, thus reducing the programming current per cell. Accordingly, the present invention can improve reliability and throughput of the flash memory cell.

Abstract: Electron gun for a color CRT having main lens forming electrodes wherein a depth from a rim portion of an anode to an electrostatic field control electrode is deeper than the depth from the rim portion of a cathode to the electrostatic field control electrode, and a DQ lens action of a center beam portion formed by the DQ lens unit being weaker than the DQ lens action of an outer electron beam portion, whereby reducing a spot diameter by enlarging a main lens diameter and correcting inconsistency between a center beam and an outer beam in the DQ lens.

Abstract: There is provided an electron gun for a cathode-ray tube, comprising a triode having a control electrode and an accelerating electrode for controlling the amount of electron beams emitted from a plurality of cathodes and accelerating the electron beams, a front focusing lens part configured of a plurality of electrodes focusing and accelerating a predetermined amount of the electron beams, and a main lens part configured of a plurality of electrodes for focusing the electron beams on a screen, in which the diameter of beam passage hole of the accelerating electrode of the triode corresponds to 140-220% of that of the control electrode. The thickness of the control electrode corresponds to 20-30% of the diameter of beam passage hole of the control electrode, and the distance between the control electrode and the accelerating electrode corresponds to 40-80% of the beam passage hole diameter of the control electrode.