Patents by Inventor Takuma NISHIMOTO

Takuma NISHIMOTO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20180192994
    Abstract: An ultrasound diagnosis device includes: an ultrasound probe which transmits an ultrasound wave toward a examinee and receives a reflected wave from the examinee; and a main device which controls the transmitting and receiving of the ultrasound waves from the ultrasound probe and is operated to receive a receiving signal obtained by receiving the reflected wave from the examinee by the ultrasound probe, to generate an ultrasound image of the examinee, and to display the ultrasound image on a display screen, wherein the ultrasound probe includes a plurality of subarrays having a plurality of element circuits transmitting and receiving ultrasound signals and a plurality of reference voltage sources, and the plurality of subarrays and the plurality of reference voltage sources have a one-to-one correspondence.
    Type: Application
    Filed: October 4, 2016
    Publication date: July 12, 2018
    Inventors: Yusaku KATSUBE, Tatsuo NAKAGAWA, Yasuyuki OKUMA, Yohei NAKAMURA, Takahide TERADA, Shinya KAJIYAMA, Takuma NISHIMOTO, Yutaka IGARASHI
  • Publication number: 20180035974
    Abstract: A test for screening defects of a transmission/reception circuit in an IC is enabled at low cost, without withstand voltage violation, and without carrying out electrical contacts with many terminals connected to oscillators. In a transmission/reception separation switch circuit using transistors as switch elements, a potential of a gate is lowered in a test more than the potential in a case of reception to avoid gate-source withstand-voltage violation when a large-amplitude signal is input, and an internal-signal loopback test is carried out without destroying a reception circuit.
    Type: Application
    Filed: February 25, 2016
    Publication date: February 8, 2018
    Applicant: Hitachi, Ltd.
    Inventors: Shinya KAJIYAMA, Yutaka IGARASHI, Yusaku KATSUBE, Takuma NISHIMOTO
  • Patent number: 9859094
    Abstract: In an image forming method of charged particle beam apparatus for scanning a sample by irradiating the sample with a converged charged particle beam and detecting secondary charged particles generated from the sample by a detection unit, receiving and processing an output signal from the detection unit, and receiving the processed signal and forming an image of the sample, receiving and processing the output signal are performed by analogically processing the output signal and by performing pulse-count processing on the output signal, and pulse-count processing is performed by removing a ringing pulse in the output signal and counting pulses in the signal from which the ringing pulse has been removed.
    Type: Grant
    Filed: November 30, 2016
    Date of Patent: January 2, 2018
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Wen Li, Kazuki Ikeda, Takuma Nishimoto, Hiroyuki Takahashi, Hajime Kawano
  • Publication number: 20170370886
    Abstract: Provided is an ultrasonic probe having an adjustable slew rate, the ultrasonic probe having minimal dimensions and circuit sizes. The ultrasonic probe includes: a transducer; a transmitting circuit; a correcting unit; and a distributing unit. The transmitting circuit includes a transducer driving unit and a current source. The transducer driving unit includes a current mirror of a low voltage transistor and a high voltage transistor. The high voltage transistor is connected to the transducer and the current source supplies an operating current to the low voltage transistor of the transducer driving unit. The correcting unit includes a transmission circuit driving unit replica, a bias unit, and an observing unit. The distributing unit transfers a signal to a current source of the transmitting circuit so that the same current value as the current value extracted by the observing unit flows.
    Type: Application
    Filed: November 27, 2015
    Publication date: December 28, 2017
    Applicant: HITACHI, LTD.
    Inventors: Takuma Nishimoto, Yutaka Igarashi, Yusaku Katsube
  • Publication number: 20170207061
    Abstract: In an image forming method of charged particle beam apparatus for scanning a sample by irradiating the sample with a converged charged particle beam and detecting secondary charged particles generated from the sample by a detection unit, receiving and processing an output signal from the detection unit, and receiving the processed signal and forming an image of the sample, receiving and processing the output signal are performed by analogically processing the output signal and by performing pulse-count processing on the output signal, and pulse-count processing is performed by removing a ringing pulse in the output signal and counting pulses in the signal from which the ringing pulse has been removed.
    Type: Application
    Filed: November 30, 2016
    Publication date: July 20, 2017
    Inventors: Wen LI, Kazuki IKEDA, Takuma NISHIMOTO, Hiroyuki TAKAHASHI, Hajime KAWANO
  • Publication number: 20170150945
    Abstract: Amplification of a signal by a small circuit size and reduction of a power are achieved. A current controlling current source unit 53 changes an outputting current based on a transition time setting signal tp. A current controlling current source unit 54 changes a drawing current based on a transition time setting signal tn. An amplitude control unit 55 changes a power source voltage supplied to the current controlling current source unit 53 and changes amplitude of a voltage generated by a current outputted from the current controlling current source unit 53, based on amplitude setting signal ap. An amplitude control unit 56 changes a power source voltage supplied to the current controlling current source unit 54 and changes amplitude of a voltage generated by the current drawn by the current controlling current source unit 54, based on amplitude setting signal an.
    Type: Application
    Filed: June 6, 2014
    Publication date: June 1, 2017
    Inventors: Takuma NISHIMOTO, Yutaka IGARASHI, Yusaku KATSUBE, Kengo IMAGAWA
  • Publication number: 20160310104
    Abstract: Provided are an ultrasound probe, an element circuit thereof, and an ultrasound diagnostic device, whereby high image quality is possible and reduced size and lower cost are made possible. Provided is an ultrasound probe, comprising: a 2-D array transducer wherein a plurality of transducers are arrayed two-dimensionally; and a 2-D array IC in which are formed, upon an IC substrate, drive circuits which are disposed upon each of the transducers of the 2-D array transducer to drive each of the transducers at different timings with a prescribed delay quantity, and common current sources which supply drive current to the transducers of the 2-D array transducer. The number n of the common current sources which are formed upon the IC substrate is fewer than the number N of the drive circuits which are formed upon the IC substrate.
    Type: Application
    Filed: November 28, 2014
    Publication date: October 27, 2016
    Inventors: Takuma NISHIMOTO, Yutaka IGARASHI, Toru YAZAKI, Kengo IMAGAWA, Yusaku KATSUBE
  • Publication number: 20120194939
    Abstract: A patterned medium inspection method according to the present invention includes a timing computation process including a read process reading the reproduced signal of a patterned medium under inspection and a computation process computing the signal interval values from the patterned medium reproduced signal read in the read process, and a judgment process judging the quality of the patterned medium using the reproduced signal interval values computed in the computation process.
    Type: Application
    Filed: December 12, 2011
    Publication date: August 2, 2012
    Inventors: Takuma NISHIMOTO, Masami Makuuchi, Yoshihiro Sakurai, Kunihito Higa, Fujio Onishi
  • Publication number: 20110211277
    Abstract: A detecting circuit, which can detect plural types of servo signals, including a cosine/sine value detector for sampling a servo signal supplied from an inspected object and thereby obtaining a cosine value and a sine value, an amplitude/phase detector for obtaining at least amplitude information and phase information on the basis of the cosine value and the sine value obtained by the cosine/sine value detector, and a servo selector/position detector for selecting a servo scheme of the inspected object and detecting a position of the inspected object on the basis of the amplitude information and the phase information obtained by the amplitude/phase detector.
    Type: Application
    Filed: February 7, 2011
    Publication date: September 1, 2011
    Inventors: Takuma NISHIMOTO, Masami Makuuchi, Yoshihiro Sakurai, Kunihito Higa