Micrometer

- Mitutoyo Mfg. Co., Ltd.
Description

FIG. 1 is a front and top-right perspective view of a micrometer showing my new design;

FIG. 2 is a re-oriented perspective view of FIG. 1;

FIG. 3 is a front elevational view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a left side elevational view thereof; and

FIG. 8 is a right side elevational view thereof.

Referenced Cited
U.S. Patent Documents
D273469 April 17, 1984 Ueda
1414550 May 1922 Cluley
1464428 August 1923 Hogarty
1737764 December 1929 Jacobs
2624121 January 1953 Knobel
2924018 February 1960 Mahlmeister
3128559 April 1964 Winter
4136457 January 30, 1979 Langer
Foreign Patent Documents
474951 April 1929 DEX
594077 May 1959 ITX
232923 September 1944 CHX
Patent History
Patent number: D286141
Type: Grant
Filed: Jan 10, 1984
Date of Patent: Oct 14, 1986
Assignee: Mitutoyo Mfg. Co., Ltd. (Tokyo)
Inventor: Tamenori Shirai (Kure)
Primary Examiner: Nelson C. Holtje
Law Firm: Flynn, Thiel, Boutell & Tanis
Application Number: 6/569,631