Patents by Inventor Takayuki Katsunuma
Takayuki Katsunuma has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Medical infusion pump, method of controlling medical infusion pump, and medical infusion pump system
Patent number: 11969575Abstract: A medical infusion pump includes: a reader configured to read identification information stored in an RF tag by wireless communication; and a control unit configured to set information about administration of a drug based on the identification information read from the RF tag. In a case in which the reader reads two different pieces of the identification information, the control unit selects only one piece of the identification information out of the two different pieces of the identification information and sets the information about administration based on said one piece of the identification information.Type: GrantFiled: April 20, 2022Date of Patent: April 30, 2024Assignee: TERUMO KABUSHIKI KAISHAInventors: Takayuki Katsunuma, Takafumi Nomura -
Patent number: 11955337Abstract: A substrate processing method includes: providing a substrate including a mask; forming a film on the mask; forming a reaction layer on a surface layer of the film; and removing the reaction layer by applying energy to the reaction layer.Type: GrantFiled: July 12, 2019Date of Patent: April 9, 2024Assignee: TOKYO ELECTRON LIMITEDInventors: Toru Hisamatsu, Takayuki Katsunuma, Shinya Ishikawa, Yoshihide Kihara, Masanobu Honda
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Patent number: 11955316Abstract: A substrate processing method includes: providing a substrate including a first region and a second region into a chamber; forming a deposit film on the first region and the second region of the substrate by generating a first plasma from a first processing gas, and selectively etching the first region with respect to the second region by generating a second plasma from the second processing gas containing an inert gas. The first processing gas is a mixed gas including a first gas containing carbon atoms and fluorine atoms and a second gas containing silicon atoms.Type: GrantFiled: September 29, 2020Date of Patent: April 9, 2024Assignee: TOKYO ELECTRON LIMITEDInventors: Takayuki Katsunuma, Daisuke Nishide
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Publication number: 20230420263Abstract: An etching method includes: (a) providing a substrate including an etching target film and a mask on the etching target film; (b) after (a), forming a metal-containing deposit on the mask by a first plasma generated from a first processing gas including a metal-containing gas and a hydrogen-containing gas; (c) after (b), deforming or modifying the metal-containing deposit by a second plasma generated from a second processing gas different from the first processing gas; and (d) after (c), etching the etching target film.Type: ApplicationFiled: June 22, 2023Publication date: December 28, 2023Applicant: Tokyo Electron LimitedInventor: Takayuki KATSUNUMA
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Publication number: 20230282447Abstract: A plasma processing method includes: providing a substrate including a silicon-containing film and a mask film having an opening pattern, on a substrate support; and etching the silicon-containing film using the mask film as a mask, with a plasma generated by a plasma generator provided in the chamber. The etching includes: supplying a processing gas containing one or more gases including carbon, hydrogen, and fluorine into the chamber; generating a plasma from the processing gas by supplying a source RF signal to the plasma generator; and supplying a bias RF signal to the substrate support unit. In the etching, the silicon-containing film is etched by at least hydrogen fluoride generated from the processing gas, while forming a carbon-containing film on at least a part of a surface of the mask film.Type: ApplicationFiled: February 28, 2023Publication date: September 7, 2023Applicant: Tokyo Electron LimitedInventors: Takahiro YONEZAWA, Takayuki KATSUNUMA, Shinya ISHIKAWA, Koki TANAKA, Sho KUMAKURA
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Publication number: 20230215707Abstract: An etching apparatus includes: a chamber; a substrate support disposed in the chamber; one or more heaters disposed in the substrate support; a gas supply; a plasma generator; a controller configured to perform an etching process comprising a plurality of cycles; and a heater controller. Each cycle includes: controlling the gas supply to supply a precursor into the chamber, thereby forming a precursor layer on a substrate supported by the substrate support, the substrate including a film and a mask; and controlling the gas supply and the plasma generator to supply a process gas into the chamber and generate a plasma from the process gas in the chamber, thereby etching the film through the mask.Type: ApplicationFiled: March 16, 2023Publication date: July 6, 2023Applicant: Tokyo Electron LimitedInventors: Tomohiko NIIZEKI, Takayuki KATSUNUMA, Yoshihide KIHARA, Maju TOMURA
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Patent number: 11664236Abstract: A plasma processing apparatus includes a plasma chamber that accommodates a substrate having a film including a side wall surface and a bottom surface that define an opening; and a controller that controls a process on the substrate in the plasma chamber. The controller includes a sequencer that performs a sequence including forming a precursor layer on the opening of the film; and generating a plasma to form a protective film on the side wall surface of the opening of the film from the precursor layer and to etch the bottom surface of the opening of the film. The controller simultaneously forms the protective film on the side wall surface of the opening of the film and etches the bottom surface of the opening of the film.Type: GrantFiled: January 19, 2021Date of Patent: May 30, 2023Assignee: TOKYO ELECTRON LIMITEDInventor: Takayuki Katsunuma
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Patent number: 11637003Abstract: A method for etching a film includes: supplying a precursor gas to the substrate, thereby forming a precursor layer on a substrate; and etching the film with a chemical species from plasma formed from a processing gas so as to increase a depth of the opening, and form a protective region from the precursor layer with the chemical species or another chemical species from the plasma. A plurality of cycles each including the supplying the precursor gas and the etching the film is executed. A temperature of the substrate during execution of the etching the film included in at least one cycle of the plurality of cycles and a temperature of the substrate during execution of the etching the film included in at least one other cycle of the plurality of cycles are set to be different from each other.Type: GrantFiled: November 11, 2020Date of Patent: April 25, 2023Assignee: TOKYO ELECTRON LIMITEDInventors: Tomohiko Niizeki, Takayuki Katsunuma, Yoshihide Kihara, Maju Tomura
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Patent number: 11617830Abstract: A medical pump includes a reader configured to read drug identification information, a storage unit that stores the drug identification information read by the reader, a notification unit, and a control unit, in which when the reader reads drug identification information anew while the drug identification information is stored in the storage unit, the control unit compares the drug identification information being stored in the storage unit with the drug identification information read anew by the reader, and when the drug identification information being stored in the storage unit does not match the drug identification information read anew by the reader, the control unit causes the notification unit to notify of non-matching between drugs.Type: GrantFiled: March 6, 2020Date of Patent: April 4, 2023Assignee: TERUMO KABUSHIKI KAISHAInventor: Takayuki Katsunuma
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Publication number: 20230058079Abstract: An etching method includes (a) performing a plasma etching on an organic film, having a mask formed thereon, to form a recess in the organic film; (b) forming an organic protective film on a side wall surface of the recess in the organic film; and (c) performing an additional plasma etching on the organic film after (b).Type: ApplicationFiled: September 26, 2022Publication date: February 23, 2023Applicant: Tokyo Electron LimitedInventors: Takayuki KATSUNUMA, Masanobu HONDA, Yuta NAKANE, Shinya ISHIKAWA
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Publication number: 20220375764Abstract: An apparatus and method process a substrate in a first session and a second session. In the first session, a hybrid gas application cycle is performed in a chamber that holds the substrate. A first gas is introduced for a first time period so components of the first gas adsorb onto the substrate. Subsequently, a second gas is introduced for a second time period so the second gas reacts with the components of the first gas to provide a protective layer on sidewalls of a pattern of the substrate, and the second gas etches a bottom portion of the pattern, a ratio of the first time period to the second time period being a use-ratio. Then, in a second session, the hybrid gas application cycle is repeated with a different use-ratio that corresponds with a vertical dimension of the pattern.Type: ApplicationFiled: August 4, 2022Publication date: November 24, 2022Applicant: Tokyo Electron LimitedInventor: Takayuki KATSUNUMA
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Patent number: 11501975Abstract: A substrate processing method includes a providing step, a forming step, and an etching step. In the providing step, a substrate including an etching target film, a first mask formed on the etching target film, and a second mask formed to cover at least a part of the first mask is provided. In the forming step, a protective film is formed on a side wall of the second mask by plasma generated from a first gas. In the etching step, the etching target film is etched with plasma generated from a second gas.Type: GrantFiled: December 24, 2020Date of Patent: November 15, 2022Assignee: TOKYO ELECTRON LIMITEDInventors: Daisuke Nishide, Takayuki Katsunuma
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Publication number: 20220344158Abstract: A plasma processing apparatus includes a reaction chamber having a gas inlet and a gas outlet; a gas supply connected to the gas inlet; a substrate support disposed in the reaction chamber; a plasma generator that forms a plasma in the reaction chamber; and processing circuitry. The processing circuitry controls provision of a substrate on the substrate support, the substrate including an etching layer and a mask on the etching layer; controls provision of a Si-containing gas to the reaction chamber to deposit a Si-containing film on at least a sidewall of a recess in the etching layer; controls the gas supply to supply a gas mixture to the reaction chamber; and controls the plasma generator to generate a first plasma from the gas mixture, thereby modifying the Si-containing film to form a protective film on the sidewall of the recess.Type: ApplicationFiled: July 8, 2022Publication date: October 27, 2022Applicant: Tokyo Electron LimitedInventor: Takayuki KATSUNUMA
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Patent number: 11476123Abstract: An etching method includes (a) performing a plasma etching on an organic film, having a mask formed thereon, to form a recess in the organic film; (b) forming an organic protective film on a side wall surface of the recess in the organic film; and (c) performing an additional plasma etching on the organic film after (b).Type: GrantFiled: September 9, 2020Date of Patent: October 18, 2022Assignee: TOKYO ELECTRON LIMITEDInventors: Takayuki Katsunuma, Masanobu Honda, Yuta Nakane, Shinya Ishikawa
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Patent number: 11443954Abstract: An apparatus and method process a substrate in a first session and a second session. In the first session, a hybrid gas application cycle is performed in a chamber that holds the substrate. A first gas is introduced for a first time period so components of the first gas adsorb onto the substrate. Subsequently, a second gas is introduced for a second time period so the second gas reacts with the components of the first gas to provide a protective layer on sidewalls of a pattern of the substrate, and the second gas etches a bottom portion of the pattern, a ratio of the first time period to the second time period being a use-ratio. Then, in a second session, the hybrid gas application cycle is repeated with a different use-ratio that corresponds with a vertical dimension of the pattern.Type: GrantFiled: December 10, 2019Date of Patent: September 13, 2022Assignee: TOKYO ELECTRON LIMITEDInventor: Takayuki Katsunuma
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Patent number: 11417527Abstract: A method of forming a film on a substrate that includes an etching layer and a mask formed on the etching layer. The method comprises (a) exposing the substrate, in a reaction chamber, to a precursor to dispose precursor particles on at least a sidewall of a recess in the etching layer; (b) supplying an inhibitor gas and a modification gas to the reaction chamber to generate a plasma; and (c) modifying the precursor particles on the sidewall into a protective film while the inhibitor gas and the modification gas are supplied in the reaction chamber.Type: GrantFiled: August 28, 2020Date of Patent: August 16, 2022Assignee: TOKYO ELECTRON LIMITEDInventor: Takayuki Katsunuma
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MEDICAL INFUSION PUMP, METHOD OF CONTROLLING MEDICAL INFUSION PUMP, AND MEDICAL INFUSION PUMP SYSTEM
Publication number: 20220241496Abstract: A medical infusion pump includes: a reader configured to read identification information stored in an RF tag by wireless communication; and a control unit configured to set information about administration of a drug based on the identification information read from the RF tag. In a case in which the reader reads two different pieces of the identification information, the control unit selects only one piece of the identification information out of the two different pieces of the identification information and sets the information about administration based on said one piece of the identification information.Type: ApplicationFiled: April 20, 2022Publication date: August 4, 2022Applicant: TERUMO KABUSHIKI KAISHAInventors: Takayuki Katsunuma, Takafumi Nomura -
Publication number: 20220115235Abstract: A substrate processing method includes: providing a substrate including a mask; forming a film on the mask; forming a reaction layer on a surface layer of the film; and removing the reaction layer by applying energy to the reaction layer.Type: ApplicationFiled: July 12, 2019Publication date: April 14, 2022Applicant: TOKYO ELECTRON LIMITEDInventors: Toru HISAMATSU, Takayuki KATSUNUMA, Shinya ISHIKAWA, Yoshihide KIHARA, Masanobu HONDA
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Publication number: 20220068645Abstract: A method of forming a film on a substrate that includes an etching layer and a mask formed on the etching layer. The method comprises (a) exposing the substrate, in a reaction chamber, to a precursor to dispose precursor particles on at least a sidewall of a recess in the etching layer; (b) supplying an inhibitor gas and a modification gas to the reaction chamber to generate a plasma; and (c) modifying the precursor particles on the sidewall into a protective film while the inhibitor gas and the modification gas are supplied in the reaction chamber.Type: ApplicationFiled: August 28, 2020Publication date: March 3, 2022Applicant: Tokyo Electron LimitedInventor: Takayuki KATSUNUMA
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Publication number: 20220068629Abstract: A substrate processing method includes step (a) of adsorbing a precursor on a side wall surface of a substrate where the side wall surface defines a recess in the substrate. The substrate processing method further includes step (b) of supplying a first chemical species and a second chemical species to the substrate. The first chemical species forms a film from the precursor on the side wall surface, and the second chemical species suppresses an increase of the thickness of the film. Steps (a) and (b) are alternately repeated.Type: ApplicationFiled: August 27, 2021Publication date: March 3, 2022Applicant: TOKYO ELECTRON LIMITEDInventor: Takayuki KATSUNUMA