Patents by Inventor Takayuki Katsunuma

Takayuki Katsunuma has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11969575
    Abstract: A medical infusion pump includes: a reader configured to read identification information stored in an RF tag by wireless communication; and a control unit configured to set information about administration of a drug based on the identification information read from the RF tag. In a case in which the reader reads two different pieces of the identification information, the control unit selects only one piece of the identification information out of the two different pieces of the identification information and sets the information about administration based on said one piece of the identification information.
    Type: Grant
    Filed: April 20, 2022
    Date of Patent: April 30, 2024
    Assignee: TERUMO KABUSHIKI KAISHA
    Inventors: Takayuki Katsunuma, Takafumi Nomura
  • Patent number: 11955337
    Abstract: A substrate processing method includes: providing a substrate including a mask; forming a film on the mask; forming a reaction layer on a surface layer of the film; and removing the reaction layer by applying energy to the reaction layer.
    Type: Grant
    Filed: July 12, 2019
    Date of Patent: April 9, 2024
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Toru Hisamatsu, Takayuki Katsunuma, Shinya Ishikawa, Yoshihide Kihara, Masanobu Honda
  • Patent number: 11955316
    Abstract: A substrate processing method includes: providing a substrate including a first region and a second region into a chamber; forming a deposit film on the first region and the second region of the substrate by generating a first plasma from a first processing gas, and selectively etching the first region with respect to the second region by generating a second plasma from the second processing gas containing an inert gas. The first processing gas is a mixed gas including a first gas containing carbon atoms and fluorine atoms and a second gas containing silicon atoms.
    Type: Grant
    Filed: September 29, 2020
    Date of Patent: April 9, 2024
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Takayuki Katsunuma, Daisuke Nishide
  • Publication number: 20230420263
    Abstract: An etching method includes: (a) providing a substrate including an etching target film and a mask on the etching target film; (b) after (a), forming a metal-containing deposit on the mask by a first plasma generated from a first processing gas including a metal-containing gas and a hydrogen-containing gas; (c) after (b), deforming or modifying the metal-containing deposit by a second plasma generated from a second processing gas different from the first processing gas; and (d) after (c), etching the etching target film.
    Type: Application
    Filed: June 22, 2023
    Publication date: December 28, 2023
    Applicant: Tokyo Electron Limited
    Inventor: Takayuki KATSUNUMA
  • Publication number: 20230282447
    Abstract: A plasma processing method includes: providing a substrate including a silicon-containing film and a mask film having an opening pattern, on a substrate support; and etching the silicon-containing film using the mask film as a mask, with a plasma generated by a plasma generator provided in the chamber. The etching includes: supplying a processing gas containing one or more gases including carbon, hydrogen, and fluorine into the chamber; generating a plasma from the processing gas by supplying a source RF signal to the plasma generator; and supplying a bias RF signal to the substrate support unit. In the etching, the silicon-containing film is etched by at least hydrogen fluoride generated from the processing gas, while forming a carbon-containing film on at least a part of a surface of the mask film.
    Type: Application
    Filed: February 28, 2023
    Publication date: September 7, 2023
    Applicant: Tokyo Electron Limited
    Inventors: Takahiro YONEZAWA, Takayuki KATSUNUMA, Shinya ISHIKAWA, Koki TANAKA, Sho KUMAKURA
  • Publication number: 20230215707
    Abstract: An etching apparatus includes: a chamber; a substrate support disposed in the chamber; one or more heaters disposed in the substrate support; a gas supply; a plasma generator; a controller configured to perform an etching process comprising a plurality of cycles; and a heater controller. Each cycle includes: controlling the gas supply to supply a precursor into the chamber, thereby forming a precursor layer on a substrate supported by the substrate support, the substrate including a film and a mask; and controlling the gas supply and the plasma generator to supply a process gas into the chamber and generate a plasma from the process gas in the chamber, thereby etching the film through the mask.
    Type: Application
    Filed: March 16, 2023
    Publication date: July 6, 2023
    Applicant: Tokyo Electron Limited
    Inventors: Tomohiko NIIZEKI, Takayuki KATSUNUMA, Yoshihide KIHARA, Maju TOMURA
  • Patent number: 11664236
    Abstract: A plasma processing apparatus includes a plasma chamber that accommodates a substrate having a film including a side wall surface and a bottom surface that define an opening; and a controller that controls a process on the substrate in the plasma chamber. The controller includes a sequencer that performs a sequence including forming a precursor layer on the opening of the film; and generating a plasma to form a protective film on the side wall surface of the opening of the film from the precursor layer and to etch the bottom surface of the opening of the film. The controller simultaneously forms the protective film on the side wall surface of the opening of the film and etches the bottom surface of the opening of the film.
    Type: Grant
    Filed: January 19, 2021
    Date of Patent: May 30, 2023
    Assignee: TOKYO ELECTRON LIMITED
    Inventor: Takayuki Katsunuma
  • Patent number: 11637003
    Abstract: A method for etching a film includes: supplying a precursor gas to the substrate, thereby forming a precursor layer on a substrate; and etching the film with a chemical species from plasma formed from a processing gas so as to increase a depth of the opening, and form a protective region from the precursor layer with the chemical species or another chemical species from the plasma. A plurality of cycles each including the supplying the precursor gas and the etching the film is executed. A temperature of the substrate during execution of the etching the film included in at least one cycle of the plurality of cycles and a temperature of the substrate during execution of the etching the film included in at least one other cycle of the plurality of cycles are set to be different from each other.
    Type: Grant
    Filed: November 11, 2020
    Date of Patent: April 25, 2023
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Tomohiko Niizeki, Takayuki Katsunuma, Yoshihide Kihara, Maju Tomura
  • Patent number: 11617830
    Abstract: A medical pump includes a reader configured to read drug identification information, a storage unit that stores the drug identification information read by the reader, a notification unit, and a control unit, in which when the reader reads drug identification information anew while the drug identification information is stored in the storage unit, the control unit compares the drug identification information being stored in the storage unit with the drug identification information read anew by the reader, and when the drug identification information being stored in the storage unit does not match the drug identification information read anew by the reader, the control unit causes the notification unit to notify of non-matching between drugs.
    Type: Grant
    Filed: March 6, 2020
    Date of Patent: April 4, 2023
    Assignee: TERUMO KABUSHIKI KAISHA
    Inventor: Takayuki Katsunuma
  • Publication number: 20230058079
    Abstract: An etching method includes (a) performing a plasma etching on an organic film, having a mask formed thereon, to form a recess in the organic film; (b) forming an organic protective film on a side wall surface of the recess in the organic film; and (c) performing an additional plasma etching on the organic film after (b).
    Type: Application
    Filed: September 26, 2022
    Publication date: February 23, 2023
    Applicant: Tokyo Electron Limited
    Inventors: Takayuki KATSUNUMA, Masanobu HONDA, Yuta NAKANE, Shinya ISHIKAWA
  • Publication number: 20220375764
    Abstract: An apparatus and method process a substrate in a first session and a second session. In the first session, a hybrid gas application cycle is performed in a chamber that holds the substrate. A first gas is introduced for a first time period so components of the first gas adsorb onto the substrate. Subsequently, a second gas is introduced for a second time period so the second gas reacts with the components of the first gas to provide a protective layer on sidewalls of a pattern of the substrate, and the second gas etches a bottom portion of the pattern, a ratio of the first time period to the second time period being a use-ratio. Then, in a second session, the hybrid gas application cycle is repeated with a different use-ratio that corresponds with a vertical dimension of the pattern.
    Type: Application
    Filed: August 4, 2022
    Publication date: November 24, 2022
    Applicant: Tokyo Electron Limited
    Inventor: Takayuki KATSUNUMA
  • Patent number: 11501975
    Abstract: A substrate processing method includes a providing step, a forming step, and an etching step. In the providing step, a substrate including an etching target film, a first mask formed on the etching target film, and a second mask formed to cover at least a part of the first mask is provided. In the forming step, a protective film is formed on a side wall of the second mask by plasma generated from a first gas. In the etching step, the etching target film is etched with plasma generated from a second gas.
    Type: Grant
    Filed: December 24, 2020
    Date of Patent: November 15, 2022
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Daisuke Nishide, Takayuki Katsunuma
  • Publication number: 20220344158
    Abstract: A plasma processing apparatus includes a reaction chamber having a gas inlet and a gas outlet; a gas supply connected to the gas inlet; a substrate support disposed in the reaction chamber; a plasma generator that forms a plasma in the reaction chamber; and processing circuitry. The processing circuitry controls provision of a substrate on the substrate support, the substrate including an etching layer and a mask on the etching layer; controls provision of a Si-containing gas to the reaction chamber to deposit a Si-containing film on at least a sidewall of a recess in the etching layer; controls the gas supply to supply a gas mixture to the reaction chamber; and controls the plasma generator to generate a first plasma from the gas mixture, thereby modifying the Si-containing film to form a protective film on the sidewall of the recess.
    Type: Application
    Filed: July 8, 2022
    Publication date: October 27, 2022
    Applicant: Tokyo Electron Limited
    Inventor: Takayuki KATSUNUMA
  • Patent number: 11476123
    Abstract: An etching method includes (a) performing a plasma etching on an organic film, having a mask formed thereon, to form a recess in the organic film; (b) forming an organic protective film on a side wall surface of the recess in the organic film; and (c) performing an additional plasma etching on the organic film after (b).
    Type: Grant
    Filed: September 9, 2020
    Date of Patent: October 18, 2022
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Takayuki Katsunuma, Masanobu Honda, Yuta Nakane, Shinya Ishikawa
  • Patent number: 11443954
    Abstract: An apparatus and method process a substrate in a first session and a second session. In the first session, a hybrid gas application cycle is performed in a chamber that holds the substrate. A first gas is introduced for a first time period so components of the first gas adsorb onto the substrate. Subsequently, a second gas is introduced for a second time period so the second gas reacts with the components of the first gas to provide a protective layer on sidewalls of a pattern of the substrate, and the second gas etches a bottom portion of the pattern, a ratio of the first time period to the second time period being a use-ratio. Then, in a second session, the hybrid gas application cycle is repeated with a different use-ratio that corresponds with a vertical dimension of the pattern.
    Type: Grant
    Filed: December 10, 2019
    Date of Patent: September 13, 2022
    Assignee: TOKYO ELECTRON LIMITED
    Inventor: Takayuki Katsunuma
  • Patent number: 11417527
    Abstract: A method of forming a film on a substrate that includes an etching layer and a mask formed on the etching layer. The method comprises (a) exposing the substrate, in a reaction chamber, to a precursor to dispose precursor particles on at least a sidewall of a recess in the etching layer; (b) supplying an inhibitor gas and a modification gas to the reaction chamber to generate a plasma; and (c) modifying the precursor particles on the sidewall into a protective film while the inhibitor gas and the modification gas are supplied in the reaction chamber.
    Type: Grant
    Filed: August 28, 2020
    Date of Patent: August 16, 2022
    Assignee: TOKYO ELECTRON LIMITED
    Inventor: Takayuki Katsunuma
  • Publication number: 20220241496
    Abstract: A medical infusion pump includes: a reader configured to read identification information stored in an RF tag by wireless communication; and a control unit configured to set information about administration of a drug based on the identification information read from the RF tag. In a case in which the reader reads two different pieces of the identification information, the control unit selects only one piece of the identification information out of the two different pieces of the identification information and sets the information about administration based on said one piece of the identification information.
    Type: Application
    Filed: April 20, 2022
    Publication date: August 4, 2022
    Applicant: TERUMO KABUSHIKI KAISHA
    Inventors: Takayuki Katsunuma, Takafumi Nomura
  • Publication number: 20220115235
    Abstract: A substrate processing method includes: providing a substrate including a mask; forming a film on the mask; forming a reaction layer on a surface layer of the film; and removing the reaction layer by applying energy to the reaction layer.
    Type: Application
    Filed: July 12, 2019
    Publication date: April 14, 2022
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Toru HISAMATSU, Takayuki KATSUNUMA, Shinya ISHIKAWA, Yoshihide KIHARA, Masanobu HONDA
  • Publication number: 20220068645
    Abstract: A method of forming a film on a substrate that includes an etching layer and a mask formed on the etching layer. The method comprises (a) exposing the substrate, in a reaction chamber, to a precursor to dispose precursor particles on at least a sidewall of a recess in the etching layer; (b) supplying an inhibitor gas and a modification gas to the reaction chamber to generate a plasma; and (c) modifying the precursor particles on the sidewall into a protective film while the inhibitor gas and the modification gas are supplied in the reaction chamber.
    Type: Application
    Filed: August 28, 2020
    Publication date: March 3, 2022
    Applicant: Tokyo Electron Limited
    Inventor: Takayuki KATSUNUMA
  • Publication number: 20220068629
    Abstract: A substrate processing method includes step (a) of adsorbing a precursor on a side wall surface of a substrate where the side wall surface defines a recess in the substrate. The substrate processing method further includes step (b) of supplying a first chemical species and a second chemical species to the substrate. The first chemical species forms a film from the precursor on the side wall surface, and the second chemical species suppresses an increase of the thickness of the film. Steps (a) and (b) are alternately repeated.
    Type: Application
    Filed: August 27, 2021
    Publication date: March 3, 2022
    Applicant: TOKYO ELECTRON LIMITED
    Inventor: Takayuki KATSUNUMA