Patents by Inventor Takahiro DOKI

Takahiro DOKI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190343472
    Abstract: An X-ray phase contrast imaging device of the present invention can change an arrangement pitch of slits related to a multi-slit and an arrangement pitch of phase shift sections related to a phase grating. A positional relationship among the multi-slit 3b, the phase grating, and an FPD is determined based on the arrangement pitch of the slits related to the multi-slit, the arrangement pitch of the phase shift sections related to the phase grating, and an arrangement pitch of detection elements related to the FPD. Among these arrangement pitches, by changing the arrangement pitch of the slits and the arrangement pitch of the phase shift sections, the present invention can change the positional relationship among the multi-slit, the phase grating, and the FPD.
    Type: Application
    Filed: July 28, 2017
    Publication date: November 14, 2019
    Inventors: Satoshi SANO, Koichi TANABE, Toshinori YOSHIMUTA, Kenji KIMURA, Hiroyuki KISHIHARA, Yukihisa WADA, Takuro IZUMI, Taro SHIRAI, Takahiro DOKI, Akira HORIBA, Takayoshi SHIMURA, Heiji WATANABE, Takuji HOSOI
  • Patent number: 10441234
    Abstract: An X-ray phase-contrast imaging device capable of easily performing imaging of an object using X-rays of plural energies is provided. The disclosed exemplary configuration includes an X-ray source of a dual energy output type, and an FPD having a high energy X-ray detection surface and a low energy X-ray detection surface so that two types of imaging, imaging by high energy X-ray and imaging by low energy X-ray, can be performed. By imaging so as to scan the object while changing the relative position of the imaging system and the object, two types of imaging can be completed at once.
    Type: Grant
    Filed: June 15, 2017
    Date of Patent: October 15, 2019
    Assignee: Shimadzu Corporation
    Inventors: Koichi Tanabe, Shingo Furui, Hiroyuki Kishihara, Kenji Kimura, Taro Shirai, Takahiro Doki, Satoshi Sano, Akira Horiba
  • Publication number: 20190293577
    Abstract: This X-ray phase imaging apparatus (100) includes a controller (5) that generates a dark field image (Iv) with respect to each of a plurality of relative positions between a subject (S) and an imaging grating (G1) changed by an adjustment mechanism (3) to acquire a contrast of a region of interest (ROI) in the dark field image (Iv), and controls the adjustment mechanism (3) to adjust a relative position between the subject (S) and the imaging grating (G1) based on the acquired contrast.
    Type: Application
    Filed: December 8, 2016
    Publication date: September 26, 2019
    Inventors: Akira HORIBA, Taro SHIRAI, Takahiro DOKI, Satoshi SANO
  • Patent number: 10393890
    Abstract: In an X-ray imaging device according to a first embodiment, an X-ray detector has a configuration in which scintillator elements are defined by light-shielding walls in a lattice shape. Among X-rays incident on the X-ray detector, X-rays incident on the light-shielding walls are not converted into scintillator light and are transmitted by the X-ray detector. Accordingly, by causing X-rays to be incident on the X-ray detector in which the scintillator elements are defined by the light-shielding walls in a lattice shape, an area in which X-rays 3a transmitted by a subject M are incident on the X-ray detector can be limited to an arbitrary range. Accordingly, since a detection mask can be omitted in the X-ray imaging device which is used for EI-XPCi, it is possible to reduce a manufacturing cost of the X-ray imaging device.
    Type: Grant
    Filed: March 1, 2016
    Date of Patent: August 27, 2019
    Assignee: SHIMADZU CORPORATION
    Inventors: Koichi Tanabe, Shingo Furui, Toshinori Yoshimuta, Kenji Kimura, Akihiro Nishimura, Taro Shirai, Takahiro Doki, Satoshi Sano, Akira Horiba, Toshiyuki Sato
  • Patent number: 10365235
    Abstract: Provided is a radiation phase-contrast imaging device capable of assuredly detecting a self-image and precisely imaging the internal structure of an object. According to the configuration of the present invention, the longitudinal direction of a detection surface of a flat panel detector is inclined with respect to the extending direction of an absorber in a phase grating. This causes variations in the position (phase) of a projected stripe pattern of a self-image at different positions on the detection surface. This is therefore expected to produce the same effects as those obtainable when a plurality of self-images are obtained by performing imaging a plurality of times in such a manner that the position of the projected self-images on the detection surface varies. This alone, however, results in a single self-image phase for a specific region of the object.
    Type: Grant
    Filed: November 20, 2015
    Date of Patent: July 30, 2019
    Assignee: Shimadzu Corporation
    Inventors: Koichi Tanabe, Shingo Furui, Hiroyuki Kishihara, Kenji Kimura, Taro Shirai, Takahiro Doki, Satoshi Sano, Akira Horiba
  • Patent number: 10335109
    Abstract: Provided is a radiation phase difference imaging apparatus in which a separation distance between a phase grating and a radiation detector is optimized. The separation distance between the phase grating and a detection surface of an FPD is determined based on the magnitude of noise corruption in a self-image projected onto the detection surface. The magnitude of the effect of the noise is used as a basis for assessing the separation distance. It is determined whether a distance Zd is appropriate for imaging, based on the magnitude of noise corruption in the self-image in a self-image picture which is obtained when the distance Zd is the distance between the phase grating and the detection surface of the FPD. The separation distance can thus be optimized based on actual conditions of an actual X-ray source that emits a plurality of types of X-rays.
    Type: Grant
    Filed: March 6, 2015
    Date of Patent: July 2, 2019
    Assignee: Shimadzu Corporation
    Inventors: Satoshi Sano, Toshiyuki Sato, Koichi Tanabe, Shingo Furui, Toshinori Yoshimuta, Hiroyuki Kishihara, Takahiro Doki, Akira Horiba
  • Publication number: 20190175126
    Abstract: Provided is a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject. According to the present invention, it is possible to provide a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject immediately before. That is, the apparatus of the present invention is provided with a phase grating 5 provided with a subject area and a reference area. Both areas each have a predetermined pattern that absorbs radiation, but the patterns are different from each other. In this area, an image of the phase grating 5 is observed in a moire pattern of a long period.
    Type: Application
    Filed: March 15, 2017
    Publication date: June 13, 2019
    Inventors: Koichi TANABE, Toshinori YOSHIMUTA, Kenji KIMURA, Hiroyuki KISHIHARA, Yukihisa WADA, Takuro IZUMI, Taro SHIRAI, Takahiro DOKI, Satoshi SANO, Akira HORIBA
  • Publication number: 20190167219
    Abstract: This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1) that radiates continuous X-rays, a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects the continuous X-rays, and a third grating (2) arranged between the detector (5) and the first grating 3. The first grating (3), the second grating (4), and the third grating (2) are arranged so as to satisfy conditions of predetermined formulas.
    Type: Application
    Filed: July 10, 2017
    Publication date: June 6, 2019
    Inventors: Satoshi SANO, Koichi TANABE, Toshinori YOSHIMUTA, Kenji KIMURA, Hiroyuki KISHIHARA, Yukihisa WADA, Takuro IZUMI, Taro SHIRAI, Takahiro DOKI, Akira HORIBA, Takayoshi SHIMURA, Heiji WATANABE, Takuji HOSOI
  • Patent number: 10295678
    Abstract: A X-ray detector having enhanced X-ray sensitivity, which enables dual energy imaging having high diagnostic performance. This X-ray detector includes: scintillator elements which are partitioned by light blocking walls and which convert low-energy X-rays to light; and scintillator elements which are partitioned by light blocking walls and which convert high-energy X-rays to light. When seen from the direction of incidence of the X-rays, the positional pattern of the light blocking walls and that of the light blocking walls are configured so as not to be in alignment with each other. Accordingly, the X-rays incident on the X-ray detector are converted to light by at least either one of the scintillator elements and are finally outputted as X-ray detection signals.
    Type: Grant
    Filed: January 26, 2016
    Date of Patent: May 21, 2019
    Assignee: Shimadzu Corporation
    Inventors: Koichi Tanabe, Shingo Furui, Toshinori Yoshimuta, Kenji Kimura, Akihiro Nishimura, Taro Shirai, Takahiro Doki, Satoshi Sano, Akira Horiba, Toshiyuki Sato
  • Patent number: 10276276
    Abstract: A movable collimator is realized with a simple mechanism in a radiation phase-contrast image capturing device. A collimator is integrated with a multi-slit or a phase grating to provide a simpler device configuration. In some examples, the collimator and the multi-slit or phase grating may be configured to move while still providing image capturing.
    Type: Grant
    Filed: January 26, 2018
    Date of Patent: April 30, 2019
    Assignee: Shimadzu Corporation
    Inventors: Akira Horiba, Shingo Furui, Koichi Tanabe, Toshinori Yoshimuta, Kenji Kimura, Hiroyuki Kishihara, Takahiro Doki, Satoshi Sano
  • Publication number: 20190101496
    Abstract: A radiation phase contrast imaging apparatus is provided with an image signal generation system including an X-ray source and an image signal detector, a plurality of gratings including a first grating and a second grating, a holder for holding a plurality of gratings in a suspended manner, and a position switching mechanism for switching the relative position of the plurality of gratings with respect to the image signal generation system between the retracted position and the detection position. Either one of the plurality of gratings and the image signal generation system is held by a single holder.
    Type: Application
    Filed: July 26, 2018
    Publication date: April 4, 2019
    Inventors: Takahiro DOKI, Kenji KIMURA, Taro SHIRAI, Satoshi SANO, Akira HORIBA, Naoki MORIMOTO, Hiroshi MIZUSHIMA
  • Publication number: 20190072501
    Abstract: The radiation phase contrast imaging apparatus includes an X-ray source, a first grating, a second grating arranged between the X-ray source and the first grating, and a moving mechanism for moving an object stage for holding an object. The moving mechanism is configured to more the object stage to an X-ray source side of the first grating and a second grating side of the first grating opposite to the source side of the first grating.
    Type: Application
    Filed: August 29, 2018
    Publication date: March 7, 2019
    Inventors: Takahiro DOKI, Kenji KIMURA, Taro SHIRAI, Satoshi SANO, Akira HORIBA, Naoki MORIMOTO
  • Publication number: 20190072502
    Abstract: The X-ray imaging apparatus is provided with an X-ray source, a plurality of gratings including a first grating and a second grating, a detector, a rotation mechanism for relatively rotating a subject including a fiber bundle and an imaging system, and an image processor for generating a dark field image. The image processor is configured to obtain a three-dimensional dark field image of the subject including at least the fiber bundle from a plurality of dark field images captured at a plurality of rotation angles.
    Type: Application
    Filed: September 5, 2018
    Publication date: March 7, 2019
    Inventors: Satoshi SANO, Taro SHIRAI, Takahiro DOKI, Akira HORIBA, Naoki MORIMOTO
  • Publication number: 20190072503
    Abstract: The X-ray imaging apparatus is provided with a plurality of gratings including an X-ray source and a first grating, a detector, a grating rotation mechanism for rotating a plurality of gratings respectively, and an image processor for generating at least a dark field image. The image processor is configured to generate a dark field image captured by arranging the grating at a plurality of angles in a plane orthogonal to the optical axis direction.
    Type: Application
    Filed: August 29, 2018
    Publication date: March 7, 2019
    Inventors: Satoshi SANO, Taro SHIRAI, Takahiro DOKI, Akira HORIBA, Naoki MORIMOTO, Kenji KIMURA, Hiroshi MIZUSHIMA
  • Publication number: 20190056336
    Abstract: [PROBLEM TO BE SOLVED] To provide a radiation phase contrast imaging device having a small device configuration [SOLVING MEANS] The present invention focused on the findings that the distance between the phase grating 5 and the FPD 4 does not need to be the Talbot distance. The distance between the phase grating 5 and the FPD 4 can be more freely set. However, a self-image cannot be detected unless the self-image is sufficiently magnified with respect to the phase grating 5. The degree on how much the self-image is magnified on the FPD 4 with respect to the original phase grating 5 is determined by a magnification ratio X2/X1. Therefore, in the present invention, the magnification ratio is set to be the same as the magnification ratio in a conventional configuration. With this, even if the distance X2 between the radiation source 3 and the FPD 4 is reduced, a situation in which the self-image cannot be detected by the FPD 4 due to the excessively small size thereof does not occur.
    Type: Application
    Filed: February 22, 2017
    Publication date: February 21, 2019
    Applicants: SHIMADZU CORPORATION, OSAKA UNIVERSITY
    Inventors: Takahiro DOKI, Koichi TANABE, Toshinori YOSHIMUTA, Kenji KIMURA, Akihiro NISHIMURA, Taro SHIRAI, Satoshi SANO, Akira HORIBA, Takayoshi SHIMURA, Heiji WATANABE, Takuji HOSOI
  • Publication number: 20190025232
    Abstract: This X-ray phase imaging apparatus is provided with a control unit that acquires information on a defect of a material based on a dark field image of the material.
    Type: Application
    Filed: July 12, 2018
    Publication date: January 24, 2019
    Inventors: Satoshi SANO, Taro SHIRAI, Takahiro DOKI, Akira HORIBA, Naoki MORIMOTO
  • Publication number: 20180368799
    Abstract: The X-ray imaging apparatus is equipped with an image processing unit for performing a position adjustment of a first dark field image and a second dark field image based on a positional difference amount between a first absorption image of an object and a second absorption image of the object.
    Type: Application
    Filed: June 7, 2018
    Publication date: December 27, 2018
    Inventors: Satoshi SANO, Taro SHIRAI, Takahiro DOKI, Akira HORIBA, Naoki MORIMOTO
  • Publication number: 20180368795
    Abstract: This X-ray phase-contrast imaging apparatus is equipped with a plurality of gratings and grating holders for holding the plurality of gratings. The plurality of gratings is arranged such that the extending direction of grating components of the plurality of gratings is oriented in a direction in which the positional displacement due to the grating holder becomes maximum in a plane orthogonal to an optical axis of the X-ray.
    Type: Application
    Filed: June 7, 2018
    Publication date: December 27, 2018
    Inventors: Akira HORIBA, Taro SHIRAI, Takahiro DOKI, Satoshi SANO, Naoki MORIMOTO
  • Publication number: 20180364182
    Abstract: An X-ray phase-contrast imaging device capable of easily performing imaging of an object using X-rays of plural energies is provided. The disclosed exemplary configuration includes an X-ray source of a dual energy output type, and an FPD having a high energy X-ray detection surface and a low energy X-ray detection surface so that two types of imaging, imaging by high energy X-ray and imaging by low energy X-ray, can be performed. By imaging so as to scan the object while changing the relative position of the imaging system and the object, two types of imaging can be completed at once.
    Type: Application
    Filed: June 15, 2017
    Publication date: December 20, 2018
    Inventors: Koichi TANABE, Shingo FURUI, Hiroyuki KISHIHARA, Kenji KIMURA, Taro SHIRAI, Takahiro DOKI, Satoshi SANO, Akira HORIBA
  • Publication number: 20180306735
    Abstract: The X-ray phase imaging apparatus includes a position switching mechanism for switching a relative position of one or more gratings between a retreated position which is an outside of a detection range on a detection surface of an image signal detector and a detection positon which is an inside of the detection range on the detection surface of the image signal detector and a focal diameter changing unit configured to change a focal diameter of the X-ray source in conjunction with switching of the relative position of the one or more gratings.
    Type: Application
    Filed: April 20, 2018
    Publication date: October 25, 2018
    Inventors: Koichi TANABE, Kenji KIMURA, Toshinori YOSHIMUTA, Taro SHIRAI, Takahiro DOKI, Satoshi SANO, Akira HORIBA, Naoki MORIMOTO