Abstract: There is provided in connection with a semiconductor memory, such as of the pseudostatic RAM, a layout of the circuit components thereof including a method of testing the memory. There is provided an oscillation circuit which is capable of withstanding bumping of the power source voltage (varying) which effects stabilization regarding the operation of the circuits included therewith including a refresh timer circuit. There is also provided for testing a refresh timer circuit and a semiconductor memory which includes a refresh timer circuit. There is further provided for an output buffer which is capable of high speed operation with respect to memory data readout, a voltage generating circuit which is capable of stable operation and a fuse circuit, such as provided in connection with redundant circuitry in the memory and which is characterized as having a configuration of a fuse logic gate circuit employing complementary channel MOSFETs together with a fuse.

Abstract: A data output buffer is provided in connection with a semiconductor memory, such as a pseudostatic RAM, which is capable of high speed operation with respect to memory data readout. The buffer includes a latch circuit comprising a pair of NAND gate circuits having input and output terminals connected in cross connection, a pair of precharge MOSFETs provided respectively between the noninverted and inverted input terminals of the latch circuit, a pair of CMOS NAND gates which transfer the inverted signal of the latch circuit according to an inverted timing signal and a pair of series-connected MOSFETs effecting a pull-up/pull-down arrangement which receives the inverted signal of the output signal of the NAND gates.

Abstract: A plurality of unit integrated circuits mounted on a large-scale integrated circuit device, for example, a wafer scale memory, are each provided with a bypass circuit which selectively shorts input and output nodes in the corresponding unit integrated circuit. By selectively bringing the bypass circuit into a transfer state, it is possible to effectively couple together all unit integrated circuits which are judged to be normal among a plurality of unit integrated circuits disposed along one row, for example. Improved redundancy arrangements are also provided, including first and second redundant elements for the unit integrated circuits, to effectively utilize the normal elements in the unit integrated circuits. Further, an improved arrangement for hierarchically connecting together the outputs of all the unit circuit blocks is provided which reduces the signal line load for the memory device.

Abstract: A working vehicle comprising two pumps for driving hydraulic motors provided for opposite running devices individually and a valve mechanism for bringing the vehicle into a low-speed state wherein a fluid is supplied from the pumps to the motors individually, or alternatively into a high-speed state wherein the combined fluid from the pumps is supplied to the motors in series. The vehicle is provided with an operating assembly for preventing the vehicle from turning at a high speed even when the vehicle is inadvertently so operated by the driver in the high-speed state.