Abstract: A semiconductor storage device includes first and second memory cells, first and second word lines connected to the first and second memory cells, respectively, a bit line connected to the first and second memory cells, and a sense amplifier including a sense node. During a first read, a controller applies a first read voltage to the second word line and determines a read result. During a second read, the controller discharges the sense node for a first time period while applying a second read voltage to the first word line to determine a first read result, and discharges the sense node for a second time period while applying the second read voltage to determine a second read result. The controller determines read data based on the first read result, the second read result, and the read result of the second memory cell.

Abstract: According to one embodiment, a sense amplifier circuit includes an amplifier having an input terminal connected to a sense node, and a first capacitor configured to be connected in a feedback path of the amplification transistor and to a bit line of a memory cell via the sense node, the first capacitor configured to supply a current to the memory cell and integrate the current when the memory cell is read.

Abstract: According to one embodiment, a semiconductor memory device includes a bit line electrically connected to a memory cell, a first node electrically connected to the bit line, a first driver configured to increase a voltage of the first node to a first voltage, a first buffer circuit configured to store data based on the voltage of the first node, a bus electrically connected to the first buffer circuit, a first transistor electrically connected between the first node and the bus, and a second buffer circuit electrically connected to the bus. The first buffer circuit is electrically connected to an input terminal of the first driver. The first driver changes a voltage of the bus based on the data stored in the first buffer circuit.

Abstract: A semiconductor storage device includes first and second memory cells, first and second word lines connected to the first and second memory cells, respectively, a bit line connected to the first and second memory cells, and a sense amplifier including a sense node. During a first read, a controller applies a first read voltage to the second word line and determines a read result. During a second read, the controller discharges the sense node for a first time period while applying a second read voltage to the first word line to determine a first read result, and discharges the sense node for a second time period while applying the second read voltage to determine a second read result. The controller determines read data based on the first read result, the second read result, and the read result of the second memory cell.

Abstract: A semiconductor device includes a first current circuit, a first resistor, a second resistor, a second current circuit, and a third resistor. The first current circuit is configured to output a first current to a first node using a first voltage supplied thereto. The first resistor is connected to the first node. The second resistor has a first end connected to a second node that is at a same voltage level as the first node and a second end. The second current circuit is configured to output a second current to a third node using a second voltage, which is higher than the first voltage, supplied thereto. The third resistor is connected between the second end of the second resistor and the third node.

Abstract: According to one embodiment, a sense amplifier circuit includes an amplifier having an input terminal connected to a sense node, and a first capacitor configured to be connected in a feedback path of the amplification transistor and to a bit line of a memory cell via the sense node, the first capacitor configured to supply a current to the memory cell and integrate the current when the memory cell is read.

Abstract: According to one embodiment, a semiconductor memory device includes a first memory cell; a first word line coupled to the first memory cell; a first sense amplifier including a first transistor; a first bit line which couples the first memory cell to the first transistor; and a first driver configured to supply a first control signal to a gate of the first transistor. The first driver includes a first circuit configured to compare the first control signal and a second control signal to generate a third control signal based on a comparison result.

Abstract: A semiconductor memory device includes: a first memory cell transistor; a bit line electrically connected to a first end of the first memory cell transistor; a source line electrically connected to a second end of the first memory cell transistor; and a control circuit. When a read operation for reading read data from the first memory cell transistor is performed, the control circuit is configured to apply a first voltage to the bit line in a first period, apply a second voltage, higher than the first voltage, to the bit line, and also apply a third voltage, lower than the first voltage, to the source line in a second period subsequent to the first period, and sense a threshold voltage of the first memory cell transistor in a third period subsequent to the second period.

Abstract: According to an embodiment, a semiconductor storage device includes a first memory cell and a control circuit. The first memory cell is configured to store first data. The control circuit is configured to apply a first voltage to a source of the first memory cell in a read operation of the first data in the first memory cell, and to apply a second voltage to the source of the first memory cell in a verify operation of the first data in the first memory cell. The second voltage is lower than the first voltage.

Abstract: A semiconductor memory device includes a memory cell, a bit line connected to the memory cell, a sense amplifier connected to the memory cell through the bit line, and a control circuit. The sense amplifier includes a sense node connected to the bit line, a first capacitive element connected to the sense node and a sense transistor having a gate connected to the sense node. The control circuit is configured to adjust a voltage applied to a back gate of the sense transistor or a source of the sense transistor to correct a variation of a threshold voltage of the sense transistor.

Abstract: According to one embodiment, a semiconductor memory device includes a first memory cell; a first word line coupled to the first memory cell; a first sense amplifier including a first transistor; a first bit line which couples the first memory cell to the first transistor; and a first driver configured to supply a first control signal to a gate of the first transistor. The first driver includes a first circuit configured to compare the first control signal and a second control signal to generate a third control signal based on a comparison result.

Abstract: According to one embodiment, a semiconductor memory device includes a bit line electrically connected to a memory cell, a first node electrically connected to the bit line, a first driver configured to increase a voltage of the first node to a first voltage, a first buffer circuit configured to store data based on the voltage of the first node, a bus electrically connected to the first buffer circuit, a first transistor electrically connected between the first node and the bus, and a second buffer circuit electrically connected to the bus. The first buffer circuit is electrically connected to an input terminal of the first driver. The first driver changes a voltage of the bus based on the data stored in the first buffer circuit.

Abstract: A semiconductor device includes a first current circuit, a first resistor, a second resistor, a second current circuit, and a third resistor. The first current circuit is configured to output a first current to a first node using a first voltage supplied thereto. The first resistor is connected to the first node. The second resistor has a first end connected to a second node that is at a same voltage level as the first node and a second end. The second current circuit is configured to output a second current to a third node using a second voltage, which is higher than the first voltage, supplied thereto. The third resistor is connected between the second end of the second resistor and the third node.

Abstract: According to one embodiment, a semiconductor memory device includes: a first memory cell transistor; a bit line electrically connected to a first end of the first memory cell transistor; a source line electrically connected to a second end of the first memory cell transistor; and a control circuit. When a read operation being read data from the first memory cell transistor is performed, the control circuit is configured to apply a first voltage to the bit line in a first period, apply a second voltage higher than the first voltage to the bit line and also apply a third voltage lower than the first voltage to the source line, in a second period subsequent to the first period, and sense a threshold voltage of the first memory cell transistor in a third period subsequent to the second period.

Abstract: According to an embodiment, a semiconductor storage device includes a first memory cell and a control circuit. The first memory cell is configured to store first data. The control circuit is configured to apply a first voltage to a source of the first memory cell in a read operation of the first data in the first memory cell, and to apply a second voltage to the source of the first memory cell in a verify operation of the first data in the first memory cell. The second voltage is lower than the first voltage.

Abstract: According to one embodiment, a semiconductor storage device includes a first plane having a first plurality of memory cells, a second plane having a second plurality of memory cells, first bit lines which are connected to the first plane, second bit lines which are connected to the second plane, a plurality of first sense amplifiers which charge the plurality of first bit lines, and a plurality of second sense amplifiers which charge the plurality of second bit lines. When the first and second planes operate in parallel, a total sum of currents supplied to the plurality of first bit lines from the plurality of first sense amplifiers and currents supplied to the plurality of second bit lines from the plurality of second sense amplifiers reaches a first current value, then decreases to a second current value, and then increases to a third current value.

Abstract: According to one embodiment, a semiconductor storage device includes a first plane having a first plurality of memory cells, a second plane having a second plurality of memory cells, first bit lines which are connected to the first plane, second bit lines which are connected to the second plane, a plurality of first sense amplifiers which charge the plurality of first bit lines, and a plurality of second sense amplifiers which charge the plurality of second bit lines. When the first and second planes operate in parallel, a total sum of currents supplied to the plurality of first bit lines from the plurality of first sense amplifiers and currents supplied to the plurality of second bit lines from the plurality of second sense amplifiers reaches a first current value, then decreases to a second current value, and then increases to a third current value.

Abstract: A semiconductor memory device includes a memory cell, a bit line connected to the memory cell, a sense amplifier connected to the memory cell through the bit line, and a control circuit. The sense amplifier includes a sense node connected to the bit line, a first capacitive element connected to the sense node and a sense transistor having a gate connected to the sense node. The control circuit is configured to adjust a voltage applied to a back gate of the sense transistor or a source of the sense transistor to correct a variation of a threshold voltage of the sense transistor.

Abstract: A semiconductor memory device includes a memory cell, a bit line connected to the memory cell, and a sense amplifier connected to the memory cell through the bit line. The sense amplifier includes a sense node connected to the bit line, a first capacitive element connected to the sense node, and a static latch circuit connected to the sense node and retains data of the sense node.

Abstract: A semiconductor memory device includes a memory cell, a bit line connected to the memory cell, and a sense amplifier connected to the memory cell through the bit line. The sense amplifier includes a sense node connected to the bit line, a first capacitive element connected to the sense node, and a static latch circuit connected to the sense node and retains data of the sense node.