Patents by Inventor Takuma NISHIMOTO
Takuma NISHIMOTO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11962051Abstract: The invention provides an electrolyte material for a solid oxide fuel cell comprising a perovskite oxide comprising at least one element A selected from the group consisting of Ba and Sr, an element Zr, at least one element M selected from the group consisting of Y and Yb, and oxygen, and also a solid phase method for producing the electrolyte material.Type: GrantFiled: August 28, 2019Date of Patent: April 16, 2024Assignee: SAKAI CHEMICAL INDUSTRY CO., LTD.Inventors: Takuma Nishimoto, Kazuya Miyasaka, Minoru Yoneda
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Publication number: 20240105436Abstract: The performance of a power supply module is to be improved. The occurrence of discharge in the power supply module is to be prevented, and the size of the power supply module is to be reduced. In a power supply module, substrates are provided being stacked in a planar view. A low voltage circuit and a high voltage circuit are formed on a first substrate such that a distance is kept for preventing surface discharge, and a low voltage circuit is formed on a second substrate. A distance between a component of a high voltage alternating current circuit on the high voltage circuit and a component of the low voltage circuit is three times a shortest distance, at which space discharge does not occurs, between a component that constitutes a high voltage direct current circuit on the high voltage circuit and a component that constitutes the low voltage circuit.Type: ApplicationFiled: September 4, 2020Publication date: March 28, 2024Inventors: Zihao Ong, Takuma Nishimoto, Isao Furuya, Hiroshi Touda
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Publication number: 20230343572Abstract: A high-voltage module HVMD includes: an error amplifier configured to output a control signal based on a reference signal Vin and a feedback signal; a high voltage output circuit configured to output a high voltage Vout for supply based on the control signal; and a feedback circuit configured to output the feedback signal based on the high voltage Vout for supply. Here, the feedback circuit includes: a first partial circuit configured to receive an input of the high voltage Vout for supply and to output an intermediate signal, the first partial circuit including a resistance element; and a second partial circuit configured to receive an input of the intermediate signal and to output the feedback signal. The high-voltage module HVMD further includes a substrate SUB including: a high voltage substrate region where the high voltage output circuit and a part of the first partial circuit are mounted.Type: ApplicationFiled: December 28, 2021Publication date: October 26, 2023Inventors: Zihao ONG, Takuma NISHIMOTO, Isao FURUYA, Hiroshi TOUDA
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Publication number: 20230056978Abstract: In a mass spectrometer, due to impurities accumulated inside a frame, a withstand voltage may decrease, and electric discharge may occur in an ion source, thereby making it impossible to perform normal measurement. Since a result of abnormality measurement due to the electric discharge cannot be distinguished from measurement abnormality caused by clogging of a tube between a pretreatment unit and a needle, there is a problem in that time is required to identify abnormal portions, and a maintenance property is lowered. As a unit for solving the problem, a return current detection unit connected in series between the frame and an ion source power supply that applies a voltage to the needle and a return current detection unit connected in series between the frame and a counter electrode power supply that applies a voltage to a counter electrode are provided.Type: ApplicationFiled: December 2, 2020Publication date: February 23, 2023Applicant: Hitachi High-Tech CorporationInventors: Takuma NISHIMOTO, Zihao ONG, Isao FURUYA, Hiroshi TOUDA, Yuichiro HASHIMOTO, Masuyuki SUGIYAMA
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Patent number: 11369993Abstract: The ultrasonic diagnostic apparatus includes: a transducer; a driving signal generation unit configured to generate a driving signal; and a transmission circuit configured to output a driving current corresponding to the driving signal, so as to drive the transducer, the transmission circuit includes: a transducer driving unit formed by a current mirror with a low voltage transistor and a high voltage transistor, the high voltage transistor being connected with the transducer, and a current source configured to supply an operation current corresponding to the driving signal to the low voltage transistor of the transducer driving unit, the driving signal generation unit includes: a transmission circuit driving unit replica that has a configuration same as that of the transducer driving unit, and a feedback control unit to detect a current flowing through a high voltage transistor of the transmission circuit driving unit replica, and to control the current to be constant.Type: GrantFiled: September 28, 2018Date of Patent: June 28, 2022Assignee: FUJIFILM HEALTHCARE CORPORATIONInventors: Toru Yazaki, Takuma Nishimoto
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Patent number: 11349476Abstract: A positive high voltage, a first terminal of a semiconductor element, and a first terminal of a first resistance element are connected to a first terminal of a first current controller. A current input terminal of a first active element is connected to a second terminal of the first current controller, and a second terminal of the semiconductor element and a second terminal of the first resistance element are connected to a control terminal of the first active element. A second resistance element is connected between a current output terminal and a control terminal of the first active element. The first current controller allows a drive current corresponding to an input signal to flow in the first active element and allows the drive current output from the first active element to flow into a load, thereby generating an output voltage.Type: GrantFiled: December 26, 2018Date of Patent: May 31, 2022Assignee: HITACHI HIGH-TECH CORPORATIONInventors: Yuki Nakamura, Takuma Nishimoto, Hiroshi Touda, Isao Furuya, Suguru Kondo
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Publication number: 20210234183Abstract: The invention provides an electrolyte material for a solid oxide fuel cell comprising a perovskite oxide comprising at least one element A selected from the group consisting of Ba and Sr, an element Zr, at least one element M selected from the group consisting of Y and Yb, and oxygen, and also a solid phase method for producing the electrolyte material.Type: ApplicationFiled: August 28, 2019Publication date: July 29, 2021Applicant: SAKAI CHEMICAL INDUSTRY CO., LTD.Inventors: Takuma NISHIMOTO, Kazuya MIYASAKA, Minoru YONEDA
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Publication number: 20210044293Abstract: A positive high voltage, a first terminal of a semiconductor element, and a first terminal of a first resistance element are connected to a first terminal of a first current controller. A current input terminal of a first active element is connected to a second terminal of the first current controller, and a second terminal of the semiconductor element and a second terminal of the first resistance element are connected to a control terminal of the first active element. A second resistance element is connected between a current output terminal and a control terminal of the first active element. The first current controller allows a drive current corresponding to an input signal to flow in the first active element and allows the drive current output from the first active element to flow into a load, thereby generating an output voltage.Type: ApplicationFiled: December 26, 2018Publication date: February 11, 2021Inventors: Yuki Nakamura, Takuma Nishimoto, Hiroshi Touda, Isao Furuya, Suguru Kondo
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Patent number: 10856845Abstract: An ultrasound diagnosis device includes: an ultrasound probe which transmits an ultrasound wave toward a examinee and receives a reflected wave from the examinee; and a main device which controls the transmitting and receiving of the ultrasound waves from the ultrasound probe and is operated to receive a receiving signal obtained by receiving the reflected wave from the examinee by the ultrasound probe, to generate an ultrasound image of the examinee, and to display the ultrasound image on a display screen, wherein the ultrasound probe includes a plurality of subarrays having a plurality of element circuits transmitting and receiving ultrasound signals and a plurality of reference voltage sources, and the plurality of subarrays and the plurality of reference voltage sources have a one-to-one correspondence.Type: GrantFiled: October 4, 2016Date of Patent: December 8, 2020Assignee: HITACHI, LTD.Inventors: Yusaku Katsube, Tatsuo Nakagawa, Yasuyuki Okuma, Yohei Nakamura, Takahide Terada, Shinya Kajiyama, Takuma Nishimoto, Yutaka Igarashi
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Patent number: 10818470Abstract: A charged particle beam device includes a deflection unit that deflects a charged particle beam released from a charged particle source to irradiate a sample, a reflection plate that reflects secondary electrons generated from the sample, and a control unit that controls the deflection unit based on an image generated by detecting the secondary electrons reflected from the reflection plate. The deflection unit includes an electromagnetic deflection unit that electromagnetically scans with the charged particle beam by a magnetic field and an electrostatic deflection unit that electrostatically scans with the charged particle beam by an electric field. The control unit controls the electromagnetic deflection unit and the electrostatic deflection unit, superimposes an electromagnetic deflection vector generated by the electromagnetic scanning and an electrostatic deflection vector generated by the electrostatic scanning, and controls at least a trajectory of the charged particle beam.Type: GrantFiled: March 6, 2017Date of Patent: October 27, 2020Assignee: HITACHI HIGH-TECH CORPORATIONInventors: Kazuki Ikeda, Wen Li, Takuma Nishimoto, Hiroyuki Takahashi, Wataru Mori, Makoto Suzuki, Hajime Kawano
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Patent number: 10799213Abstract: Provided are an ultrasound probe, an element circuit thereof, and an ultrasound diagnostic device, whereby high image quality is possible and reduced size and lower cost are made possible. Provided is an ultrasound probe, comprising: a 2-D array transducer wherein a plurality of transducers are arrayed two-dimensionally; and a 2-D array IC in which are formed, upon an IC substrate, drive circuits which are disposed upon each of the transducers of the 2-D array transducer to drive each of the transducers at different timings with a prescribed delay quantity, and common current sources which supply drive current to the transducers of the 2-D array transducer. The number n of the common current sources which are formed upon the IC substrate is fewer than the number N of the drive circuits which are formed upon the IC substrate.Type: GrantFiled: November 28, 2014Date of Patent: October 13, 2020Assignee: Hitachi, Ltd.Inventors: Takuma Nishimoto, Yutaka Igarashi, Toru Yazaki, Kengo Imagawa, Yusaku Katsube
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Patent number: 10796880Abstract: Provided is a charged particle beam device to enable determination of a noise source of a charged particle beam device that can cause a noise frequency component superimposed on a measurement image. The charged particle beam device includes a unit that extracts information regarding a noise source.Type: GrantFiled: December 27, 2016Date of Patent: October 6, 2020Assignee: HITACHI HICH-TECH CORPORATIONInventors: Takuma Nishimoto, Wen Li, Hiroyuki Takahashi, Wataru Mori, Hajime Kawano
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Publication number: 20200275911Abstract: The ultrasonic diagnostic apparatus includes: a transducer; a driving signal generation unit configured to generate a driving signal; and a transmission circuit configured to output a driving current corresponding to the driving signal, so as to drive the transducer, the transmission circuit includes: a transducer driving unit formed by a current mirror with a low voltage transistor and a high voltage transistor, the high voltage transistor being connected with the transducer, and a current source configured to supply an operation current corresponding to the driving signal to the low voltage transistor of the transducer driving unit, the driving signal generation unit includes: a transmission circuit driving unit replica that has a configuration same as that of the transducer driving unit, and a feedback control unit to detect a current flowing through a high voltage transistor of the transmission circuit driving unit replica, and to control the current to be constant.Type: ApplicationFiled: September 28, 2018Publication date: September 3, 2020Inventors: Toru YAZAKI, Takuma NISHIMOTO
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Ultrasonic-wave probe, ultrasonic-wave diagnosis apparatus, and test method of ultrasonic-wave probe
Patent number: 10595822Abstract: A test for screening defects of a transmission/reception circuit in an IC is enabled at low cost, without withstand voltage violation, and without carrying out electrical contacts with many terminals connected to oscillators. In a transmission/reception separation switch circuit using transistors as switch elements, a potential of a gate is lowered in a test more than the potential in a case of reception to avoid gate-source withstand-voltage violation when a large-amplitude signal is input, and an internal-signal loopback test is carried out without destroying a reception circuit.Type: GrantFiled: February 25, 2016Date of Patent: March 24, 2020Assignee: Hitachi, Ltd.Inventors: Shinya Kajiyama, Yutaka Igarashi, Yusaku Katsube, Takuma Nishimoto -
Publication number: 20200043695Abstract: A charged particle beam device includes a deflection unit that deflects a charged particle beam released from a charged particle source to irradiate a sample, a reflection plate that reflects secondary electrons generated from the sample, and a control unit that controls the deflection unit based on an image generated by detecting the secondary electrons reflected from the reflection plate. The deflection unit includes an electromagnetic deflection unit that electromagnetically scans with the charged particle beam by a magnetic field and an electrostatic deflection unit that electrostatically scans with the charged particle beam by an electric field. The control unit controls the electromagnetic deflection unit and the electrostatic deflection unit, superimposes an electromagnetic deflection vector generated by the electromagnetic scanning and an electrostatic deflection vector generated by the electrostatic scanning, and controls at least a trajectory of the charged particle beam.Type: ApplicationFiled: March 6, 2017Publication date: February 6, 2020Inventors: Kazuki IKEDA, Wen LI, Takuma NISHIMOTO, Hiroyuki TAKAHASHI, Wataru MORI, Makoto SUZUKI, Hajime KAWANO
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Patent number: 10546718Abstract: Even in a case where a disturbance is applied from an adjacently disposed power supply circuit or the like, in order to realize a reduction in ripple, a high-voltage power supply device is configured to include a drive circuit, a transformer that boosts an output voltage of the drive circuit, a boost circuit that further boosts a voltage boosted by the transformer, a shield that covers the transformer and the boost circuit, a filter circuit that filters, smoothes, and outputs a high voltage output from the boost circuit, and an impedance loop circuit configured by connection of a plurality of impedance elements into a loop shape. A grounding point of the boost circuit, a grounding point of the shield, and a grounding point of the filter circuit are configured to be grounded via the impedance loop circuit, and this is applied to a high-voltage power supply unit that applies a high voltage to an electron gun of a charged particle beam apparatus.Type: GrantFiled: December 8, 2015Date of Patent: January 28, 2020Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Takuma Nishimoto, Wen Li, Hiroyuki Takahashi, Hajime Kawano
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Publication number: 20190341225Abstract: Provided is a charged particle beam device to enable determination of a noise source of a charged particle beam device that can cause a noise frequency component superimposed on a measurement image. The charged particle beam device includes a unit that extracts information regarding a noise source.Type: ApplicationFiled: December 27, 2016Publication date: November 7, 2019Inventors: Takuma NISHIMOTO, Wen LI, Hiroyuki TAKAHASHI, Wataru MORI, Hajime KAWANO
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Patent number: 10458956Abstract: Provided is an ultrasonic probe having an adjustable slew rate, the ultrasonic probe having minimal dimensions and circuit sizes. The ultrasonic probe includes: a transducer; a transmitting circuit; a correcting unit; and a distributing unit. The transmitting circuit includes a transducer driving unit and a current source. The transducer driving unit includes a current mirror of a low voltage transistor and a high voltage transistor. The high voltage transistor is connected to the transducer and the current source supplies an operating current to the low voltage transistor of the transducer driving unit. The correcting unit includes a transmission circuit driving unit replica, a bias unit, and an observing unit. The distributing unit transfers a signal to a current source of the transmitting circuit so that the same current value as the current value extracted by the observing unit flows.Type: GrantFiled: November 27, 2015Date of Patent: October 29, 2019Assignee: HITACHI, LTD.Inventors: Takuma Nishimoto, Yutaka Igarashi, Yusaku Katsube
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Patent number: 10448923Abstract: Amplification of a signal by a small circuit size and reduction of a power are achieved. A current controlling current source unit 53 changes an outputting current based on a transition time setting signal tp. A current controlling current source unit 54 changes a drawing current based on a transition time setting signal tn. An amplitude control unit 55 changes a power source voltage supplied to the current controlling current source unit 53 and changes amplitude of a voltage generated by a current outputted from the current controlling current source unit 53, based on amplitude setting signal ap. An amplitude control unit 56 changes a power source voltage supplied to the current controlling current source unit 54 and changes amplitude of a voltage generated by the current drawn by the current controlling current source unit 54, based on amplitude setting signal an.Type: GrantFiled: June 6, 2014Date of Patent: October 22, 2019Assignee: Hitachi, Ltd.Inventors: Takuma Nishimoto, Yutaka Igarashi, Yusaku Katsube, Kengo Imagawa
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Publication number: 20180366296Abstract: Even in a case where a disturbance is applied from an adjacently disposed power supply circuit or the like, in order to realize a reduction in ripple, a high-voltage power supply device is configured to include a drive circuit, a transformer that boosts an output voltage of the drive circuit, a boost circuit that further boosts a voltage boosted by the transformer, a shield that covers the transformer and the boost circuit, a filter circuit that filters, smoothes, and outputs a high voltage output from the boost circuit, and an impedance loop circuit configured by connection of a plurality of impedance elements into a loop shape. A grounding point of the boost circuit, a grounding point of the shield, and a grounding point of the filter circuit are configured to be grounded via the impedance loop circuit, and this is applied to a high-voltage power supply unit that applies a high voltage to an electron gun of a charged particle beam apparatus.Type: ApplicationFiled: December 8, 2015Publication date: December 20, 2018Applicant: Hitachi High-Technologies CorporationInventors: Takuma NISHIMOTO, Wen LI, Hiroyuki TAKAHASHI, Hajime KAWANO