Patents by Inventor Takahisa Hiraide

Takahisa Hiraide has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test pattern preparation system
    Patent number: 5815513
    Abstract: A test pattern preparation system for testing an LSI circuit, the system includes: a circuit data file for storing various circuit data; an old test pattern file for storing old test patterns; a test pattern preparation unit for performing a logic simulation, detecting "simultaneous-change action" based on a result of the logic simulation, and preparing a new test pattern in accordance with the circuit data and the old test patterns; and a new test pattern file for storing new test patterns which are prepared by the test pattern preparation unit.
    Type: Grant
    Filed: March 20, 1997
    Date of Patent: September 29, 1998
    Assignee: Fujitsu Limited
    Inventor: Takahisa Hiraide