Abstract: A secondary battery is fixed in a sealed container. A first tool unit and a second tool unit are provided on the sealed container. The first tool unit is formed from a first tool and a first holder. The second tool unit is formed from a second tool and a second holder. The first holder holds the first tool while maintaining airtightness of the sealed container, while allowing an advancing/retreating movement and a tilting movement of the first tool. The second holder has a structure similar to that of the first holder.

Abstract: A laminated glass according to an embodiment of the present invention includes a first glass plate, a second glass plate, and an interlayer film held between the first glass plate and the second glass plate. When a relative dielectric constant of the first glass plate is represented by ?g1; a relative dielectric constant of the second glass plate is represented by ?g2; a relative dielectric constant of a first interlayer film provided in a first region of the interlayer film is represented by ?m1; a reflection coefficient at an interface between the first glass plate and the first interlayer film is represented by ?1; and a reflection coefficient at an interface between the second glass plate and the first interlayer film is represented by ?2, the reflection coefficients ?1 and ?2 satisfy relations 0.0??1?0.2 and 0.0??2?0.2.

Abstract: A laminated glass according to an embodiment of the present invention includes a first glass plate, a second glass plate, and an interlayer film held between the first glass plate and the second glass plate. When a relative dielectric constant of the first glass plate is represented by ?g1; a relative dielectric constant of the second glass plate is represented by ?g2; a relative dielectric constant of a first interlayer film provided in a first region of the interlayer film is represented by ?m1; a reflection coefficient at an interface between the first glass plate and the first interlayer film is represented by ?1; and a reflection coefficient at an interface between the second glass plate and the first interlayer film is represented by ?2, the reflection coefficients ?1 and ?2 satisfy relations 0.0??1?0.2 and 0.0??2?0.2.

Abstract: An oil pump including a first housing having a rotation shaft insertion hole, a cam ring, a pump element, a rotation shaft rotatably extending through the rotation shaft insertion hole, a second housing disposed on the cam ring, wherein the cam ring is placed in a position relative to the rotation shaft insertion hole of the first housing by using a jig, and the cam ring includes a clamped portion that is clamped by a cam ring holding device, while the first housing and the second housing are fixed to each other after placing the cam ring in the position relative to the rotation shaft insertion hole by using the jig. Alternatively, the oil pump including a fixing means for fixing the cam ring to the pump body instead of the clamped portion.

Abstract: An oil pump including a first housing having a rotation shaft insertion hole, a cam ring, a pump element, a rotation shaft rotatably extending through the rotation shaft insertion hole, a second housing disposed on the cam ring, wherein the cam ring is placed in a position relative to the rotation shaft insertion hole of the first housing by using a jig, and the cam ring includes a clamped portion that is clamped by a cam ring holding device, while the first housing and the second housing are fixed to each other after placing the cam ring in the position relative to the rotation shaft insertion hole by using the jig. Alternatively, the oil pump including a fixing means for fixing the cam ring to the pump body instead of the clamped portion.

Abstract: A testing apparatus using a scanning electron microscope for enabling tests and measurements on any part of a test subject in a nondestructive way without being limited by a size of the test subject, which is, a testing apparatus 1 using a scanning electron microscope for performing tests and measurements on any part of a test subject in a nondestructive way by using a scanning electron microscope 6a, comprising a local vacuum formation portion 9 for forming a local vacuum region by blocking around a part to be tested of the test subject from the outside air, wherein the local vacuum formation portion comprises an exhaust portion for exhausting to form a partial vacuum region, a float means 14 for floating the whole local vacuum formation portion above the test subject by emitting a compressed gas to an outer circumference portion of the local vacuum formation portion and a length measuring means 16 for measuring a distance between the test subject and the local vacuum formation portion for controlling floati

Abstract: The state of a polysilicon film formed by excimer laser annealing an amorphous silicon film is to be evaluated. When the amorphous silicon film is annealed to form a polysilicon film, linearity or periodicity presents itself in the spatial structure of the film surface of the polysilicon film formed depending on the energy applied to the amorphous silicon during annealing. This linearity or periodicity is processed as an image and represented numerically from the image by exploiting the linearity or periodicity. The state of the polysilicon film is checked based on the numerical results.

Abstract: A polysilicon film evaluation apparatus is provided which enables objective automatic evaluation of the status of a polysilicon film, as formed to a high accuracy in a contact-free fashion.

Abstract: A testing apparatus using a scanning electron microscope for enabling tests and measurements on any part of a test subject in a nondestructive way without being limited by a size of the test subject, which is, a testing apparatus 1 using a scanning electron microscope for performing tests and measurements on any part of a test subject in a nondestructive way by using a scanning electron microscope 6a, comprising a local vacuum formation portion 9 for forming a local vacuum region by blocking around a part to be tested of the test subject from the outside air, wherein the local vacuum formation portion comprises an exhaust portion for exhausting to form a partial vacuum region, a float means 14 for floating the whole local vacuum formation portion above the test subject by emitting a compressed gas to an outer circumference portion of the local vacuum formation portion and a length measuring means 16 for measuring a distance between the test subject and the local vacuum formation portion for controlling floati

Abstract: To provide an apparatus that may impart a complicated bend deformation to an object to be machined such as a ceramic bar elongated in one direction or the like, and may reduce the non-uniformity in machining amount of the object to be machined upon the machining work of the object to be machined, specifically a correcting mechanism for deforming the object to be machined together with a jig holding the object to be machined is provided in a machining apparatus. The correcting mechanism includes a base, a plurality of levers provided at first ends with pins, a shaft fixed to the base for rotatably supporting the levers, and a plurality of correcting drive means coupled to second ends of said levers for pivoting the levers to the shaft to thereby pivoting the pins.

Abstract: A temperature meter for measuring temperature of a measurement target object to which a temperature sensor cannot be fixed directly is formed by a temperature sensor configured to measure an observed temperature in a vicinity of the measurement target object; a timer configured to measure a temperature observation time; and a calculation processor configured to calculate the temperature of the measurement target object according to the observed temperature and the temperature observation time by carrying out a prescribed calculation processing.

Abstract: The state of a polysilicon film formed by excimer laser annealing an amorphous silicon film is to be evaluated. When the amorphous silicon film is annealed to form a polysilicon film, linearity or periodicity presents itself in the spatial structure of the film surface of the polysilicon film formed depending on the energy applied to the amorphous silicon during annealing. This linearity or periodicity is processed as an image and represented numerically from the image by exploiting the linearity or periodicity. The state of the polysilicon film is checked based on the numerical results.

Abstract: When electric elements are formed on a ceramic bar or the like, the positional displacement of the respective elements occurs due to a division exposing process or the like. An object of the present invention is to provide a device and a method which unify the non-polished portion of the respective elements by conducting polishing while a complicated deformation or the like is given to the ceramic bar. To achieve this object, the ceramic bar or like is held by using a jig, and a plurality of loads are applied to portions of the jig where the ceramic bar or the like is held, to thereby deform the ceramic bar or the like and polish the element in that state. In this situation the load applied points are disposed so as to avoid the boundaries of the division exposure.

Abstract: In the polishing work for forming a crown shape on a ceramic bar bearing a plurality of conversion units for the magnetic heads, the present invention is to provide a well-controlled satisfactory shape by pressing the ceramic bar, provided with plural grooves perpendicular to the longitudinal direction and on a surface opposed to the polished plane, to a substantially concave polishing plane through an elastic member principally composed of rubber, then measuring the magneto resistivity of an element provided in the conversion unit of the magnetic head, and adjusting the pressure at the crown forming operation by a closed loop control based on the result of such measurement.

Abstract: A temperature meter for measuring temperature of a measurement target object to which a temperature sensor cannot be fixed directly is formed by a temperature sensor configured to measure an observed temperature in a vicinity of the measurement target object; a timer configured to measure a temperature observation time; and a calculation processor configured to calculate the temperature of the measurement target object according to the observed temperature and the temperature observation time by carrying out a prescribed calculation processing.

Abstract: A polysilicon film evaluation apparatus is provided which enables objective automatic evaluation of the status of a polysilicon film, as formed to a high accuracy in a contact-free fashion.

Abstract: In the polishing work for forming a crown shape on a ceramic bar bearing a plurality of conversion units for the magnetic heads, the present invention is to provide a well-controlled satisfactory shape by pressing the ceramic bar, provided with plural grooves perpendicular to the longitudinal direction and on a surface opposed to the polished plane, to a substantially concave polishing plane through an elastic member principally composed of rubber, then measuring the magneto resistivity of an element provided in the conversion unit of the magnetic head, and adjusting the pressure at the crown forming operation by a closed loop control based on the result of such measurement.

Abstract: To provide an apparatus that may impart a complicated bend deformation to an object to be machined such as a ceramic bar elongated in one direction or the like, and may reduce the non-uniformity in machining amount of the object to be machined upon the machining work of the object to be machined, specifically a correcting mechanism for deforming the object to be machined together with a jig holding the object to be machined is provided in a machining apparatus. The correcting mechanism includes a base, a plurality of levers provided at first ends with pins, a shaft fixed to the base for rotatably supporting the levers, and a plurality of correcting drive means coupled to second ends of said levers for pivoting the levers to the shaft to thereby pivoting the pins.

Abstract: The state of a polysilicon film formed by excimer laser annealing an amorphous silicon film is to be evaluated. When the amorphous silicon film is annealed to form a polysilicon film, linearity or periodicity presents itself in the spatial structure of the film surface of the polysilicon film formed depending on the energy applied to the amorphous silicon during annealing. This linearity or periodicity is processed as an image and represented numerically from the image by exploiting the linearity or periodicity. The state of the polysilicon film is checked based on the numerical results.

Abstract: To provide an apparatus that may impart a complicated bend deformation to an object to be machined such as a ceramic bar elongated in one direction or the like, and may reduce the non-uniformity in machining amount of the object to be machined upon the machining work of the object to be machined, specifically a correcting mechanism for deforming the object to be machined together with a jig holding the object to be machined is provided in a machining apparatus. The correcting mechanism includes a base, a plurality of levers provided at first ends with pins, a shaft fixed to the base for rotatably supporting the levers, and a plurality of correcting drive means coupled to second ends of said levers for pivoting the levers to the shaft to thereby pivoting the pins.