Abstract: A conveyance apparatus connected to a substrate processing apparatus configured to bring a pressing member and a material on a substrate into contact with each other to form a cured film of the material on the substrate, the conveyance apparatus includes an acquisition unit configured to acquire a state of a peripheral portion of an adhesion substrate including the pressing member and the substrate adhering to the pressing member with the material interposed in between, a position adjusting unit configured to adjust a position of the adhesion substrate based on a result acquired by the acquisition unit, and a conveyance unit configured to convey the adhesion substrate adjusted by the position adjusting unit.

Abstract: A conveyance apparatus loads a pressing member to a planarization apparatus that forms a planarized film made of a material on a substrate by bringing a flat surface of the pressing member and the material on the substrate into contact with each other. The pressing member includes a first surface including the flat surface, and a second surface on an opposite side of the first surface. The conveyance apparatus comprises a determiner configured to perform determination as to whether a determination surface of the pressing member is the first surface or the second surface, and a controller configured to control the conveyance of the pressing member based on a result of the determination by the determiner.

Abstract: An electronic watch including a movement, and the movement includes a movement main body, a plate manufactured by a ferromagnetic metal, and a hook having flexibility, and the plate includes an engagement part that protrudes from the rear surface of the plate and which is configured to accommodate one end part of the hook, and the one end part of the hook is configured to be accommodated by the engagement part by elastically deforming the hook, and the other end part of the hook is fixed to the movement main body.

Abstract: An imprint apparatus forms a pattern on a substrate by bringing a pattern region of a mold into contact with imprint material on the substrate and curing the imprint material. The mold has first and second surfaces. The first surface includes the pattern region and a peripheral region surrounding the pattern region. The second surface includes a held region. The imprint apparatus includes a mold driving mechanism to hold the held region of the mold and drive the mold, a mold conveyance mechanism to hold the peripheral region of the mold and convey the mold, and a controller to control the mold conveyance mechanism based on thickness between the peripheral region and the held region.

Abstract: A mass analyzer includes a main substrate, an upper substrate adhered to the main substrate, and a lower substrate. A mass analysis room (cavity) is formed in the main substrate and penetrates from an upper surface of the first main substrate to a lower surface of the first main substrate. A vertical direction (Z direction) to the main substrate by the upper substrate, both sides of the lower substrate, a travelling direction (X direction) of charged particles and a right angle to the Z direction by the main substrate, and both sides of a right-angled direction (Y to Z direction) and the X direction by a side surface of the main substrate are surrounded. A central hole is open in the side plate of the main substrate that the charged particles enter. The charged particles enter the mass analysis room through the central hole formed in the first main substrate.

Abstract: An imprint device that forms a pattern by having the imprint material on a substrate and a mold come in contact with each other, the imprint device including a substrate holding unit that holds the substrate with a suction unit including partial areas, a moving unit including the substrate holding unit, a mold release being performed while a suction force of a partial area corresponding to an area in which the pattern is formed is set weaker than a suction force of other partial areas, an acquisition unit acquiring measurement data indicating a positional relationship between the substrate and the substrate holding unit, a target of the measurement data including an end portion of the substrate and the substrate holding unit, and a processor unit obtaining a correction amount to correct a positional deviation of the substrate with respect to the substrate holding unit using the acquired measurement data.

Abstract: An operation management system configured to acquire measured values of a workpiece from a numerical controller which controls a machine tool to measure the workpiece is provided with a measurement macro receiving unit configured to read a measurement macro for controlling the measurement from the numerical controller, a measurement macro analysis unit configured to analyze the measurement macro to identify the name of a measurement result variable loaded with the measured values, and a measurement result read-out unit configured to read out the value of the measurement result variable from the numerical controller. The operation management system easily acquires the result of the workpiece measurement from the numerical controller.

Abstract: An electronic watch including a movement, and the movement includes a movement main body, a plate manufactured by a ferromagnetic metal, and a hook having flexibility, and the plate includes an engagement part that protrudes from the rear surface of the plate and which is configured to accommodate one end part of the hook, and the one end part of the hook is configured to be accommodated by the engagement part by elastically deforming the hook, and the other end part of the hook is fixed to the movement main body.

Abstract: A mass analyzer includes a main substrate, an upper substrate adhered to the main substrate, and a lower substrate. A mass analysis room (cavity) is formed in the main substrate and penetrates from an upper surface of the first main substrate to a lower surface of the first main substrate. A vertical direction (Z direction) to the main substrate by the upper substrate, both sides of the lower substrate, a travelling direction (X direction) of charged particles and a right angle to the Z direction by the main substrate, and both sides of a right-angled direction (Y to Z direction) and the X direction by a side surface of the main substrate are surrounded. A central hole is open in the side plate of the main substrate that the charged particles enter. The charged particles enter the mass analysis room through the central hole formed in the first main substrate.

Abstract: A mass analyzer includes a main substrate, an upper substrate adhered to the main substrate, and a lower substrate. A mass analysis room (cavity) is formed in the main substrate and penetrates from an upper surface of the first main substrate to a lower surface of the first main substrate. A vertical direction (Z direction) to the main substrate by the upper substrate, both sides of the lower substrate, a travelling direction (X direction) of charged particles and a right angle to the Z direction by the main substrate, and both sides of a right-angled direction (Y to Z direction) and the X direction by a side surface of the main substrate are surrounded. A central hole is open in the side plate of the main substrate that the charged particles enter. The charged particles enter the mass analysis room through the central hole formed in the first main substrate.

Abstract: An imprint apparatus forms a pattern on a substrate by bringing a pattern region of a mold into contact with imprint material on the substrate and curing the imprint material. The mold has first and second surfaces. The first surface includes the pattern region and a peripheral region surrounding the pattern region. The second surface includes a held region. The imprint apparatus includes a mold driving mechanism to hold the held region of the mold and drive the mold, a mold conveyance mechanism to hold the peripheral region of the mold and convey the mold, and a controller to control the mold conveyance mechanism based on thickness between the peripheral region and the held region.

Abstract: A watch includes a dial plate, a patch antenna, an upper side display component at a visible side than the dial plate, and a lower side display component at the rear surface side of the dial plate. The watch includes a first component layer on which at least a part of a wheel train mechanism for driving the upper side display component and a motor for driving the wheel train mechanism are disposed, and a second component layer that is positioned between the first component layer and the dial plate, and on which the lower side display component and a driving component of the lower side display component are disposed. The patch antenna is disposed on the second component layer so as to be planarly overlapped with a metal component disposed on the first component layer.

Abstract: An operation management system configured to acquire measured values of a workpiece from a numerical controller which controls a machine tool to measure the workpiece is provided with a measurement macro receiving unit configured to read a measurement macro for controlling the measurement from the numerical controller, a measurement macro analysis unit configured to analyze the measurement macro to identify the name of a measurement result variable loaded with the measured values, and a measurement result read-out unit configured to read out the value of the measurement result variable from the numerical controller. The operation management system easily acquires the result of the workpiece measurement from the numerical controller.

Abstract: A mass analyzer includes a main substrate, an upper substrate adhered to the main substrate, and a lower substrate. A mass analysis room (cavity) is formed in the main substrate and penetrates from an upper surface of the first main substrate to a lower surface of the first main substrate. A vertical direction (Z direction) to the main substrate by the upper substrate, both sides of the lower substrate, a travelling direction (X direction) of charged particles and a right angle to the Z direction by the main substrate, and both sides of a right-angled direction (Y to Z direction) and the X direction by a side surface of the main substrate are surrounded. A central hole is open in the side plate of the main substrate that the charged particles enter. The charged particles enter the mass analysis room through the central hole formed in the first main substrate.

Abstract: A controller for controlling a machine tool and a robot includes a storage unit, configured to store an input machining program including a statement for machine tool and a statement for robot, and a machining program distribution unit configured to transfer the statement for machine tool, out of the statements for machine tool and statements for robot that are included in the stored machining program, to the machine tool control unit and to transfer the statement for robot to the robot control unit.

Abstract: An imprint device that forms a pattern by having the imprint material on a substrate and a mold come in contact with each other, the imprint device including a substrate holding unit that holds the substrate with a suction unit including partial areas, a moving unit including the substrate holding unit, a mold release being performed while a suction force of a partial area corresponding to an area in which the pattern is formed is set weaker than a suction force of other partial areas, an acquisition unit acquiring measurement data indicating a positional relationship between the substrate and the substrate holding unit, a target of the measurement data including an end portion of the substrate and the substrate holding unit, and a processor unit obtaining a correction amount to correct a positional deviation of the substrate with respect to the substrate holding unit using the acquired measurement data.

Abstract: A controller for controlling a machine tool and a robot includes a storage unit, configured to store an input machining program including a statement for machine tool and a statement for robot, and a machining program distribution unit configured to transfer the statement for machine tool, out of the statements for machine tool and statements for robot that are included in the stored machining program, to the machine tool control unit and to transfer the statement for robot to the robot control unit.

Abstract: A recording unit holds a plurality of examination data including the examination date of a performed examination. A search unit extracts examination data matching a set condition, of the plurality of examination data held in the recording unit. An output unit outputs a search result by the search unit. A first narrowing unit extracts examination data in which the examination date is included within a designated first period. A reference data determination unit classifies the examination data extracted by the first narrowing unit by an examinee and determines, for every examinee, one piece of the examination data to be a reference in accordance with a predetermined rule.

Abstract: A recording unit holds a plurality of examination data including the examination date of a performed examination. A search unit extracts examination data matching a set condition, of the plurality of examination data held in the recording unit. An output unit outputs a search result by the search unit. A first narrowing unit extracts examination data in which the examination date is included within a designated first period. A reference data determination unit classifies the examination data extracted by the first narrowing unit by an examinee and determines, for every examinee, one piece of the examination data to be a reference in accordance with a predetermined rule.

Abstract: A controller managing system that enables a computer of a managing device to efficiently perform communication processing with a plurality of controllers. These controllers are connected via a network. to the monitoring computer of the managing device. The monitoring computer performs a power status determination task and a monitoring task. Each controller transmits power-ON information representing a power ON state to the monitoring computer at prescribed intervals. When the power status determination task cannot receive the power-ON information within a predetermined time period from either one of the controllers, it is determined that the power supply to that controller is OFF. The monitoring task skips the controller that is determined as being in a power OFF state; so as not to receive data therefrom, and communicates with the next controller that is in a power ON state.