Abstract: A multi-row active disturb (MRAD) test circuit, a semiconductor memory device having the test circuit, and an MRAD test method are provided. The semiconductor memory device includes at least one memory array including a plurality of word lines sharing a bit line sense amplifier. Furthermore, in the semiconductor memory device, at least two word lines among the plurality of word lines, which have a bit line sense amplifier in common, are activated simultaneously in an MRAD test mode. The test circuit includes a control signal generating circuit and a row decoder. The control signal generating circuit is a circuit for generating a plurality of control signals and generates at least one activated control signal in an MRAD test mode. The row decoder activates at least two word lines by a control signal and a predetermined row address signal comprised of a plurality of bits.

Abstract: A multi-row active disturb (MRAD) test circuit, a semiconductor memory device having the test circuit, and an MRAD test method are provided. The semiconductor memory device includes at least one memory array including a plurality of word lines sharing a bit line sense amplifier. Furthermore, in the semiconductor memory device, at least two word lines among the plurality of word lines, which have a bit line sense amplifier in common, are activated simultaneously in an MRAD test mode. The test circuit includes a control signal generating circuit and a row decoder. The control signal generating circuit is a circuit for generating a plurality of control signals and generates at least one activated control signal in an MRAD test mode. The row decoder activates at least two word lines by a control signal and a predetermined row address signal comprised of a plurality of bits.

Abstract: An operation control circuit of an integrated circuit memory device operates in a synchronous mode according to an internal clock signal. An internal clock controller generates an internal clock enable signal in response to a mode command. An internal clock generator generates the internal clock signal based on the internal clock enable signal and an external clock. In particular, an internal clock controller generates an internal clock enable signal in response to a mode command. Accordingly, the integrated circuit memory device may be free of a clock enable pin.

Abstract: A column select line enable circuit prevents the first bit in a sequence of output data from being missed, thereby reducing tRCD in a synchronous memory device. The circuit delays a predetermined period of time after a row active command is applied to the memory device and then activates a column select enable line regardless of the state of the system clock signal. The column select enable line is maintained in an active state for a second period of time to allow the first bit of data to be read from the device. Thereafter, the column select enable line is enabled and disabled responsive to the system clock signal to read the remaining bits in the sequence of output data in a conventional manner. In a preferred embodiment, the circuit does not enable the column select enable line unless a decoded bank address signal is active.

Abstract: There are provided a synchronous RAM controlling device and method for controlling a synchronous RAM in order to access data when a burst length of a memory access is full page regardless of whether a termination access method or a wrap-around access method is used. In the synchronous RAM controlling device, an OR gate performs an OR operation on a burst stop signal for stopping input/output of data in the synchronous RAM responsive to an externally received input/output operation command signal. A counter is reset in response to the OR-operation result and counts the cycles of an external system clock signal. A burst sensor senses completion of a burst operation according to a burst length signal which is externally received and represents a burst length of at least 1 and outputs the sensed result as the burst stop signal. A control signal is input to the burst sensor which causes the burst sensor to operate the memory in one of termination or wrap-around access methods.

Abstract: A test circuit shortens test time during testing reliability of a chip. The test circuit comprises a bit line level sensing circuit connected to a bit line and transferring data in response to a voltage level of the data when a memory cell data is transferred to the bit line, a bit line level sensing control circuit for controlling a driving operation of the bit line level sensing circuit, and transfer device for transferring the data transferred from the bit line level sensing circuit to an outside of the chip, so that the test circuit tests whether the memory cell is defective or not.

Abstract: A semiconductor memory device having a shortened test time and a column selection transistor control method therefor.

Abstract: Integrated circuit chips with multiplexed input/output pads include means for expanding the functional and diagnostic capability of the circuit by increasing the effective number of input/output pads connected thereto so that more information can be provided to and from the chip. In particular, multiplexing means preferably provides the capability of accessing any one of a plurality of signal lines in the circuit from each input/output pad. This expanded capability is preferably achieved using one or more selection control signals which can be generated internally or externally to a chip containing the integrated circuit.

Abstract: A semiconductor memory device for driving word lines at high speed has a word line signal generating circuit for receiving a predecoded signal of a row address, and power source supply circuit for supplying the output signal of the word line signal generating circuit to a word line as source power. The device includes a normal word line decoder for receiving the predecoded signal and the output signal of the power source supplying circuit, respectively and for selecting a normal word line; a spare word line decoder for receiving the predecoded signal and the output signal of the power source supply circuit, respectively and for selecting a spare word line; and a redundancy enabling circuit connected to the spare word line decoder and the normal word line decoder for determining whether the normal word line is selected.

Abstract: A semiconductor memory device for driving word lines at high speed has a word line signal generating circuit for receiving a predecoded signal of a row address, and power source supply circuit for supplying the output signal of the word line signal generating circuit to a word line as source power. The device includes a normal word line decoder for receiving the predecoded signal and the output signal of the power source supplying circuit, respectively and for selecting a normal word line; a spare word line decoder for receiving the predecoded signal and the output signal of the power source supply circuit, respectively and for selecting a spare word line; and a redundancy enabling circuit connected to the spare word line decoder and the normal word line decoder for determining whether the normal word line is selected.