Micrometer
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Description
FIG. 1 is a front and top-right perspective view of a micrometer showing my new design;
FIG. 2 is a re-oriented perspective view of FIG. 1;
FIG. 3 is a front elevational view thereof;
FIG. 4 is a rear elevational view thereof;
FIG. 5 is a top plan view thereof;
FIG. 6 is a bottom plan view thereof;
FIG. 7 is a left side elevational view thereof; and
FIG. 8 is a right side elevational view thereof.
Referenced Cited
U.S. Patent Documents
Foreign Patent Documents
D273469 | April 17, 1984 | Ueda |
1414550 | May 1922 | Cluley |
1464428 | August 1923 | Hogarty |
1737764 | December 1929 | Jacobs |
2624121 | January 1953 | Knobel |
2924018 | February 1960 | Mahlmeister |
3128559 | April 1964 | Winter |
4136457 | January 30, 1979 | Langer |
474951 | April 1929 | DEX |
594077 | May 1959 | ITX |
232923 | September 1944 | CHX |
Patent History
Patent number: D286141
Type: Grant
Filed: Jan 10, 1984
Date of Patent: Oct 14, 1986
Assignee: Mitutoyo Mfg. Co., Ltd. (Tokyo)
Inventor: Tamenori Shirai (Kure)
Primary Examiner: Nelson C. Holtje
Law Firm: Flynn, Thiel, Boutell & Tanis
Application Number: 6/569,631
Type: Grant
Filed: Jan 10, 1984
Date of Patent: Oct 14, 1986
Assignee: Mitutoyo Mfg. Co., Ltd. (Tokyo)
Inventor: Tamenori Shirai (Kure)
Primary Examiner: Nelson C. Holtje
Law Firm: Flynn, Thiel, Boutell & Tanis
Application Number: 6/569,631
Classifications