Patents by Inventor Tatsuhiko Eguchi

Tatsuhiko Eguchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8951371
    Abstract: A method of producing a copper alloy containing a precipitate X composed of Ni and Si and a precipitate Y that includes (a) Ni and 0% Si, (b) Si and 0% Ni, or (c) neither Ni nor Si, wherein the precipitate X has a grain size of 0.001 to 0.1 ?m, and the precipitate Y has a grain size of 0.01 to 1 ?m.
    Type: Grant
    Filed: December 22, 2010
    Date of Patent: February 10, 2015
    Assignee: The Furukawa Electric Co., Ltd.
    Inventors: Kuniteru Mihara, Tatsuhiko Eguchi, Nobuyuki Tanaka, Kiyoshige Hirose
  • Publication number: 20140318673
    Abstract: A copper alloy material, having an alloy composition containing any one or both of Ni and Co in an amount of 0.4 to 5.0 mass % in total, and Si in an amount of 0.1 to 1.5 mass %, with the balance being copper and unavoidable impurities, wherein a ratio of an area of grains in which an angle of orientation deviated from S-orientation {2 3 1} <3 4 6> is within 30° is 60% or more, according to a crystal orientation analysis in EBSD measurement; an electrical or electronic part formed by working the copper alloy material; and a method of producing the copper alloy material.
    Type: Application
    Filed: June 24, 2014
    Publication date: October 30, 2014
    Inventors: Hiroshi KANEKO, Kiyoshige HIROSE, Tatsuhiko EGUCHI
  • Patent number: 8795446
    Abstract: A copper alloy material, having an alloy composition containing any one or both of Ni and Co in an amount of 0.4 to 5.0 mass % in total, and Si in an amount of 0.1 to 1.5 mass %, with the balance being copper and unavoidable impurities, wherein a ratio of an area of grains in which an angle of orientation deviated from S-orientation {2 3 1}<3 4 6> is within 30° is 60 % or more, according to a crystal orientation analysis in EBSD measurement; an electrical or electronic part formed by working the copper alloy material; and a method of producing the copper alloy material.
    Type: Grant
    Filed: April 21, 2011
    Date of Patent: August 5, 2014
    Assignee: Furukawa Electric Co., Ltd.
    Inventors: Hiroshi Kaneko, Kiyoshige Hirose, Tatsuhiko Eguchi
  • Patent number: 8753529
    Abstract: Provided is a clathrate compound represented by a following chemical formula, for example, BaaGabAlcSid (where 7.77?a?8.16, 7.47?b?15.21, 0.28?c?6.92, 30.35?d?32.80, and a+b+c+d=54), and a thermoelectric material containing the clathrate compound. A producing method of the thermoelectric material is also provided.
    Type: Grant
    Filed: January 7, 2013
    Date of Patent: June 17, 2014
    Assignee: Furukawa Electric Co., Ltd.
    Inventors: Daisuke Kikuchi, Tatsuhiko Eguchi
  • Publication number: 20120267013
    Abstract: A copper alloy sheet material, having an R value of 1 or greater, which is defined by: R=([BR]+[RDW]+[W])/([C]+[S]+[B]) wherein [BR], [RDW], [W], [C], [S], and [B] represent an area ratio of crystal texture orientation component of BR orientation {3 6 2}<8 5 3>, RD-rotated-cube orientation {0 1 2}<1 0 0>, cube orientation {1 0 0}<0 0 1>, copper orientation {1 2 1}<1 1 1>, S-orientation {2 3 1}<3 4 6>, and brass orientation {1 1 0}<1 1 2>, respectively, in crystal orientation analysis in an EBSD (electron back scatter diffraction) analysis, and having a proof stress of 500 MPa or greater, and an electrical conductivity of 30%IACS or higher; and a production method of the same.
    Type: Application
    Filed: June 1, 2012
    Publication date: October 25, 2012
    Inventors: Hiroshi KANEKO, Koji Sato, Tatsuhiko Eguchi
  • Patent number: 8287669
    Abstract: A copper alloy for electric and electronic equipments, containing from 0.5 to 4.0 mass % of Ni, from 0.5 to 2.0 mass % of Co, and from 0.3 to 1.5 mass % of Si, with the balance of copper and inevitable impurities, wherein R{200} is 0.3 or more, in which the R{200} is a proportion of a diffraction intensity from a {200} plane of the following diffraction intensities and is represented by R{200}=I{200}/(I{111}+I{200}+I{220}+I{311}), I{111} is a diffraction intensity from a {111} plane, I{200} is a diffraction intensity from a {200} plane, I{220} is a diffraction intensity from a {220} plane, and I{311} is a diffraction intensity from a {311} plane, each at the material surface.
    Type: Grant
    Filed: May 30, 2008
    Date of Patent: October 16, 2012
    Assignee: The Furukawa Electric Co., Ltd.
    Inventors: Hiroshi Kaneko, Tatsuhiko Eguchi, Kuniteru Mihara, Kiyoshige Hirose
  • Publication number: 20120241056
    Abstract: {Problems} To provide a copper alloy material, having a low Young's modulus that is required of electrical or electronic parts, such as connectors. {Means to solve} A copper alloy sheet material for electrical or electronic parts, having an alloy composition containing any one or both of Ni and Co in an amount of 0.5 to 5.0 mass % in total, and Si in an amount of 0.2 to 1.5 mass %, with the balance being Cu and inevitable impurities, wherein the copper alloy sheet material has a 0.2% proof stress in the rolling direction of 500 MPa or more, an electrical conductivity of 30% IACS or more, a Young's modulus of 110 GPa or less, and a factor of bending deflection of 105 GPa or less.
    Type: Application
    Filed: June 1, 2012
    Publication date: September 27, 2012
    Inventors: Koji SATO, Hiroshi KANEKO, Tatsuhiko EGUCHI
  • Publication number: 20110259480
    Abstract: A copper alloy material, containing Ni 1.8 to 5.0 mass % and Si 0.3 to 1.7 mass %, at a ratio of contents of Ni and Si, Ni/Si, of 3.0 to 6.0, and having a content of S of less than 0.005 mass %, with the balance of being Cu and inevitable impurities, wherein the copper alloy material satisfies formulae (1) to (4): 130×C+300?TS?130×C+650??(1) 0.001?d?0.020??(2) W?150??(3) 10?L?800??(4) wherein TS represents a tensile strength (MPa) of the copper alloy material in a direction parallel to rolling; C represents the content (mass %) of Ni in the copper alloy material; d represents an average grain diameter (mm) of the copper alloy material; W represents a width (nm) of a precipitate free zone; and L represents a particle diameter (nm) of a compound on a grain boundary.
    Type: Application
    Filed: July 1, 2011
    Publication date: October 27, 2011
    Inventors: Kiyoshige Hirose, Tatsuhiko Eguchi
  • Publication number: 20110200479
    Abstract: A copper alloy material for electric/electronic parts, containing Co and Si as additive elements, wherein, a compound A is dispersed, which is composed of Co and Si and has an average particle diameter of 5 nm or more but less than 50 nm, and at least one compound is dispersed, which is selected from: a compound B which does not contain one or any of Co and Si and has an average particle diameter from 50 to 500 nm, a compound C which contains both of Co and Si and another element and has an average particle diameter from 50 to 500 nm, and a compound D which is composed of Co and Si and has an average particle diameter from 50 to 500 nm; a grain size of the copper alloy matrix is 3 to 35 ?m; and an electrical conductivity is 50% IACS or more.
    Type: Application
    Filed: February 4, 2011
    Publication date: August 18, 2011
    Applicant: THE FURUKAWA ELECTRIC CO., LTD.
    Inventors: Kuniteru MIHARA, Ryosuke MATSUO, Tatsuhiko EGUCHI
  • Publication number: 20110200480
    Abstract: A copper alloy material for electric/electronic parts, containing Co in an amount of 0.7 to 2.5 mass % and Si in an amount that gives a mass ratio of Co and Si (Co/Si ratio) within the range from 3.5 to 4.0, with the balance being Cu and unavoidable impurities, wherein the grain size is 3 to 15 ?m.
    Type: Application
    Filed: February 4, 2011
    Publication date: August 18, 2011
    Applicant: THE FURUKAWA ELECTRIC CO., LTD.
    Inventors: Ryosuke MATSUO, Kuniteru MIHARA, Tatsuhiko EGUCHI
  • Publication number: 20110192505
    Abstract: A copper alloy material, having an alloy composition containing any one or both of Ni and Co in an amount of 0.4 to 5.0 mass % in total, and Si in an amount of 0.1 to 1.5 mass %, with the balance being copper and unavoidable impurities, wherein a ratio of an area of grains in which an angle of orientation deviated from S-orientation {2 3 1}<3 4 6> is within 30° is 60% or more, according to a crystal orientation analysis in EBSD measurement; an electrical or electronic part formed by working the copper alloy material; and a method of producing the copper alloy material.
    Type: Application
    Filed: April 21, 2011
    Publication date: August 11, 2011
    Inventors: Hiroshi KANEKO, Kiyoshige HIROSE, Tatsuhiko EGUCHI
  • Publication number: 20110186187
    Abstract: A method of producing a copper alloy containing: Ni and/or Si and at least one or more of B, Al, As, Hf, Zr, Cr, Ti, C, Fe, P, In, Sb, Mn, Ta, V, S, O, N, Misch metal (MM), Co, and Be, the copper alloy having a precipitate X composed of Ni and Si, and a precipitate Y composed of Ni and/or Si, and at least one or more of B, Al, As, Hf, Zr, Cr, Ti, C, Fe, P, In, Sb, Mn, Ta, V, S, O, N, Misch metal (MM), Co, and Be, in which a grain diameter of the precipitate Y is 0.01 to 2 ?m.
    Type: Application
    Filed: April 11, 2011
    Publication date: August 4, 2011
    Applicant: THE FURUKAWA ELECTRIC CO., LTD.
    Inventors: Kuniteru MIHARA, Nobuyuki TANAKA, Tatsuhiko EGUCHI, Kiyoshige HIROSE
  • Publication number: 20110186192
    Abstract: A copper alloy material for an electric/electronic part, having a composition comprising Co 0.5 to 2.0 mass % and Si 0.1 to 0.5 mass %, with the balance of Cu and inevitable impurities, in which a copper alloy of a matrix has a grain size of 3 to 35 ?m, a precipitate composed of Co and Si has a particle size of 5 to 50 nm, the precipitate has a density of 1×108 to 1×1010 number/mm2, and the copper alloy material has a tensile strength of 550 MPa and an electrical conductivity of 50% IACS or more.
    Type: Application
    Filed: January 28, 2011
    Publication date: August 4, 2011
    Applicant: THE FURUKAWA ELECTRIC CO., LTD.
    Inventors: Kuniteru MIHARA, Ryosuke MATSUO, Tatsuhiko EGUCHI
  • Patent number: 7947133
    Abstract: A copper alloy strip material for electrical/electronic equipment includes a copper alloy containing 2.0 to 5.0 mass % Ni, 0.43 to 1.5 mass % Si, and a remaining component formed of Cu and an unavoidable impurity. Three types of intermetallic compounds A, B, and C comprising Ni and Si in a total amount of 50 mass % or more are contained. The intermetallic compound A has a compound diameter of 0.3 ?m to 2 ?m, the intermetallic compound B has a compound diameter of 0.05 ?m to less than 0.3 ?m, and the intermetallic compound C has a compound diameter of more than 0.001 ?m to less than 0.05 ?m.
    Type: Grant
    Filed: September 12, 2007
    Date of Patent: May 24, 2011
    Assignee: Furukawa Electric Co., Ltd.
    Inventors: Kuniteru Mihara, Tatsuhiko Eguchi
  • Publication number: 20110094635
    Abstract: A method of producing a copper alloy containing a precipitate X composed of Ni and Si and a precipitate Y that comprises (a) Ni and 0% Si, (b) Si and 0% Ni, or (c) neither Ni nor Si, wherein the precipitate X has a grain size of 0.001 to 0.1 ?m, and the precipitate Y has a grain size of 0.01 to 1 ?m.
    Type: Application
    Filed: December 22, 2010
    Publication date: April 28, 2011
    Applicant: THE FURUKAWA ELECTRIC CO., LTD.
    Inventors: Kuniteru Mihara, Tatsuhiko Eguchi, Nobuyuki Tanaka, Kiyoshige Hirose
  • Publication number: 20110038753
    Abstract: A copper alloy sheet material which has a tensile strength of 730-820 MPa and contains at least nickel (Ni) and silicon (Si), with the remainder being copper (Cu) and inevitable impurities. When the sheet material has a shape capable of 180° tight bending and the width and thickness of this sheet material are expressed by W (unit: mm) and T (unit: mm) respectively, then the product of W and T is 0.16 or less. Preferably, the sheet material is constituted of an alloy containing nickel at 1.8-3.3 mass %, silicon at 0.4 mass %, and chromium (Cr) at 0.01-0.5 mass %, with the remainder being copper and inevitable impurities. The sheet material may further contain one or more of: at least one member selected among tin (Sn), magnesium (Mg), silver (Ag), manganese (Mn), titanium (Ti), iron (Fe), and phosphorus (P) in a total amount of 0.01-1 mass %; zinc (Zn) at 0.01-10 mass %, cobalt (Co) at and 0.01-1.5 mass %.
    Type: Application
    Filed: November 5, 2008
    Publication date: February 17, 2011
    Inventors: Hiroshi Kaneko, Kiyoshige Hirose, Kuniteru Mihara, Tatsuhiko Eguchi
  • Publication number: 20110005644
    Abstract: A copper alloy material for an electric/electronic part, containing Co 0.5 to 2.5 mass % and Si 0.1 to 1.0 mass %, at a ratio of Co/Si of 3 to 5 in terms of mass ratio, with the balance of Cu and inevitable impurities, which is obtained by subjecting to a solution treatment at a temperature (° C.) from 800° C. to 960° C. and lower than ?122.77X2+409.99X+615.74, in which X represents the Co content in mass %.
    Type: Application
    Filed: September 20, 2010
    Publication date: January 13, 2011
    Inventors: Ryosuke MATSUO, Tatsuhiko EGUCHI, Kuniteru MIHARA
  • Publication number: 20100326573
    Abstract: An copper alloy material for electric/electronic components containing Co by 0.2 to 2 mass % and Si by 0.05 to 0.5 mass % and having a remaining component composed of Cu and unavoidable impurities, characterized in that its grain size is 3 to 35 ?m and size of precipitate containing the both of Co and Si is 5 to 50 nm, electric conductivity is 50% IACS or more, tensile strength is 500 MPa or more and bending workability (R/t) is 2 or less.
    Type: Application
    Filed: January 30, 2009
    Publication date: December 30, 2010
    Inventors: Kuniteru Mihara, Ryosuke Matsuo, Tatsuhiko Eguchi
  • Publication number: 20100310413
    Abstract: A copper alloy material, containing Ni 1.8 to 5.0 mass % and Si 0.3 to 1.7 mass %, at a ratio of contents of Ni and Si, Ni/Si, of 3.0 to 6.0, and having a content of S of less than 0.005 mass %, with the balance of being Cu and inevitable impurities, wherein the copper alloy material satisfies formulae (1) to (4): 130×C+300?TS?130×C+650??(1) 0.001?d?0.020??(2) W?150??(3) 10?L?800??(4) wherein TS represents a tensile strength (MPa) of the copper alloy material in a direction parallel to rolling; C represents the content (mass %) of Ni in the copper alloy material; d represents an average grain diameter (mm) of the copper alloy material; W represents a width (nm) of a precipitate free zone; and L represents a particle diameter (nm) of a compound on a grain boundary.
    Type: Application
    Filed: August 17, 2010
    Publication date: December 9, 2010
    Inventors: Kiyoshige HIROSE, Tatsuhiko EGUCHI
  • Publication number: 20100269963
    Abstract: A copper alloy material according to the present invention is characterized in that the same comprises: Ni between 2.8 mass % and 5.0 mass %; Si between 0.4 mass % and 1.7 mass %; S of which content is limited to less than 0.005 mass %; and the balance of the copper alloy material is composed of copper and unavoidable impurity, wherein a proof stress is stronger than or equal to 800 MPa, and the same is superior in bending workability and in stress relaxation resistance.
    Type: Application
    Filed: October 31, 2008
    Publication date: October 28, 2010
    Inventors: Kiyoshige Hirose, Kuniteru Mihara, Hiroshi Kaneko, Tatsuhiko Eguchi