Abstract: To provide a method for controlling a transmission system with quick response in which plural electronic devices are connected to one host apparatus through a common data line. The method for controlling the transmission system of the present invention comprises: a step of transmitting a command signal for releasing the data line and suspending the processing through a command signal line to the electronic device occupying the data line in the state where one of the plural electronic devices is executing the processing that occupies the data line so as to make the electronic device release the data line and suspend the processing and to perform data transmission between the host apparatus and the other one of the electronic devices; and a step of resuming the suspended processing after the data transmission between the host apparatus and the other electronic device.

Abstract: The problem of the present invention is to provide a TEM sample equipped with an identifying function for easily specifying a detailed TEM sample and to provide a system for handling the management of information relating to the TEM sample using the TEM when making observations that is constructed with the FIB device manufacturing the sample. The TEM sample of the present invention is written with a mark encoding information specifying the sample at a specified location of a peripheral part. Information relating to the sample filed taking sample specifying information as an index is supplied to a TEM as associated matter. The sample working FIB device and observation TEM device of the present invention are provided with a function enabling writing of information relating to the sample and images to the file during operation which is then read out and utilized on a display.

Abstract: A small-sized and low-cost transmission apparatus and a transmission method (having a high responsivity) capable of transmitting an interrupt signal with a small number of input/output terminals (without a dedicated line for interrupt signals) are provided. A first transmission apparatus of the present invention comprises a central processing unit for carrying out an interrupt process in response to an interrupt signal; an input/output section having at least one data line for transmitting data signals between a second transmission apparatus and the first transmission apparatus and for transmitting an interrupt signal from the second transmission apparatus to the first transmission apparatus; and an interrupt signal detecting section for detecting an interrupt signal from among signals transmitted from the second transmission apparatus via the data line.

Abstract: A sample manufacturing device comprises a sample stage to which an original sample is fixed, a focused ion beam irradiation system for irradiating a focused ion beam from a vertical direction to a specified place on the original sample, and a side entry stage, arranged diagonally above the sample stage, for inserting a sample stage for specified observation in a diagonal direction with respect to the vertical direction, and supporting the inserted sample holder for observation so as to be capable of movement in the diagonal direction. A test piece taken out from a specified place of the original sample is fixed to a tip section of the sample holder for specified observation supported on the side entry stage.

Abstract: A signal component for scanning a processing range and a signal component for synchronizing to movement of a moving stage are superimposed on an ion beam scanning signal. Using such a scanning signal, processing is carried out while moving a sample stage. In this way, it is possible to carry out processing using a focused ion beam device in a reduced amount of time for a plurality of samples.

Abstract: The present invention provides a probe, for a probe scanning microscope, with a structure that has high abrasion resistance and required rigidity as well as being mechanically narrow, that is attached to one end of a cantilever so that a tip makes vertical contact with a sample surface, made of a material that is conductive and has good measurement reproducibility with stable resolution.

Abstract: A method for preparing a sample for observation, by the steps of: contacting a first predetermined area of the sample surface with an organic compound vapor while irradiating the first predetermined area with an ion beam to decompose the organic compound into a layer having a mask function, the layer covering the first predetermined area; and contacting a second predetermined area of the sample surface with an etching gas while irradiating the second predetermined area with an ion beam in order to remove material from the sample surface at the second predetermined area, wherein the second predetermined area includes at least part of the first predetermined area and the layer covering the first predetermined area prevents removal of material from the sample surface in the first predetermined area.

Abstract: A server system includes: a driver for allowing client systems to use peripherals; a driver event detecting portion; a usage frequency management table for recording the usage history and a usage history frequency management portion; a reservation management table for registering reservations by operating the usage frequencies and predicting the usage time periods of a peripheral; a data content detecting portion for detecting the content processed through the driver; and a data content management portion for recording the content. The system is configured so that management of setup usage reservations of the peripheral and changing reservations in response to a user request from a client system can be performed.

Abstract: A sample semiconductor device which is processed and/or observed with the focused liquid metal ion beam can be returned again to the manufacturing process in this invention. The metal ions used in this apparatus are generally Ga ions. Ga ions contaminate a semiconductor device and a semiconductor manufacturing apparatus by auto-doping. An area which is irradiated with a focused liquid metal ion is doped by the metal ions which are subsequently removed by irradiation with a gas ion beam or covered by hard fusing metal.

Abstract: To process sample of specific portion or position for the transmission electron microscope [TEM] simply to the most suitable or optimal shape, and to confirm the sample thickness of the sample while processing above (on-going confirmation). To make TEM sample through etching by way of irradiation of ion beam 2 onto sample 4, and to confirm processing status of sample by way of irradiating electron beam 7 from horizontal angle to cross-section of sample, and of detecting secondary electron, reflection electron, X ray, and transmission electron with respective detector 5, 9, 10, and 11, and to estimate the thickness of sample in process above since the intensities of these signals above changes due to the thin film thickness of sample.

Abstract: In a data recording method, successive frames of main data and auxiliary data are recorded on a recording tape. The auxiliary data includes control information regarding the main data. A main data completion point indication is recorded in a track of the auxiliary data prior to a corresponding location of a track of the main data at which recording of the main data is completed. Also, a continuous data flag is recorded at a location in the auxiliary data track corresponding to the location of the main data track at which recording of the main data is completed. The continuous data flag indicates that the recorded main data continues at a corresponding location and an opposite plane of the recording tape. When a recorded data region end search is carried out, the tape running direction is reversed upon detection of the continuous data flag in the auxiliary data track.

Abstract: A TOC recording/reproducing device which can shorten the time required to read TOC by searching a closer TOC between two identical TOCs recorded at both starting terminals on first and second recording surfaces of the tape on the basis of tape position information detected from tape reproduction.

Abstract: This invention relates to a time code recording and reproducing apparatus for recording and reproducing time codes corresponding to a digital signal. Time code converting means (100) converts a first time code into a second time code. A frame phase which occurs during the recording of input information is determined by frame timing generating means. A phase difference between a frame of the second time code and a recording frame is detected by phase difference detecting means (103). Phase difference correcting means (104) outputs a third time code on the basis of the detected phase difference. The input information is recorded together with the third time code. Thereby, the recording can be performed while the relation of the correspondence between the input information and the time code is held. In addition, the reproduction can be performed.

Abstract: This invention relates to a time code recording and reproducing apparatus for recording and reproducing time codes corresponding to a digital signal. Time code converting means (100) converts a first time code into a second time code. A frame phase which occurs during the recording of input information is determined by frame timing generating means. A phase difference between a frame of the second time code and a recording frame is detected by phase difference detecting means (103). Phase difference correcting means (104) outputs a third time code on the basis of the detected phase difference. The input information is recorded together with the third time code. Thereby, the recording can be performed while the relation of the correspondence between the input information and the time code is held. In addition, the reproduction can be performed.

Abstract: A means is employed to blow a gas for forming a conductive film and a gas for forming an insulating film onto the surface of a specimen while it is being irradiated with an ion beam, in order to easily and quickly form a small conductive pattern and an insulating pattern in a laminated manner, and a means is employed to cut a pattern by the irradiation with an ion beam and to form a new electrically conductive pattern by blowing a gas while the pattern is being irradiated with the ion beam in order to accomplish an electric connection between the patterns, making it possible to locally cut or connect tiny patterns.

Abstract: The method of preparing and observing a microsection utilizes a focused ion beam device composed of an ion tube for producing a scanned and focused ion beam, a sample stage including an XY displacement mechanism and an inclination mechanism, a gas gun for injecting deposition material gas onto a surface of a sample and a secondary charged particle detector such that the focused ion beam device has three functions, i.e., a scanning ion microscope function, a maskless etching function and a maskless deposition function.

Abstract: An apparatus for effecting preparation and observation of a topographic section in a particular region of a sample. The apparatus includes: a sample chamber for containing a sample, an ion beam irradiation unit mounted in the sample chamber for irradiating the sample with a scanned ion beam to groove the particular region to thereby prepare the topographic section, an electron beam irradiation unit mounted in the sample chamber for irradiating the topographic section with a scanned electron beam, the electron beam irradiation unit being arranged relative to the ion beam irradiation unit such that the electron beam intersects the ion beam at the particular region at an angle not exceeding 90.degree.

Abstract: A process of forming a metal pattern film on a designated area of a substrate. A vapor stream of a decomposable hexacarbonyl metal compound is directed toward the substrate designated area to form thereon a layer of the decomposable hexacarbonyl metal compound. This layer is irradiated with a focused metal ion beam to decompose the hexacarbonyl metal compound into the gaseous carbonyl component and solid metal component to thereby deposit the solid metal component on the substrate designated area.

Abstract: There is here provided a flocked product having a warm and soft appearance and a thick and tender feel which is obtained by flocking the surface of a nonwoven, woven or knitted fabric.

Abstract: A metal-polypropylene laminate composite comprising a polypropylene sheet made of a blend of a modified polypropylene prepared by modifying a crystalline polypropylene with an unsaturated carboxylic acid or its derivatives or a crystalline polypropylene containing such a modified polypropylene, with 15 to 50 wt. % of waste paper, organic fibers or wood pulp and metal plates superposed on and bonded by hot forming to both the surfaces of said polypropylene sheet is provided.It is of light weight and useful in acoustically sound absorption, vibration damping and heat insulation purpose.