Abstract: A transparent shift register latch (170) includes a normal operating gate (182) and a test gate (184) for selectively connecting data to a node (180). The node (180) is input to an isolation gate (186) through an inverter (188) for connection to an output node (190). A peripheral port (172) is interfaced with the output node (190) through an isolation gate (192). The gates (186) and (192) are operable in a test mode to interface data stored on the node (180) with the output of the latch (170) and inhibit input of data from the port (172). In the normal operating mode, the isolation gate (192) is closed and the isolation gate (186) is opened. The transparent shift register latch (170) allows testing of interface lines between adjacent logic modules.

Abstract: A method and apparatus for testing VLSI processors using a bit-sliced bus-oriented data path include data and control monitors and BIT for the on-chip memory. The data monitor is used to compress output data produced by the data path. BIT implementation of a functional test coupled with the data monitor are used for an off-line self-test of the data path in field. The control monitor is used to decouple the testing task of the control section from that of the data path.