Abstract: An antireflection film includes a first layer and a second layer formed on a substrate in this order from the substrate side, the second layer being formed to be in contact with an ambient medium. The first layer and the second layer are formed such that an average refractive index n1 of the first layer at a given wavelength ?0, an average refractive index n2 of the second layer at the given wavelength ?0, a film thickness d1 of the first layer, and a film thickness d2 of the second layer satisfy conditional expressions below: 0.96<n1/(n0×n0×n3)1/3<1.04, 0.96<n2/(n0×n3×n3)1/3<1.04, 0.8<d1×n1/(?0/6)<1.2, and 0.8<d2×n2/(?0/6)<1.2, where n0 is a refractive index of the substrate at the given wavelength ?0, and n3 is a refractive index of the ambient medium at the given wavelength ?0.

Abstract: An imaging apparatus, including imaging optical system having a lens group and an aperture stop, and a solid-state image sensor which includes a photoelectric conversion layer made of an organic material and a color filter layer with color filters of two or more colors and a separation wall. The photoelectric conversion layer has a thickness of 0.1 82 m to 1 ?m, each of the color filters has a refractive index of 1.5 to 1.8, the separation wall has a width of 0.05 ?m to 0.2 ?m and a refractive index of 1.22 to 1.34, and the lens group and the solid-state image sensor are disposed such that the relationship between a pixel pitch D (?m) of the sensor and a maximum angle ? (°) of a principal ray incident on the sensor is 45???25.D?20 where D?2.6 ?m.

Abstract: A heat-ray shielding material including: two or more metal particle-containing layers each containing at least one kind of metal particles; and one or more transparent dielectric layers, the heat-ray shielding material having a lamination structure where the metal particle-containing layers and the dielectric layers are alternatingly laminated, wherein at least one of the transparent dielectric layers has an optical thickness (nd) which satisfies the following expression (1) with respect to wavelength ?1 at which reflectance of the transparent dielectric layer is minimum: {(2m+1)×(?1/4)}?{(?1/4)×0.25}<nd<{(2m+1)×(?1/4)}+{(?1/4)×0.25}??Expression (1) where m is an integer of 0 or greater, ?1 is a wavelength at which the reflectance is minimum, n is a refractive index of the dielectric layer and d is a thickness (nm) of the dielectric layer.

Abstract: There is provided a defect detection apparatus including: a light illumination section; a group of lenses including an object lens and a focusing lens; a light splitter section that splits the light passing through the lens group into two beams; a deflecting section; a phase shifting section that shifts the phase of the at least one of the beams from the two beams; a wave combining section that wave combines the two beams phase shifted by the phase shifting section; and an imaging section that captures an optical image of light wave combined by the wave combining section, wherein the object lens and the focusing lens are disposed such that two beams that have passed through the focusing lens are parallel to each other and the main axes of the two beams that have passed through the focusing lens are parallel to each other.

Abstract: A sensor is an optical resonator constituted by: a first reflecting body that exhibits semi transmissivity/semi reflectivity; a transparent body; and a second reflecting body that exhibits one of reflectivity and semi transmissivity/semi reflectivity, provided in this order from the light incident side. The sensor is configured such that the absorption peak of the measuring light beam by resonance in the optical resonator matches the absorption peak of the measuring light beam by local plasmon resonance generated at the surface and/or within the optical resonator. The sensor has absorption properties such that light of specific wavelengths are absorbed depending the mean complex refractive indices of the first and second reflecting bodies and the thickness of the transparent body. An emitted light beam is output from the first reflecting body. The physical properties of the emitted light beam that change according to the absorption properties are detected.

Abstract: The present invention provides an organic electroluminescence display device including an organic electroluminescence element which includes a transparent electrode, a counter electrode, and an organic compound layer provided between these electrodes, the organic compound layer including a light emitting layer, and a fine particle containing layer positioned in the optical path of light emitted from the light emitting layer, wherein the fine particle containing layer contains an organic resin material, a first fine particle, and a second fine particle having a weight average particle diameter greater than that of the first fine particle, wherein a refractive index n1 of the organic resin material into which the first fine particle is added and an average refractive index n2 of the organic compound layer satisfy a relationship |n1?n2|<0.25, and wherein the refractive index n1 and a refractive index n3 of the second fine particle satisfy a relationship n3?n1>0.2.

Abstract: A Raman spectroscopic device includes an optical resonator, in which a first reflecting body that exhibits semi transmissivity/semi reflectivity and has a surface which is a light scattering surface that generates Raman scattering, a transparent body, and a second reflecting body that exhibits reflectivity, are laminated in sequence one on another. The Raman spectroscopic device utilizes light absorption due to resonance to obtain a surface amplified Raman effect.

Abstract: In an apparatus for analyzing an electromagnetic field in an analytical space: a range setting unit sets the range of the analytical space; an object-information setting unit sets a distribution-index value indicating the amount of particles distributed in the range, the dimensions of the particles, a first material-property value of a first material of which the particles are formed, and a second material-property value of a second material existing around the particles in the range; a model production unit produces a calculation model of an arrangement in which the particles are arranged at random positions in the range so as to realize the distribution-index value, the dimensions of the particles, the first material-property value, and the second material-property value which are set by the object-information setting unit; and an analysis unit analyzes the electromagnetic field in the range in accordance with the calculation model.

Abstract: The present invention provides a heat ray-shielding material which includes metal particle-containing layer containing at least one kind of metal particle, wherein the metal particle contains substantially hexagonal or substantially discoidal metallic flat particles in an amount of 60% by number or more, and the main planes of the metallic flat particles are oriented at an angle ranging from 0° to ±30° relative to one surface of the metal particle-containing layer.

Abstract: A measurement apparatus includes a dielectric block, a thin film layer formed on the dielectric block and brought into contact with a sample, a light source for generating a light beam, an optical incident system for causing the light beam to enter the dielectric block so that the light beam is totally reflected at the interface between the dielectric block and the thin film, and a two-dimensional light detection means for detecting the intensity of the light beam totally reflected at the interface. A predetermined pattern is formed within a region irradiated with the light beam on the dielectric block. The measurement apparatus includes a correction means for correcting an output from the two-dimensional light detection means, based on the pattern, so that an object on the face of the dielectric block is similar to the object detected by the two-dimensional detection means.

Abstract: A two-photon absorbing optical recording material comprising at least one two-photon absorbing compound and a recording component is provided. Recording is made on it by utilizing the two-photon absorption of the two-photon absorbing compound in the material, and then the material is irradiated with light to thereby detect the difference in the reflectance between the recorded area and the unrecorded area thereof, and the recorded information is thereby reproduced from the material, and also provided are a photosensitive polymer composition and a photon-mode recording method for the material.

Abstract: The present invention provides an organic electroluminescence display device including an organic electroluminescence element which includes a transparent electrode, a counter electrode, and an organic compound layer provided between these electrodes, the organic compound layer including a light emitting layer, and a fine particle containing layer positioned in the optical path of light emitted from the light emitting layer, wherein the fine particle containing layer contains an organic resin material, a first fine particle, and a second fine particle having a weight average particle diameter greater than that of the first fine particle, wherein a refractive index n1 of the organic resin material into which the first fine particle is added and an average refractive index n2 of the organic compound layer satisfy a relationship |n1?n2|<0.25, and wherein the refractive index n1 and a refractive index n3 of the second fine particle satisfy a relationship n3?n1>0.2.

Abstract: A two-photon absorbing optical recording material comprising at least one two-photon absorbing compound and a recording component is provided. Recording is made on it by utilizing the two-photon absorption of the two-photon absorbing compound in the material, and then the material is irradiated with light to thereby detect the difference in the reflectance between the recorded area and the unrecorded area thereof, and the recorded information is thereby reproduced from the material, and also provided are a photosensitive polymer composition and a photon-mode recording method for the material.

Abstract: A Raman spectroscopic device includes an optical resonator, in which a first reflecting body that exhibits semi transmissivity/semi reflectivity and has a surface which is a light scattering surface that generates Raman scattering, a transparent body, and a second reflecting body that exhibits reflectivity, are laminated in sequence one on another. The Raman spectroscopic device utilizes light absorption due to resonance to obtain a surface amplified Raman effect.

Abstract: A new and novel sensor having a simple structure with high detection sensitivity. The sensor (S1) includes the following from measuring light (L1) input side in the order listed below: a first reflector (10) having semi-transmissive and semi-reflective properties; a translucent body (20); and a second reflector (30) having perfect reflection properties, or semi-transmissive and semi-reflective properties. The first reflector (10) and/or second reflector is brought into contact with a specimen, and the average complex refractive index varies with the specimen. Absorption properties for absorbing light having a particular wavelength are produced by these components, the properties of the measuring light (L1) are changed by the optical properties including the absorption properties, the output light (L2) is outputted from the first reflector (10) and/or second reflector (30), and the physical properties of the output light (L2) that vary according to the optical properties are detected.

Abstract: Light guides are formed above each light receiving element. These light guides are made of a high refractive index material, and surrounded by a material of lower refractive index. The light guides are each made up of a light introduction region leading with a constant width from a light entrance surface, and a tapered reduced region leading from the light introduction region to a light exit surface. The light introduction region totally reflects the incident light toward the reduced region. The reduced region, owing to its tapered shape, surely directs the light onto a light receiving element, and prevents the light from entering charge transfer paths around the light receiving element.

Abstract: A sample holding device used for a mass spectroscope includes a substrate on which a detection surface is formed, a measuring region formed on the detection surface of the substrate and having placed thereon at least an analyte, and a reference region formed in another region of the detection surface of the substrate except for the measuring region, the reference region having the same configuration as the measuring region except that the former does not have the analyte placed thereon.

Abstract: A new and novel sensor having a simple structure with high detection sensitivity. The sensor (S1) includes the following from measuring light (L1) input side in the order listed below: a first reflector (10) having semi-transmissive and semi-reflective properties; a translucent body (20); and a second reflector (30) having perfect reflection properties, or semi-transmissive and semi-reflective properties. The first reflector (10) and/or second reflector is brought into contact with a specimen, and the average complex refractive index varies with the specimen. Absorption properties for absorbing light having a particular wavelength are produced by these components, the properties of the measuring light (L1) are changed by the optical properties including the absorption properties, the output light (L2) is outputted from the first reflector (10) and/or second reflector (30), and the physical properties of the output light (L2) that vary according to the optical properties are detected.

Abstract: A measurement apparatus includes a dielectric block, a thin film layer formed on the dielectric block and brought into contact with a sample, a light source for generating a light beam, an optical incident system for causing the light beam to enter the dielectric block so that the light beam is totally reflected at the interface between the dielectric block and the thin film, and a two-dimensional light detection means for detecting the intensity of the light beam totally reflected at the interface. A predetermined pattern is formed within a region irradiated with the light beam on the dielectric block. The measurement apparatus includes a correction means for correcting an output from the two-dimensional light detection means, based on the pattern, so that an object on the face of the dielectric block is similar to the object detected by the two-dimensional detection means.

Abstract: A measurement apparatus includes a dielectric block, a thin film layer formed on the dielectric block and brought into contact with a sample, a light source for generating a light beam, an optical incident system for causing the light beam to enter the dielectric block so that the light beam is totally reflected at the interface between the dielectric block and the thin film, and a two-dimensional light detection means for detecting the intensity of the light beam totally reflected at the interface. A predetermined pattern is formed within a region irradiated with the light beam on the dielectric block. The measurement apparatus includes a correction means for correcting an output from the two-dimensional light detection means, based on the pattern, so that an object on the face of the dielectric block is similar to the object detected by the two-dimensional detection means.