Abstract: An image processing method and an image processing apparatus which remove the effects of cosmic rays, noise and defective pixels without losing data in a specified time and which can correct image data efficiently and with high accuracy are provided. An image processing method of performing correction processing on an abnormal value of X-ray image data is provided which includes the steps of: (S3) determining whether or not there exists a target element with intensity significantly different from intensity of peripheral elements, in a three dimensional space formed with a space axis and a time axis defined by a series of captured image frames; and (S9) replacing the intensity of the target element with a replacement value calculated from the intensity of peripheral elements.

Abstract: There are provided a radiation detector capable of detecting radiation without occurrence of dead time while maintaining an exposure state in which radiation enters continuously, and an X-ray analysis apparatus and a radiation detection method using the radiation detector. A radiation detector 100 that detects radiation in synchronization with an external apparatus 200, includes: a sensor 110 that generates pulses when radiation particles are detected; a plurality of counters 140a, 140b provided so as to be able to count the pulses; and a control circuit 160 configured to switch a counter to count the pulses among the plurality of counters 140a, 140b, when receiving a synchronization signal from the external apparatus 200.

Abstract: A correction information generation method and a correction information generation apparatus enabling easy Flat-Field Correction operation without special accessory equipment are provided. The correction information generation method for performing Flat-Field Correction of X-ray detection sensitivity on a pixel detector, includes the steps of: moving the relative position of a detector 130 with respect to an incident X-ray having a cross-sectional beam shape traversing a detection surface so that the whole of the detection surface is irradiated with the incident X-ray in total time and each of pixels arranged in the moving direction is uniformly irradiated; and generating information for correcting the sensitivity of a pixel based on an intensity value detected for a given energy band of the incident X-ray.

Abstract: There is provided a radiation detector that appropriately corrects an offset within a minute read cell without increasing area while achieving high-speed measurement at a high counting rate. A radiation detector 100 having a plurality of single-photon-counting imaging cells includes, for each imaging cell, a photodiode 3 which is applied with a reverse bias voltage and generates a current signal in response to incidence of radiation, a previous-stage DA converter d1 configured to correct an input signal based on the current signal generated by the photodiode 3, an amplifier k2 configured to amplify the signal corrected by the previous-stage DA converter d1, a subsequent-stage DA converter d2 configured to correct a charge signal amplified by the amplifier k2, a wave height discriminator 9 configured to discriminate output signals based on the signal corrected by the subsequent-stage DA converter d2, and a counter 10 configured to count the discriminated signals.

Abstract: An X-ray data processing apparatus for processing X-ray data that is obtained by simultaneously measuring X-rays of multiple wavelengths. The apparatus includes a management unit 210 to receive and manage X-ray data that is detected by a detector, a calculation unit 230 which calculates a detection amount of charge sharing events in lower energy side data caused by higher energy X-ray, based on the higher energy side data obtained using a threshold value on a higher energy side and the lower energy side data obtained using a threshold value on a lower energy side of the received X-ray data, and a correction unit 250 to reconfigure the lower energy side data using the calculated detection amount. The apparatus can remove a residual image of an X-ray on a higher energy side which remains in data on a lower energy side.

Abstract: There is provided a radiation detector that appropriately corrects an offset within a minute read cell without increasing area while achieving high-speed measurement at a high counting rate. A radiation detector 100 having a plurality of single-photon-counting imaging cells includes, for each imaging cell, a photodiode 3 which is applied with a reverse bias voltage and generates a current signal in response to incidence of radiation, a previous-stage DA converter d1 configured to correct an input signal based on the current signal generated by the photodiode 3, an amplifier k2 configured to amplify the signal corrected by the previous-stage DA converter d1, a subsequent-stage DA converter d2 configured to correct a charge signal amplified by the amplifier k2, a wave height discriminator 9 configured to discriminate output signals based on the signal corrected by the subsequent-stage DA converter d2, and a counter 10 configured to count the discriminated signals.

Abstract: There is provided a radiation detector which shortens the data read time to outside in accordance with the necessity to increase the frame rate. A radiation detector 100 having a plurality of single-photon-counting imaging cells, including an imaging cell 1 configured to generate a detection signal in accordance with the intensity of radiation, a digitization circuit 5 configured to digitize the detection signal, a data read structure 11 configured to count the digitized detection signal and to keep the result as a data bit, and a send-out register 13 configured to control the input of a predetermined data bit output from the data read structure 11 by a data shift in accordance with a first clock Pck, to keep the input data bit as a result of the control, and to send out the kept data bit by a data shift in accordance with a second clock Sck.

Abstract: A wavelength-classifying type X-ray diffraction device bombards a sample with characteristic X-rays generated from an X-ray generation source, and detects characteristic X-rays diffracted by the sample using an X-ray detector. The X-ray generation source is composed of several metals of different atomic number, respective metals generating several characteristic X-rays of different wavelengths. An X-ray detector is composed of several pixels for receiving X-rays and outputting pulse signals corresponding to X-ray wavelengths. Pixels are respectively furnished with classification circuits. The classification circuits classify and output pixel output signals based on each of characteristic X-ray wavelengths. X-ray intensity is detected on a per-wavelength basis in individual pixels 12. Measurement data based on different wavelength X-rays are acquired simultaneously in just one measurement.

Abstract: A wavelength-classifying type X-ray diffraction device bombards a sample with characteristic X-rays generated from an X-ray generation source, and detects characteristic X-rays diffracted by the sample using an X-ray detector. The X-ray generation source is composed of several metals of different atomic number, respective metals generating several characteristic X-rays of different wavelengths. An X-ray detector is composed of several pixels for receiving X-rays and outputting pulse signals corresponding to X-ray wavelengths. Pixels are respectively furnished with classification circuits. The classification circuits classify and output pixel output signals based on each of characteristic X-ray wavelengths. X-ray intensity is detected on a per-wavelength basis in individual pixels 12. Measurement data based on different wavelength X-rays are acquired simultaneously in just one measurement.

Abstract: A wavelength-classifying type X-ray diffraction device bombards a sample with characteristic X-rays generated from an X-ray generation source, and detects characteristic X-rays diffracted by the sample using an X-ray detector. The X-ray generation source is composed of several metals of different atomic number, respective metals generating several characteristic X-rays of different wavelengths. An X-ray detector is composed of several pixels for receiving X-rays and outputting pulse signals corresponding to X-ray wavelengths. Pixels are respectively furnished with classification circuits. The classification circuits classify and output pixel output signals based on each of characteristic X-ray wavelengths. X-ray intensity is detected on a per-wavelength basis in individual pixels 12. Measurement data based on different wavelength X-rays are acquired simultaneously in just one measurement.

Abstract: To provide an X-ray detector facilitating the installing and replacement work of a module while reducing the possibility of breakage. An X-ray detector 50 detecting X-ray image data for each detection module includes: a detection module 7 provided with a protruding frame on aback side of a detection device detecting X-rays; and a guide frame 12 fitting into the protruding frame and removably supporting the detection device, wherein the guide frame 12 fixes the position of the detection device relative to the guide frame 12 by fitting. Therefore, fitting the protruding frame 8 into the guide frame 12 enables precise and easy installation/removal of the detection module. That is a detection module can be newly installed onto the guide frame without interfering each other with adjacent detection modules already installed while minimizing a space therebetween.

Abstract: An X-ray detector is connected to a large number of detector modules connected in series. The X-ray detector detects X-ray image data for each detection module, each module synchronously reading X-ray image data detected by itself based on an internal clock ?, each module transferring the read X-ray image data one after another. Each of the detection modules receives the transferred X-ray image data, and resynchronizes the received X-ray image data by using the internal clock, and transfers the same together with the detected X-ray image data. This enables arranging the detection module at an arbitrary position without a change in the method of transferring data for each measurement or without a load on a control device.

Abstract: A wavelength-classifying type X-ray diffraction device bombards a sample with characteristic X-rays generated from an X-ray generation source, and detects characteristic X-rays diffracted by the sample using an X-ray detector. The X-ray generation source is composed of several metals of different atomic number, respective metals generating several characteristic X-rays of different wavelengths. An X-ray detector is composed of several pixels for receiving X-rays and outputting pulse signals corresponding to X-ray wavelengths. Pixels are respectively furnished with classification circuits. The classification circuits classify and output pixel output signals based on each of characteristic X-ray wavelengths. X-ray intensity is detected on a per-wavelength basis in individual pixels 12. Measurement data based on different wavelength X-rays are acquired simultaneously in just one measurement.