Patents by Inventor Tatsuya Sugimoto

Tatsuya Sugimoto has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20100292516
    Abstract: A process for producing a perfluoroalkyne compound includes an addition reaction step of adding Cl2, Br2, or I2 to a compound shown by the formula (1) CH3C?CR1 to obtain a compound shown by the formula (2) CH3CX2CX2R1, a fluorination reaction step of reacting the compound shown by the formula (2) with fluorine gas to obtain a compound shown by the formula (3) CF3CX2CX2R2, and a dehalogenation reaction step of contacting the compound shown by the formula (3) with a metal or an organometallic compound to obtain a perfluoroalkyne compound shown by the formula (4) CF3C?CR2. According to the present invention, a perfluoroalkyne compound can be produced at high productivity and high yield using starting raw materials which are environmentally friendly and industrially available. In the above formulas, R1 represents a methyl group or an ethyl group, X represents Cl, Br, or I, and R2 represents a trifluoromethyl group or a pentafluoroethyl group.
    Type: Application
    Filed: March 30, 2007
    Publication date: November 18, 2010
    Applicant: Zeon Corporation
    Inventor: Tatsuya Sugimoto
  • Publication number: 20100264116
    Abstract: A plasma etching method includes plasma-etching a silicon oxide layer through a mask using a process gas, the process gas containing oxygen gas and a fluorohydrocarbon shown by the formula (1), CxHyFz, wherein x is an integer from 4 to 6, y is an integer from 1 to 4, and z is a positive integer, provided that (y+z) is 2x or less. A contact hole having a very small diameter and a high aspect ratio can be formed in a substantially vertical shape without necking by plasma-etching the silicon oxide layer using a single process gas.
    Type: Application
    Filed: September 26, 2008
    Publication date: October 21, 2010
    Applicant: Zeon Corporation
    Inventors: Takefumi Suzuki, Tatsuya Sugimoto, Masahiro Nakamura
  • Patent number: 7704893
    Abstract: The present invention relates to a semiconductor device comprising an insulation film consisting of a fluoridation carbon film that has been subjected to thermal history of 420° C. or lower. The feature of the present invention is that an amount of hydrogen atoms included in the fluoridation carbon film is 3 atomic % or less before the fluoridation carbon film is subjected to the thermal history.
    Type: Grant
    Filed: August 12, 2004
    Date of Patent: April 27, 2010
    Assignees: Tokyo Eectron Limited, Zeon Corporation
    Inventors: Yasuo Kobayashi, Kohei Kawamura, Tadahiro Ohmi, Akinobu Teramoto, Tatsuya Sugimoto, Toshiro Yamada, Kimiaki Tanaka
  • Patent number: 7655572
    Abstract: Photoresist film is used as a mask, plasma etching of a SiO2 film is selectively performed to a photoresist film, and a hole is formed. An etching gas comprising unsaturated fluorocarbon gas containing oxygen expressed with CxFyO (y/x is 1-1.5 at an integer in x, as for 4 or 5, and y) is used for the plasma etching. C4F4O gas and C4F6O gas are used for the unsaturated fluorocarbon gas containing oxygen, for example.
    Type: Grant
    Filed: October 20, 2006
    Date of Patent: February 2, 2010
    Assignees: Tokyo Electron Limited, Zeon Corporation
    Inventors: Akinori Kitamura, Masanobu Honda, Nozomi Hirai, Masahiro Nakamura, Tatsuya Sugimoto
  • Patent number: 7652179
    Abstract: A gas for plasma reaction comprising a chainlike perfluoroalkyne having 5 or 6 carbon atoms, preferably perfluoro-2-pentyne. This plasma reaction gas is suitable for dry etching for formation of a fine pattern, for plasma CVD for formation of a thin film, and for plasma ashing. The plasma reaction gas is synthesized by contacting a dihydrofluoroalkane compound or a monohydrofluoroalkene compound with a basic compound.
    Type: Grant
    Filed: January 11, 2008
    Date of Patent: January 26, 2010
    Assignee: Zeon Corporation
    Inventors: Mitsuru Sugawara, Toshiro Yamada, Tatsuya Sugimoto, Kimiaki Tanaka
  • Publication number: 20080284684
    Abstract: A plasma display device and a method for driving the plasma display device are provided, wherein deterioration in image quality in a period immediately after power-on can be restrained while improving dark contrast. When driving a PDP, by applying various drive pulses, that includes a phosphor layer containing a secondary electron emissive material in respective discharge cells, drive pulses having different pulse waveforms are generated in a period from power-on of the plasma display device to after a lapse of a predetermined period of time, and in a period after a lapse of the predetermined period of time.
    Type: Application
    Filed: May 13, 2008
    Publication date: November 20, 2008
    Applicant: Pioneer Corporation
    Inventors: Mitsuhiro ISHIZUKA, Mitsuyoshi Makino, Hajime Homma, Koji Hashimoto, Masanori Ishihara, Tsutomu Tokunaga, Tatsuya Sugimoto
  • Publication number: 20080278415
    Abstract: A method for driving a plasma display panel which is capable of improving contrast is provided. A plasma display apparatus which is capable of improving dark contrast and suppressing a degradation in image quality immediately after power-on is also provided. In the PDP, the peak potentials of drive pulses to be applied in order to drive display cells which have a phosphor layer containing a phosphor material and a secondary electron emitting material, are set as follows. The peak potential of a reset pulse, to be applied to each of the row electrodes in the first subfield within each unit display period, is set to be lower than the peak potential of a sustain pulse, to be applied to each of the row electrodes in every subfield to produce sustain discharge only in display cells that are in the lighting mode.
    Type: Application
    Filed: May 9, 2008
    Publication date: November 13, 2008
    Applicant: Pioneer Corporation
    Inventors: Shunsuke ITAKURA, Tsutomu Tokunaga, Tatsuya Sugimoto, Yoshichika Sato, Yuya Shiozaki
  • Patent number: 7449415
    Abstract: A high-purity gas for plasma reaction having an octafluorocyclopentene purity of at least 99.9% by volume based on the total volume of the gas for plasma reaction, wherein the total content of nitrogen gas and oxygen gas, contained as trace gaseous ingredients of the remainder, is not larger than 200 ppm by volume. This high-purity gas for plasma reaction can be produced by (1) a process of distilling crude octafluorocyclopentene in an inert gas of group 0, or (2) a process of distilling crude octafluorocyclopentene into a purity of at least 99.9% by volume, and then, removing an impurity remainder.
    Type: Grant
    Filed: March 14, 2005
    Date of Patent: November 11, 2008
    Assignee: Zeon Corporation
    Inventors: Toshinobu Hirayama, Toshiro Yamada, Tatsuya Sugimoto, Mitsuru Sugawara
  • Publication number: 20080274334
    Abstract: A dry etching gas comprising a C4-6 fluorine compound which has an ether bond or carbonyl group and one or more fluorine atoms in the molecule and is constituted only of carbon, fluorine, and oxygen atoms and in which the ratio of the number of fluorine atoms to the number of carbon atoms (F/C) is 1.9 or lower (provided that the compound is neither a fluorine compound having one cyclic ether bond and one carbon-carbon double bond nor a saturated fluorine compound having one carbonyl group); a mixed dry etching gas comprising the dry etching gas and at least one gas selected from the group consisting of rare gases, O2, O3, CO, CO2, CHF3, CH2F2, CF4, C2F6, and C3F8; and a method of dry etching which comprises converting either of these dry etching gases into a plasma and processing a semiconductor material with the plasma.
    Type: Application
    Filed: May 30, 2005
    Publication date: November 6, 2008
    Applicants: National Institute of Advanced Industrial Science and Technology, Zeon Corporation
    Inventors: Akira Sekiya, Tatsuya Sugimoto, Toshiro Yamada, Takanobu Mase
  • Publication number: 20080139855
    Abstract: A gas for plasma reaction comprising a chainlike perfluoroalkyne having 5 or 6 carbon atoms, preferably perfluoro-2-pentyne. This plasma reaction gas is suitable for dry etching for formation of a fine pattern, for plasma CVD for formation of a thin film, and for plasma ashing. The plasma reaction gas is synthesized by contacting a dihydrofluoroalkane compound or a monohydrofluoroalkene compound with a basic compound.
    Type: Application
    Filed: January 11, 2008
    Publication date: June 12, 2008
    Applicant: Zeon Corporation
    Inventors: Mitsuru Sugawara, Toshiro Yamada, Tatsuya Sugimoto, Kimiaki Tanaka
  • Patent number: 7341764
    Abstract: A gas for plasma reaction comprising a chainlike perfluoroalkyne having 5 or 6 carbon atoms, preferably perfluoro-2-pentyne. This plasma reaction gas is suitable for dry etching for formation of a fine pattern, for plasma CVD for formation of a thin film, and for plasma ashing. The plasma reaction gas is synthesized by contacting a dihydrofluoroalkane compound or a monohydrofluoroalkene compound with a basic compound.
    Type: Grant
    Filed: October 31, 2002
    Date of Patent: March 11, 2008
    Assignee: Zeon Corporation
    Inventors: Mitsuru Sugawara, Toshiro Yamada, Tatsuya Sugimoto, Kimiaki Tanaka
  • Patent number: 7226380
    Abstract: A second planetary gear unit PR and a clutch C1 for outputting reduced speed rotation are located on one axial side of a first planetary gear unit PU, with an output unit located therebetween. A clutch C2 which connects/disconnects an input shaft 2 to/from a sun gear S2 of the planetary gear unit PU and a clutch C3 connects and disconnects the input shaft to/from a carrier CR2 of the planetary gear unit are on the other axial side of the first planetary gear unit PU. Compared with a transmission wherein a clutch C2 or clutch C3 is located between the second planetary gear unit PR and the planetary gear unit PU, the second planetary gear unit PR and the first planetary gear unit PU can be located closer together, and a member which transmits the reduced speed rotation can be made shorter. Further, compared to the case wherein, for example, the clutches C1, C2, C3 are located together on one axial side, oil supply to their servos is simplified.
    Type: Grant
    Filed: December 26, 2003
    Date of Patent: June 5, 2007
    Assignee: Aisin AW Co., Ltd.
    Inventors: Kazumichi Kayama, Nobutada Sugiura, Shundo Yamaguchi, Tatsuya Sugimoto, Tomochika Inagaki
  • Publication number: 20070090093
    Abstract: Photoresist film is used as a mask, plasma etching of a SiO2 film is selectively performed to a photoresist film, and a hole is formed. An etching gas comprising unsaturated fluorocarbon gas containing oxygen expressed with CxFyO (y/x is 1-1.5 at an integer in x, as for 4 or 5, and y) is used for the plasma etching. C4F4O gas and C4F6O gas are used for the unsaturated fluorocarbon gas containing oxygen, for example.
    Type: Application
    Filed: October 20, 2006
    Publication date: April 26, 2007
    Applicants: TOKYO ELECTRON LIMITED, ZEON CORPORATION
    Inventors: Akinori Kitamura, Masanobu Honda, Nozomi Hirai, Masahiro Nakamura, Tatsuya Sugimoto
  • Publication number: 20060264059
    Abstract: The present invention relates to a semiconductor device comprising an insulation film consisting of a fluoridation carbon film that has been subjected to thermal history of 420° C. or lower. The feature of the present invention is that an amount of hydrogen atoms included in the fluoridation carbon film is 3 atomic % or less before the fluoridation carbon film is subjected to the thermal history.
    Type: Application
    Filed: August 12, 2004
    Publication date: November 23, 2006
    Inventors: Yasuo Kobayashi, Kohei Kawamura, Tadahiro Ohmi, Akinobu Teramoto, Tatsuya Sugimoto, Toshiro Yamada, Kimiaki Tanaka
  • Publication number: 20050247670
    Abstract: A dry etching method wherein a resist film is irradiated with radiation having a wavelength of not more than 195 nm to form a resist pattern having a minimum line width of not more than 200 nm, and the substrate having the resist pattern formed thereon is subjected to dry etching using a fluorine-containing compound having 4 to 6 carbon atoms and at least one unsaturated bond as an etching gas. As the fluorine-containing compound, perfuloro-2-pentyne, perfuloro-2-butyne, nonafluoro-2-pentene and perfluoro-2-pentene are preferably used. Perfuloro-2-pentyne is produced by a process wherein a 1,1,1-trihalo-2,2,2-trifluoroethane is allowed to react with pentafluoropropionaldehyde to give a 2-halo-1,1,1,4,4,5,5,5-octafluoro-2-pentene, and the thus-produced halo-octafluoro-2-pentene is dehydrohalogenated.
    Type: Application
    Filed: July 16, 2003
    Publication date: November 10, 2005
    Inventors: Toshiro Yamada, Tatsuya Sugimoto
  • Publication number: 20050227804
    Abstract: A second planetary gear unit PR and a clutch C1 for outputting reduced speed rotation are located on one axial side of a first planetary gear unit PU, with an output unit located therebetween. A clutch C2 which connects/disconnects an input shaft 2 to/from a sun gear S2 of the planetary gear unit PU and a clutch C3 connects and disconnects the input shaft to/from a carrier CR2 of the planetary gear unit are on the other axial side of the first planetary gear unit PU. Compared with a transmission wherein a clutch C2 or clutch C3 is located between the second planetary gear unit PR and the planetary gear unit PU, the second planetary gear unit PR and the first planetary gear unit PU can be located closer together, and a member which transmits the reduced speed rotation can be made shorter. Further, compared to the case wherein, for example, the clutches C1, C2, C3 are located together on one axial side, oil supply to their servos is simplified.
    Type: Application
    Filed: December 26, 2003
    Publication date: October 13, 2005
    Inventors: Kazumichi Kayama, Nobutada Sugiura, Shundo Yamaguchi, Tatsuya Sugimoto, Tomochika Inagaki
  • Publication number: 20050178731
    Abstract: A high-purity gas for plasma reaction having an octafluorocyclopentene purity of at least 99.9% by volume based on the total volume of the gas for plasma reaction, wherein the total content of nitrogen gas and oxygen gas, contained as trace gaseous ingredients of the remainder, is not larger than 200 ppm by volume. This high-purity gas for plasma reaction can be produced by (1) a process of distilling crude octafluoro-cyclopentene in an inert gas of group 0, or (2) a process of distilling crude octafluorocyclopentene into a purity of at least 99.9% by volume, and then, removing an impurity remainder.
    Type: Application
    Filed: March 14, 2005
    Publication date: August 18, 2005
    Applicant: Zeon Corporation
    Inventors: Toshinobu Hirayama, Toshiro Yamada, Tatsuya Sugimoto, Mitsuru Sugawara
  • Publication number: 20050092240
    Abstract: A gas for plasma reaction comprising a chainlike perfluoroalkyne having 5 or 6 carbon atoms, preferably perfluoro-2-pentyne. This plasma reaction gas is suitable for dry etching for formation of a fine pattern, for plasma CVD for formation of a thin film, and for plasma ashing. The plasma reaction gas is synthesized by contacting a dihydrofluoroalkane compound or a monohydrofluoroalkene compound with a basic compound.
    Type: Application
    Filed: October 31, 2002
    Publication date: May 5, 2005
    Inventors: Mitsuru Sugawara, Toshiro Yamada, Tatsuya Sugimoto, Kimiaki Tanaka
  • Patent number: 6884365
    Abstract: A high-purity gas for plasma reaction having an octafluorocyclopentene purity of at least 99.9% by volume based on the total volume of the gas for plasma reaction, wherein the total content of nitrogen gas and oxygen gas, contained as trace gaseous ingredients of the remainder, is not larger than 200 ppm by volume. This high-purity gas for plasma reaction can be produced by (1) a process of distilling crude octafluorocyclopentene in an inert gas of group 0, or (2) a process of distilling crude octafluorocyclopentene into a purity of at least 99.9% by volume, and then, removing an impurity remainder.
    Type: Grant
    Filed: May 24, 2000
    Date of Patent: April 26, 2005
    Assignee: Zeon Corporation
    Inventors: Toshinobu Hirayama, Toshiro Yamada, Tatsuya Sugimoto, Mitsuru Sugawara
  • Patent number: 6843526
    Abstract: A storable and removable jump seat for use in a vehicle. The improved seat provide for convertible seating in the form of a folding jump seat provides conforming appearance, comfort, safety and practicality. The jump seat provides a safe, comfortable and easily storable seat that may be folded and stored against a wall within the vehicle's cargo area in order to expand the available cargo space. The jump seat assembly is also designed to be quickly and easily removable in order to increase the available cargo space within a vehicle. The jump seat may be quickly and easily reinstalled without the need for tools or additional assistance. Multiple jump seats may be arranged within a vehicle to provide a side by side seating arrangement.
    Type: Grant
    Filed: March 26, 2002
    Date of Patent: January 18, 2005
    Inventors: Hiroyuki Honda, Charles Stephen Haase, Kelly Michael Whalen, Takuya Hori, Tatsuya Sugimoto