Patents by Inventor Tamenori Shirai

Tamenori Shirai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6397667
    Abstract: A surface property measuring device includes a detector having a stylus, and a driving mechanism for causing the detector to advance and retreat along a surface to be measured. The measuring device further comprises a main shaft fixed to a frame of the driving mechanism in parallel with an advancing and retreating direction of the detector, and a slide block which is shaped like a rectangle in the advancing and retreating direction of the detector, sliding on the main shaft, the main shaft being inserted through two of a fore and a rear portion of the slide block. This results in improvement of the straightness accuracy in the movement of the detector, and reduces the cost while stabilizing the measurement accuracy.
    Type: Grant
    Filed: December 15, 1998
    Date of Patent: June 4, 2002
    Assignee: Mitutoyo Corporation
    Inventors: Nobuyoshi Fujii, Satoshi Ueda, Tamenori Shirai, Shinya Sasaki
  • Patent number: 6164124
    Abstract: A surface property measuring device comprises a detector having a stylus for measuring surface property and a skid at a leading end thereof, and a driving mechanism for causing the detector to advance and retreat along a surface to be measured. The measuring device further comprises a detector-lifting plate having an engaging portion engaging with a protrusion of a connector housing when the detector retreats to the utmost. The detecting-lifting plate is fixed to a frame of the driving mechanism, for lifting the leading end of the detector to thereby separate the skid and the stylus from the surface to be measured when the detector retreats. This enables the surface to be measured, a nose, the stylus, and the skid which protrude from the detector, to be protected when arranging the measurement and also removing the measuring device after the measurement.
    Type: Grant
    Filed: December 15, 1998
    Date of Patent: December 26, 2000
    Assignee: Mitutoyo Corporation
    Inventors: Nobuyoshi Fujii, Tamenori Shirai
  • Patent number: 4532711
    Abstract: A micrometer head adapted to be mounted to a measuring instrument or the like and used for measuring and precision feeding includes an adjusting ring (23) spaced a predetermined distance apart from a thimble (6). This adjusting ring (23) is connected to an intermediate tubular member (16) which is provided on a sleeve (15) coupled onto a spindle (1) in a manner so as to be rotatable relative to the sleeve (15). A coil spring (35) is confined between the adjusting ring (23) and a graduation ring (17) disposed inside the thimble (6). Rotation of the adjusting ring (23) causes the spindle (1), sleeve (15), graduation ring (17) and thimble (6) to be simultaneously moved relative to a mount fixable portion (31) adapted to be mounted to the measuring instrument or the like.
    Type: Grant
    Filed: June 24, 1983
    Date of Patent: August 6, 1985
    Assignee: Mitutoyo Mfg. Co., Ltd.
    Inventor: Tamenori Shirai
  • Patent number: D273468
    Type: Grant
    Filed: March 1, 1982
    Date of Patent: April 17, 1984
    Assignee: Mitutoyo MGF. Co., Ltd.
    Inventors: Minoru Ueda, Tamenori Shirai, Takafumi Kanou
  • Patent number: D273469
    Type: Grant
    Filed: March 1, 1982
    Date of Patent: April 17, 1984
    Assignee: Mitutoyo MFG. Co., Ltd.
    Inventors: Minoru Ueda, Tamenori Shirai, Takafumi Kanou
  • Patent number: D286141
    Type: Grant
    Filed: January 10, 1984
    Date of Patent: October 14, 1986
    Assignee: Mitutoyo Mfg. Co., Ltd.
    Inventor: Tamenori Shirai