Patents by Inventor Takahiro DOKI

Takahiro DOKI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11415529
    Abstract: The X-ray phase imaging apparatus includes an imaging system, a position switching mechanism for switching between a retracted position and an imaging position, a control unit for controlling switching between the retracted position and the imaging position, and an image processing unit for generating an X-ray phase contrast image based on the first image and the second image. The control unit is configured to control sequentially imaging at the retracted position and imaging at the imaging position.
    Type: Grant
    Filed: March 30, 2020
    Date of Patent: August 16, 2022
    Assignee: Shimadzu Corporation
    Inventors: Takahiro Doki, Kenji Kimura, Taro Shirai, Satoshi Sano, Akira Horiba, Naoki Morimoto
  • Patent number: 11386561
    Abstract: An X-ray imaging apparatus is configured to acquire a plurality of pieces of slice image data from volume data, acquire a plurality of pieces of first processed image data by performing first processing, acquire a plurality of pieces of second processed image data by performing second processing, detect edges of the subject based on the acquired plurality of pieces of the second processed image data, and acquire edge image data including detected edges of the subject.
    Type: Grant
    Filed: May 28, 2020
    Date of Patent: July 12, 2022
    Assignee: Shimadzu Corporation
    Inventors: Naoki Morimoto, Kenji Kimura, Taro Shirai, Takahiro Doki
  • Patent number: 11385190
    Abstract: The X-ray phase imaging apparatus includes an imaging system, a position switching mechanism for switching between a retracted position and an imaging position, a control unit for controlling switching between the retracted position and the imaging position, and an image processing unit for generating an X-ray phase contrast image based on the first image and the second image. The control unit is configured to control sequentially imaging at the retracted position and imaging at the imaging position.
    Type: Grant
    Filed: March 30, 2020
    Date of Patent: July 12, 2022
    Assignee: Shimadzu Corporation
    Inventors: Takahiro Doki, Kenji Kimura, Taro Shirai, Satoshi Sano, Akira Horiba, Naoki Morimoto
  • Patent number: 11327029
    Abstract: The X-ray imaging device (100) is provided with an X-ray source (1), a plurality of gratings, a moving mechanism (8), and an image processing unit (6). The image processing unit (6) is configured to generate a phase-contrast image (16) by associating a pixel value in each pixel of a subject (T) in a plurality of subject images (10) with phase values of a Moire fringe (30) at each pixel and aligning the pixel of the subject of the same position in the plurality of subject images.
    Type: Grant
    Filed: January 22, 2019
    Date of Patent: May 10, 2022
    Assignee: Shimadzu Corporation
    Inventors: Satoshi Sano, Koichi Tanabe, Kenji Kimura, Yukihisa Wada, Satoshi Tokuda, Taro Shirai, Takahiro Doki, Akira Horiba, Naoki Morimoto
  • Patent number: 11175241
    Abstract: This X-ray phase image capturing system (100) includes an X-ray source (1), a plurality of gratings, and a detector (4), a moving mechanism (8), and an image processing unit (5). The image processing unit (5) is configured to generate a phase-contrast image (15) based on a plurality of feature quantities (12) and feature quantities 14 extracted from a plurality of X-ray image sets (R) acquired by performing fringe scanning a plurality of times in a short time.
    Type: Grant
    Filed: November 27, 2018
    Date of Patent: November 16, 2021
    Assignee: Shimadzu Corporation
    Inventors: Satoshi Sano, Kenji Kimura, Taro Shirai, Masanobu Sato, Takahiro Doki, Akira Horiba, Naoki Morimoto
  • Patent number: 11172897
    Abstract: A radiation phase contrast imaging device includes an X-ray source, an X-ray detector configured to detect radiated X-rays, a plurality of gratings, an image processor configured to generate a reconstructed image from an X-ray image acquired from the X-ray detector, a display, and a controller configured or programmed to perform control to display, on the display, the X-ray image before reconstruction and the reconstructed image generated by the image processor.
    Type: Grant
    Filed: October 12, 2018
    Date of Patent: November 16, 2021
    Assignee: Shimadzu Corporation
    Inventors: Kenji Kimura, Taro Shirai, Takahiro Doki, Satoshi Sano, Akira Horiba, Naoki Morimoto
  • Patent number: 11154270
    Abstract: This X-ray imaging apparatus (100) includes a rotation mechanism (8) for relatively rotating an imaging system (200) constituted by an X-ray source (1), a detector (5), a first grating (2) and a second grating (3), and an image processing unit (6) for generating a dark-field image based on an X-ray intensity distribution at each of a plurality of rotation angles. The image processing unit (6) is configured to perform a scattering correction for reducing a dark-field signal of a pixel whose dark-field signal is larger than a threshold value (V1) among a plurality of pieces of pixels in the dark-field image to a set value (V2).
    Type: Grant
    Filed: November 6, 2018
    Date of Patent: October 26, 2021
    Assignee: Shimadzu Corporation
    Inventors: Satoshi Sano, Kenji Kimura, Taro Shirai, Takahiro Doki, Akira Horiba, Naoki Morimoto
  • Publication number: 20210172885
    Abstract: The X-ray imaging device (100) is provided with an X-ray source (1), a plurality of gratings, a moving mechanism (8), and an image processing unit (6). The image processing unit (6) is configured to generate a phase-contrast image (16) by associating a pixel value in each pixel of a subject (T) in a plurality of subject images (10) with phase values of a Moire fringe (30) at each pixel and aligning the pixel of the subject of the same position in the plurality of subject images.
    Type: Application
    Filed: January 22, 2019
    Publication date: June 10, 2021
    Inventors: Satoshi SANO, Koichi TANABE, Kenji KIMURA, Yukihisa WADA, Satoshi TOKUDA, Taro SHIRAI, Takahiro DOKI, Akira HORIBA, Naoki MORIMOTO
  • Patent number: 11013482
    Abstract: A phase contrast X-ray imaging system includes an X-ray source; a plurality of gratings; a detector; a grating movement mechanism; and an image processor that generates a phase contrast image. The image processor generates the phase contrast image by using a pitch of an intensity change and a function which has the pitch as a variable and expresses the intensity change in a pixel value as a grating moves.
    Type: Grant
    Filed: September 19, 2018
    Date of Patent: May 25, 2021
    Assignee: Shimadzu Corporation
    Inventors: Naoki Morimoto, Kenji Kimura, Taro Shirai, Takahiro Doki, Satoshi Sano, Akira Horiba
  • Publication number: 20210148839
    Abstract: This X-ray phase image capturing system (100) includes an X-ray source (1), a plurality of gratings, and a detector (4), a moving mechanism (8), and an image processing unit (5). The image processing unit (5) is configured to generate a phase-contrast image (15) based on a plurality of feature quantities (12) and feature quantities 14 extracted from a plurality of X-ray image sets (R) acquired by performing fringe scanning a plurality of times in a short time.
    Type: Application
    Filed: November 27, 2018
    Publication date: May 20, 2021
    Inventors: Satoshi SANO, Kenji KIMURA, Taro SHIRAI, Masanobu SATO, Takahiro DOKI, Akira HORIBA, Naoki MORIMOTO
  • Patent number: 10980501
    Abstract: The X-ray phase imaging apparatus includes a position switching mechanism for switching a relative position of one or more gratings between a retreated position which is an outside of a detection range on a detection surface of an image signal detector and a detection positon which is an inside of the detection range on the detection surface of the image signal detector and a focal diameter changing unit configured to change a focal diameter of the X-ray source in conjunction with switching of the relative position of the one or more gratings.
    Type: Grant
    Filed: April 20, 2018
    Date of Patent: April 20, 2021
    Assignee: Shimadzu Corporation
    Inventors: Koichi Tanabe, Kenji Kimura, Toshinori Yoshimuta, Taro Shirai, Takahiro Doki, Satoshi Sano, Akira Horiba, Naoki Morimoto
  • Publication number: 20210059630
    Abstract: This X-ray imaging apparatus (100) includes a rotation mechanism (8) for relatively rotating an imaging system (200) constituted by an X-ray source (1), a detector (5), a first grating (2) and a second grating (3), and an image processing unit (6) for generating a dark-field image based on an X-ray intensity distribution at each of a plurality of rotation angles. The image processing unit (6) is configured to perform a scattering correction for reducing a dark-field signal of a pixel whose dark-field signal is larger than a threshold value (V1) among a plurality of pieces of pixels in the dark-field image to a set value (V2).
    Type: Application
    Filed: November 6, 2018
    Publication date: March 4, 2021
    Inventors: Satoshi SANO, Kenji KIMURA, Taro SHIRAI, Takahiro DOKI, Akira HORIBA, Naoki MORIMOTO
  • Publication number: 20210027472
    Abstract: An X-ray imaging apparatus is configured to acquire a plurality of pieces of slice image data from volume data, acquire a plurality of pieces of first processed image data by performing first processing, acquire a plurality of pieces of second processed image data by performing second processing, detect edges of the subject based on the acquired plurality of pieces of the second processed image data, and acquire edge image data including detected edges of the subject.
    Type: Application
    Filed: May 28, 2020
    Publication date: January 28, 2021
    Inventors: Naoki MORIMOTO, Kenji KIMURA, Taro SHIRAI, Takahiro DOKI
  • Patent number: 10863958
    Abstract: This X-ray phase difference imaging system (100) includes an X-ray source (1), a plurality of gratings, a detector (4), and an image processor (6), in which the image processor (6) is configured to correct an artifact of a second phase contrast image (10b) that is reconstructed by using a first X-ray image (9a) and a third X-ray image (9c), on the basis of a first phase contrast image (10a) that is reconstructed by using the first X-ray image (9a) and a second X-ray image (9b).
    Type: Grant
    Filed: September 18, 2018
    Date of Patent: December 15, 2020
    Assignee: Shimadzu Corporation
    Inventors: Taro Shirai, Kenji Kimura, Takahiro Doki, Satoshi Sano, Akira Horiba, Naoki Morimoto
  • Patent number: 10859512
    Abstract: Provided is a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject. According to the present invention, it is possible to provide a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject immediately before. That is, the apparatus of the present invention is provided with a phase grating 5 provided with a subject area and a reference area. Both areas each have a predetermined pattern that absorbs radiation, but the patterns are different from each other. In this area, an image of the phase grating 5 is observed in a moire pattern of a long period.
    Type: Grant
    Filed: March 15, 2017
    Date of Patent: December 8, 2020
    Assignee: Shimadzu Corporation
    Inventors: Koichi Tanabe, Toshinori Yoshimuta, Kenji Kimura, Hiroyuki Kishihara, Yukihisa Wada, Takuro Izumi, Taro Shirai, Takahiro Doki, Satoshi Sano, Akira Horiba
  • Patent number: 10837922
    Abstract: The X-ray imaging apparatus is provided with a plurality of gratings including an X-ray source and a first grating, a detector, a grating rotation mechanism for rotating a plurality of gratings respectively, and an image processor for generating at least a dark field image. The image processor is configured to generate a dark field image captured by arranging the grating at a plurality of angles in a plane orthogonal to the optical axis direction.
    Type: Grant
    Filed: August 29, 2018
    Date of Patent: November 17, 2020
    Assignee: Shimadzu Corporation
    Inventors: Satoshi Sano, Taro Shirai, Takahiro Doki, Akira Horiba, Naoki Morimoto, Kenji Kimura, Hiroshi Mizushima
  • Publication number: 20200333265
    Abstract: The X-ray phase imaging apparatus includes an imaging system, a position switching mechanism for switching between a retracted position and an imaging position, a control unit for controlling switching between the retracted position and the imaging position, and an image processing unit for generating an X-ray phase contrast image based on the first image and the second image. The control unit is configured to control sequentially imaging at the retracted position and imaging at the imaging position.
    Type: Application
    Filed: March 30, 2020
    Publication date: October 22, 2020
    Inventors: Takahiro DOKI, Kenji KIMURA, Taro SHIRAI, Satoshi SANO, Akira HORIBA, Naoki MORIMOTO
  • Patent number: 10809210
    Abstract: This X-ray phase imaging apparatus (100) includes a controller (5) that generates a dark field image (Iv) with respect to each of a plurality of relative positions between a subject (S) and an imaging grating (G1) changed by an adjustment mechanism (3) to acquire a contrast of a region of interest (ROI) in the dark field image (Iv), and controls the adjustment mechanism (3) to adjust a relative position between the subject (S) and the imaging grating (G1) based on the acquired contrast.
    Type: Grant
    Filed: September 6, 2017
    Date of Patent: October 20, 2020
    Assignee: Shimadzu Corporation
    Inventors: Akira Horiba, Taro Shirai, Takahiro Doki, Satoshi Sano
  • Patent number: 10801971
    Abstract: An X-ray phase contrast imaging system includes an X-ray source, a detector, a plurality of gratings including a first grating and a second grating, and a grating positional displacement acquisition section configured to obtain a positional displacement of the grating based on a Fourier transform image obtained by Fourier transforming an interference fringe image detected by the detector.
    Type: Grant
    Filed: April 20, 2018
    Date of Patent: October 13, 2020
    Assignee: Shimadzu Corporation
    Inventors: Naoki Morimoto, Taro Shirai, Takahiro Doki, Satoshi Sano, Akira Horiba
  • Patent number: 10786217
    Abstract: This X-ray phase-contrast imaging apparatus is equipped with a plurality of gratings and grating holders for holding the plurality of gratings. The plurality of gratings is arranged such that the extending direction of grating components of the plurality of gratings is oriented in a direction in which the positional displacement due to the grating holder becomes maximum in a plane orthogonal to an optical axis of the X-ray.
    Type: Grant
    Filed: June 7, 2018
    Date of Patent: September 29, 2020
    Assignee: Shimadzu Corporation
    Inventors: Akira Horiba, Taro Shirai, Takahiro Doki, Satoshi Sano, Naoki Morimoto