Abstract: Method for non-invasively profiling carrier concentration in In-containing compound semiconductor wafers that enables employing the profiled wafers themselves in semiconductor device applications. The method, which using the C/V technique profiles carrier concentration in wafers including an In-containing-compound semiconductor surface layer, is characterized in non-invasively profiling carrier concentration by contacting a liquid electrode on the wafer surface, and without using photo-etching, employing an applied voltage that is up to a voltage surpassing 10V.

Abstract: A coating device for applying a coating to a surface of a travelling continuous substrate by discharging it from a nozzle extending in a widthwise direction of the substrate. In the coating device, a plurality of discharge openings are arranged in a row at predetermined distances spaced apart from one another in a longitudinal direction of the nozzle. A flat surface is formed on at least a portion, of a tip end of said nozzle opposed to the substrate, which lies at a downstream side in a travelling direction of the substrate. The flat surface is adapted to permit the uniformization of the thickness of the coating discharged from the plurality of discharge openings onto the substrate. Thus, the coating can be applied widthwise uniformly onto the substrate with the aid of the flat surface. In addition, it is possible to reliably prevent the deformation of the discharge openings.

Abstract: A machine tool includes a tool (a drill or the like having a diameter of 2 mm or less), a camera (artificial retina chip or the like) which acquires an image of the tool, and an image processor which determines whether the tool is faulty based on the image acquired by the camera.

Abstract: The machine tool comprises a tool (a drill or the like whose diameter is 2 mm or less), a camera (artificial retina chip or the like) which acquires an image of the tool, and an image processor which determines whether the tool is faulty based on the image acquired by the camera.

Abstract: A method of calculating optical frequency spectrum for use in an optical-spectrum measuring apparatus for measuring optical spectrum characteristics of a light source. In the method, a bandwidth storage section stores a characteristic of a bandwidth of passed wavelengths with respect to a measuring wavelength of a spectrometer. A CPU obtains a bandwidth of wavelengths with respect to each measuring point in accordance with the stored bandwidth of wavelengths. Then, measured intensities of light at the measuring points are used to add measured values across the measured value in a required range of bandwidth of optical frequencies. Moreover, correction is performed in accordance with a ratio of the bandwidth of wavelengths at each of the measuring points and the intervals of wavelength at the measuring points. Thus, an intensity of light at each of the measuring points is obtained.

Abstract: The microcapsule magnetic display sheet is sequentially provided thereon with a transparent front sheet, a microcapsule layer coated on the transparent front sheet and then a ultraviolet ray curable resin layer. The ultraviolet ray curable resin layer is formed by painting liquid ultraviolet raycurable resin on the microcapsule layer first and then hardening it by irradiating it with UV rays. As the liquid ultraviolet ray curable resin can fill fine gaps of the microcapsules, no hollows left between the microcapsules and the UV resin layer. As the UV resin filled in gaps shares wording pressure, the microcapsules are fully protected and hardly be destroyed. After painting the liquid UV ray curable resin on the microcapsule layer and before it IS hardened, a separable film is covered on it. While a film is covered on it, the sheet is hard and if the film is separated, the sheet is soft. So the stiffness of the magnetic display sheet can be regulated by covering or not covering a film.

Abstract: A packet switching apparatus is disclosed which is adapted to determine and control an allowed transmission rate of a transmitting terminal in a packet switching network. The packet switching apparatus comprises a rate discriminator to monitor an interval of packet reception for each of connections, judge, based on the interval of packet reception, whether the transmitting terminal having sent the packet is in pause of transmission and determine a first allowed transmission rate for the transmitting terminal correspondingly to a result of the judgment, an ER calculator to calculate, based on a predetermined algorithm, a second allowed transmission rate for the transmitting terminal, and an ER setter to select one of the first allowed transmission rate determined by the rate discriminator and second allowed transmission rate calculated by the ER calculator, whichever is smaller, and write it into a packet returned to the transmitting terminal.

Abstract: Gelatin microcapsules for magnetic display enclosing therein dispersion medium, magnetic powder and nonmagnetic powder, characterized in that that the dispersion medium in the microcapsules is composed of at least low boiling point solvent, particle diameter of the microcapsules is ion a range of 400 .mu.m tap 800 .mu.m and particles bigger than average are removed out. And solvents with boiling point higher than 175 .degree. C., dispersant and suspension are contained in the dispersion medium, magnetic powder and nonmagnetic powder are affinity-treated. The microcapsule magnetic display sheet is produced by coating the above-described microcapsules. Therefore, recording speed and erasing speed are fast and recorded words or pictures are clear even if a magnetic force lower than 1100 gauss is used.

Abstract: A numerical control apparatus and a numerical control method is provided which permit high-accuracy and high-velocity travel at a joint between paths as well as simple and rapid calculations for this purpose. A path is inserted at the joint between the paths so as to achieve a continuous curvature.

Abstract: The object of the present invention it to provide an optical spectrum calculation method that can find an optical spectrum by an arbitrarily determined wavelength bandwidth even in a spectrometer in which the width of the emission slit cannot be arbitrarily changed.In order to attain this objective, a wavelength bandwidth memory unit 40 is provided, and in this wavelength bandwidth memory unit 40, the characteristics of the transiting wavelength bandwidth for the measured wavelength of spectrometer 5' are recorded. CPU 34 finds the wavelength bandwidth for each measurement point based on the recorded wavelength bandwidth.

Abstract: InGaAs photodiodes are produced on an epitaxial InP wafer having an InP substrate, epitaxially grown layers and an InGaAs light sensing layer. An insulating protection film of SixNy or SiOx with openings is selectively deposited on the epitaxial wafer. Compound semiconductor undercoats of a compound semiconductor with a narrower band gap than InP are grown on the InP window layers at the openings by utilizing the protection film as a mask. A p-type impurity from a solid source or a gas source is diffused through the undercoats and the epitaxial InP layer into the InGaAs sensing layer. Then, either p-electrodes are formed on the undercoats and the undercoats are etched by utilizing the p-electrodes as a mask, or the undercoats are shaped by selective etching in a form of p-electrodes and the p-electrodes are formed on the undercoats.

Abstract: An optical spectrum measuring apparatus is disclosed which is able to accurately measure the optical spectrum without an influence and to measure the light intensity per unit frequency without an influence of the change of the bandwidth of the wavelength because of the measured wavelength. The diffraction grating 4 emits the diffracted light with an appropriate wavelength corresponding to the incident angle after diffracting the parallel light. The outgoing light slit 6 passes the diffracted light with a length shorter than the slit width. The AD converter 9 measures the intensity of the diffracted light passed through the outgoing light slit 6. CPU 12 controls the incident angle and the width of the slit. The memory of the bandwidth of the wavelength 14 stores the bandwidth of the passed wavelength and the measured light intensity is adjusted with the bandwidth of the passed wavelength.

Abstract: A mechanical safety breaker for disengaging a mechanical connection between two mechanical members at a time when a force transmitted through the connection of the two members exceeds a predetermined value is provided by employing an overload breaker element made of a ceramic. A ceramic breaker element provides a long time stabilized fracture performance particularly when the load applied thereto is of a repetitive nature.

Abstract: First and second disc drives which respectively read first and second discs on which signals are digitally recorded perform multiprocessing of each disc's signals by a single demodulator circuit based on commands from a host device. In this way, the single demodulator circuit is shared by the first and the second disc drives, and each disc drive can be used in the same way as two independent disc drives.

Abstract: The present invention has the object of preventing saturation of an optical detector by applying an inverted bias voltage so as to allow accurate measurement of optical spectra. In order to achieve this object, the present invention provides voltage applying means 8 controlled by a control section 6 for applying an inverted bias voltage to the optical detector 3 in order to prevent saturation of the optical detector 3.

Abstract: In an apparatus for detecting an abnormality of a control system, the internal property calculating section thereof calculates an internal property of the control system only on the basis of a command value representing a position or a speed of the control system, and the abnormality judging section judges the existence of abnormalities of the control system on the basis of an internal property calculated by the internal property calculating section and an actual internal property of the control system. Consequently, the apparatus can precisely detect abnormalities without being influenced by an observed noise or an operational error.

Abstract: An optical spectrum measuring apparatus is disclosed that is able to take measurements at high speed. An encoder is connected to the rotational axis of a motor. A counter counts the number of pulses outputted from the encoder 14. A comparator, that is connected to the counter and a register, compares a value stored in the counter with a value stored in the register set by a control section, and outputs an AD conversion signal when the values are equal. The control section sets the register with a value corresponding to a first measurement point and rotates a diffraction grating at a constant speed from an angle corresponding to a measurement initiation wavelength to an angle corresponding to a measurement termination wavelength. An AD conversion signal is outputted from the comparator when a measurement point is reached, then the control section sets the register to a value corresponding to the next measurement point.

Abstract: Light source 1 emits light composed of various wavelength components from an emission end 1a. An optical fiber 2 receives the light from one end portion 2a and emits the light from the other end portion 2b. A Czerny-Turner dispersion spectroscope is formed by this end portion 2b, concave mirrors 3 and 5, a diffraction grating 4, and an emission slit 6. A mask 9 restricts the aperture diameter, so as to remove light which has spread wider than the aperture diameter of the mask 9 from the light which has passed through the emission slit 6.

Abstract: Fine processing of InP epitaxial wafers including As, In and P for producing laser diodes, light emitting diodes or photodiodes. The InP epitaxial wafer is selectively covered with striped protection mask films. The wafer is etched by some etchant which forms normal-mesas or mountain-shaped stripes under the masks. Then the wafer is again etched by a gas of thermally dissolved AsCl.sub.3 till the stripes have rectangle sections with erect surfaces. Buried layers of InP are grown on the eliminated parts of the wafer.

Abstract: A novel synthetic mixed-layer silicate consisting of the layers of serpentine and layers of saponite each having a specified chemical composition is proposed, which has excellent dispersibility in water to form a colloidal dispersion capable of being converted into a gel by standing to be useful as a gelating agent exhibiting thixotropy along with unique porosity characteristics which enable the use thereof as an adsorbent.