Abstract: The semiconductor device includes a power source signal generator and a redundancy signal generator. The power source signal generator generates a fuse power source signal driven to have a target level of an internal voltage signal. The fuse power source signal is generated to have a lower level than the target level of the internal voltage signal by a certain level during a period from a moment that a deep power-down mode starts till a moment that a level of the internal voltage signal reaches a predetermined level after termination of the deep power-down mode. The redundancy signal generator latches a fuse data in response to a fuse reset signal and a fuse set signal to generate a redundancy signal while the fuse power source signal is supplied.

Abstract: Column decoders are provided. The column decoder includes a power supplier and a column selection signal generator. The power supplier generates a supply voltage signal from a power voltage in response to a control signal enabled from a start point of time of a write mode or a read mode till an end point of time of a burst length. A level of the supply voltage signal is controlled according to the control signal. The column selection signal generator operates while the supply voltage signal is supplied. The column selection signal generator generates one of column selection signals, which is selectively enabled according to a logic combination of a high-order address signal, a mid-order address signal and a low-order address signal which are generated by decoding column address signals.